JPH0147732B2 - - Google Patents

Info

Publication number
JPH0147732B2
JPH0147732B2 JP8898080A JP8898080A JPH0147732B2 JP H0147732 B2 JPH0147732 B2 JP H0147732B2 JP 8898080 A JP8898080 A JP 8898080A JP 8898080 A JP8898080 A JP 8898080A JP H0147732 B2 JPH0147732 B2 JP H0147732B2
Authority
JP
Japan
Prior art keywords
circuit
particle
counting
generates
signal
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
JP8898080A
Other languages
English (en)
Japanese (ja)
Other versions
JPS5714739A (en
Inventor
Masayoshi Hayashi
Takashi Yumita
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Sysmex Corp
Original Assignee
Sysmex Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Sysmex Corp filed Critical Sysmex Corp
Priority to JP8898080A priority Critical patent/JPS5714739A/ja
Publication of JPS5714739A publication Critical patent/JPS5714739A/ja
Publication of JPH0147732B2 publication Critical patent/JPH0147732B2/ja
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06M—COUNTING MECHANISMS; COUNTING OF OBJECTS NOT OTHERWISE PROVIDED FOR
    • G06M11/00—Counting of objects distributed at random, e.g. on a surface
    • G06M11/02—Counting of objects distributed at random, e.g. on a surface using an electron beam scanning a surface line by line, e.g. of blood cells on a substrate
    • G06M11/04—Counting of objects distributed at random, e.g. on a surface using an electron beam scanning a surface line by line, e.g. of blood cells on a substrate with provision for distinguishing between different sizes of objects

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Theoretical Computer Science (AREA)
  • Investigating Or Analysing Biological Materials (AREA)
JP8898080A 1980-06-30 1980-06-30 Particle analyzer Granted JPS5714739A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP8898080A JPS5714739A (en) 1980-06-30 1980-06-30 Particle analyzer

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP8898080A JPS5714739A (en) 1980-06-30 1980-06-30 Particle analyzer

Publications (2)

Publication Number Publication Date
JPS5714739A JPS5714739A (en) 1982-01-26
JPH0147732B2 true JPH0147732B2 (OSRAM) 1989-10-16

Family

ID=13957941

Family Applications (1)

Application Number Title Priority Date Filing Date
JP8898080A Granted JPS5714739A (en) 1980-06-30 1980-06-30 Particle analyzer

Country Status (1)

Country Link
JP (1) JPS5714739A (OSRAM)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20110027825A1 (en) * 2008-03-03 2011-02-03 Chempaq A/S High resolution classification

Also Published As

Publication number Publication date
JPS5714739A (en) 1982-01-26

Similar Documents

Publication Publication Date Title
JP2815435B2 (ja) 粒子解析装置及び血球カウンタ
EP0318814B1 (en) Digital circuit testing apparatus
EP0082535A1 (en) Unwanted signal detecting and measuring apparatus
US4646297A (en) Skew detector
US4830020A (en) Measurement signal interference elimination
EP0278637A2 (en) Automatic peak-to-peak amplitude measurement system
US4862069A (en) Method of in-circuit testing
JPH0147732B2 (OSRAM)
JPH0147731B2 (OSRAM)
US6907394B1 (en) Device for simulating circuits, method for simulating the same, and recording medium
JPS6229014B2 (OSRAM)
CN112685800A (zh) 一种基于时间窗自比较的硬件木马检测方法
JP2723913B2 (ja) 光ディスクの欠陥検査装置
JPS5825144A (ja) 血液分析方法およびその装置
JPH0128334B2 (OSRAM)
JPS61201173A (ja) 磁気デイスク特性測定装置
SU1005073A1 (ru) Устройство дл регистрации параметрических отказов
JPH0325880B2 (OSRAM)
JPH028272B2 (OSRAM)
JPH023940B2 (OSRAM)
RU2031443C1 (ru) Устройство для измерения геометрических параметров плоских фигур
CA1223455A (en) Coincidence correction in particle analysis
JPS61126447A (ja) 粒子分析装置
JPS614924A (ja) 車輌用ユニットの良否判定方法
JPH0533301U (ja) フロツピーデイスクのピークシフトエラー検出装置