JPH0187549U - - Google Patents

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Publication number
JPH0187549U
JPH0187549U JP18482687U JP18482687U JPH0187549U JP H0187549 U JPH0187549 U JP H0187549U JP 18482687 U JP18482687 U JP 18482687U JP 18482687 U JP18482687 U JP 18482687U JP H0187549 U JPH0187549 U JP H0187549U
Authority
JP
Japan
Prior art keywords
semiconductor element
dam
sealing material
semiconductor
surround
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP18482687U
Other languages
Japanese (ja)
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP18482687U priority Critical patent/JPH0187549U/ja
Publication of JPH0187549U publication Critical patent/JPH0187549U/ja
Pending legal-status Critical Current

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Landscapes

  • Structures Or Materials For Encapsulating Or Coating Semiconductor Devices Or Solid State Devices (AREA)

Description

【図面の簡単な説明】[Brief explanation of the drawing]

第1図A乃至Dは本考案に係る半導体装置の一
実施例を説明するための図であり、第2図は従来
例を説明するための図である。 1……絶縁基板、2……スルーホール、3……
金属膜、4,4′……半田層、5……半導体素子
、6,6′……金属細線、7……封止材料。
1A to 1D are diagrams for explaining an embodiment of a semiconductor device according to the present invention, and FIG. 2 is a diagram for explaining a conventional example. 1...Insulating board, 2...Through hole, 3...
Metal film, 4, 4'... Solder layer, 5... Semiconductor element, 6, 6'... Metal thin wire, 7... Sealing material.

Claims (1)

【実用新案登録請求の範囲】[Scope of utility model registration request] 絶縁基板上に接着された半導体素子、該半導体
素子を囲むように配置された封止材料流れ止め用
のダムを備え、このダム内に前記封止材料を充填
して前記半導体素子を封止してなる半導体装置に
おいて、前記ダムが前記半導体素子の接着に用い
られる半田材料と同じ材料からなることを特徴と
する半導体装置。
A semiconductor element bonded on an insulating substrate, a dam for preventing the flow of sealing material arranged to surround the semiconductor element, and the semiconductor element is sealed by filling the dam with the sealing material. 1. A semiconductor device characterized in that said dam is made of the same material as a solder material used for bonding said semiconductor element.
JP18482687U 1987-12-03 1987-12-03 Pending JPH0187549U (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP18482687U JPH0187549U (en) 1987-12-03 1987-12-03

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP18482687U JPH0187549U (en) 1987-12-03 1987-12-03

Publications (1)

Publication Number Publication Date
JPH0187549U true JPH0187549U (en) 1989-06-09

Family

ID=31476163

Family Applications (1)

Application Number Title Priority Date Filing Date
JP18482687U Pending JPH0187549U (en) 1987-12-03 1987-12-03

Country Status (1)

Country Link
JP (1) JPH0187549U (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2014220305A (en) * 2013-05-06 2014-11-20 株式会社デンソー Multilayer substrate and electronic device using the same, method of manufacturing electronic device

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5916351A (en) * 1982-07-19 1984-01-27 Matsushita Electric Ind Co Ltd Electronic circuit device and manufacture thereof

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5916351A (en) * 1982-07-19 1984-01-27 Matsushita Electric Ind Co Ltd Electronic circuit device and manufacture thereof

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2014220305A (en) * 2013-05-06 2014-11-20 株式会社デンソー Multilayer substrate and electronic device using the same, method of manufacturing electronic device

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