JPH0220922B2 - - Google Patents
Info
- Publication number
- JPH0220922B2 JPH0220922B2 JP55038400A JP3840080A JPH0220922B2 JP H0220922 B2 JPH0220922 B2 JP H0220922B2 JP 55038400 A JP55038400 A JP 55038400A JP 3840080 A JP3840080 A JP 3840080A JP H0220922 B2 JPH0220922 B2 JP H0220922B2
- Authority
- JP
- Japan
- Prior art keywords
- thickness
- steel plate
- measurement
- image
- plate
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B21/00—Measuring arrangements or details thereof, where the measuring technique is not covered by the other groups of this subclass, unspecified or not relevant
- G01B21/02—Measuring arrangements or details thereof, where the measuring technique is not covered by the other groups of this subclass, unspecified or not relevant for measuring length, width, or thickness
- G01B21/08—Measuring arrangements or details thereof, where the measuring technique is not covered by the other groups of this subclass, unspecified or not relevant for measuring length, width, or thickness for measuring thickness
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B15/00—Measuring arrangements characterised by the use of electromagnetic waves or particle radiation, e.g. by the use of microwaves, X-rays, gamma rays or electrons
- G01B15/02—Measuring arrangements characterised by the use of electromagnetic waves or particle radiation, e.g. by the use of microwaves, X-rays, gamma rays or electrons for measuring thickness
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Electromagnetism (AREA)
- Length Measuring Devices By Optical Means (AREA)
- Length Measuring Devices With Unspecified Measuring Means (AREA)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP3840080A JPS56135106A (en) | 1980-03-26 | 1980-03-26 | Material plate thickness correction |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP3840080A JPS56135106A (en) | 1980-03-26 | 1980-03-26 | Material plate thickness correction |
Publications (2)
Publication Number | Publication Date |
---|---|
JPS56135106A JPS56135106A (en) | 1981-10-22 |
JPH0220922B2 true JPH0220922B2 (enrdf_load_stackoverflow) | 1990-05-11 |
Family
ID=12524237
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP3840080A Granted JPS56135106A (en) | 1980-03-26 | 1980-03-26 | Material plate thickness correction |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS56135106A (enrdf_load_stackoverflow) |
Families Citing this family (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
DE10312535B4 (de) * | 2003-03-20 | 2006-12-07 | Ims-Messsysteme Gmbh | Verfahren und Vorrichtung zum geometrischen Vermessen eines Materialbandes |
JP6447872B2 (ja) * | 2015-03-27 | 2019-01-09 | カルソニックカンセイ株式会社 | エアバッグドアの脆弱線残厚測定装置および測定方法 |
CN107192326B (zh) * | 2017-05-13 | 2019-05-24 | 克拉玛依职业技术学院 | 基于gps数据计算岩层矢量真厚度的方法 |
-
1980
- 1980-03-26 JP JP3840080A patent/JPS56135106A/ja active Granted
Also Published As
Publication number | Publication date |
---|---|
JPS56135106A (en) | 1981-10-22 |
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