JPH0131661B2 - - Google Patents

Info

Publication number
JPH0131661B2
JPH0131661B2 JP57172434A JP17243482A JPH0131661B2 JP H0131661 B2 JPH0131661 B2 JP H0131661B2 JP 57172434 A JP57172434 A JP 57172434A JP 17243482 A JP17243482 A JP 17243482A JP H0131661 B2 JPH0131661 B2 JP H0131661B2
Authority
JP
Japan
Prior art keywords
collision
ion
ion detector
magnetic field
convergence
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
JP57172434A
Other languages
English (en)
Japanese (ja)
Other versions
JPS5960855A (ja
Inventor
Kozo Shimazu
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Shimadzu Corp
Original Assignee
Shimadzu Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Shimadzu Corp filed Critical Shimadzu Corp
Priority to JP57172434A priority Critical patent/JPS5960855A/ja
Publication of JPS5960855A publication Critical patent/JPS5960855A/ja
Publication of JPH0131661B2 publication Critical patent/JPH0131661B2/ja
Granted legal-status Critical Current

Links

Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/26—Mass spectrometers or separator tubes
    • H01J49/28—Static spectrometers
    • H01J49/32—Static spectrometers using double focusing

Landscapes

  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Other Investigation Or Analysis Of Materials By Electrical Means (AREA)
  • Electron Tubes For Measurement (AREA)
JP57172434A 1982-09-29 1982-09-29 二重収束型質量分析装置 Granted JPS5960855A (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP57172434A JPS5960855A (ja) 1982-09-29 1982-09-29 二重収束型質量分析装置

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP57172434A JPS5960855A (ja) 1982-09-29 1982-09-29 二重収束型質量分析装置

Publications (2)

Publication Number Publication Date
JPS5960855A JPS5960855A (ja) 1984-04-06
JPH0131661B2 true JPH0131661B2 (enExample) 1989-06-27

Family

ID=15941903

Family Applications (1)

Application Number Title Priority Date Filing Date
JP57172434A Granted JPS5960855A (ja) 1982-09-29 1982-09-29 二重収束型質量分析装置

Country Status (1)

Country Link
JP (1) JPS5960855A (enExample)

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0342615Y2 (enExample) * 1984-10-19 1991-09-06
JP2647102B2 (ja) * 1987-11-18 1997-08-27 日本原子力研究所 粒子ビーム測定装置

Also Published As

Publication number Publication date
JPS5960855A (ja) 1984-04-06

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