JPH01311210A - Measuring instrument for waving shape of disk surface - Google Patents

Measuring instrument for waving shape of disk surface

Info

Publication number
JPH01311210A
JPH01311210A JP14247788A JP14247788A JPH01311210A JP H01311210 A JPH01311210 A JP H01311210A JP 14247788 A JP14247788 A JP 14247788A JP 14247788 A JP14247788 A JP 14247788A JP H01311210 A JPH01311210 A JP H01311210A
Authority
JP
Japan
Prior art keywords
disk
light
output
shape
deflection
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP14247788A
Other languages
Japanese (ja)
Inventor
Shinichi Wakana
伸一 若菜
Munetoshi Inada
稲田 宗俊
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Fujitsu Ltd
Original Assignee
Fujitsu Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Fujitsu Ltd filed Critical Fujitsu Ltd
Priority to JP14247788A priority Critical patent/JPH01311210A/en
Publication of JPH01311210A publication Critical patent/JPH01311210A/en
Pending legal-status Critical Current

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  • Length Measuring Devices By Optical Means (AREA)
  • Manufacturing Of Magnetic Record Carriers (AREA)

Abstract

PURPOSE:To easily and accurately measure the waving shape of the surface by detecting the rotational deflection of a mounting base for the disk and correcting the arithmetic result of a photodetecting element output arithmetic means. CONSTITUTION:A measurement sensor 7 irradiates the disk 1 which is rotated by a power source 3 with the laser light, whose reflected light is photodetected by the photodetecting element of the sensor 7. Then when the disk 1 rotates and a position different from an initial position is irradiated, a rotational deflection detecting means 11 detects the quantity of deflection. The output of the deflection detecting means 11 is applied to a position adjusting means 12 corresponding to the measurement sensor 7 and an output arithmetic means 13. Then the position adjusting means 12 corrects the position of the measurement sensor 7, i.e. the position on the disk 1 irradiated with the light so as to cancel the influence of the deflection of a disk rotating shaft 4. Further, the output arithmetic means 13 corrects a quantity based upon the deflection of the rotating shaft 4 as to the surface waving shape of the disk 1. Consequently, the accurate surface waving shape can be measured.

Description

【発明の詳細な説明】 目既要] 本発明は回転中のディスクについて表面うねり形状を計
測する装置に関し、 回転ディスクを搭載する搭載台の回転ぶれを検出し、受
光素子出力演算手段の演算結果を補正することにより、
簡易で正確な表面うねり形状を計測する装置を提供する
ことを目的とし、回転中のディスクに照射された光ビー
ムの反射光を受光素子により受光し、ディスク表面のう
ねり形状を検査する装置において、回転ディスクを搭載
し動力源で駆動される回転軸に軸着されたディスク搭載
台の回転ぷれを検出する検出手段と、光ビーム発生源の
位置調整手段と、ディスクからの反射光受光素子出力演
算手段とを具備し、回転ぶれ検出手段の出力により、光
ビーム発生源の位置調整手段を制御すると共に、反射光
受光素子出力演算手段の演算結果を補正し、ディスク表
面うねり形状を計測することで構成する。
[Detailed Description of the Invention] Summary] The present invention relates to a device for measuring the surface waviness shape of a rotating disk, which detects the rotational vibration of a mounting base on which the rotating disk is mounted, and calculates the calculation result of the light receiving element output calculation means. By correcting
The purpose of the present invention is to provide a simple and accurate device for measuring the shape of surface waviness, and the device detects the reflected light of a light beam irradiated onto a rotating disk using a light receiving element to inspect the shape of waviness on the surface of the disk. A detection means for detecting the rotational deflection of a disk mounting base mounted on a rotating disk and mounted on a rotating shaft driven by a power source, a means for adjusting the position of a light beam generation source, and a light receiving element output calculation for reflected light from the disk. and controlling the position adjustment means of the light beam generation source using the output of the rotational shake detection means, and correcting the calculation result of the reflected light receiving element output calculation means to measure the waviness shape of the disk surface. Configure.

[産業上の利用分野] 本発明は回転中のディスクについて表面うねり形状値を
計測する装置に関する。
[Industrial Application Field] The present invention relates to an apparatus for measuring surface waviness shape values of a rotating disk.

従来、回転する磁気ディスク表面にレーザ光を照射し、
反射光を受光素子で受光することによって求めたディス
ク表面の各点の傾きデータを演算し、うねり形状を算出
していた。このようにディスク面の微細なうねり形状を
非接触で検査する手段では、ディスクを回転させるため
の軸がぶれると計測誤差に直結し、高価な装置を使用し
ない限り誤差は免れなかった。そこで比較的簡易な手段
で誤差のない形状値を求める技術を開発することが要望
された。
Conventionally, laser light is irradiated onto the surface of a rotating magnetic disk.
The undulation shape was calculated by calculating the inclination data of each point on the disk surface, which was obtained by receiving the reflected light with a light-receiving element. In this non-contact method of inspecting the fine undulations on the disk surface, any wobbling of the shaft that rotates the disk directly leads to measurement errors, and errors cannot be avoided unless expensive equipment is used. Therefore, there was a need to develop a technique to obtain error-free shape values using relatively simple means.

[従来の技術] 磁気ディスクを搭載台上に搭載し表面うねり形状を計測
する装置は、第4図に示す構成となっていた。第4図に
おいて、1はディスク、2は搭載台、3はディスク回転
の動力源としてのモータ、4は回転軸、5はスピンドル
部、6はベアリング、7はレーザ光を使用する表面うね
り形状計測センサ、8はセンサ移動制御部、9は計測値
演算制御部を示し。第4図において、モータ3によりス
ピンドル部5を介して回転軸4が搭載台2を回転させる
。搭載台2上にはディスク1が置かれていて、ディスク
1は回転したとき表面に僅かのうねりを持っていること
がある。計測センサ7からレーザ光をディスク1の成る
点に照射し、反射光を例えば4分割受光素子の中央部に
入射させるように初期設定を行う。ディスクlの他の測
定点において、表面にうねりがあるとレーザ光の反射は
受光素子の他の位置に到達する。反射光到達点間の距離
とセンサ・ディスク間の距離などから、ディスク1面の
傾き角の大きさを演算して求める。そして計測センサ7
をセンサ移動制御部8により移動させながら、照射位置
を例えばディスク1の円周上に沿って多数の点とすれば
、ディスク面の円周上に沿った多数のデータを得るから
、その値により演算制御部9においてうねり形状を算出
することができる。
[Prior Art] An apparatus for mounting a magnetic disk on a mounting table and measuring the shape of surface waviness has a configuration shown in FIG. 4. In Fig. 4, 1 is a disk, 2 is a mounting base, 3 is a motor as a power source for rotating the disk, 4 is a rotating shaft, 5 is a spindle, 6 is a bearing, and 7 is a surface waviness shape measurement using a laser beam. A sensor, 8 a sensor movement control section, and 9 a measured value calculation control section. In FIG. 4, a rotary shaft 4 rotates the mounting base 2 by a motor 3 via a spindle portion 5. As shown in FIG. A disk 1 is placed on a mounting base 2, and the disk 1 may have slight undulations on its surface when rotated. Initial settings are made such that a laser beam is irradiated from the measurement sensor 7 to a point on the disk 1, and the reflected light is made to enter, for example, the center of a four-division light-receiving element. If there are undulations on the surface at other measurement points on the disk I, the reflected laser light will reach other positions on the light receiving element. The magnitude of the tilt angle of one surface of the disk is calculated and determined from the distance between the reflected light arrival points and the distance between the sensor and the disk. and measurement sensor 7
If, for example, the irradiation position is set at a number of points along the circumference of the disk 1 while being moved by the sensor movement control unit 8, a large number of data along the circumference of the disk surface will be obtained. The arithmetic control unit 9 can calculate the undulation shape.

[発明が解決しようとする課題] モータ3の回転軸4は使用中に回転軸ぶれを起こし易い
。即ち第5図Aにベアリングを一部断面にして示すよう
にヘアリング6−1 、6−2を軸4に押付けながらバ
ンド6−5で締付けているが、ヘアリング6−L、6−
2の磨耗、バンド6−3の締付は力の変化などのため、
軸4の中心線が傾きながら回転するようになる。そのた
め回転軸4の成る外周面上の1点の回転軌跡を見ると、
第5図Bに示すようになる。今、回転軸4が軸ぶれを起
こしながら回転していると、搭載しているディスク1の
面上の点も回転ふれに対応してぶれた動きをする。その
ためビーム照射光を回転軸の中心から所定半径の円周上
に照射させているとしても、ディスク1面はその円周上
以外の場所を照射して反射光のデータを得ているから、
求めたうねり形状は正確な値ではない。例えば5.25
インチの磁気ディスクに対しレーザ光を照射するとき、
約50μmのビーム直径となり、ディスク面上で回転軸
のぶれに基づく照射点移動は数μm以上となった。
[Problems to be Solved by the Invention] The rotating shaft 4 of the motor 3 is prone to wobbling during use. That is, as shown in FIG. 5A with a partial cross section of the bearing, the hair rings 6-1 and 6-2 are pressed against the shaft 4 and tightened with the band 6-5, but the hair rings 6-L and 6-2 are tightened with the band 6-5.
2 wear and band 6-3 tightening due to changes in force, etc.
The center line of the shaft 4 rotates while being tilted. Therefore, when looking at the rotation trajectory of one point on the outer peripheral surface of the rotating shaft 4,
The result is as shown in FIG. 5B. Now, when the rotating shaft 4 is rotating while causing shaft wobbling, a point on the surface of the mounted disk 1 also moves wobbling in response to the rotational wobbling. Therefore, even if the beam irradiation light is irradiated on the circumference of a predetermined radius from the center of the rotation axis, data on the reflected light is obtained by irradiating the surface of the disk at a place other than the circumference.
The obtained undulation shape is not an accurate value. For example 5.25
When irradiating a laser beam onto an inch magnetic disk,
The beam diameter was about 50 μm, and the movement of the irradiation point on the disk surface due to the vibration of the rotation axis was several μm or more.

そのためベアリング6−1と6−2との間を長い目に採
れば、ぶれが小さくなるが装置が大規模となり、またモ
ータのパワーを太き(する必要があった。
Therefore, if the distance between the bearings 6-1 and 6-2 is extended over a long period of time, the vibration will be reduced, but the device will become larger and the power of the motor will need to be increased.

一方、通常のベアリングを使用せずにエアベアリングな
ど回転時に磨耗のない構成とすることでも良いが、装置
が極めて高価となる欠点が生じた。
On the other hand, it is also possible to use an air bearing or other structure that does not wear out during rotation without using a normal bearing, but this has the drawback of making the device extremely expensive.

本発明の目的は前述の欠点を改善し、回転ディスクを搭
載する搭載台の回転ぶれを検出し、受光素子出力演算手
段の演算結果を補正することにより、簡易で正確な表面
うねり形状を計測する装置を提供することにある。
The purpose of the present invention is to improve the above-mentioned drawbacks and measure the surface waviness shape easily and accurately by detecting the rotational shake of the mounting base on which the rotating disk is mounted and correcting the calculation result of the light receiving element output calculation means. The goal is to provide equipment.

[課題を解決するための手段] 第1図は本発明の原理構成を示す図である。第1図にお
いて、1はディスク、2は搭載台、3は回転軸の動力源
、4は回転軸、7は光源・受光素子を含む表面うねり形
状計測センサ、11は回転ぶれ検出手段、12は光ビー
ム発生源の位置調整手段、13は受光素子出力演算手段
を示す。
[Means for Solving the Problems] FIG. 1 is a diagram showing the basic configuration of the present invention. In FIG. 1, 1 is a disk, 2 is a mounting base, 3 is a power source for a rotating shaft, 4 is a rotating shaft, 7 is a surface waviness shape measurement sensor including a light source and a light receiving element, 11 is a rotational shake detection means, and 12 is a A position adjustment means for a light beam generation source, and a reference numeral 13 denotes a light receiving element output calculation means.

回転中のディスク1に照射された光ビームの反射光を受
光素子7により受光し、ディスク1表面のうねり形状を
検査する装置において、本発明は下記の構成としている
。即ち、 回転ディスク1を搭載し動力源3で駆動される回転軸4
に軸着されたディスク搭載台2の回転ぶれを検出する検
出手段11と、光ビーム発生源の位置調整手段12と、
ディスク1からの反射光受光素子出力演算手段13とを
具備し、回転ふれ検出手段11の出力により、光ビーム
発生源の位置調整手段12を制御すると共に、反射光受
光素子出力演算手段13の演算結果を補正し、ディスク
表面うねり形状値を計測することである。
The present invention has the following configuration in an apparatus for inspecting the shape of waviness on the surface of the disk 1 by receiving the reflected light of the light beam irradiated onto the rotating disk 1 by the light receiving element 7. That is, a rotating shaft 4 mounted with a rotating disk 1 and driven by a power source 3
a detection means 11 for detecting the rotational shake of the disk mounting base 2 which is pivotally attached to the disk mounting base 2; a position adjustment means 12 for the light beam generation source;
A light beam receiving element output calculating means 13 for reflected light from the disk 1 is provided, and the position adjusting means 12 of the light beam generation source is controlled by the output of the rotational shake detecting means 11, and the calculation means 13 for calculating the output of the reflected light receiving element is controlled. The method is to correct the results and measure the disk surface waviness shape value.

[作用] 第1図の構成において、動力源3により回転軸4を回転
させる。回転軸4と搭載台2は捻子などで固着され、デ
ィスクlは搭載台2上に載置されているから、ディスク
1が動力源3により回転する。計測センサ7から例えば
レーザ光をディスクlに照射し、その反射光をセンサ7
内の受光素子により受光する。ディスク1が回転し、当
初と異なる位置を照射したとき、受光素子上の入射光位
置も当初とは異なり、その間隔がディスク1のうねりに
対応するので、うねり形状値を計測することが出来る。
[Operation] In the configuration shown in FIG. 1, the rotating shaft 4 is rotated by the power source 3. Since the rotating shaft 4 and the mounting base 2 are fixed with a screw or the like, and the disk 1 is placed on the mounting base 2, the disk 1 is rotated by the power source 3. For example, a laser beam is irradiated onto the disk l from the measurement sensor 7, and the reflected light is sent to the sensor 7.
The light is received by the light receiving element inside. When the disk 1 rotates and irradiates a position different from the initial position, the position of the incident light on the light receiving element is also different from the initial position, and the interval corresponds to the waviness of the disk 1, so that the waviness shape value can be measured.

このときディスク1を回転させる回転軸4がベアリング
の経年変化などにより回転ぶれを起こしているから、回
転ぶれ検出手段11によりぶれの量を検出する。ぶれ検
出手段11の出力は計測センサ7に対応する位置調整手
段12と、出力演算手段13とに印加され、前者により
計測センサ7の位置即ちディスクl上に照射する光の照
射位置をディスク回転軸4のぶれの影響を打ち消すよう
に補正する。また出力演算手段13において、計測セン
サ7が計測したディスク1の表面うねり形状につき回転
軸4のぶれに基づく量を補正する。
At this time, since the rotating shaft 4 that rotates the disk 1 has rotational wobbling due to aging of the bearings, etc., the amount of wobbling is detected by the rotational wobbling detection means 11. The output of the blur detection means 11 is applied to a position adjustment means 12 corresponding to the measurement sensor 7 and an output calculation means 13, and the former determines the position of the measurement sensor 7, that is, the irradiation position of the light irradiated onto the disk l, according to the disk rotation axis. Correct to cancel the effect of blur in 4. In addition, the output calculation means 13 corrects the amount based on the wobbling of the rotating shaft 4 for the surface waviness of the disk 1 measured by the measurement sensor 7.

[実施例] 第2図は本発明の実施例として、第1図における回転ぶ
れ検出部の構成を示す図である。第2図Aは斜視図、同
図Bは上面図を示す。第2図A。
[Embodiment] FIG. 2 is a diagram showing the configuration of the rotational shake detection section in FIG. 1 as an embodiment of the present invention. FIG. 2A shows a perspective view, and FIG. 2B shows a top view. Figure 2A.

Bにおいて、14は半導体レーザを使用する光源、15
は光集束用レンズ、16は二次元位置検出素子を示す。
In B, 14 is a light source using a semiconductor laser, 15
1 is a light focusing lens, and 16 is a two-dimensional position detection element.

ディスク搭載台2は光の反射を良くするため十分に磨き
出して置く。第2図Bに示すように搭載台2の側面位置
が実線の場合と、回転ぶれのため破線位置となった場合
では、二次元位置検出素子16上の光入射位置が変化し
、位置の変化−ffiはぶれの大きさに対応する。(こ
こではこのやり方を三角測量方式と名付けている。)そ
して二次元位置検出素子16において、搭載台2の垂直
方向の傾き情報(面倒れ情報)と水平方向の距離変化情
報とが得られるため、特に傾き情報はディスク表面うね
り形状値を補正するように出力演算手段13に印加し、
距離変化情報は計測センサの位置補正のため位置調整手
段12に印加する。
The disk mounting stand 2 is sufficiently polished to improve the reflection of light. As shown in FIG. 2B, when the side position of the mounting base 2 is indicated by the solid line and when it is indicated by the broken line due to rotational shake, the light incident position on the two-dimensional position detection element 16 changes, and the position changes. -ffi corresponds to the magnitude of blur. (Here, this method is named the triangulation method.) Then, the two-dimensional position detection element 16 obtains vertical tilt information (face tilt information) and horizontal distance change information of the mounting base 2. In particular, the tilt information is applied to the output calculation means 13 so as to correct the disk surface waviness shape value,
The distance change information is applied to the position adjustment means 12 for position correction of the measurement sensor.

なお回転ぶれ検出部は、図示する以外に、静電容量型、
ファイバ反射型で構成することも出来る。
In addition to the ones shown in the figure, the rotational shake detection unit is a capacitive type,
It can also be configured as a fiber reflection type.

今、搭載台2の表面から発光源14までの距離がR8で
、ΔRの距離変化情報が得られ、ディスク面に回転軸中
心から距離rの位置をセンスしていたとき、位置補正量
はΔR−r/R,となる。
Now, when the distance from the surface of the mounting base 2 to the light emitting source 14 is R8, the distance change information of ΔR is obtained, and the position of the disk surface at a distance r from the rotation axis center is sensed, the position correction amount is ΔR -r/R.

この補正は計測センサについて位置移動用モータの位置
補正を行うこと、或いは圧電素子を用いて微細調整を行
う。
This correction is performed by correcting the position of the position movement motor for the measurement sensor, or by performing fine adjustment using a piezoelectric element.

第3図は上述の構成を示すブロック部であり、ぶれ検出
出力は増幅部17を介して駆動モータ18に与えられる
。駆動モータは位置調整部12の例である。なお、19
はロータリエンコーダを示し、エンコーダ19からはう
ねり計測センサの計測のためディスクlの回転位置情報
が得られるので、その情報を得て傾き情報をより正確に
補正できる。
FIG. 3 shows a block section showing the above-mentioned configuration, and the blur detection output is given to the drive motor 18 via the amplification section 17. The drive motor is an example of the position adjustment section 12. In addition, 19
indicates a rotary encoder, and since information on the rotational position of the disk I is obtained from the encoder 19 for measurement by the waviness measurement sensor, the inclination information can be corrected more accurately by obtaining this information.

回転ディスクは磁気ディスクが好適であるが、それに限
定されず、半導体ウェハに適用することも可能である。
The rotating disk is preferably a magnetic disk, but is not limited thereto, and can also be applied to a semiconductor wafer.

[発明の効果コ このようにして本発明によると、比較的安価な部(Aを
使用して構成し、特にぶれ検出部を設けて回転軸に生じ
たぶれを検出することにより、計測センサによる計測値
に補正を加えるため、うねり形状の正確な値が算出でき
る。
[Effects of the Invention] Thus, according to the present invention, it is constructed using a relatively inexpensive part (A, and in particular, by providing a blurring detection part to detect the blurring that occurs in the rotation axis, Since the measured values are corrected, accurate values for the undulation shape can be calculated.

【図面の簡単な説明】[Brief explanation of the drawing]

第1図は本発明の原理構成を示す図、 第2図・第3図は本発明の実施例の構成を示す図、第4
図は従来の計測装置を示す図、 第5図は第4図における回転軸のぶれを説明するための
図である。 1−・回転ディスク 2−・〜ディスク搭載台 3−・・動力源 4−・−回転軸 7・−・受光素子を含むうねり形状計測センサ11−・
一回転ぶれ検出手段 12−位置調整手段 13・・−出力演算手段 特許出願人    富士通株式会社 代 理 人  弁理士  鈴木栄祐 杢*=を月の1層′5¥講乃く擾コ 東1図 A                Bされa:ご部 第2図 y5デi=−イクリ 第3図 従来遺族Σ 第4図 “軸択れ A            B 第5図
Fig. 1 is a diagram showing the principle configuration of the present invention, Figs. 2 and 3 are diagrams showing the configuration of an embodiment of the invention, and Fig. 4
This figure shows a conventional measuring device, and FIG. 5 is a diagram for explaining the deviation of the rotation axis in FIG. 4. 1--Rotating disk 2--Disk mounting stand 3--Power source 4--Rotating shaft 7--Waviness shape measurement sensor 11 including a light receiving element
One-rotation shake detection means 12 - Position adjustment means 13 - Output calculation means Patent applicant: Fujitsu Limited Agent Patent attorney Eisuke Suzuki B S a: Figure 2 y5 d i = - Ikuri Figure 3 Conventional bereaved family Σ Figure 4 "Axis selection A B Figure 5

Claims (1)

【特許請求の範囲】 I 、回転中のディスク(1)に照射された光ビームの
反射光を受光素子(7)により受光し、ディスク(1)
表面のうねり形状を検査する装置において、 回転ディスク(1)を搭載し動力源(3)で駆動される
回転軸(4)に軸着されたディスク搭載台(2)の回転
ぶれを検出する検出手段(11)と、 光ビーム発生源の位置調整手段(12)と、ディスク(
1)からの反射光受光素子出力演算手段(13)とを具
備し、 回転ぶれ検出手段(11)の出力により、光ビーム発生
源の位置調整手段(12)を制御すると共に、反射光受
光素子出力演算手段(13)の演算結果を補正し、ディ
スク表面うねり形状を計測することを特徴とするディス
ク表面うねり形状計測装置。 II、請求項第 I 項記載の回転ぶれを検出する検出手段
は、良好な光反射率の搭載台側面に光を当てたとき、反
射した光を測光する三角測量形式であることを特徴とす
るディスク表面うねり形状計測装置。
[Claims] I. The light receiving element (7) receives the reflected light of the light beam irradiated on the rotating disk (1), and the disk (1)
In a device that inspects the shape of surface waviness, detection detects rotational vibration of a disk mounting base (2) mounted on a rotating disk (1) and attached to a rotating shaft (4) driven by a power source (3). means (11), position adjustment means (12) for the light beam generation source, and a disk (
1), the output of the rotational shake detection means (11) controls the position adjustment means (12) of the light beam generation source, and the output of the reflected light receiving element A disk surface waviness shape measuring device characterized in that the calculation result of the output calculation means (13) is corrected to measure the disk surface waviness shape. II. The detection means for detecting rotational shake recited in claim I is characterized in that it is of a triangulation type that measures the reflected light when light is applied to the side surface of the mounting base, which has good light reflectance. Disc surface waviness measurement device.
JP14247788A 1988-06-09 1988-06-09 Measuring instrument for waving shape of disk surface Pending JPH01311210A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP14247788A JPH01311210A (en) 1988-06-09 1988-06-09 Measuring instrument for waving shape of disk surface

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP14247788A JPH01311210A (en) 1988-06-09 1988-06-09 Measuring instrument for waving shape of disk surface

Publications (1)

Publication Number Publication Date
JPH01311210A true JPH01311210A (en) 1989-12-15

Family

ID=15316232

Family Applications (1)

Application Number Title Priority Date Filing Date
JP14247788A Pending JPH01311210A (en) 1988-06-09 1988-06-09 Measuring instrument for waving shape of disk surface

Country Status (1)

Country Link
JP (1) JPH01311210A (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH11132754A (en) * 1997-10-30 1999-05-21 Nippon Telegr & Teleph Corp <Ntt> X-ray gap measuring method and device

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH11132754A (en) * 1997-10-30 1999-05-21 Nippon Telegr & Teleph Corp <Ntt> X-ray gap measuring method and device

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