JPH0216876B2 - - Google Patents

Info

Publication number
JPH0216876B2
JPH0216876B2 JP56209802A JP20980281A JPH0216876B2 JP H0216876 B2 JPH0216876 B2 JP H0216876B2 JP 56209802 A JP56209802 A JP 56209802A JP 20980281 A JP20980281 A JP 20980281A JP H0216876 B2 JPH0216876 B2 JP H0216876B2
Authority
JP
Japan
Prior art keywords
plate
burn
shaped
row
card edge
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
JP56209802A
Other languages
English (en)
Japanese (ja)
Other versions
JPS58113769A (ja
Inventor
Minami Kikawada
Yoshitaka Okukado
Shunzo Yano
Kenichi Ooi
Kyoshi Shimazaki
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Fujitsu Ltd
Original Assignee
Fujitsu Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Fujitsu Ltd filed Critical Fujitsu Ltd
Priority to JP56209802A priority Critical patent/JPS58113769A/ja
Publication of JPS58113769A publication Critical patent/JPS58113769A/ja
Publication of JPH0216876B2 publication Critical patent/JPH0216876B2/ja
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/50—Testing of electric apparatus, lines, cables or components for short-circuits, continuity, leakage current or incorrect line connections
    • G01R31/58—Testing of lines, cables or conductors
    • G01R31/59—Testing of lines, cables or conductors while the cable continuously passes the testing apparatus, e.g. during manufacture

Landscapes

  • Manufacturing Of Electrical Connectors (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Tests Of Electronic Circuits (AREA)
JP56209802A 1981-12-28 1981-12-28 バ−ンイン装置 Granted JPS58113769A (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP56209802A JPS58113769A (ja) 1981-12-28 1981-12-28 バ−ンイン装置

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP56209802A JPS58113769A (ja) 1981-12-28 1981-12-28 バ−ンイン装置

Publications (2)

Publication Number Publication Date
JPS58113769A JPS58113769A (ja) 1983-07-06
JPH0216876B2 true JPH0216876B2 (enExample) 1990-04-18

Family

ID=16578832

Family Applications (1)

Application Number Title Priority Date Filing Date
JP56209802A Granted JPS58113769A (ja) 1981-12-28 1981-12-28 バ−ンイン装置

Country Status (1)

Country Link
JP (1) JPS58113769A (enExample)

Families Citing this family (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6023766U (ja) * 1983-07-25 1985-02-18 タバイエスペツク株式会社 バ−ンイン装置
JPS61118076U (enExample) * 1985-01-07 1986-07-25
JPS61187480U (enExample) * 1985-05-14 1986-11-21

Family Cites Families (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5425644U (enExample) * 1977-07-21 1979-02-20

Also Published As

Publication number Publication date
JPS58113769A (ja) 1983-07-06

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