JPH0235076U - - Google Patents
Info
- Publication number
- JPH0235076U JPH0235076U JP11459488U JP11459488U JPH0235076U JP H0235076 U JPH0235076 U JP H0235076U JP 11459488 U JP11459488 U JP 11459488U JP 11459488 U JP11459488 U JP 11459488U JP H0235076 U JPH0235076 U JP H0235076U
- Authority
- JP
- Japan
- Prior art keywords
- board
- contact
- printed circuit
- support
- circuit board
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 239000000523 sample Substances 0.000 claims description 2
- 238000010586 diagram Methods 0.000 description 1
Landscapes
- Testing Electric Properties And Detecting Electric Faults (AREA)
- Tests Of Electronic Circuits (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP11459488U JPH0235076U (cs) | 1988-08-31 | 1988-08-31 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP11459488U JPH0235076U (cs) | 1988-08-31 | 1988-08-31 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPH0235076U true JPH0235076U (cs) | 1990-03-06 |
Family
ID=31355481
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP11459488U Pending JPH0235076U (cs) | 1988-08-31 | 1988-08-31 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPH0235076U (cs) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2017223573A (ja) * | 2016-06-16 | 2017-12-21 | 澁谷工業株式会社 | 半導体素子検査装置 |
-
1988
- 1988-08-31 JP JP11459488U patent/JPH0235076U/ja active Pending
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2017223573A (ja) * | 2016-06-16 | 2017-12-21 | 澁谷工業株式会社 | 半導体素子検査装置 |