JPH02170137A - Mim liquid crystal panel - Google Patents
Mim liquid crystal panelInfo
- Publication number
- JPH02170137A JPH02170137A JP63324910A JP32491088A JPH02170137A JP H02170137 A JPH02170137 A JP H02170137A JP 63324910 A JP63324910 A JP 63324910A JP 32491088 A JP32491088 A JP 32491088A JP H02170137 A JPH02170137 A JP H02170137A
- Authority
- JP
- Japan
- Prior art keywords
- tantalum
- mim
- liquid crystal
- crystal panel
- capacitors
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 239000004973 liquid crystal related substance Substances 0.000 title claims abstract description 10
- 239000003990 capacitor Substances 0.000 claims abstract description 19
- 239000010409 thin film Substances 0.000 claims abstract description 16
- 229910052715 tantalum Inorganic materials 0.000 claims abstract description 15
- GUVRBAGPIYLISA-UHFFFAOYSA-N tantalum atom Chemical compound [Ta] GUVRBAGPIYLISA-UHFFFAOYSA-N 0.000 claims abstract description 15
- 239000010408 film Substances 0.000 claims abstract description 12
- 239000000758 substrate Substances 0.000 claims abstract description 6
- 238000007743 anodising Methods 0.000 claims description 3
- 230000003647 oxidation Effects 0.000 abstract description 9
- 238000007254 oxidation reaction Methods 0.000 abstract description 9
- VYZAMTAEIAYCRO-UHFFFAOYSA-N Chromium Chemical compound [Cr] VYZAMTAEIAYCRO-UHFFFAOYSA-N 0.000 abstract description 3
- BPUBBGLMJRNUCC-UHFFFAOYSA-N oxygen(2-);tantalum(5+) Chemical compound [O-2].[O-2].[O-2].[O-2].[O-2].[Ta+5].[Ta+5] BPUBBGLMJRNUCC-UHFFFAOYSA-N 0.000 abstract description 3
- 229910001936 tantalum oxide Inorganic materials 0.000 abstract description 3
- 229910052804 chromium Inorganic materials 0.000 abstract 1
- 239000011651 chromium Substances 0.000 abstract 1
- 238000003475 lamination Methods 0.000 abstract 1
- 230000000694 effects Effects 0.000 description 2
- 238000004519 manufacturing process Methods 0.000 description 2
- 238000000034 method Methods 0.000 description 2
- 238000005530 etching Methods 0.000 description 1
- 238000009413 insulation Methods 0.000 description 1
- 230000000717 retained effect Effects 0.000 description 1
- 238000004544 sputter deposition Methods 0.000 description 1
Landscapes
- Liquid Crystal (AREA)
- Devices For Indicating Variable Information By Combining Individual Elements (AREA)
Abstract
Description
【発明の詳細な説明】
[産業上の利用分野]
本発明は、MIM液晶パネルに、内部容量を信頼性良く
作り込む方法に関する。DETAILED DESCRIPTION OF THE INVENTION [Field of Industrial Application] The present invention relates to a method for reliably creating internal capacitance in an MIM liquid crystal panel.
[従来の技術]
従来のMIM液晶パネルのMIM素子を形成した基板の
一例について、画素部分を拡大した平面図を第2図に示
す。表面が陽極酸化されたタンタルライン21からMI
M素子22に信号が供給され、さらにMIM素子22を
通り、MIM素子の上側電極23を通して画素電極24
に信号が入る第5図は、従来のMIM液晶パネルに薄膜
容量を形成した場合の平面図である。薄膜容量6・6は
クロムライン67上に、タンタル酸化膜をリアクティブ
スパッタし、更に画素電極24が積層されて形成されて
いる。[Prior Art] FIG. 2 shows an enlarged plan view of a pixel portion of an example of a substrate on which MIM elements of a conventional MIM liquid crystal panel are formed. MI from tantalum line 21 with anodized surface
A signal is supplied to the M element 22, further passes through the MIM element 22, and passes through the upper electrode 23 of the MIM element to the pixel electrode 24.
FIG. 5 is a plan view of a conventional MIM liquid crystal panel in which a thin film capacitor is formed. The thin film capacitors 6 are formed by reactively sputtering a tantalum oxide film on the chrome line 67, and further layering the pixel electrode 24.
[発明が解決しようとする課題]
1 内部容量が作り込まれていない第2図の様なパネル
では、画素の信号が充分に保持されない為コントラスト
が不足したり、パネル内でコントラス斗のむらが生じ易
がった。[Problems to be solved by the invention] 1. In a panel like the one shown in Fig. 2 in which internal capacitance is not built in, pixel signals are not retained sufficiently, resulting in insufficient contrast or uneven contrast within the panel. It was easy.
2、一方向部容量を作り込んでも第3図の如くの様に薄
膜容量66の絶縁膜を、リアクティブスバッタした場合
には、絶縁膜の抵抗値が小さく、Nj模容量36を作り
込んだ効果を出す事が出来なかった。従って、1と同様
、コントラスト不足や1パネル内でコントラストのむら
が生じ易かった本発明は、以上の様な問題を次の様な手
段により解消する事を目的とする。2. Even if a unidirectional partial capacitor is created, if the insulating film of the thin film capacitor 66 is subjected to reactive scattering as shown in Fig. 3, the resistance value of the insulating film is small, and the Nj pseudo capacitor 36 is created. I couldn't make it effective. Therefore, as in 1, lack of contrast and unevenness of contrast tend to occur within one panel.The present invention aims to solve the above-mentioned problems by the following means.
[課題を解決するための手段]
本発明のMIM液晶パネルは、上下基板の一方の基板に
MIM素子を形成した液晶パネルの該素子形成基板上に
薄膜容量を各画素毎に形成した液晶パネルにおいて、該
薄膜容量の絶縁膜は、タンタルの陽極酸化により形成さ
れ、MIM素子を形成する時に行なうタンタルの陽極酸
化電圧より高い電圧で陽極酸化されている事を特徴とす
る。[Means for Solving the Problems] The MIM liquid crystal panel of the present invention is a liquid crystal panel in which a MIM element is formed on one of the upper and lower substrates, and a thin film capacitor is formed for each pixel on the element forming substrate. The insulating film of the thin film capacitor is formed by anodic oxidation of tantalum, and is characterized in that it is anodized at a higher voltage than the anodic oxidation voltage of tantalum used when forming an MIM element.
[実施例]
第1図は、本発明の一実施例を示すパネルの画素部分の
平面図である。この例では、薄膜容量10は、タンタル
ライン11と、タンタルライン11を陽極酸化したタン
タル酸化膜と画素電極工TO12の積層により形成され
る。MIM素子15に信号を供給するのは、クロムライ
ン14である。この様に薄膜容量10の絶縁膜をタンタ
ルの陽極酸化で行なうと非常に高抵抗の良質の絶縁膜カ
バネル全体に均一に得られる。プロセス的には、MIM
素子13を陽極酸化で製作する際、同時に薄膜容量10
の絶縁膜を作り、MIM素子16とタンタルライン11
を分離した後、タンタルライン110部分のみを再度高
い′電圧で陽極酸化するのが確実で簡単である。薄膜容
量の絶縁抵抗は、MIM素子の抵抗より高い事が必要で
ある。従ってMIM素子より高い電圧で陽極酸化する必
要がある。2倍の陽極酸化電圧で行うと単位面積当りの
抵抗は、約700倍となる。15はエツチングにより除
去されたタンタルライン。[Embodiment] FIG. 1 is a plan view of a pixel portion of a panel showing an embodiment of the present invention. In this example, the thin film capacitor 10 is formed by stacking a tantalum line 11, a tantalum oxide film obtained by anodizing the tantalum line 11, and a pixel electrode TO12. It is the chrome line 14 that supplies the signal to the MIM element 15. When the insulating film of the thin film capacitor 10 is formed by anodic oxidation of tantalum in this manner, a high-resistance, high-quality insulating film can be obtained uniformly over the entire panel. In terms of process, MIM
When manufacturing the element 13 by anodic oxidation, the thin film capacitance 10
An insulating film is made, and the MIM element 16 and the tantalum line 11 are
After separating the tantalum lines, it is reliable and simple to anodize only the tantalum line 110 portion again at a high voltage. The insulation resistance of the thin film capacitor needs to be higher than the resistance of the MIM element. Therefore, it is necessary to perform anodic oxidation at a higher voltage than the MIM element. If the anodic oxidation voltage is doubled, the resistance per unit area will be approximately 700 times higher. 15 is a tantalum line removed by etching.
[発明の効果]
本発明の構造で薄膜容量を信頼性良く作ることが出来、
コントラストが安定して優れたノぐネルを製造する事が
出来るという効果を生じる。[Effects of the Invention] With the structure of the present invention, a thin film capacitor can be made with high reliability,
The effect is that it is possible to manufacture an excellent noggle with stable contrast.
第1図は、本発明の実施例を示す画素部の平面図。
第2図は、従来の実施例を示す画素部の平面図第3図は
、従来の別の実施例を示す画素部の平面図。
以上FIG. 1 is a plan view of a pixel section showing an embodiment of the present invention. FIG. 2 is a plan view of a pixel section showing a conventional embodiment. FIG. 3 is a plan view of a pixel section showing another conventional embodiment. that's all
Claims (1)
ルの該素子形成基板上に薄膜容量を各画素毎に形成した
液晶パネルにおいて、該薄膜容量の絶縁膜は、タンタル
の陽極酸化により形成され、MIM素子を形成する時に
行なうタンタルの陽極酸化電圧より高い電圧で陽極酸化
されている事を特徴とするMIM液晶パネル。In a liquid crystal panel in which a MIM element is formed on one of the upper and lower substrates, and a thin film capacitor is formed for each pixel on the element forming substrate, the insulating film of the thin film capacitor is formed by anodizing tantalum, An MIM liquid crystal panel characterized in that it is anodized at a voltage higher than the anodizing voltage used for tantalum when forming an MIM element.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP63324910A JPH02170137A (en) | 1988-12-23 | 1988-12-23 | Mim liquid crystal panel |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP63324910A JPH02170137A (en) | 1988-12-23 | 1988-12-23 | Mim liquid crystal panel |
Publications (1)
Publication Number | Publication Date |
---|---|
JPH02170137A true JPH02170137A (en) | 1990-06-29 |
Family
ID=18170986
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP63324910A Pending JPH02170137A (en) | 1988-12-23 | 1988-12-23 | Mim liquid crystal panel |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPH02170137A (en) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
WO1996002867A1 (en) * | 1994-07-14 | 1996-02-01 | Citizen Watch Co., Ltd. | Liquid crystal display and method of manufacturing the same |
-
1988
- 1988-12-23 JP JP63324910A patent/JPH02170137A/en active Pending
Cited By (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
WO1996002867A1 (en) * | 1994-07-14 | 1996-02-01 | Citizen Watch Co., Ltd. | Liquid crystal display and method of manufacturing the same |
GB2306747A (en) * | 1994-07-14 | 1997-05-07 | Citizen Watch Co Ltd | Liquid crystal display and method of manufacturing the same |
GB2306747B (en) * | 1994-07-14 | 1998-07-01 | Citizen Watch Co Ltd | Liquid crystal display and method of manufacturing the same |
US5893621A (en) * | 1994-07-14 | 1999-04-13 | Citizen Watch Co., Ltd. | Liquid crystal display and method of manufacturing the same |
US6512556B1 (en) | 1994-07-14 | 2003-01-28 | Citizen Watch Co., Ltd. | Liquid crystal display and method of manufacturing the same |
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