JPH0148978B2 - - Google Patents

Info

Publication number
JPH0148978B2
JPH0148978B2 JP58030881A JP3088183A JPH0148978B2 JP H0148978 B2 JPH0148978 B2 JP H0148978B2 JP 58030881 A JP58030881 A JP 58030881A JP 3088183 A JP3088183 A JP 3088183A JP H0148978 B2 JPH0148978 B2 JP H0148978B2
Authority
JP
Japan
Prior art keywords
molten metal
pipe
particle
tube
counter electrode
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
JP58030881A
Other languages
English (en)
Japanese (ja)
Other versions
JPS59157543A (ja
Inventor
Akihiro Ono
Masao Saeki
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Nippon Steel Corp
Original Assignee
Nippon Steel Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Nippon Steel Corp filed Critical Nippon Steel Corp
Priority to JP58030881A priority Critical patent/JPS59157543A/ja
Publication of JPS59157543A publication Critical patent/JPS59157543A/ja
Publication of JPH0148978B2 publication Critical patent/JPH0148978B2/ja
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/62—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
    • G01N21/71—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light thermally excited
    • G01N21/73—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light thermally excited using plasma burners or torches
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N33/00—Investigating or analysing materials by specific methods not covered by groups G01N1/00 - G01N31/00
    • G01N33/20—Metals
    • G01N33/205—Metals in liquid state, e.g. molten metals

Landscapes

  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Physics & Mathematics (AREA)
  • Chemical & Material Sciences (AREA)
  • Pathology (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Engineering & Computer Science (AREA)
  • Nuclear Medicine, Radiotherapy & Molecular Imaging (AREA)
  • Plasma & Fusion (AREA)
  • Food Science & Technology (AREA)
  • Medicinal Chemistry (AREA)
  • Investigating, Analyzing Materials By Fluorescence Or Luminescence (AREA)
JP58030881A 1983-02-28 1983-02-28 溶融金属の電極間隙自動調節型微粒子生成プラズマ発光分光分析装置 Granted JPS59157543A (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP58030881A JPS59157543A (ja) 1983-02-28 1983-02-28 溶融金属の電極間隙自動調節型微粒子生成プラズマ発光分光分析装置

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP58030881A JPS59157543A (ja) 1983-02-28 1983-02-28 溶融金属の電極間隙自動調節型微粒子生成プラズマ発光分光分析装置

Publications (2)

Publication Number Publication Date
JPS59157543A JPS59157543A (ja) 1984-09-06
JPH0148978B2 true JPH0148978B2 (enrdf_load_stackoverflow) 1989-10-23

Family

ID=12316075

Family Applications (1)

Application Number Title Priority Date Filing Date
JP58030881A Granted JPS59157543A (ja) 1983-02-28 1983-02-28 溶融金属の電極間隙自動調節型微粒子生成プラズマ発光分光分析装置

Country Status (1)

Country Link
JP (1) JPS59157543A (enrdf_load_stackoverflow)

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP0193821A3 (en) * 1985-03-06 1987-06-10 Allied Corporation In-situ analysis of a liquid conductive material
US4615225A (en) * 1985-03-13 1986-10-07 Allied Corporation In-situ analysis of a liquid conductive material

Also Published As

Publication number Publication date
JPS59157543A (ja) 1984-09-06

Similar Documents

Publication Publication Date Title
Layman et al. New, computer-controlled microwave discharge emission spectrometer employing microarc sample atomization for trace and micro elemental analysis
JP5000350B2 (ja) 原子分析装置
JPS6211130A (ja) 液状導電性材料の現場分析
US3602595A (en) Method of and apparatus for generating aerosols by electric arc
JPH0151939B2 (enrdf_load_stackoverflow)
JPH0148978B2 (enrdf_load_stackoverflow)
JPH0149891B2 (enrdf_load_stackoverflow)
JPH0148499B2 (enrdf_load_stackoverflow)
JPH0148498B2 (enrdf_load_stackoverflow)
JPH0149892B2 (enrdf_load_stackoverflow)
JPS59210330A (ja) 溶融金属の電極間間隔自動調節型微粒子長距離搬送プラズマ発光分光分析装置
JPS6220497B2 (enrdf_load_stackoverflow)
JP3736427B2 (ja) 溶融金属中の成分の分析方法および分析装置
EP0193821A2 (en) In-situ analysis of a liquid conductive material
JPH035548B2 (enrdf_load_stackoverflow)
JPS6214774B2 (enrdf_load_stackoverflow)
JPS6214773B2 (enrdf_load_stackoverflow)
Burakov et al. Intracavity laser spectroscopy: plasma diagnostics and spectral analysis
JPH07128237A (ja) 鋼成分迅速分析方法及び装置
JPS6220496B2 (enrdf_load_stackoverflow)
JPS60219538A (ja) 不活性ガス吹き込み微粒子回収溶融金属分析方法および装置
Hermann et al. Multi-element determination with solid sampling by laser ablation using electrothermal atomisation and continuum source coherent forward scattering spectrometry
Cremers et al. Direct solid metal analysis by laser ablation into the inductively coupled plasma
JPH0215816B2 (enrdf_load_stackoverflow)
JPS58102136A (ja) 微粒子発生−溶液捕集による小形状金属試料の直接発光分光分析方法及び装置