JPH0140062Y2 - - Google Patents

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Publication number
JPH0140062Y2
JPH0140062Y2 JP7748782U JP7748782U JPH0140062Y2 JP H0140062 Y2 JPH0140062 Y2 JP H0140062Y2 JP 7748782 U JP7748782 U JP 7748782U JP 7748782 U JP7748782 U JP 7748782U JP H0140062 Y2 JPH0140062 Y2 JP H0140062Y2
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JP
Japan
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Expired
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JP7748782U
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English (en)
Japanese (ja)
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JPS58178682U (ja
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Priority to JP7748782U priority Critical patent/JPS58178682U/ja
Publication of JPS58178682U publication Critical patent/JPS58178682U/ja
Application granted granted Critical
Publication of JPH0140062Y2 publication Critical patent/JPH0140062Y2/ja
Granted legal-status Critical Current

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  • Keying Circuit Devices (AREA)
  • Testing Electric Properties And Detecting Electric Faults (AREA)
JP7748782U 1982-05-25 1982-05-25 開閉器の接点検査装置 Granted JPS58178682U (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP7748782U JPS58178682U (ja) 1982-05-25 1982-05-25 開閉器の接点検査装置

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP7748782U JPS58178682U (ja) 1982-05-25 1982-05-25 開閉器の接点検査装置

Publications (2)

Publication Number Publication Date
JPS58178682U JPS58178682U (ja) 1983-11-29
JPH0140062Y2 true JPH0140062Y2 (enrdf_load_stackoverflow) 1989-12-01

Family

ID=30086742

Family Applications (1)

Application Number Title Priority Date Filing Date
JP7748782U Granted JPS58178682U (ja) 1982-05-25 1982-05-25 開閉器の接点検査装置

Country Status (1)

Country Link
JP (1) JPS58178682U (enrdf_load_stackoverflow)

Families Citing this family (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP3625472B1 (ja) * 2004-04-05 2005-03-02 富士通テン株式会社 接点腐食防止装置
JP3625474B1 (ja) * 2004-04-05 2005-03-02 富士通テン株式会社 接点腐食防止回路
JP3625473B1 (ja) * 2004-04-05 2005-03-02 富士通テン株式会社 接点腐食防止方法および装置

Also Published As

Publication number Publication date
JPS58178682U (ja) 1983-11-29

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