JPH0180932U - - Google Patents

Info

Publication number
JPH0180932U
JPH0180932U JP1987177433U JP17743387U JPH0180932U JP H0180932 U JPH0180932 U JP H0180932U JP 1987177433 U JP1987177433 U JP 1987177433U JP 17743387 U JP17743387 U JP 17743387U JP H0180932 U JPH0180932 U JP H0180932U
Authority
JP
Japan
Prior art keywords
clip
clips
shape
inspection jig
tolerance range
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP1987177433U
Other languages
Japanese (ja)
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP1987177433U priority Critical patent/JPH0180932U/ja
Publication of JPH0180932U publication Critical patent/JPH0180932U/ja
Pending legal-status Critical Current

Links

Landscapes

  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
  • Automatic Assembly (AREA)
  • Clamps And Clips (AREA)

Description

【図面の簡単な説明】[Brief explanation of the drawing]

第1図は本考案の一実施例のクリツプ検査治具
を示す正面図、第2図は第1図の検査治具が対象
とするクリツプの側面図、第3図は良品のクリツ
プの検査状態を示す正面図、第4図は不良品のク
リツプの検査状態を示す正面図である。 1……クリツプ受け入れ検査治具、2……良品
のクリツプ、3……不良品のクリツプ、4……溝
Fig. 1 is a front view showing a clip inspection jig according to an embodiment of the present invention, Fig. 2 is a side view of a clip targeted by the inspection jig of Fig. 1, and Fig. 3 is an inspection state of a non-defective clip. FIG. 4 is a front view showing the state of inspection of defective clips. 1... Clip acceptance inspection jig, 2... Good clip, 3... Defective clip, 4... Groove.

Claims (1)

【実用新案登録請求の範囲】[Scope of utility model registration request] 半導体ウエハの固定用クリツプの形状を検査す
るクリツプ検査治具において、前記クリツプのう
ち許容範囲内の形状を有するクリツプが入り、か
つ前記許容範囲内の形状を有しないクリツプが入
らないように、象つた溝を設けたことを特徴とす
るクリツプ検査治具。
In a clip inspection jig for inspecting the shape of a clip for fixing a semiconductor wafer, an image is used so that among the clips, clips having a shape within the tolerance range are inserted, and clips not having a shape within the tolerance range are not included. A clip inspection jig characterized by having a groove.
JP1987177433U 1987-11-19 1987-11-19 Pending JPH0180932U (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP1987177433U JPH0180932U (en) 1987-11-19 1987-11-19

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP1987177433U JPH0180932U (en) 1987-11-19 1987-11-19

Publications (1)

Publication Number Publication Date
JPH0180932U true JPH0180932U (en) 1989-05-30

Family

ID=31469097

Family Applications (1)

Application Number Title Priority Date Filing Date
JP1987177433U Pending JPH0180932U (en) 1987-11-19 1987-11-19

Country Status (1)

Country Link
JP (1) JPH0180932U (en)

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