JPH02141847U - - Google Patents
Info
- Publication number
- JPH02141847U JPH02141847U JP5125989U JP5125989U JPH02141847U JP H02141847 U JPH02141847 U JP H02141847U JP 5125989 U JP5125989 U JP 5125989U JP 5125989 U JP5125989 U JP 5125989U JP H02141847 U JPH02141847 U JP H02141847U
- Authority
- JP
- Japan
- Prior art keywords
- disk
- light
- detection means
- disk body
- light detection
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Landscapes
- Length Measuring Devices By Optical Means (AREA)
- Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP1989051259U JPH0736271Y2 (ja) | 1989-04-28 | 1989-04-28 | 円盤体の欠陥検査装置 |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP1989051259U JPH0736271Y2 (ja) | 1989-04-28 | 1989-04-28 | 円盤体の欠陥検査装置 |
Publications (2)
Publication Number | Publication Date |
---|---|
JPH02141847U true JPH02141847U (enrdf_load_stackoverflow) | 1990-11-29 |
JPH0736271Y2 JPH0736271Y2 (ja) | 1995-08-16 |
Family
ID=31570534
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP1989051259U Expired - Lifetime JPH0736271Y2 (ja) | 1989-04-28 | 1989-04-28 | 円盤体の欠陥検査装置 |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPH0736271Y2 (enrdf_load_stackoverflow) |
Cited By (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH0564760U (ja) * | 1992-01-22 | 1993-08-27 | 東京航空計器株式会社 | 円盤状物品の保持装置 |
WO2009013887A1 (ja) * | 2007-07-25 | 2009-01-29 | Nikon Corporation | 端部検査装置 |
CN106442552A (zh) * | 2016-08-29 | 2017-02-22 | 宁波永信精密管业有限公司 | 套筒件外观检测装置 |
Citations (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS60258729A (ja) * | 1984-06-04 | 1985-12-20 | Hitachi Ltd | 磁気デイスク塗膜の検査方法及びその装置 |
-
1989
- 1989-04-28 JP JP1989051259U patent/JPH0736271Y2/ja not_active Expired - Lifetime
Patent Citations (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS60258729A (ja) * | 1984-06-04 | 1985-12-20 | Hitachi Ltd | 磁気デイスク塗膜の検査方法及びその装置 |
Cited By (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH0564760U (ja) * | 1992-01-22 | 1993-08-27 | 東京航空計器株式会社 | 円盤状物品の保持装置 |
WO2009013887A1 (ja) * | 2007-07-25 | 2009-01-29 | Nikon Corporation | 端部検査装置 |
CN106442552A (zh) * | 2016-08-29 | 2017-02-22 | 宁波永信精密管业有限公司 | 套筒件外观检测装置 |
Also Published As
Publication number | Publication date |
---|---|
JPH0736271Y2 (ja) | 1995-08-16 |
Similar Documents
Legal Events
Date | Code | Title | Description |
---|---|---|---|
EXPY | Cancellation because of completion of term |