JPS5960855A - 二重収束型質量分析装置 - Google Patents

二重収束型質量分析装置

Info

Publication number
JPS5960855A
JPS5960855A JP57172434A JP17243482A JPS5960855A JP S5960855 A JPS5960855 A JP S5960855A JP 57172434 A JP57172434 A JP 57172434A JP 17243482 A JP17243482 A JP 17243482A JP S5960855 A JPS5960855 A JP S5960855A
Authority
JP
Japan
Prior art keywords
collision
ion
collision chamber
ion detector
chamber
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP57172434A
Other languages
English (en)
Japanese (ja)
Other versions
JPH0131661B2 (enExample
Inventor
Kozo Shimazu
島津 光三
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Shimadzu Corp
Shimazu Seisakusho KK
Original Assignee
Shimadzu Corp
Shimazu Seisakusho KK
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Shimadzu Corp, Shimazu Seisakusho KK filed Critical Shimadzu Corp
Priority to JP57172434A priority Critical patent/JPS5960855A/ja
Publication of JPS5960855A publication Critical patent/JPS5960855A/ja
Publication of JPH0131661B2 publication Critical patent/JPH0131661B2/ja
Granted legal-status Critical Current

Links

Classifications

    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00Particle spectrometers or separator tubes
    • H01J49/26Mass spectrometers or separator tubes
    • H01J49/28Static spectrometers
    • H01J49/32Static spectrometers using double focusing

Landscapes

  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Other Investigation Or Analysis Of Materials By Electrical Means (AREA)
  • Electron Tubes For Measurement (AREA)
JP57172434A 1982-09-29 1982-09-29 二重収束型質量分析装置 Granted JPS5960855A (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP57172434A JPS5960855A (ja) 1982-09-29 1982-09-29 二重収束型質量分析装置

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP57172434A JPS5960855A (ja) 1982-09-29 1982-09-29 二重収束型質量分析装置

Publications (2)

Publication Number Publication Date
JPS5960855A true JPS5960855A (ja) 1984-04-06
JPH0131661B2 JPH0131661B2 (enExample) 1989-06-27

Family

ID=15941903

Family Applications (1)

Application Number Title Priority Date Filing Date
JP57172434A Granted JPS5960855A (ja) 1982-09-29 1982-09-29 二重収束型質量分析装置

Country Status (1)

Country Link
JP (1) JPS5960855A (enExample)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6174950U (enExample) * 1984-10-19 1986-05-21
JPH01132037A (ja) * 1987-11-18 1989-05-24 Japan Atom Energy Res Inst 粒子ビーム測定装置

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6174950U (enExample) * 1984-10-19 1986-05-21
JPH01132037A (ja) * 1987-11-18 1989-05-24 Japan Atom Energy Res Inst 粒子ビーム測定装置

Also Published As

Publication number Publication date
JPH0131661B2 (enExample) 1989-06-27

Similar Documents

Publication Publication Date Title
CA1249381A (en) Low noise tandem quadrupole mass spectrometers and method
US8101923B2 (en) System and method for spatially-resolved chemical analysis using microplasma desorption and ionization of a sample
EP1994546B1 (en) High sensitivity slitless ion source mass spectrometer for trace gas leak detection
CA2269385C (en) Simultaneous detection isotopic ratio mass spectrometer
CN112305002B (zh) 光谱学和成像系统
CN101405829A (zh) 抑制非期望离子的用于示踪气体检漏的质谱仪
US20180240657A1 (en) Collision cell having an axial field
JP2014504784A (ja) 質量分析装置
Praphairaksit et al. Reduction of space charge effects in inductively coupled plasma mass spectrometry using a supplemental electron source inside the skimmer: ion transmission and mass spectral characteristics
JP3721833B2 (ja) 質量分析装置
US9818591B2 (en) Mirror lens for directing an ion beam
JP2004342620A (ja) 質量分析装置
US6586730B1 (en) Plasma ion source mass spectrometer
JPH01296558A (ja) 質量分析計
JPS5960855A (ja) 二重収束型質量分析装置
CA3012283A1 (en) Extraction system for charged secondary particles for use in a mass spectrometer or other charged particle device
CN104067370A (zh) 质谱及其相关技术改进
CN209525467U (zh) 一种兼具质量和能量分辨能力的中性粒子分析系统
US20230230822A1 (en) Collision cell having an axial field
KR102665131B1 (ko) 질량 분석기
EP4443472A1 (en) Mass spectrometer
KR102614315B1 (ko) 질량 분석기
JPH0518842Y2 (enExample)
JP7387769B2 (ja) イオン化源およびそれらを使用する方法ならびにシステム
JPS6193544A (ja) 質量分析装置