JPH0221578U - - Google Patents

Info

Publication number
JPH0221578U
JPH0221578U JP10021088U JP10021088U JPH0221578U JP H0221578 U JPH0221578 U JP H0221578U JP 10021088 U JP10021088 U JP 10021088U JP 10021088 U JP10021088 U JP 10021088U JP H0221578 U JPH0221578 U JP H0221578U
Authority
JP
Japan
Prior art keywords
wafer
probe
probe head
electromagnet
attached
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP10021088U
Other languages
English (en)
Japanese (ja)
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP10021088U priority Critical patent/JPH0221578U/ja
Publication of JPH0221578U publication Critical patent/JPH0221578U/ja
Pending legal-status Critical Current

Links

Landscapes

  • Testing Of Individual Semiconductor Devices (AREA)
  • Measuring Leads Or Probes (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
JP10021088U 1988-07-28 1988-07-28 Pending JPH0221578U (cs)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP10021088U JPH0221578U (cs) 1988-07-28 1988-07-28

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP10021088U JPH0221578U (cs) 1988-07-28 1988-07-28

Publications (1)

Publication Number Publication Date
JPH0221578U true JPH0221578U (cs) 1990-02-13

Family

ID=31328083

Family Applications (1)

Application Number Title Priority Date Filing Date
JP10021088U Pending JPH0221578U (cs) 1988-07-28 1988-07-28

Country Status (1)

Country Link
JP (1) JPH0221578U (cs)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH07240444A (ja) * 1994-02-25 1995-09-12 Aging Tesuta Kaihatsu Kyodo Kumiai 半導体チップ試験装置
JP2001249167A (ja) * 2000-03-06 2001-09-14 Tokyo Weld Co Ltd 測定プローブ駆動装置

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH07240444A (ja) * 1994-02-25 1995-09-12 Aging Tesuta Kaihatsu Kyodo Kumiai 半導体チップ試験装置
JP2001249167A (ja) * 2000-03-06 2001-09-14 Tokyo Weld Co Ltd 測定プローブ駆動装置

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