JPH0197263U - - Google Patents
Info
- Publication number
- JPH0197263U JPH0197263U JP19269187U JP19269187U JPH0197263U JP H0197263 U JPH0197263 U JP H0197263U JP 19269187 U JP19269187 U JP 19269187U JP 19269187 U JP19269187 U JP 19269187U JP H0197263 U JPH0197263 U JP H0197263U
- Authority
- JP
- Japan
- Prior art keywords
- package
- measurement probe
- probe assembly
- utility
- model registration
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 239000000523 sample Substances 0.000 claims description 37
- 238000005259 measurement Methods 0.000 claims description 36
- 239000004020 conductor Substances 0.000 claims description 7
- 239000011295 pitch Substances 0.000 claims 7
- 238000011990 functional testing Methods 0.000 claims 1
- 239000011810 insulating material Substances 0.000 claims 1
- WABPQHHGFIMREM-UHFFFAOYSA-N lead(0) Chemical compound [Pb] WABPQHHGFIMREM-UHFFFAOYSA-N 0.000 description 1
Landscapes
- Testing Of Individual Semiconductor Devices (AREA)
- Measuring Leads Or Probes (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP19269187U JPH0533974Y2 (enEXAMPLES) | 1987-12-21 | 1987-12-21 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP19269187U JPH0533974Y2 (enEXAMPLES) | 1987-12-21 | 1987-12-21 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPH0197263U true JPH0197263U (enEXAMPLES) | 1989-06-28 |
| JPH0533974Y2 JPH0533974Y2 (enEXAMPLES) | 1993-08-27 |
Family
ID=31483531
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP19269187U Expired - Lifetime JPH0533974Y2 (enEXAMPLES) | 1987-12-21 | 1987-12-21 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPH0533974Y2 (enEXAMPLES) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2006261144A (ja) * | 2005-03-15 | 2006-09-28 | Minowa Koa Inc | 抵抗器の製造法及び抵抗器の検測装置 |
-
1987
- 1987-12-21 JP JP19269187U patent/JPH0533974Y2/ja not_active Expired - Lifetime
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2006261144A (ja) * | 2005-03-15 | 2006-09-28 | Minowa Koa Inc | 抵抗器の製造法及び抵抗器の検測装置 |
Also Published As
| Publication number | Publication date |
|---|---|
| JPH0533974Y2 (enEXAMPLES) | 1993-08-27 |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| JPH0197263U (enEXAMPLES) | ||
| JPH0197262U (enEXAMPLES) | ||
| JPH08179003A (ja) | 表面実装部品測定端子取付器 | |
| JPH0210462Y2 (enEXAMPLES) | ||
| JPH031822Y2 (enEXAMPLES) | ||
| JPH0742140Y2 (ja) | プローブのアース構造 | |
| JPS5828360Y2 (ja) | Ｉｃクリツプ | |
| KR200300719Y1 (ko) | 계측기용 단자 체결구조 | |
| JPS60161865U (ja) | 回路測定ブロ−ブ | |
| JPH0195672U (enEXAMPLES) | ||
| JPH02130475A (ja) | 探針 | |
| KR200227339Y1 (ko) | 반도체 측정장비 | |
| JP3132465B2 (ja) | 半導体装置及びプローブユニット | |
| JPS6267481U (enEXAMPLES) | ||
| SU801158A1 (ru) | Контактное устройство | |
| JPS58134775U (ja) | Ｉｃ測定クリツプ | |
| JPS6231974A (ja) | Ｉｃ用ソケツト | |
| JPH04102473U (ja) | 測定用接触子 | |
| JPS63199071U (enEXAMPLES) | ||
| JPS61162758A (ja) | インサ−キツトテスタの測定ノ−ド中継装置 | |
| JPH0461310B2 (enEXAMPLES) | ||
| JPH04126174U (ja) | プローブの構造 | |
| JPS6011077U (ja) | 探針装置 | |
| JPH0285368U (enEXAMPLES) | ||
| JPS62295426A (ja) | プロ−ブカ−ド |