JPH0212675U - - Google Patents
Info
- Publication number
- JPH0212675U JPH0212675U JP9015488U JP9015488U JPH0212675U JP H0212675 U JPH0212675 U JP H0212675U JP 9015488 U JP9015488 U JP 9015488U JP 9015488 U JP9015488 U JP 9015488U JP H0212675 U JPH0212675 U JP H0212675U
- Authority
- JP
- Japan
- Prior art keywords
- rotary table
- printed circuit
- inspection
- probe
- area
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 238000007689 inspection Methods 0.000 claims description 9
- 239000000523 sample Substances 0.000 claims description 4
- 230000002950 deficient Effects 0.000 description 1
Landscapes
- Tests Of Electronic Circuits (AREA)
- Testing Electric Properties And Detecting Electric Faults (AREA)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP9015488U JPH0212675U (sv) | 1988-07-07 | 1988-07-07 |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP9015488U JPH0212675U (sv) | 1988-07-07 | 1988-07-07 |
Publications (1)
Publication Number | Publication Date |
---|---|
JPH0212675U true JPH0212675U (sv) | 1990-01-26 |
Family
ID=31314686
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP9015488U Pending JPH0212675U (sv) | 1988-07-07 | 1988-07-07 |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPH0212675U (sv) |
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2002277502A (ja) * | 2001-01-12 | 2002-09-25 | Nidec-Read Corp | 基板検査装置及び基板検査方法 |
WO2010008030A1 (ja) * | 2008-07-18 | 2010-01-21 | 日本電産リード株式会社 | ピン先端部のクリーニング機構を有する基板検査装置 |
-
1988
- 1988-07-07 JP JP9015488U patent/JPH0212675U/ja active Pending
Cited By (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2002277502A (ja) * | 2001-01-12 | 2002-09-25 | Nidec-Read Corp | 基板検査装置及び基板検査方法 |
WO2010008030A1 (ja) * | 2008-07-18 | 2010-01-21 | 日本電産リード株式会社 | ピン先端部のクリーニング機構を有する基板検査装置 |
CN102099699A (zh) * | 2008-07-18 | 2011-06-15 | 日本电产丽德株式会社 | 具有销顶端部的清洁机构的基板检查装置 |
JP5594535B2 (ja) * | 2008-07-18 | 2014-09-24 | 日本電産リード株式会社 | ピン先端部のクリーニング機構を有する基板検査装置 |
TWI467182B (zh) * | 2008-07-18 | 2015-01-01 | Nidec Read Corp | And a substrate inspection apparatus having a cleaning mechanism for the front end portion of the probe |
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