JPH0124251B2 - - Google Patents

Info

Publication number
JPH0124251B2
JPH0124251B2 JP10551280A JP10551280A JPH0124251B2 JP H0124251 B2 JPH0124251 B2 JP H0124251B2 JP 10551280 A JP10551280 A JP 10551280A JP 10551280 A JP10551280 A JP 10551280A JP H0124251 B2 JPH0124251 B2 JP H0124251B2
Authority
JP
Japan
Prior art keywords
mask
optical system
optical
detection device
light beam
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
JP10551280A
Other languages
English (en)
Japanese (ja)
Other versions
JPS5729922A (en
Inventor
Hiroshi Tamaki
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Tokyo Optical Co Ltd
Original Assignee
Tokyo Optical Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Tokyo Optical Co Ltd filed Critical Tokyo Optical Co Ltd
Priority to JP10551280A priority Critical patent/JPS5729922A/ja
Publication of JPS5729922A publication Critical patent/JPS5729922A/ja
Publication of JPH0124251B2 publication Critical patent/JPH0124251B2/ja
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01M—TESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
    • G01M11/00—Testing of optical apparatus; Testing structures by optical methods not otherwise provided for
    • G01M11/02—Testing optical properties
    • G01M11/0228—Testing optical properties by measuring refractive power

Landscapes

  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Testing Of Optical Devices Or Fibers (AREA)
  • Eyeglasses (AREA)
JP10551280A 1980-07-31 1980-07-31 Measuring device for refractive characteristic of optical system Granted JPS5729922A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP10551280A JPS5729922A (en) 1980-07-31 1980-07-31 Measuring device for refractive characteristic of optical system

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP10551280A JPS5729922A (en) 1980-07-31 1980-07-31 Measuring device for refractive characteristic of optical system

Publications (2)

Publication Number Publication Date
JPS5729922A JPS5729922A (en) 1982-02-18
JPH0124251B2 true JPH0124251B2 (ko) 1989-05-10

Family

ID=14409646

Family Applications (1)

Application Number Title Priority Date Filing Date
JP10551280A Granted JPS5729922A (en) 1980-07-31 1980-07-31 Measuring device for refractive characteristic of optical system

Country Status (1)

Country Link
JP (1) JPS5729922A (ko)

Families Citing this family (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS58130440A (ja) * 1982-01-29 1983-08-03 Seiko Epson Corp 磁気デイスク
JPS5927237A (ja) * 1982-08-06 1984-02-13 Nippon Kogaku Kk <Nikon> 光学系の検査装置
JPS5928640A (ja) * 1982-08-10 1984-02-15 Tokyo Optical Co Ltd レンズメ−タ−及びそれに使用されるタ−ゲツト板
JPS5928639A (ja) * 1982-08-10 1984-02-15 Tokyo Optical Co Ltd レンズメ−タ−及びレンズメ−タ−用タ−ゲツト板
JPS6091241A (ja) * 1983-10-26 1985-05-22 Matsushita Electric Ind Co Ltd 薄膜の屈折率測定装置
DE3635689A1 (de) * 1986-10-21 1988-05-05 Messerschmitt Boelkow Blohm Verfahren zur vermessung der optischen achse eines leitstrahlprojektors und einrichtung zur durchfuehrung des verfahrens

Also Published As

Publication number Publication date
JPS5729922A (en) 1982-02-18

Similar Documents

Publication Publication Date Title
JP5559840B2 (ja) 画像センサのチルトを求めるための方法
JP4531965B2 (ja) 振れ検出装置、振れ検出装置付き回転レーザ装置及び振れ検出補正装置付き位置測定設定システム
US8913234B2 (en) Measurement of the positions of centres of curvature of optical surfaces of a multi-lens optical system
US4281926A (en) Method and means for analyzing sphero-cylindrical optical systems
US4410268A (en) Apparatus for automatically measuring the characteristics of an optical system
JPS6233541B2 (ko)
JP3921004B2 (ja) 変位傾斜測定装置
JPH02165029A (ja) 光導波路の光軸の位置を調べる方法および装置
JPH0124251B2 (ko)
US4627722A (en) Method and apparatus for optically measuring three-dimensional coordinates
JPH0365488B2 (ko)
US7212294B2 (en) Method for determination of the level of two or more measurement points, and an arrangement for this purpose
JPS60142204A (ja) 物体の寸法計測方法
JPS581120A (ja) テレセントリツク光線を発生する装置および物体の寸法または位置を測定する方法
CN110609289B (zh) 一种运动性能测试装置
JPH0117093B2 (ko)
JPS6341017B2 (ko)
JPH0310898B2 (ko)
JPH0580611B2 (ko)
JPH08159915A (ja) 非球面レンズの偏心測定装置およびその偏心測定方法
JPH03186709A (ja) 光学式形状測定方法
JP2675051B2 (ja) 光学式非接触位置測定装置
JPH0634344A (ja) 表面の曲率を測定する装置および方法
JP2000131192A (ja) レンズメータ
JPS60211302A (ja) 倒れ測定装置