JPH01144852U - - Google Patents

Info

Publication number
JPH01144852U
JPH01144852U JP3020689U JP3020689U JPH01144852U JP H01144852 U JPH01144852 U JP H01144852U JP 3020689 U JP3020689 U JP 3020689U JP 3020689 U JP3020689 U JP 3020689U JP H01144852 U JPH01144852 U JP H01144852U
Authority
JP
Japan
Prior art keywords
wavelength
ray
sample surface
scanning
sample
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP3020689U
Other languages
English (en)
Japanese (ja)
Other versions
JPH0345176Y2 (fr
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP3020689U priority Critical patent/JPH0345176Y2/ja
Publication of JPH01144852U publication Critical patent/JPH01144852U/ja
Application granted granted Critical
Publication of JPH0345176Y2 publication Critical patent/JPH0345176Y2/ja
Expired legal-status Critical Current

Links

Landscapes

  • Analysing Materials By The Use Of Radiation (AREA)
JP3020689U 1989-03-16 1989-03-16 Expired JPH0345176Y2 (fr)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP3020689U JPH0345176Y2 (fr) 1989-03-16 1989-03-16

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP3020689U JPH0345176Y2 (fr) 1989-03-16 1989-03-16

Publications (2)

Publication Number Publication Date
JPH01144852U true JPH01144852U (fr) 1989-10-04
JPH0345176Y2 JPH0345176Y2 (fr) 1991-09-24

Family

ID=31255068

Family Applications (1)

Application Number Title Priority Date Filing Date
JP3020689U Expired JPH0345176Y2 (fr) 1989-03-16 1989-03-16

Country Status (1)

Country Link
JP (1) JPH0345176Y2 (fr)

Also Published As

Publication number Publication date
JPH0345176Y2 (fr) 1991-09-24

Similar Documents

Publication Publication Date Title
JP3488843B2 (ja) X線分光装置及びxafs測定装置
JPH01144852U (fr)
JP2564896B2 (ja) X線分光マッピング装置
JPS6354058U (fr)
JPS6319250U (fr)
JP2658127B2 (ja) 薄層のx線分光分析方法
JPS63107848U (fr)
JP2727691B2 (ja) X線吸収端微細構造分析装置
JP2001091448A (ja) 分析装置
JPH0453549U (fr)
JPS6381245U (fr)
JPS6385860U (fr)
JPH01173661U (fr)
JPH01142850U (fr)
JPS5837365Y2 (ja) Ct装置
JPH02304400A (ja) X線分光装置
JPS6423864U (fr)
JPS6356556U (fr)
JP2584946Y2 (ja) 蛍光x線分析装置
JPH02150555U (fr)
Wooster et al. A two-crystal Weissenberg X-ray goniometer
JPH02102651U (fr)
JPS63151843A (ja) X線分析用試料ホルダ−
JPS61114757U (fr)
JPH01146103U (fr)