JPS58208674A - 絶縁劣化状況測定方法 - Google Patents
絶縁劣化状況測定方法Info
- Publication number
- JPS58208674A JPS58208674A JP57092517A JP9251782A JPS58208674A JP S58208674 A JPS58208674 A JP S58208674A JP 57092517 A JP57092517 A JP 57092517A JP 9251782 A JP9251782 A JP 9251782A JP S58208674 A JPS58208674 A JP S58208674A
- Authority
- JP
- Japan
- Prior art keywords
- insulation
- deterioration
- resistance
- ground
- voltage
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 238000009413 insulation Methods 0.000 title claims abstract description 34
- 230000006866 deterioration Effects 0.000 title claims abstract description 23
- 238000005259 measurement Methods 0.000 title description 4
- 238000000034 method Methods 0.000 claims description 5
- 230000015556 catabolic process Effects 0.000 claims 1
- 238000006731 degradation reaction Methods 0.000 claims 1
- 230000003068 static effect Effects 0.000 claims 1
- 230000020169 heat generation Effects 0.000 abstract description 4
- 238000010586 diagram Methods 0.000 description 3
- 238000000691 measurement method Methods 0.000 description 3
- 241000282472 Canis lupus familiaris Species 0.000 description 1
- 101100381996 Saccharomyces cerevisiae (strain ATCC 204508 / S288c) BRO1 gene Proteins 0.000 description 1
- 230000005856 abnormality Effects 0.000 description 1
- 238000007796 conventional method Methods 0.000 description 1
- 238000001514 detection method Methods 0.000 description 1
- 241000894007 species Species 0.000 description 1
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/12—Testing dielectric strength or breakdown voltage ; Testing or monitoring effectiveness or level of insulation, e.g. of a cable or of an apparatus, for example using partial discharge measurements; Electrostatic testing
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Testing Of Short-Circuits, Discontinuities, Leakage, Or Incorrect Line Connections (AREA)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP57092517A JPS58208674A (ja) | 1982-05-31 | 1982-05-31 | 絶縁劣化状況測定方法 |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP57092517A JPS58208674A (ja) | 1982-05-31 | 1982-05-31 | 絶縁劣化状況測定方法 |
Publications (2)
Publication Number | Publication Date |
---|---|
JPS58208674A true JPS58208674A (ja) | 1983-12-05 |
JPH0221550B2 JPH0221550B2 (enrdf_load_stackoverflow) | 1990-05-15 |
Family
ID=14056511
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP57092517A Granted JPS58208674A (ja) | 1982-05-31 | 1982-05-31 | 絶縁劣化状況測定方法 |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS58208674A (enrdf_load_stackoverflow) |
-
1982
- 1982-05-31 JP JP57092517A patent/JPS58208674A/ja active Granted
Also Published As
Publication number | Publication date |
---|---|
JPH0221550B2 (enrdf_load_stackoverflow) | 1990-05-15 |
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