JPH01260615A - Magnetic head - Google Patents
Magnetic headInfo
- Publication number
- JPH01260615A JPH01260615A JP9117788A JP9117788A JPH01260615A JP H01260615 A JPH01260615 A JP H01260615A JP 9117788 A JP9117788 A JP 9117788A JP 9117788 A JP9117788 A JP 9117788A JP H01260615 A JPH01260615 A JP H01260615A
- Authority
- JP
- Japan
- Prior art keywords
- films
- magnetic
- film
- magnetic gap
- thin metallic
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 230000005291 magnetic effect Effects 0.000 title claims abstract description 56
- 229910052751 metal Inorganic materials 0.000 claims abstract description 36
- 239000002184 metal Substances 0.000 claims abstract description 36
- 238000009792 diffusion process Methods 0.000 claims abstract description 15
- 239000010408 film Substances 0.000 claims description 30
- 239000010409 thin film Substances 0.000 claims description 25
- 238000005728 strengthening Methods 0.000 claims description 14
- 230000002265 prevention Effects 0.000 claims description 8
- 229910000859 α-Fe Inorganic materials 0.000 claims description 7
- 230000005294 ferromagnetic effect Effects 0.000 claims description 6
- 230000004907 flux Effects 0.000 claims description 3
- 230000000737 periodic effect Effects 0.000 claims description 3
- 229910000702 sendust Inorganic materials 0.000 abstract description 13
- 239000000853 adhesive Substances 0.000 abstract description 6
- 238000004544 sputter deposition Methods 0.000 abstract description 6
- 238000000151 deposition Methods 0.000 abstract description 5
- 230000003449 preventive effect Effects 0.000 abstract description 5
- 238000000137 annealing Methods 0.000 abstract description 4
- 230000006866 deterioration Effects 0.000 abstract description 4
- 238000010438 heat treatment Methods 0.000 abstract description 3
- 230000015572 biosynthetic process Effects 0.000 abstract description 2
- 230000001070 adhesive effect Effects 0.000 abstract 5
- PNEYBMLMFCGWSK-UHFFFAOYSA-N aluminium oxide Inorganic materials [O-2].[O-2].[O-2].[Al+3].[Al+3] PNEYBMLMFCGWSK-UHFFFAOYSA-N 0.000 abstract 1
- 229910052593 corundum Inorganic materials 0.000 abstract 1
- 229910001845 yogo sapphire Inorganic materials 0.000 abstract 1
- 239000011521 glass Substances 0.000 description 9
- 238000004804 winding Methods 0.000 description 4
- RYGMFSIKBFXOCR-UHFFFAOYSA-N Copper Chemical compound [Cu] RYGMFSIKBFXOCR-UHFFFAOYSA-N 0.000 description 2
- 229910052804 chromium Inorganic materials 0.000 description 2
- 230000000694 effects Effects 0.000 description 2
- 239000003302 ferromagnetic material Substances 0.000 description 2
- 238000003780 insertion Methods 0.000 description 2
- 230000037431 insertion Effects 0.000 description 2
- 239000000696 magnetic material Substances 0.000 description 2
- 229910045601 alloy Inorganic materials 0.000 description 1
- 239000000956 alloy Substances 0.000 description 1
- 230000002542 deteriorative effect Effects 0.000 description 1
- 238000010586 diagram Methods 0.000 description 1
- 238000005516 engineering process Methods 0.000 description 1
- 239000000463 material Substances 0.000 description 1
- 150000002739 metals Chemical class 0.000 description 1
- 229910052750 molybdenum Inorganic materials 0.000 description 1
- 229910052758 niobium Inorganic materials 0.000 description 1
- 125000006850 spacer group Chemical group 0.000 description 1
- 229910052715 tantalum Inorganic materials 0.000 description 1
- 229910052721 tungsten Inorganic materials 0.000 description 1
- 238000007740 vapor deposition Methods 0.000 description 1
- 229910052726 zirconium Inorganic materials 0.000 description 1
Abstract
Description
【発明の詳細な説明】
〔産業上の利用分野〕
本発明は、磁気ヘッドに関し、詳しくは8mmVTRや
R−DAT装置等に使用され、ギャップ構造を改善して
高密度記録を実現した磁気ヘッドに関するものである。DETAILED DESCRIPTION OF THE INVENTION [Field of Industrial Application] The present invention relates to a magnetic head, and more particularly to a magnetic head that is used in 8mm VTRs, R-DAT devices, etc., and that achieves high-density recording by improving the gap structure. It is something.
磁気記録媒体の情報の記録及び再生には、近年の高密度
記録の実現に伴って、上記磁気記録媒体としてメタル媒
体が使用されている。一方、このような高密度記録に使
用される磁気ヘッドとしてはM I G (metal
in gap) ヘッドがある。With the recent realization of high-density recording, metal media have been used as magnetic recording media for recording and reproducing information on magnetic recording media. On the other hand, MIG (metal
in gap) There is a head.
例えば、R−D、AT装置に使用されるMIGヘッドの
従来構造例を第4図乃至第6図を参照して次に示す。第
4図乃至第6図に示すMIGヘッド(1)において、(
2)はフェライト類のバルク型コアチップ、(2a)
(2b)はコア、(3)、 (4)’ (4)はガラ
ス、(g)は磁気ギャップ、(5)は金属薄膜、(6)
は付着力強化膜、(7)は銅製の線材である。上記コア
チップ(2)は一対のコア(2a) (2b)を金属
薄膜(5)を介してガラス(3) (4)(4)にて
接合一体化したもので、コアチップ(2)の、磁気記録
媒体、即ち磁気媒体(11)と摺接する頂端面(8)に
は、5i02等のギヤップスベーサからなると共に、所
定のトラック幅(1)を有する磁気ギャップ(g)が形
成され、その両側方から上記磁気ギャップ(g)をガラ
ス(4)(4)で保護している。上記金属薄膜(5)は
、各コア(2a) (2b)の磁気ギャップ(g)を
形成しているエツジ部位(2a+) (2b+)の端面
に、付着力強化膜(6)を介してセンダスト等の高飽和
磁束密度を有する金属強磁性体を、蒸着或いはスパッタ
法で磁気ギャップ(g)に平行に被着させたものである
。そして付着力強化膜(6)は、コア(2a) (2
b)の材料であるフェライトと、金属薄膜(5)との付
着力を向上させるため、上記エツジ部位(2aυ(2b
+)の端面に予めスパッタ法等で数100人厚に被着形
成したもので、その上にセンダスト等の金属薄膜(5)
を被着させる。この時、付着力強化膜(6)は元素周期
律表で第IVa−Vla族に含まれる金属、即ちTi、
v、 Cr、 Zr、 Nb、 Mo、旧。For example, examples of conventional structures of MIG heads used in RD and AT devices are shown below with reference to FIGS. 4 to 6. In the MIG head (1) shown in FIGS. 4 to 6, (
2) is a ferrite bulk type core chip, (2a)
(2b) is the core, (3), (4)' (4) is glass, (g) is the magnetic gap, (5) is the metal thin film, (6)
(7) is a copper wire. The core chip (2) is a pair of cores (2a) and (2b) joined together with glass (3) (4) (4) through a metal thin film (5), and the magnetic A magnetic gap (g) made of a gap baser such as 5i02 and having a predetermined track width (1) is formed on the top end surface (8) in sliding contact with the recording medium, that is, the magnetic medium (11), and from both sides thereof The magnetic gap (g) is protected by glass (4) (4). The metal thin film (5) is applied to the end face of the edge portion (2a+) (2b+) forming the magnetic gap (g) of each core (2a) (2b) through an adhesion strengthening film (6). A metal ferromagnetic material having a high saturation magnetic flux density such as ferromagnetic material is deposited parallel to the magnetic gap (g) by vapor deposition or sputtering. The adhesion-strengthening film (6) is formed by the core (2a) (2
In order to improve the adhesion between the ferrite, which is the material of b), and the metal thin film (5), the edge portion (2aυ(2b)
A thin film of metal such as sendust (5) is deposited on the end face of the
to be coated with. At this time, the adhesion-strengthening film (6) is made of metals included in groups IVa-Vla in the periodic table of elements, that is, Ti,
v, Cr, Zr, Nb, Mo, old.
Ta、 Wから選択され、例えば、Cr、 Ti、 T
aが多く用いられる。線材(7)はコア(2a) (
2b)の巻線係止溝(9a) (9b)と巻線挿通穴
(10)七を利用してコア(2a) (2b)に所定
ターン数ずつ巻回している。selected from Ta, W, for example Cr, Ti, T
a is often used. The wire rod (7) has a core (2a) (
The cores (2a) and (2b) are wound with a predetermined number of turns by using the winding locking grooves (9a) and (9b) and the winding insertion holes (10) of 2b).
〔発明が解決しようとする課題]
ところで、上述したようにMIGヘッド(1)ではコア
チップ(2a) (2b)のエツジ部位(2a+)(
2b+)、即ち磁気ギャップ(g)形成側の端面に、予
めCr等の付着力強化膜(6)を介してセンダスト等の
強磁性体金属薄膜(5)を被着・形成し、更にその上の
磁気ギャップ(g)形成面にSiO□等のギャップスペ
ーサを被着した後、各コアチップ(,2a) (2b
)をガラス(3)(4)(4)にて接合一体化している
。この時、上記金属薄膜(5)を被着・形成するに際し
ては、付着力強化膜(6)上にスパッタリング法等でセ
ンダスト等を被着した後、そのままであると軟磁性特性
を持たぬので、合金組織を改善して、磁気的特性を出す
ためにガラスモールド温度が低い場合には、500°C
〜600°Cの温度でアニールしており、更にガラス(
3)(4)(4)にて接合一体化する際もできるだけ同
様な温度で加熱している。そのため、付着力強化膜(6
)を形成するCr等の金属が、金属薄膜(5)中に熱的
に拡散していって金属薄膜(5)の付着力゛強化膜(6
)との界面近傍で磁気特性が劣化する。例えば、第7図
に示・すように、非磁性材にCrとセンダストとを積層
して形成し、その抗磁力(Hc)の温度依存性を測定す
ると、(センダスト) / (Cr) =1000人/
300人では折れ線(I!、i)、(センダスト) /
(Cr) =1000人1500人では折れ線(12
)となり、それぞれ550°C以上で抗磁力(Hc)が
急増し、磁気特性の劣化を見ることができる。更に、そ
の結果、第5図及び第6図に示すように、磁気ギャップ
(g)に対して平行な金属薄膜(5)の上記劣化層(5
a)が形成されると、この部分の磁気抵抗が大きくなっ
て磁気ギャップ(g)と平行な疑似ギャップ(g+)
(gg)となる。そうすると、このMIGヘッド(1
)により磁気媒体(1)に書込まれた情報を再生する際
に、第8図に示すような出力波形(A)が生じる。この
MIGヘッド(1)による上記出力再生波形(A)は、
磁気ギャップ(g)による立上がり(m)の両側部位に
、不所望な疑似ギャップ(gl (gz)による立上
がり(n)(n)が発生し、この立上がり(n)(n)
が原因となって正確な再生を困難にするエラー動作が多
発するという不都合があった。[Problems to be Solved by the Invention] By the way, as mentioned above, in the MIG head (1), the edge portions (2a+) (
2b+), that is, on the end face on the side where the magnetic gap (g) is formed, a ferromagnetic metal thin film (5) such as Sendust is coated and formed in advance via an adhesion strengthening film (6) such as Cr, and then After depositing a gap spacer such as SiO□ on the magnetic gap (g) forming surface of each core chip (, 2a) (2b
) are joined and integrated with glass (3) (4) (4). At this time, when depositing and forming the metal thin film (5), after depositing sendust etc. on the adhesion strength film (6) by sputtering method, etc., it does not have soft magnetic properties if left as is. , 500°C when the glass mold temperature is low to improve the alloy structure and exhibit magnetic properties.
It is annealed at a temperature of ~600°C, and is further coated with glass (
3) (4) When joining and integrating in (4), heating is performed at the same temperature as possible. Therefore, the adhesion-strengthening film (6
) is thermally diffused into the metal thin film (5) to strengthen the adhesion of the metal thin film (5) (6).
) magnetic properties deteriorate near the interface. For example, as shown in Figure 7, when Cr and Sendust are layered on a non-magnetic material and the temperature dependence of the coercive force (Hc) is measured, (Sendust) / (Cr) = 1000. Man/
For 300 people, the line is (I!, i), (sendust) /
(Cr) = 1000 people and 1500 people, the polygonal line (12
), and the coercive force (Hc) rapidly increases at 550°C or higher, and it can be seen that the magnetic properties deteriorate. Furthermore, as a result, as shown in FIGS. 5 and 6, the deteriorated layer (5) of the metal thin film (5) parallel to the magnetic gap (g)
When a) is formed, the magnetic resistance of this part increases and a pseudo gap (g+) parallel to the magnetic gap (g) is formed.
(gg). Then, this MIG head (1
) when reproducing information written on the magnetic medium (1), an output waveform (A) as shown in FIG. 8 is generated. The output reproduction waveform (A) from this MIG head (1) is as follows:
On both sides of the rise (m) caused by the magnetic gap (g), rises (n) (n) due to the undesired pseudo gap (gl (gz)) occur, and this rise (n) (n)
This has the disadvantage that error operations occur frequently, making accurate playback difficult.
本発明は、フェライトからなる一対のコアが接合一体化
されたコアチップの頂端面に磁気ギャップを形成し、こ
の磁気ギャップに位置するコアのエツジ部位に、元素周
期律表で第IVa〜VIa族中の金属からなる付着力強
化膜を介して高飽和磁束密度を有する強磁性体の金属薄
膜を磁気ギャップに平行に設けたものにおいて、上記金
属薄膜と付着力強化膜との間に所定厚の拡散防止膜を介
在形成したことを特徴とする。In the present invention, a magnetic gap is formed on the top end surface of a core chip in which a pair of cores made of ferrite are joined and integrated, and an edge portion of the core located in this magnetic gap is placed in a group IVa to VIa of the periodic table of elements. A ferromagnetic metal thin film having a high saturation magnetic flux density is provided in parallel to the magnetic gap through an adhesion strengthening film made of a metal of It is characterized by the intervening formation of a preventive film.
上記技術的手段によれば、一対のフェライト製コアを接
合一体化してなるコアチップの頂端面に磁気ギャップを
形成し、磁気ギャップに位置するコアのエツジ部位に、
付着力強化膜を介して強磁性体の金属薄膜を設けると共
に、その間にM2O3等の拡散防止膜を設け、付着力強
化膜を形成する金属が、アニールやコア接合一体化時の
温度で、金属薄膜中に拡散していくのを防止する。According to the above technical means, a magnetic gap is formed on the top end surface of a core chip formed by joining and integrating a pair of ferrite cores, and the edge portion of the core located in the magnetic gap is
A ferromagnetic metal thin film is provided through the adhesion strength film, and a diffusion prevention film such as M2O3 is provided in between, so that the metal forming the adhesion strength film will not melt at the temperature during annealing or core bonding. Prevents diffusion into the thin film.
本発明の一実施例を第1図乃至第3図を参照して以下説
明する。第4図乃至第6図と同一参照符号は同一物を示
しその説明を省略する。図において(2)はコアチップ
、(2a) (2b)はフェライト製の一対のコア、
(2aυ(2b+)はコア(2a) (2b)のエツ
ジ部位、(3)(4)(4)はガラス、(5)はセンダ
スト等の強磁性体の金属薄膜、(6)は元素周梱律表で
第IVa〜VIa族に含まれる金属からなる付着力強化
膜、(7)は銅製の線材、(8)はコアチップ(2)の
頂端面、(9a) (9b)は巻線係止溝、(10)
は巻線挿通穴、(11)は磁気媒体、(g)は磁気ギャ
ップである。本発明の特徴は、上記金属薄膜(5)と付
着力強化膜(6)との間に拡散防止膜(12)としてA
l 2031 S t Oz + Ta z Os *
T iOz等を、例えば50人〜200人程度の厚さ
に介在したことである。An embodiment of the present invention will be described below with reference to FIGS. 1 to 3. The same reference numerals as in FIGS. 4 to 6 indicate the same parts, and the explanation thereof will be omitted. In the figure, (2) is a core chip, (2a) and (2b) are a pair of ferrite cores,
(2aυ (2b+) is the edge part of the core (2a) (2b), (3) (4) (4) is glass, (5) is a thin ferromagnetic metal film such as sendust, (6) is the element surrounding (7) is a copper wire, (8) is the top end surface of the core chip (2), (9a) (9b) is a winding locking film. Groove, (10)
is a winding insertion hole, (11) is a magnetic medium, and (g) is a magnetic gap. A feature of the present invention is that a diffusion prevention film (12) is provided between the metal thin film (5) and the adhesion-strengthening film (6).
l 2031 S t Oz + Ta z Os *
The reason is that TiOz or the like is interposed to a thickness of, for example, about 50 to 200 people.
上記拡散防止膜(12)の成膜に際しては、コア(2a
’) (2b)のエツジ部位(2al) (2b、)
、即ち磁気ギャップ(g)形成側の端面に、まずCr等
の付着力強化膜(6)をスパッタ法等で被着した後、A
l z 03等の拡散防止膜(工2)及びセンダスト等
の金属薄膜(5)を順次、スパッタリングで被着する。When forming the above-mentioned diffusion prevention film (12), the core (2a
') Edge site of (2b) (2al) (2b, )
That is, first, an adhesion-strengthening film (6) such as Cr is deposited on the end face on the side where the magnetic gap (g) is formed by a sputtering method, and then A
A diffusion prevention film (Step 2) such as lz03 and a metal thin film (5) such as Sendust are sequentially deposited by sputtering.
そして、後述の接合時温度が低い場合には、金属薄膜(
5)を500〜600°Cでアニールした後、・コア(
2a) (2b)をガラス(3)(4)(4)にて接
合一体化してコアチップ(2)を形成する。If the bonding temperature is low, as described below, the metal thin film (
5) After annealing at 500 to 600°C, the core (
2a) (2b) are joined and integrated with glasses (3), (4), and (4) to form a core chip (2).
そうすると、上記アニール及びガラス接合時においてコ
ア(2a) (2b)を加熱する際、付着力強化膜(
6)を形成するCr等の金属が、金属薄膜(5)中に拡
散していかず、金属薄膜(5)の磁気特性の劣化が防止
される。例えば、第7図に示すように、非磁性材にCr
とAtz03とセンダストを積層して形成し、その抗磁
力(Hc)の温度依存性を測定すると、(センダスト)
/(Alzos ) / (Cr) =1000人/2
00人/300人では折れ線(!3)、(センダスト)
/ (#203 )/ (Cr) −1000人/
100人/100人では折れ線(!4)、(センダスト
) / (/VzOz ) / (Cr)=1000人
150人/100人では折れ線(I!、S)となり、そ
れぞれ抗磁力(He)は大きく変化せず、磁気特性の劣
化は見られない。特に、M2O3が薄くても磁気特性の
劣化を防ぐことができ、Crによる付着力強化を妨げな
い。そこで、金属薄膜(5)中において磁気ギャップ(
g)に平行な磁気特性の劣化層も形成されなくなって疑
似ギャップ(gI) (g−)が発生しない。そのた
め、本発明に係るMIGヘッド(13)により磁気媒体
(11)に書込まれた情報を再生する際に、その出力再
生波形(A)において不所望な立上がり(n)(n)(
第8図参照)が発生せず、正確な再生が得られる。Then, when heating the cores (2a) (2b) during the above annealing and glass bonding, the adhesion-strengthening film (
6) does not diffuse into the metal thin film (5), and deterioration of the magnetic properties of the metal thin film (5) is prevented. For example, as shown in Figure 7, Cr is added to the non-magnetic material.
When Atz03 and Sendust are laminated and the temperature dependence of the coercive force (Hc) is measured, (Sendust)
/ (Alzos) / (Cr) = 1000 people/2
For 00 people/300 people, the line is (!3), (Sendust)
/ (#203)/ (Cr) -1000 people/
For 100 people/100 people, it becomes a polygonal line (!4), (Sendust) / (/VzOz ) / (Cr) = 1000 people, for 150 people / 100 people it becomes a polygonal line (I!, S), and the coercive force (He) is large. There is no change, and no deterioration of magnetic properties is observed. In particular, even if M2O3 is thin, it is possible to prevent deterioration of magnetic properties and it does not interfere with the enhancement of adhesion by Cr. Therefore, the magnetic gap (
A layer with deteriorated magnetic properties parallel to g) is no longer formed, and no pseudo gap (gI) (g-) is generated. Therefore, when reproducing information written on the magnetic medium (11) by the MIG head (13) according to the present invention, undesired rises (n) (n) (
(see FIG. 8) does not occur, and accurate reproduction can be obtained.
本発明によれば、一対のフェライト製コアを接合一体化
してなるコアチップの頂端面に磁気ギャップを形成し、
磁気ギャップに佐賀するコアのエツジ部位に、付着力強
化膜を介して強磁性体の金属薄膜を設ける際、その間に
拡散防止膜を設けたから、付着力強化膜を形成する金属
が金属薄膜中に拡散していかず、金属薄膜の磁気特性の
劣化が防止されて出力特性が十分大きく信頼性向上を図
ることができる。According to the present invention, a magnetic gap is formed on the top end surface of a core chip formed by joining and integrating a pair of ferrite cores,
When a thin ferromagnetic metal film is provided at the edge of the core that spans the magnetic gap via an adhesion-strengthening film, a diffusion prevention film is provided in between, so that the metal forming the adhesion-strengthening film is not absorbed into the metal thin film. The metal thin film is not diffused and the magnetic properties of the metal thin film are prevented from deteriorating, so that the output properties are sufficiently large and the reliability can be improved.
第1図と第2図は本発明に係る磁気ヘッドの一実施例を
示す斜視図と平面図、第3図は第1図磁気ヘッドの磁気
ギャップ近傍部分を示す要部拡大断面図、第4図と第5
図は従来の磁気ヘッドの一具体例を示す斜視図と平面図
、第6図は第4図磁気ヘッドの磁気ギャップ近傍部分を
示す要部拡大断面図、第7図は第1図磁気ヘラドに係る
金属薄膜と拡散防止膜と付着力強化膜とを積層したもの
及び第4図磁気ヘッドに係る金属薄膜と付着力強化膜と
を積層したものの各抗磁力の温度依存性を示すグラフ、
第8図は第、 4図磁気ヘッドの出力波形を示す特性
図である。
(2)−コアチップ、(2a) (2b)−コア、(
5) −・金属薄膜、 (6) −、−付着力強化膜
、(8)−頂端面、 (12)−拡散防止膜、(g
) −磁気ギヤラス。1 and 2 are perspective views and plan views showing one embodiment of the magnetic head according to the present invention, FIG. Figure and 5th
The figure shows a perspective view and a plan view of a specific example of a conventional magnetic head, FIG. 6 is an enlarged cross-sectional view of the main part showing the vicinity of the magnetic gap of the magnetic head in FIG. 4, and FIG. FIG. 4 is a graph showing the temperature dependence of each coercive force of a laminated metal thin film, a diffusion prevention film, and an adhesion-strengthening film, and FIG.
FIG. 8 is a characteristic diagram showing the output waveform of the magnetic head shown in FIGS. (2) - Core chip, (2a) (2b) - Core, (
5) -metal thin film, (6) -, -adhesive strength film, (8) -top end surface, (12) -diffusion prevention film, (g
) −Magnetic gear lath.
Claims (1)
たコアチップの頂端面に磁気ギャップを形成し、この磁
気ギャップに位置するコアのエッジ部位に、元素周期律
表で第IVa−VIa族中の金属からなる付着力強化膜を介
して高飽和磁束密度を有する強磁性体の金属薄膜を磁気
ギャップに平行に設けたものにおいて、 上記金属薄膜と付着力強化膜との間に所定厚の拡散防止
膜を介在形成したことを特徴とする磁気ヘッド。(1) A magnetic gap is formed on the top end surface of a core chip in which a pair of cores made of ferrite are joined and integrated, and the edge portion of the core located in this magnetic gap is filled with elements from groups IVa to VIa in the periodic table. In a device in which a ferromagnetic metal thin film having a high saturation magnetic flux density is provided in parallel to the magnetic gap via an adhesion-strengthening film made of metal, a diffusion prevention layer of a predetermined thickness is provided between the metal thin film and the adhesion-strengthening film. A magnetic head characterized by having a film formed therebetween.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP9117788A JPH01260615A (en) | 1988-04-12 | 1988-04-12 | Magnetic head |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP9117788A JPH01260615A (en) | 1988-04-12 | 1988-04-12 | Magnetic head |
Publications (1)
Publication Number | Publication Date |
---|---|
JPH01260615A true JPH01260615A (en) | 1989-10-17 |
Family
ID=14019180
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP9117788A Pending JPH01260615A (en) | 1988-04-12 | 1988-04-12 | Magnetic head |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPH01260615A (en) |
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH04163705A (en) * | 1990-10-29 | 1992-06-09 | Fuji Elelctrochem Co Ltd | Magnetic head |
JPH06203323A (en) * | 1992-06-16 | 1994-07-22 | Samsung Electro Mech Co Ltd | Magnetic head and its production |
Citations (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS61172203A (en) * | 1985-01-26 | 1986-08-02 | Sony Corp | Magnetic head |
JPS62145510A (en) * | 1985-12-18 | 1987-06-29 | Sony Corp | Magnetic head |
JPS62162206A (en) * | 1986-01-10 | 1987-07-18 | Hitachi Ltd | Magnetic head |
JPS62295204A (en) * | 1986-06-13 | 1987-12-22 | Alps Electric Co Ltd | Magnetic head |
-
1988
- 1988-04-12 JP JP9117788A patent/JPH01260615A/en active Pending
Patent Citations (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS61172203A (en) * | 1985-01-26 | 1986-08-02 | Sony Corp | Magnetic head |
JPS62145510A (en) * | 1985-12-18 | 1987-06-29 | Sony Corp | Magnetic head |
JPS62162206A (en) * | 1986-01-10 | 1987-07-18 | Hitachi Ltd | Magnetic head |
JPS62295204A (en) * | 1986-06-13 | 1987-12-22 | Alps Electric Co Ltd | Magnetic head |
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH04163705A (en) * | 1990-10-29 | 1992-06-09 | Fuji Elelctrochem Co Ltd | Magnetic head |
JPH06203323A (en) * | 1992-06-16 | 1994-07-22 | Samsung Electro Mech Co Ltd | Magnetic head and its production |
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