JPH02170137A - Mim liquid crystal panel - Google Patents

Mim liquid crystal panel

Info

Publication number
JPH02170137A
JPH02170137A JP63324910A JP32491088A JPH02170137A JP H02170137 A JPH02170137 A JP H02170137A JP 63324910 A JP63324910 A JP 63324910A JP 32491088 A JP32491088 A JP 32491088A JP H02170137 A JPH02170137 A JP H02170137A
Authority
JP
Japan
Prior art keywords
tantalum
mim
liquid crystal
crystal panel
capacitors
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP63324910A
Other languages
Japanese (ja)
Inventor
Satoru Yazawa
矢沢 悟
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Seiko Epson Corp
Original Assignee
Seiko Epson Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Seiko Epson Corp filed Critical Seiko Epson Corp
Priority to JP63324910A priority Critical patent/JPH02170137A/en
Publication of JPH02170137A publication Critical patent/JPH02170137A/en
Pending legal-status Critical Current

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  • Liquid Crystal (AREA)
  • Devices For Indicating Variable Information By Combining Individual Elements (AREA)

Abstract

PURPOSE:To form thin-film capacitors having high reliability and to improve display contrast by forming the insulating film for the thin-film capacitors by anodic oxidation of tantalum with a prescribed voltage for each of MIM elements. CONSTITUTION:The MIM elements 13 which are supplied with signals by chromium lines 13 are formed on one substrate forming the liquid crystal panel. The tantalum lines 11 and the thin-film capacitors 10 formed by lamination of the tantalum oxide film obtd. by the anodic oxidation of the lines 11 and picture element electrodes 12 consisting of ITO are provided on the element 13. The insulating film of the capacitors 10 is again anodized by the voltage higher than the anodic oxidation voltage of the tantalum at the time of forming the elements 13 and the resistance of the capacitors 10 is higher than the resistance of the elements 13. The thin-film capacitors having the high reliability are, therefore, easily and surely formed and the MIM liquid crystal panel of the stable contrast is obtd.

Description

【発明の詳細な説明】 [産業上の利用分野] 本発明は、MIM液晶パネルに、内部容量を信頼性良く
作り込む方法に関する。
DETAILED DESCRIPTION OF THE INVENTION [Field of Industrial Application] The present invention relates to a method for reliably creating internal capacitance in an MIM liquid crystal panel.

[従来の技術] 従来のMIM液晶パネルのMIM素子を形成した基板の
一例について、画素部分を拡大した平面図を第2図に示
す。表面が陽極酸化されたタンタルライン21からMI
M素子22に信号が供給され、さらにMIM素子22を
通り、MIM素子の上側電極23を通して画素電極24
に信号が入る第5図は、従来のMIM液晶パネルに薄膜
容量を形成した場合の平面図である。薄膜容量6・6は
クロムライン67上に、タンタル酸化膜をリアクティブ
スパッタし、更に画素電極24が積層されて形成されて
いる。
[Prior Art] FIG. 2 shows an enlarged plan view of a pixel portion of an example of a substrate on which MIM elements of a conventional MIM liquid crystal panel are formed. MI from tantalum line 21 with anodized surface
A signal is supplied to the M element 22, further passes through the MIM element 22, and passes through the upper electrode 23 of the MIM element to the pixel electrode 24.
FIG. 5 is a plan view of a conventional MIM liquid crystal panel in which a thin film capacitor is formed. The thin film capacitors 6 are formed by reactively sputtering a tantalum oxide film on the chrome line 67, and further layering the pixel electrode 24.

[発明が解決しようとする課題] 1 内部容量が作り込まれていない第2図の様なパネル
では、画素の信号が充分に保持されない為コントラスト
が不足したり、パネル内でコントラス斗のむらが生じ易
がった。
[Problems to be solved by the invention] 1. In a panel like the one shown in Fig. 2 in which internal capacitance is not built in, pixel signals are not retained sufficiently, resulting in insufficient contrast or uneven contrast within the panel. It was easy.

2、一方向部容量を作り込んでも第3図の如くの様に薄
膜容量66の絶縁膜を、リアクティブスバッタした場合
には、絶縁膜の抵抗値が小さく、Nj模容量36を作り
込んだ効果を出す事が出来なかった。従って、1と同様
、コントラスト不足や1パネル内でコントラストのむら
が生じ易かった本発明は、以上の様な問題を次の様な手
段により解消する事を目的とする。
2. Even if a unidirectional partial capacitor is created, if the insulating film of the thin film capacitor 66 is subjected to reactive scattering as shown in Fig. 3, the resistance value of the insulating film is small, and the Nj pseudo capacitor 36 is created. I couldn't make it effective. Therefore, as in 1, lack of contrast and unevenness of contrast tend to occur within one panel.The present invention aims to solve the above-mentioned problems by the following means.

[課題を解決するための手段] 本発明のMIM液晶パネルは、上下基板の一方の基板に
MIM素子を形成した液晶パネルの該素子形成基板上に
薄膜容量を各画素毎に形成した液晶パネルにおいて、該
薄膜容量の絶縁膜は、タンタルの陽極酸化により形成さ
れ、MIM素子を形成する時に行なうタンタルの陽極酸
化電圧より高い電圧で陽極酸化されている事を特徴とす
る。
[Means for Solving the Problems] The MIM liquid crystal panel of the present invention is a liquid crystal panel in which a MIM element is formed on one of the upper and lower substrates, and a thin film capacitor is formed for each pixel on the element forming substrate. The insulating film of the thin film capacitor is formed by anodic oxidation of tantalum, and is characterized in that it is anodized at a higher voltage than the anodic oxidation voltage of tantalum used when forming an MIM element.

[実施例] 第1図は、本発明の一実施例を示すパネルの画素部分の
平面図である。この例では、薄膜容量10は、タンタル
ライン11と、タンタルライン11を陽極酸化したタン
タル酸化膜と画素電極工TO12の積層により形成され
る。MIM素子15に信号を供給するのは、クロムライ
ン14である。この様に薄膜容量10の絶縁膜をタンタ
ルの陽極酸化で行なうと非常に高抵抗の良質の絶縁膜カ
バネル全体に均一に得られる。プロセス的には、MIM
素子13を陽極酸化で製作する際、同時に薄膜容量10
の絶縁膜を作り、MIM素子16とタンタルライン11
を分離した後、タンタルライン110部分のみを再度高
い′電圧で陽極酸化するのが確実で簡単である。薄膜容
量の絶縁抵抗は、MIM素子の抵抗より高い事が必要で
ある。従ってMIM素子より高い電圧で陽極酸化する必
要がある。2倍の陽極酸化電圧で行うと単位面積当りの
抵抗は、約700倍となる。15はエツチングにより除
去されたタンタルライン。
[Embodiment] FIG. 1 is a plan view of a pixel portion of a panel showing an embodiment of the present invention. In this example, the thin film capacitor 10 is formed by stacking a tantalum line 11, a tantalum oxide film obtained by anodizing the tantalum line 11, and a pixel electrode TO12. It is the chrome line 14 that supplies the signal to the MIM element 15. When the insulating film of the thin film capacitor 10 is formed by anodic oxidation of tantalum in this manner, a high-resistance, high-quality insulating film can be obtained uniformly over the entire panel. In terms of process, MIM
When manufacturing the element 13 by anodic oxidation, the thin film capacitance 10
An insulating film is made, and the MIM element 16 and the tantalum line 11 are
After separating the tantalum lines, it is reliable and simple to anodize only the tantalum line 110 portion again at a high voltage. The insulation resistance of the thin film capacitor needs to be higher than the resistance of the MIM element. Therefore, it is necessary to perform anodic oxidation at a higher voltage than the MIM element. If the anodic oxidation voltage is doubled, the resistance per unit area will be approximately 700 times higher. 15 is a tantalum line removed by etching.

[発明の効果] 本発明の構造で薄膜容量を信頼性良く作ることが出来、
コントラストが安定して優れたノぐネルを製造する事が
出来るという効果を生じる。
[Effects of the Invention] With the structure of the present invention, a thin film capacitor can be made with high reliability,
The effect is that it is possible to manufacture an excellent noggle with stable contrast.

【図面の簡単な説明】[Brief explanation of the drawing]

第1図は、本発明の実施例を示す画素部の平面図。 第2図は、従来の実施例を示す画素部の平面図第3図は
、従来の別の実施例を示す画素部の平面図。 以上
FIG. 1 is a plan view of a pixel section showing an embodiment of the present invention. FIG. 2 is a plan view of a pixel section showing a conventional embodiment. FIG. 3 is a plan view of a pixel section showing another conventional embodiment. that's all

Claims (1)

【特許請求の範囲】[Claims] 上下基板の一方の基板にMIM素子を形成した液晶パネ
ルの該素子形成基板上に薄膜容量を各画素毎に形成した
液晶パネルにおいて、該薄膜容量の絶縁膜は、タンタル
の陽極酸化により形成され、MIM素子を形成する時に
行なうタンタルの陽極酸化電圧より高い電圧で陽極酸化
されている事を特徴とするMIM液晶パネル。
In a liquid crystal panel in which a MIM element is formed on one of the upper and lower substrates, and a thin film capacitor is formed for each pixel on the element forming substrate, the insulating film of the thin film capacitor is formed by anodizing tantalum, An MIM liquid crystal panel characterized in that it is anodized at a voltage higher than the anodizing voltage used for tantalum when forming an MIM element.
JP63324910A 1988-12-23 1988-12-23 Mim liquid crystal panel Pending JPH02170137A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP63324910A JPH02170137A (en) 1988-12-23 1988-12-23 Mim liquid crystal panel

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP63324910A JPH02170137A (en) 1988-12-23 1988-12-23 Mim liquid crystal panel

Publications (1)

Publication Number Publication Date
JPH02170137A true JPH02170137A (en) 1990-06-29

Family

ID=18170986

Family Applications (1)

Application Number Title Priority Date Filing Date
JP63324910A Pending JPH02170137A (en) 1988-12-23 1988-12-23 Mim liquid crystal panel

Country Status (1)

Country Link
JP (1) JPH02170137A (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO1996002867A1 (en) * 1994-07-14 1996-02-01 Citizen Watch Co., Ltd. Liquid crystal display and method of manufacturing the same

Cited By (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO1996002867A1 (en) * 1994-07-14 1996-02-01 Citizen Watch Co., Ltd. Liquid crystal display and method of manufacturing the same
GB2306747A (en) * 1994-07-14 1997-05-07 Citizen Watch Co Ltd Liquid crystal display and method of manufacturing the same
GB2306747B (en) * 1994-07-14 1998-07-01 Citizen Watch Co Ltd Liquid crystal display and method of manufacturing the same
US5893621A (en) * 1994-07-14 1999-04-13 Citizen Watch Co., Ltd. Liquid crystal display and method of manufacturing the same
US6512556B1 (en) 1994-07-14 2003-01-28 Citizen Watch Co., Ltd. Liquid crystal display and method of manufacturing the same

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