JPH0212675U - - Google Patents
Info
- Publication number
- JPH0212675U JPH0212675U JP9015488U JP9015488U JPH0212675U JP H0212675 U JPH0212675 U JP H0212675U JP 9015488 U JP9015488 U JP 9015488U JP 9015488 U JP9015488 U JP 9015488U JP H0212675 U JPH0212675 U JP H0212675U
- Authority
- JP
- Japan
- Prior art keywords
- rotary table
- printed circuit
- inspection
- probe
- area
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 238000007689 inspection Methods 0.000 claims description 9
- 239000000523 sample Substances 0.000 claims description 4
- 230000002950 deficient Effects 0.000 description 1
Landscapes
- Testing Electric Properties And Detecting Electric Faults (AREA)
- Tests Of Electronic Circuits (AREA)
Description
第1図ないし第3図は本考案の一実施例を示す
もので、第1図は平面図、第2図は投入ストツク
部の側面図、第3図は検査ピンボードの側面図、
第4図は従来の検査装置の斜視図である。
1……FPC(被検査物)、9……検査回路、
10……回転テーブル、12……ピン、13……
投入ストツク部(搬送手段)、14……検査ピン
ボード(検査手段)、15……良品ストツク部(
搬送手段)、16……不良品搬出部(搬送手段)
、18……ガイドレール、19……真空吸着部、
20……昇降機構、21……摩擦部材、22……
プローブ、23……ブラシ、26……収納箱。
Figures 1 to 3 show an embodiment of the present invention, in which Figure 1 is a plan view, Figure 2 is a side view of the input stock section, Figure 3 is a side view of the inspection pin board,
FIG. 4 is a perspective view of a conventional inspection device. 1...FPC (test object), 9...Test circuit,
10... Rotating table, 12... Pin, 13...
Input stock section (transporting means), 14... Inspection pin board (inspection means), 15... Good product stock section (
transport means), 16... Defective product delivery section (transport means)
, 18... Guide rail, 19... Vacuum suction part,
20... Lifting mechanism, 21... Friction member, 22...
Probe, 23...brush, 26...storage box.
Claims (1)
れる領域が少なくとも3箇所に設けられた回転テ
ーブル10と、該回転テーブルの周囲にそれぞれ
設けられて回転テーブル上の一つの領域へのプリ
ント基板の搬入および他の領域からのプリント基
板の搬出を行う搬送手段13,15と、前記搬送
手段による搬入および搬出が行われる領域とは異
なる回転テーブル上の領域の上方に昇降可能に設
けられ、前記プリント基板に接触するプローブ2
2を有する検査手段14と、該検査手段のプロー
ブの導通状態から前記プリント基板の良否を判断
する検査回路9と、前記回転テーブル上の隣接す
る載置領域の間に設けられて回転テーブルと一体
に回転することにより前記検査手段のプローブに
接触させられるブラシ23とからなることを特徴
とするプリント基板の検査装置。 A rotary table 10 is provided with at least three areas on which printed circuit boards having the same planar shape are placed, and a rotary table 10 is provided around the rotary table to carry the printed circuit board to one area on the rotary table. Conveying means 13 and 15 for carrying out printed circuit boards from other areas are provided so as to be movable up and down above an area on a rotary table different from the area where the carrying in and out of the printed circuit boards are carried out by the carrying means, and Contact probe 2
2, an inspection circuit 9 that determines the quality of the printed circuit board from the conduction state of the probe of the inspection means, and an inspection circuit 9 that is provided between adjacent mounting areas on the rotary table and is integrated with the rotary table. 1. A printed circuit board inspection device comprising: a brush 23 that is brought into contact with the probe of the inspection means by rotating the brush 23;
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP9015488U JPH0212675U (en) | 1988-07-07 | 1988-07-07 |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP9015488U JPH0212675U (en) | 1988-07-07 | 1988-07-07 |
Publications (1)
Publication Number | Publication Date |
---|---|
JPH0212675U true JPH0212675U (en) | 1990-01-26 |
Family
ID=31314686
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP9015488U Pending JPH0212675U (en) | 1988-07-07 | 1988-07-07 |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPH0212675U (en) |
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2002277502A (en) * | 2001-01-12 | 2002-09-25 | Nidec-Read Corp | Substrate inspection device and substrate inspection method |
WO2010008030A1 (en) * | 2008-07-18 | 2010-01-21 | 日本電産リード株式会社 | Substrate-inspecting device having cleaning mechanism for tips of pins |
-
1988
- 1988-07-07 JP JP9015488U patent/JPH0212675U/ja active Pending
Cited By (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2002277502A (en) * | 2001-01-12 | 2002-09-25 | Nidec-Read Corp | Substrate inspection device and substrate inspection method |
WO2010008030A1 (en) * | 2008-07-18 | 2010-01-21 | 日本電産リード株式会社 | Substrate-inspecting device having cleaning mechanism for tips of pins |
CN102099699A (en) * | 2008-07-18 | 2011-06-15 | 日本电产丽德株式会社 | Substrate-inspecting device having cleaning mechanism for tips of pins |
JP5594535B2 (en) * | 2008-07-18 | 2014-09-24 | 日本電産リード株式会社 | Substrate inspection apparatus having pin tip cleaning mechanism |
TWI467182B (en) * | 2008-07-18 | 2015-01-01 | Nidec Read Corp | And a substrate inspection apparatus having a cleaning mechanism for the front end portion of the probe |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
JPH0212675U (en) | ||
JPS59124679U (en) | Processing table of laser processing machine | |
JPH0440600U (en) | ||
JPH0192330U (en) | ||
JPH0379158U (en) | ||
JPS61161684U (en) | ||
JPS58187550U (en) | Continuous form conveyor | |
JPH0183736U (en) | ||
JPS6258108U (en) | ||
JPH0433458U (en) | ||
JPS59179823U (en) | Continuous vertical conveyance and discharge device | |
JPH0299375U (en) | ||
JPS6228180U (en) | ||
JPH0184495U (en) | ||
JPS58175897U (en) | Empty can sorting machine | |
JPS63200172U (en) | ||
JPS58114216U (en) | Grain conveyor belt | |
JPS60179602U (en) | Packaging device for rod-shaped members | |
JPS6111647U (en) | paper pulling device | |
JPS6015259U (en) | Conveyor for transporting items to be cleaned in washing machines | |
JPS62194642U (en) | ||
JPH0350153U (en) | ||
JPH0291721U (en) | ||
JPS63137939U (en) | ||
JPH0353844U (en) |