JPH0193556U - - Google Patents

Info

Publication number
JPH0193556U
JPH0193556U JP1987190264U JP19026487U JPH0193556U JP H0193556 U JPH0193556 U JP H0193556U JP 1987190264 U JP1987190264 U JP 1987190264U JP 19026487 U JP19026487 U JP 19026487U JP H0193556 U JPH0193556 U JP H0193556U
Authority
JP
Japan
Prior art keywords
counting circuit
ray
gate
timer
circuit
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP1987190264U
Other languages
English (en)
Japanese (ja)
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP1987190264U priority Critical patent/JPH0193556U/ja
Publication of JPH0193556U publication Critical patent/JPH0193556U/ja
Pending legal-status Critical Current

Links

Landscapes

  • Analysing Materials By The Use Of Radiation (AREA)
JP1987190264U 1987-12-15 1987-12-15 Pending JPH0193556U (enExample)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP1987190264U JPH0193556U (enExample) 1987-12-15 1987-12-15

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP1987190264U JPH0193556U (enExample) 1987-12-15 1987-12-15

Publications (1)

Publication Number Publication Date
JPH0193556U true JPH0193556U (enExample) 1989-06-20

Family

ID=31481252

Family Applications (1)

Application Number Title Priority Date Filing Date
JP1987190264U Pending JPH0193556U (enExample) 1987-12-15 1987-12-15

Country Status (1)

Country Link
JP (1) JPH0193556U (enExample)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2006058015A (ja) * 2004-08-17 2006-03-02 Jeol Ltd 波高分布表示機能を備えたｘ線分析装置

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2006058015A (ja) * 2004-08-17 2006-03-02 Jeol Ltd 波高分布表示機能を備えたｘ線分析装置

Similar Documents

Publication Publication Date Title
US4612660A (en) Time resolved extended X-ray absorption fine structure spectrometer
AU5091393A (en) Time of flight mass spectrometer, ion source, and methods of preparing a sample for mass analysis and of mass analyzing a sample
DE3104468C2 (de) Röntgenfluoreszenzspektrometer
JPH0193556U (enExample)
GB1303343A (enExample)
ES469059A1 (es) Un tubo de rayos x perfeccionado
AU534682B2 (en) Automatic sample feeder for flameless atomic absorption spectrometer
JPS5235693A (en) Automatic analysis apparatus of a wide range of quantitative determinati on
JPS52146688A (en) Fluorescent x ray analyzer
JPS5589738A (en) Auger electron photometry unit
GB967047A (en) Spectrometric analysis
Maxia et al. The neutron-deficient yttrium isotopes 82Y, 83Y and 84Y
JPS6443962A (en) Mass spectrometer
DE1773175A1 (de) Verfahren und Vorrichtung zur Analyse von Radionukliden in fluessigen Szintillatoren
Griffiths et al. The analysis of high-purity irons, mild steels and low-alloy steels by X-ray emission spectroscopy. Part 2: The determination of trace elements in high-purity irons(X ray fluorescence analysis of trace elements in high purity irons)
JPS63128661U (enExample)
JPS5730254A (en) Complex surface analyzer
JPH03106451U (enExample)
Ichioka et al. Analysis of Steels by Optical Emission Spectrometer in a Vacuum With Inductively Coupled Plasma
Beitz et al. X-ray fluorescence analysis
JPH01105854U (enExample)
JPS5887749A (ja) 質量分析装置の磁場制御方法
Berlin X-Ray Probe with Slit Aperture in the Secondary Beam.
JPS6312153U (enExample)
MCDONALD Design and fabrication of quadrupole ion mass spectrometer for upper atmosphere[Scientific Report, 1 Oct. 1978- 30 Aug. 1979]