JPH0221550B2 - - Google Patents

Info

Publication number
JPH0221550B2
JPH0221550B2 JP57092517A JP9251782A JPH0221550B2 JP H0221550 B2 JPH0221550 B2 JP H0221550B2 JP 57092517 A JP57092517 A JP 57092517A JP 9251782 A JP9251782 A JP 9251782A JP H0221550 B2 JPH0221550 B2 JP H0221550B2
Authority
JP
Japan
Prior art keywords
voltage
ground
insulation
low
capacitance
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
JP57092517A
Other languages
English (en)
Japanese (ja)
Other versions
JPS58208674A (ja
Inventor
Tatsuji Matsuno
Yoshio Nomura
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Toyo Communication Equipment Co Ltd
Original Assignee
Toyo Communication Equipment Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Toyo Communication Equipment Co Ltd filed Critical Toyo Communication Equipment Co Ltd
Priority to JP57092517A priority Critical patent/JPS58208674A/ja
Publication of JPS58208674A publication Critical patent/JPS58208674A/ja
Publication of JPH0221550B2 publication Critical patent/JPH0221550B2/ja
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/12—Testing dielectric strength or breakdown voltage ; Testing or monitoring effectiveness or level of insulation, e.g. of a cable or of an apparatus, for example using partial discharge measurements; Electrostatic testing

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Testing Of Short-Circuits, Discontinuities, Leakage, Or Incorrect Line Connections (AREA)
JP57092517A 1982-05-31 1982-05-31 絶縁劣化状況測定方法 Granted JPS58208674A (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP57092517A JPS58208674A (ja) 1982-05-31 1982-05-31 絶縁劣化状況測定方法

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP57092517A JPS58208674A (ja) 1982-05-31 1982-05-31 絶縁劣化状況測定方法

Publications (2)

Publication Number Publication Date
JPS58208674A JPS58208674A (ja) 1983-12-05
JPH0221550B2 true JPH0221550B2 (enrdf_load_stackoverflow) 1990-05-15

Family

ID=14056511

Family Applications (1)

Application Number Title Priority Date Filing Date
JP57092517A Granted JPS58208674A (ja) 1982-05-31 1982-05-31 絶縁劣化状況測定方法

Country Status (1)

Country Link
JP (1) JPS58208674A (enrdf_load_stackoverflow)

Also Published As

Publication number Publication date
JPS58208674A (ja) 1983-12-05

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