JPH01301598A - Uniformizing method of characteristic property of compound semiconductor single crystal - Google Patents

Uniformizing method of characteristic property of compound semiconductor single crystal

Info

Publication number
JPH01301598A
JPH01301598A JP13114588A JP13114588A JPH01301598A JP H01301598 A JPH01301598 A JP H01301598A JP 13114588 A JP13114588 A JP 13114588A JP 13114588 A JP13114588 A JP 13114588A JP H01301598 A JPH01301598 A JP H01301598A
Authority
JP
Japan
Prior art keywords
single crystal
powder
compound semiconductor
semiconductor single
wafer
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP13114588A
Other languages
Japanese (ja)
Inventor
Masato Yoshida
誠人 吉田
Ichiji Shimizu
清水 一司
Kenzo Susa
憲三 須佐
Hiroyuki Ishibashi
浩之 石橋
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Resonac Corp
Original Assignee
Hitachi Chemical Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hitachi Chemical Co Ltd filed Critical Hitachi Chemical Co Ltd
Priority to JP13114588A priority Critical patent/JPH01301598A/en
Publication of JPH01301598A publication Critical patent/JPH01301598A/en
Pending legal-status Critical Current

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  • Crystals, And After-Treatments Of Crystals (AREA)

Abstract

PURPOSE:To uniformize various properties such as electric, electronic and optical properties of above single crystal with easy heat-treating process, by covering a compound semiconductor single crystal with powder of said single crystal, heating and cooling. CONSTITUTION:In case of heat treatment of a compound semiconductor single crystal, ingot or wafer of said single crystal, etc., is covered with powder of the same kind as said single crystal. Powder having fine particle is used as said powder and a contact of said powder with the crystal is preferably kept in a good state. In a concrete example, a single crystal wafer 3 is set in a quartz ample 1 and powder 2 of the same kind as the single crystal is simultaneously filled in the ample 1, sealed in vacuum and heat-treated of heating-cooling keeping said state, as exemplified in the figure. By said process, various above- mentioned properties of a compound semiconductor single crystal are effectively uniformized.

Description

【発明の詳細な説明】 (産業上の利用分野) 本発明は化合物半導体単結晶の電気的、電子的及び光学
的等の諸特性を均質化させる方法に関する。
DETAILED DESCRIPTION OF THE INVENTION (Field of Industrial Application) The present invention relates to a method for homogenizing the electrical, electronic, optical, etc. properties of a compound semiconductor single crystal.

(従来の技術) 液体封止チョクラスキー法(LEC法)や水平式ブリッ
ジマン法で作られる半導体基板結晶は、集積回路に用い
られる(100)面内で、電気的特性等の諸特性が不均
一に分布しているのが通常である。これらの特性を均質
化する方法として、GaAs単結晶の場合As雰囲気下
で熱処理する方法が提案されている。
(Prior art) Semiconductor substrate crystals made by the liquid-filled Czochlaski method (LEC method) or the horizontal Bridgman method have various characteristics such as electrical characteristics within the (100) plane used in integrated circuits. It is usually unevenly distributed. As a method for homogenizing these characteristics, a method has been proposed in which a GaAs single crystal is heat-treated in an As atmosphere.

(発明が解決しようとする課!り 化合物半導体単結晶の熱処理をほどこす際、例えばGa
As単結晶の場合インゴット及びウェハの表面からAs
が抜けてしまうので従来の方法ではAs雰囲気中で熱処
理することによりAsが抜けることを防いでいる。しか
しながらこの方法ではAs圧の制御及び毒物の取り扱い
等作業が難しい。
(The problem that the invention seeks to solve!) When heat-treating a compound semiconductor single crystal, for example, Ga
In the case of As single crystal, As is removed from the surface of the ingot and wafer.
Therefore, in the conventional method, heat treatment is performed in an As atmosphere to prevent As from coming out. However, with this method, it is difficult to control the As pressure and handle poisonous substances.

本発明は、容易な熱処理操作で効果的に化合物半導体単
結晶の諸特性を均質化させる方法を提供するものである
The present invention provides a method for effectively homogenizing the properties of a compound semiconductor single crystal using a simple heat treatment operation.

(問題点を解決するための手段) 本発明は、化合物半導体単結晶を熱処理する場合、化合
物半導体単結晶のインゴット、ウェハをその単結晶と同
種類の粉末で覆うようにしたものである。粉末は粒子の
小さいものを用い、結晶との接触を良好な状態にするこ
とが好ましい。さらにウェハ又はインゴットを覆う粉末
を十分な量にし、気相との接触を極力少なくし、表面か
らAs等が抜けることを防ぐことが好ましい。又化合物
半導体粉末の組成を単結晶インゴット、ウェハの組成に
比べて蒸気圧の高い成分を多くしたものをでもよい。加
熱−冷却の熱処理は、加熱−冷却をる。
(Means for Solving the Problems) According to the present invention, when a compound semiconductor single crystal is heat-treated, an ingot or wafer of the compound semiconductor single crystal is covered with powder of the same type as the single crystal. It is preferable to use powder with small particles to ensure good contact with the crystals. Furthermore, it is preferable to use a sufficient amount of powder to cover the wafer or ingot, to minimize contact with the gas phase, and to prevent As and the like from coming off the surface. Further, the composition of the compound semiconductor powder may be one in which the component having a higher vapor pressure is increased compared to the composition of the single crystal ingot or wafer. The heating-cooling heat treatment involves heating-cooling.

熱処理段階で、化合物半導体単結晶は、少なくとも単結
晶成分の蒸発が起る温度域で、単結晶と同種類の粉末で
覆われておれば良い。
In the heat treatment step, the compound semiconductor single crystal only needs to be covered with the same type of powder as the single crystal at least in a temperature range where evaporation of the single crystal components occurs.

第1図は、石英アンプルl内に単結晶ウェハ3を入れる
と共に単結晶と同種類の粉末2をアンプル内に充填し、
真空封入したものであり、この状態で加熱−急冷の熱処
理を行う。又第2図のように、ウェハ3を同種類の粉末
で覆い全体を圧縮しペレット状にしたちの4を、石英ア
ンプルl内に更に単結晶と同種類の粉末2と共に充填し
真空封入にしても良い。これによりさらにウェハの気相
との接触を防ぐことができる。
In FIG. 1, a single crystal wafer 3 is placed in a quartz ampoule l, and the ampoule is filled with powder 2 of the same type as the single crystal.
It is sealed in a vacuum, and heat treatment of heating and rapid cooling is performed in this state. Further, as shown in Fig. 2, the wafer 3 is covered with the same kind of powder and the whole is compressed to form a pellet, which is then filled into a quartz ampoule l with the same kind of powder 2 as the single crystal and sealed in a vacuum. Also good. This further prevents the wafer from coming into contact with the gas phase.

又、アンプル中の気相の体積をできるだけ小さいものに
することにより、本発明の効果を上げることができる。
Furthermore, the effects of the present invention can be enhanced by making the volume of the gas phase in the ampoule as small as possible.

ウェハの代りに単結晶インゴットを使用しても良く、こ
の場合工業的見地から有利となる。
Instead of wafers, single crystal ingots may also be used, which is advantageous from an industrial point of view.

(実施例) GaAs単結晶を育成する際の原料(多結晶GaAs)
を粉末にし、6X6X0.5 (mm)に加工したウェ
ハ全体を覆う、加工したウェハは、3H,So、 : 
H,O,: H,Oの比のエツチング液で表面をlOμ
m程度エツチングしたものを用いる。第1図で示すよう
に石英アンプル中に真空封入し950’K、46時間加
熱し急冷する。上述したエツチング液で50μmエツチ
ングし電気特性を測定したところ熱処理することにより
抵抗率は3X10”n2X10”Ω’cm、キャリア濃
度は6X 10’cm−’−+I X I Oocm−
”になった。
(Example) Raw material for growing GaAs single crystal (polycrystalline GaAs)
The processed wafer, which covers the entire wafer processed into powder and processed into 6 x 6 x 0.5 (mm), is 3H, So, :
H, O,: The surface is etched with an etching solution having a ratio of H, O.
Use one that has been etched by about m. As shown in FIG. 1, it is vacuum sealed in a quartz ampoule, heated at 950'K for 46 hours, and then rapidly cooled. After etching by 50 μm with the above-mentioned etching solution and measuring the electrical characteristics, the resistivity was 3X10"n2X10"Ω'cm and the carrier concentration was 6X10'cm-'-+I X I Oocm-.
"Became.

比較のため粉末で覆わない場合は、抵抗率が1×10’
Ω’cm、キャリア濃度が2X I O”am−”とな
り、あきらかにウェハ表面からAsが抜けた結果となり
、本発明がAsが抜けるのを防ぐ効果があることを示す
For comparison, when not covered with powder, the resistivity is 1 x 10'
Ω'cm, and the carrier concentration was 2X I O "am-", which clearly resulted in the removal of As from the wafer surface, indicating that the present invention is effective in preventing the removal of As.

(発明の効果) 本発明により、化合物半導体単結晶の電気的、電子的及
び光学的等の諸特性を、容易な操作で効率良く行うこと
ができる。
(Effects of the Invention) According to the present invention, various electrical, electronic, optical, etc. properties of a compound semiconductor single crystal can be efficiently controlled with easy operations.

【図面の簡単な説明】[Brief explanation of the drawing]

第1[i!l、第2rl!Jは本発明の方法を示す石英
管アンプルの一部切欠正面図である。 符号の説明 1、石英管アンプル 2、単結晶と同種類の粉末 3、単結晶ウェハ ー)、パ、′石7 一゛:・遜 ゛ニジ 第1図 〉 1石英アンプ 2単結晶と同種類の粉末 3単結晶ウエハ
1st [i! l, 2nd rl! J is a partially cutaway front view of a quartz tube ampoule showing the method of the present invention. Explanation of symbols 1, quartz tube ampoule 2, powder of the same type as the single crystal 3, single crystal wafer) Powder 3 single crystal wafer

Claims (1)

【特許請求の範囲】[Claims] 1、化合物半導体単結晶をその単結晶の粉末で覆って加
熱し、その後冷却することを特徴とする化合物半導体単
結晶の特性を均質化させる方法。
1. A method for homogenizing the properties of a compound semiconductor single crystal, which comprises covering the compound semiconductor single crystal with powder of the single crystal, heating it, and then cooling it.
JP13114588A 1988-05-27 1988-05-27 Uniformizing method of characteristic property of compound semiconductor single crystal Pending JPH01301598A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP13114588A JPH01301598A (en) 1988-05-27 1988-05-27 Uniformizing method of characteristic property of compound semiconductor single crystal

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP13114588A JPH01301598A (en) 1988-05-27 1988-05-27 Uniformizing method of characteristic property of compound semiconductor single crystal

Publications (1)

Publication Number Publication Date
JPH01301598A true JPH01301598A (en) 1989-12-05

Family

ID=15051053

Family Applications (1)

Application Number Title Priority Date Filing Date
JP13114588A Pending JPH01301598A (en) 1988-05-27 1988-05-27 Uniformizing method of characteristic property of compound semiconductor single crystal

Country Status (1)

Country Link
JP (1) JPH01301598A (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2002037697A (en) * 2000-07-25 2002-02-06 Mitsui Mining & Smelting Co Ltd Method for producing optical material

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2002037697A (en) * 2000-07-25 2002-02-06 Mitsui Mining & Smelting Co Ltd Method for producing optical material
JP4575561B2 (en) * 2000-07-25 2010-11-04 三井金属鉱業株式会社 Manufacturing method of optical material

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