JPH01310841A - Displacement inspecting method for printed board - Google Patents

Displacement inspecting method for printed board

Info

Publication number
JPH01310841A
JPH01310841A JP14093188A JP14093188A JPH01310841A JP H01310841 A JPH01310841 A JP H01310841A JP 14093188 A JP14093188 A JP 14093188A JP 14093188 A JP14093188 A JP 14093188A JP H01310841 A JPH01310841 A JP H01310841A
Authority
JP
Japan
Prior art keywords
drill
test circle
inner layer
layer pattern
printed circuit
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP14093188A
Other languages
Japanese (ja)
Inventor
Yasuo Koganemaru
小金丸 靖雄
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Yokogawa Electric Corp
Original Assignee
Yokogawa Electric Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Yokogawa Electric Corp filed Critical Yokogawa Electric Corp
Priority to JP14093188A priority Critical patent/JPH01310841A/en
Publication of JPH01310841A publication Critical patent/JPH01310841A/en
Pending legal-status Critical Current

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Abstract

PURPOSE:To prevent boring of a poor printed board and to improve a yield, by a method wherein, under a state to be superposed with a test circle with a given inner size formed in an inner layer pattern and having no conductor present therein, a hole with a given inner size being lower than that of the test circle, and when, during a work, energization is effected between first and second terminals, disqualification of a printed base board is determined. CONSTITUTION:A test circle 31 is a circular part with a given size d1, which is formed in an inner layer pattern 30 and where a conductor is absent. The test circle has size larger than an inner size d2 of a hole formed by means of a drill 40, and a difference (d1-d2)/2 is a displacement amount being allowable to the inner layer pattern 30. When a part of a test circle 32 makes contact with the drill during a boring work made by means of the drill 40, since energization occurs between terminals 51 and 52, the energization detects the occurrence of a displacement amount being higher than the clearance (d1-d2)/2. In this case, an inspection hole 22 is inspected visually, a direction in which displacement occurs is determined from a position where a conductor appears, from an appearing length, a displacement amount is determined, a determine value forms an offset amount to add it to an initial value, and instruction is made on an NC device to position the drill.

Description

【発明の詳細な説明】[Detailed description of the invention] 【産業上の利用分野】[Industrial application field]

本発明は多層プリン1〜基板の製造に用いるドリルに係
り、特に内層パターンとスルーホールの位置ずれを検査
するのに適した改良に関する。
The present invention relates to a drill used for manufacturing multilayer prints 1 to substrates, and particularly relates to an improvement suitable for inspecting misalignment between inner layer patterns and through holes.

【従来の技術】[Conventional technology]

多層プリント基板では、各層のパターンを十分な精度で
重合わせることが必要である。従来の検査手法としてエ
ックス線なとを用いた非破壊検査や、タlTIスセクシ
ョン法等の破壊検査が行われていた。 クロスセクション法の概略を説明すると、多層プリント
基板のスル、−ホール部を切取り、そのスルーポール断
面を観察するものである。第3図はクロスセクション法
の説明をする断面図である。 図において、10はカラスエポキシ樹脂などの絶縁性材
料よりなるプリント基板、20はプリント基板10に設
けられたスルーポールで、内周面及びこの近傍のプリン
1〜基板10表血に銅箔か設りである。30は1人JJ
田パターンて、ここては二″、N g’2Gフである。
In multilayer printed circuit boards, it is necessary to overlap the patterns of each layer with sufficient accuracy. Conventional inspection methods include non-destructive inspection using X-rays and destructive inspection such as the TTI ssection method. Briefly, the cross-section method involves cutting out through-hole portions of a multilayer printed circuit board and observing the through-pole cross section. FIG. 3 is a sectional view illustrating the cross-section method. In the figure, 10 is a printed circuit board made of an insulating material such as a glass epoxy resin, 20 is a through pole provided on the printed circuit board 10, and copper foil is installed on the inner peripheral surface and the surfaces of the printed circuit boards 1 to 10 in the vicinity. It is. 30 is one JJ
The pattern here is 2'', Ng'2G.

【発明が解決しようとする課題】[Problem to be solved by the invention]

しかし、プリント基板10のスルーポール20の切取り
作業や断面研磨作業は大変手間のかかるものである。そ
こで本出願人はこの様な課題を解決するものとして、実
即昭63−10329号「プリン1〜基板の検査用パタ
ーン塁を提案している。 本発明ら−1,記課題を解決するもので、プリン1〜基
板加土用ドリルにチエツク機能を持なぜな新規な解決手
段を提a(することを1・1的とする。
However, the work of cutting out the through-pole 20 of the printed circuit board 10 and the work of polishing its cross section are very time-consuming. Therefore, as a solution to such problems, the present applicant has proposed a pattern base for inspection of printed circuit boards, published in No. 10329/1983.The present invention et al. Therefore, we will propose a new solution that has a check function in the drill for adding soil to the substrate.

【課題を解決するだめの手段] 、−のような[°1的を達成する第1の発明は、多層プ
リン1〜基板の内層パターンと接続された第1の端そと
、この多層プリント基板の所定位置に穴開ζJ作業を行
う導電性材料よりなるドリルと接続された第2の端イと
を有するものにおいて、次の構成と1.たものである。 即し、当該所定位置には、内層パターンに設けられた導
体の存在しない所定内径(d1)のテスト円を設り、こ
のデス1〜円と重なる状態で当該デス1〜円よりも小さ
い所定内径(d2)の穴を前記ドリルにより穴開し)作
業を行う。 そし7て、この穴開i−1作業中に前記第1と第2の端
子の間で導通があった場合は不合格と判定することを特
徴としている。 このような目的を達成する第2の発明は、多層プリン1
〜基板′の内層パターンと接続された第1の端子と、こ
の多層プリント基板の所定位置に穴開は作業を行う導電
性材料よりなるドリルと、当該プリン1〜基板の表面に
設げられた配線パターンと接続された第2の端子とを存
するものにおいて、次の構成としたものである。 即ち、当該所定位置には、内層パターンに設けられた導
体の存在しない所定内径(d1)のテスト円を段Cつ、
このテスト円と重なる状態で表面に設けられた前記配線
パターンを設り、このテスト円と重なる状態で当該デス
1〜円よりも小さい所定内径(d2)の穴を前記ドリル
により穴開り作業を行う。 そして、この穴開り作業中に前記第1と第2の端子の間
で導通があった場合は不合格と判定することを特徴とし
ている。 【作用】 本発明の各構成要素はつき゛の作用をする6iE、規の
多層プリン1〜基板ては、テスト円とドリルの内径との
間のクリアランスの為に第1と第2の端子の間には導通
がない。しかし、内層パターンの位方決めに過大な位置
ずれがあると、このクリアランスを越えるから導通が生
じる。 なお、ドリルの導電性を用いているので、第1の端子は
ドリル自体に設(Jることもできるし、またプリント基
板表面に設けることもできる。
[Means for Solving the Problems] A first invention that achieves the objectives as described above is based on a multilayer print board 1 to a first edge connected to an inner layer pattern of a board, and a multilayer print board. A drill having a second end A connected to a drill made of a conductive material for drilling a hole at a predetermined position ζJ has the following configuration and 1. It is something that That is, a test circle with a predetermined inner diameter (d1) provided in the inner layer pattern where there is no conductor is provided at the predetermined position, and a test circle with a predetermined inner diameter smaller than the des1~ circle is set in a state where it overlaps with this des1~ circle. Drill the hole (d2) with the drill). 7. If there is continuity between the first and second terminals during the hole drilling i-1 operation, it is determined to be a failure. The second invention that achieves this purpose is a multilayer print 1.
- A first terminal connected to the inner layer pattern of the board', a drill made of a conductive material for drilling holes at predetermined positions on this multilayer printed circuit board, and a drill provided on the surface of the board. This device includes a wiring pattern and a connected second terminal, and has the following configuration. That is, at the predetermined position, there are C test circles with a predetermined inner diameter (d1) provided in the inner layer pattern where no conductor is present;
The wiring pattern provided on the surface is set up so that it overlaps with this test circle, and a hole with a predetermined inner diameter (d2) smaller than the said D1~circle is drilled using the drill while it overlaps with this test circle. conduct. If there is continuity between the first and second terminals during this hole-drilling operation, the product is determined to be rejected. [Function] Each component of the present invention has the function of 6iE, and the multilayer printed circuit board 1 to the standard board is provided between the first and second terminals due to the clearance between the test circle and the inner diameter of the drill. There is no continuity. However, if there is an excessive positional deviation in the orientation of the inner layer pattern, this clearance will be exceeded and conduction will occur. Note that since the conductivity of the drill is used, the first terminal can be provided on the drill itself or on the surface of the printed circuit board.

【実施例] 以下図面を用いて、第1の発明を説明する。 第1図は第1の発明の一実施例を示す要部構成図で、(
A)は断面図、(B)は内層パターンの平面図である。 図において、検査穴21は内層パターン30か正確に位
置決めされた状態にあり、同軸にデス1〜円31が設け
である。テスト円31は内層パターン30に投げられた
導体の存在しない所定内径(d1)の円状の部分て、ド
リル40により形成される穴の内径(d2)よりも大き
なものとなっており、この差Hd1−d2)/2)が内
層パターン30に許容される位置ずれ量になっている。 端T−51は内層パターン30と接続されたものであり
、端子52はドリル40に接続されたもので、この端子
51.52の間で内層パターン30とドリル40との導
通状態を検査する。なお、ドリル40の先端は軸に比へ
て太くなっており、切削屑の排出が容易になっている。 検査穴21の状態は良好なので、端子51.52の間に
は導通が発生しない。 検査穴22は内層パターン30に許容範囲を越えた位置
ずれを生じた場合の説明図である。デス1−円32の一
部かドリル40の穴開は作業中に接触する(図中a点て
示す)。そこで端子51.52の間には導通が発生ずる
から、この導通により位置ずれ量かクリアランス((d
l−d2)/2)よりも大きいことか解る。 この場合には、検査穴22を目視検査して導体の現れて
いる位置から位置ずれの方向を定め、現れている長さか
ら位置ずれの量を定めるとよい。 そして、この求めた値をオフセラ1〜量として初期値に
加算してNC装置などに指示してドリルの位置決めをず
れは、このような位置ずれ量か大きくなっているプリン
1〜基板についても、内層パターン30について導通状
態の不良のない製品か製造できる。 第2図は第2の発明の一実施例を示す要部断面図である
。図において、ドリル41の太さは先端と軸とで等しく
なっている。内層パターン30には第1図と同じくテス
ト円33が形成されている。 プリン1一基板10の表面には、テスト円33と重なる
位置に外層配線パターン50が設けられている。端子5
3は外層配線パターン50に接続されたもので、この端
子51.53の間で内層パターン30及びドリル40と
外層配線パターン50の導通状態を検査する。 このように構成された装置の動作を次に説明する。内層
パターン30が正しく位置決めされていれば、端子51
.53の間で導通は発生しない。内層パターン30かク
リアランスを越えてずれていれば、ドリル40の穴開は
作業の際に内層パターン30と外層配線パターン50と
の間に導通が生じるから、端子51.53の間で導通ず
る。このようにずれは、第1の発明と同一の解決課題を
異なる構成で解決できる。 【発明の効果】 以上説明したように、本発明によれば内層パターン30
の位置ずれをプリント基板10に予め股!−7られな検
査穴を用いて容易に検査できるので、不良プリント基板
に穴開は加」二しなくてずみ、製造コストか低下する。 また、実施例のように位置ずれ量を補償してドリル40
の位置を定めれば、製品歩留まり率も増大する。
[Example] The first invention will be described below with reference to the drawings. FIG. 1 is a main part configuration diagram showing an embodiment of the first invention, (
A) is a cross-sectional view, and (B) is a plan view of the inner layer pattern. In the figure, the inspection hole 21 is in a state where the inner layer pattern 30 is accurately positioned, and the circles 1 to 31 are coaxially provided. The test circle 31 is a circular portion of a predetermined inner diameter (d1) where there is no conductor thrown into the inner layer pattern 30, and is larger than the inner diameter (d2) of the hole formed by the drill 40, and this difference Hd1-d2)/2) is the amount of positional deviation allowed for the inner layer pattern 30. The end T-51 is connected to the inner layer pattern 30, and the terminal 52 is connected to the drill 40. The electrical continuity between the inner layer pattern 30 and the drill 40 is tested between the terminals 51 and 52. Note that the tip of the drill 40 is thicker than the shaft, making it easier to discharge cutting waste. Since the inspection hole 21 is in good condition, no conduction occurs between the terminals 51 and 52. The inspection hole 22 is an explanatory diagram when the inner layer pattern 30 is misaligned beyond the allowable range. A part of the circle 32 comes into contact with the hole drilled by the drill 40 during operation (point a in the figure). Therefore, conduction occurs between the terminals 51 and 52, and due to this conduction, the amount of positional deviation or clearance ((d
It can be seen that it is larger than ld2)/2). In this case, it is preferable to visually inspect the inspection hole 22 to determine the direction of misalignment from the position where the conductor appears, and determine the amount of misalignment from the length of the exposed conductor. Then, this obtained value is added to the initial value as an offset amount and is instructed to an NC device etc. to adjust the positioning of the drill. It is possible to manufacture a product with no defects in the conduction state of the inner layer pattern 30. FIG. 2 is a sectional view of essential parts showing an embodiment of the second invention. In the figure, the thickness of the drill 41 is equal between the tip and the shaft. A test circle 33 is formed in the inner layer pattern 30 as in FIG. An outer layer wiring pattern 50 is provided on the surface of the printed circuit board 10 at a position overlapping with the test circle 33. terminal 5
3 is connected to the outer layer wiring pattern 50, and the electrical continuity between the inner layer pattern 30 and the drill 40 and the outer layer wiring pattern 50 is tested between these terminals 51 and 53. The operation of the device configured in this manner will be described next. If the inner layer pattern 30 is positioned correctly, the terminal 51
.. No conduction occurs between 53. If the inner layer pattern 30 is deviated beyond the clearance, conduction will occur between the inner layer pattern 30 and the outer layer wiring pattern 50 during drilling with the drill 40, and therefore conduction will occur between the terminals 51 and 53. In this way, the same problem as the first invention can be solved by using a different configuration. Effects of the Invention As explained above, according to the present invention, the inner layer pattern 30
Check the misalignment on the printed circuit board 10 in advance! -7 Since the inspection can be easily carried out using a small inspection hole, there is no need to drill additional holes in the defective printed circuit board, and the manufacturing cost is reduced. Further, as in the embodiment, the amount of positional deviation is compensated and the drill 40 is
By determining the location of the product, the product yield rate will also increase.

【図面の簡単な説明】[Brief explanation of the drawing]

第1図は第1の発明の一実施例を示す要部構成図、第2
図は第2の発明の一実施例を示す要部断面図である。第
3図はクロスセクション法を説明をする断面図である。 10・・・プリント基板、21.22・・・検査穴、3
0・・・内層パターン、31〜33・・・デス1〜円、
40・・・ドリル、50・・・外層配線パターン、51
〜53第3図
Fig. 1 is a main part configuration diagram showing an embodiment of the first invention;
The figure is a sectional view of a main part showing an embodiment of the second invention. FIG. 3 is a cross-sectional view for explaining the cross-section method. 10... Printed circuit board, 21.22... Inspection hole, 3
0...Inner layer pattern, 31-33...Death 1-yen,
40...Drill, 50...Outer layer wiring pattern, 51
~53Figure 3

Claims (2)

【特許請求の範囲】[Claims] (1)多層プリント基板の内層パターンと接続された第
1の端子と、 この多層プリント基板の所定位置に穴開け作業を行う導
電性材料よりなるドリルと接続された第2の端子と、 を有し、 当該所定位置には、内層パターンに設けられた導体の存
在しない所定内径(d1)のテスト円を設け、このテス
ト円と重なる状態で当該テスト円よりも小さい所定内径
(d2)の穴を前記ドリルにより穴開け作業を行い、 この穴開け作業中に前記第1と第2の端子の間で導通が
あった場合は不合格と判定することを特徴とするプリン
ト基板の位置ずれ検査方法。
(1) A first terminal connected to an inner layer pattern of a multilayer printed circuit board, and a second terminal connected to a drill made of a conductive material for drilling holes in a predetermined position of the multilayer printed circuit board. Then, a test circle with a predetermined inner diameter (d1) provided in the inner layer pattern without a conductor is provided at the predetermined position, and a hole with a predetermined inner diameter (d2) smaller than the test circle is inserted in a state that overlaps with this test circle. A method for inspecting positional deviation of a printed circuit board, comprising: drilling a hole with the drill; and determining a failure if there is continuity between the first and second terminals during the drilling.
(2)多層プリント基板の内層パターンと接続された第
1の端子と、 この多層プリント基板の所定位置に穴開け作業を行う導
電性材料よりなるドリルと、 当該プリント基板の表面に設けられた配線パターンと接
続された第2の端子とを有し、 当該所定位置には、内層パターンに設けられた導体の存
在しない所定内径(d1)のテスト円を設け、このテス
ト円と重なる状態で表面に設けられた前記配線パターン
を設け、このテスト円と重なる状態で当該テスト円より
も小さい所定内径(d2)の穴を前記ドリルにより穴開
け作業を行い、 そして、この穴開け作業中に前記第1と第2の端子の間
で導通があった場合は不合格と判定することを特徴とす
るプリント基板の位置ずれ検査方法。
(2) A first terminal connected to an inner layer pattern of a multilayer printed circuit board, a drill made of a conductive material for drilling holes in a predetermined position of this multilayer printed circuit board, and wiring provided on the surface of the printed circuit board. It has a second terminal connected to the pattern, a test circle with a predetermined inner diameter (d1) provided in the inner layer pattern where no conductor is present is provided at the predetermined position, and a test circle is placed on the surface in a state overlapping with this test circle. A hole with a predetermined inner diameter (d2) smaller than the test circle is drilled using the drill in a state where the wiring pattern is overlapped with the test circle, and during this hole-drilling operation, the first A method for inspecting positional deviation of a printed circuit board, characterized in that if there is continuity between the terminal and the second terminal, the method is determined to be a failure.
JP14093188A 1988-06-08 1988-06-08 Displacement inspecting method for printed board Pending JPH01310841A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP14093188A JPH01310841A (en) 1988-06-08 1988-06-08 Displacement inspecting method for printed board

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP14093188A JPH01310841A (en) 1988-06-08 1988-06-08 Displacement inspecting method for printed board

Publications (1)

Publication Number Publication Date
JPH01310841A true JPH01310841A (en) 1989-12-14

Family

ID=15280147

Family Applications (1)

Application Number Title Priority Date Filing Date
JP14093188A Pending JPH01310841A (en) 1988-06-08 1988-06-08 Displacement inspecting method for printed board

Country Status (1)

Country Link
JP (1) JPH01310841A (en)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN105598488A (en) * 2016-03-04 2016-05-25 广德英菲特电子有限公司 PCB (printed circuit board) drilling method
CN112911791A (en) * 2021-01-29 2021-06-04 深圳市强达电路有限公司 Printed circuit board for detecting deviation of drilling hole

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN105598488A (en) * 2016-03-04 2016-05-25 广德英菲特电子有限公司 PCB (printed circuit board) drilling method
CN112911791A (en) * 2021-01-29 2021-06-04 深圳市强达电路有限公司 Printed circuit board for detecting deviation of drilling hole

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