JPH0136597B2 - - Google Patents

Info

Publication number
JPH0136597B2
JPH0136597B2 JP56082185A JP8218581A JPH0136597B2 JP H0136597 B2 JPH0136597 B2 JP H0136597B2 JP 56082185 A JP56082185 A JP 56082185A JP 8218581 A JP8218581 A JP 8218581A JP H0136597 B2 JPH0136597 B2 JP H0136597B2
Authority
JP
Japan
Prior art keywords
circuit
integrated circuit
frequency
signal
input
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
JP56082185A
Other languages
English (en)
Japanese (ja)
Other versions
JPS57197831A (en
Inventor
Masaaki Yano
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
NEC Corp
Original Assignee
Nippon Electric Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Nippon Electric Co Ltd filed Critical Nippon Electric Co Ltd
Priority to JP56082185A priority Critical patent/JPS57197831A/ja
Publication of JPS57197831A publication Critical patent/JPS57197831A/ja
Publication of JPH0136597B2 publication Critical patent/JPH0136597B2/ja
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00—Error detection; Error correction; Monitoring
    • G06F11/22—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing
    • G06F11/24—Marginal checking or other specified testing methods not covered by G06F11/26, e.g. race tests

Landscapes

  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Theoretical Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • Quality & Reliability (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
  • Semiconductor Integrated Circuits (AREA)
JP56082185A 1981-05-29 1981-05-29 Integration circuit chip Granted JPS57197831A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP56082185A JPS57197831A (en) 1981-05-29 1981-05-29 Integration circuit chip

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP56082185A JPS57197831A (en) 1981-05-29 1981-05-29 Integration circuit chip

Publications (2)

Publication Number Publication Date
JPS57197831A JPS57197831A (en) 1982-12-04
JPH0136597B2 true JPH0136597B2 (OSRAM) 1989-08-01

Family

ID=13767377

Family Applications (1)

Application Number Title Priority Date Filing Date
JP56082185A Granted JPS57197831A (en) 1981-05-29 1981-05-29 Integration circuit chip

Country Status (1)

Country Link
JP (1) JPS57197831A (OSRAM)

Families Citing this family (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS59181548A (ja) * 1983-03-31 1984-10-16 Fujitsu Ltd 半導体装置
JPS6089937A (ja) * 1983-10-24 1985-05-20 Nec Corp 集積回路装置
US4939389A (en) * 1988-09-02 1990-07-03 International Business Machines Corporation VLSI performance compensation for off-chip drivers and clock generation
JPH07109845B2 (ja) * 1989-11-15 1995-11-22 日本電気株式会社 半導体集積回路

Also Published As

Publication number Publication date
JPS57197831A (en) 1982-12-04

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