JPH01140179U - - Google Patents

Info

Publication number
JPH01140179U
JPH01140179U JP3647388U JP3647388U JPH01140179U JP H01140179 U JPH01140179 U JP H01140179U JP 3647388 U JP3647388 U JP 3647388U JP 3647388 U JP3647388 U JP 3647388U JP H01140179 U JPH01140179 U JP H01140179U
Authority
JP
Japan
Prior art keywords
socket
electrode
contact
contact pin
pin
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP3647388U
Other languages
Japanese (ja)
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP3647388U priority Critical patent/JPH01140179U/ja
Publication of JPH01140179U publication Critical patent/JPH01140179U/ja
Pending legal-status Critical Current

Links

Landscapes

  • Testing Of Individual Semiconductor Devices (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)

Description

【図面の簡単な説明】[Brief explanation of the drawing]

第1図は選別特性試験治具に実装された本考案
の一実施例の斜視図、第2図は選別特性試験治具
に実装された従来例の斜視図である。 1……コンタクトピン、1a……ピン嵌入部分
、2……ピン支持台、4……ソケツト、5……(
ピンセツト等の)把持部、6……ピンセツト。
FIG. 1 is a perspective view of an embodiment of the present invention mounted on a sorting characteristic testing jig, and FIG. 2 is a perspective view of a conventional example mounted on a sorting characteristic testing jig. 1...Contact pin, 1a...Pin insertion part, 2...Pin support base, 4...Socket, 5...(
(tweezers, etc.) gripping part, 6...tweezers.

Claims (1)

【実用新案登録請求の範囲】[Scope of utility model registration request] 電極接触用コンタクトピンが、その基部をピン
支持台のソケツトに着脱可能に嵌入し、その先端
部を集積回路の電極部に接触せしめる構造の測定
治具において、前記コンタクトピンがソケツト嵌
入状態で、ソケツト外になる部分にフランジ状の
凸部を有し、ピンセツト等把持部としていること
を特徴とする集積回路用測定治具。
In a measurement jig having a structure in which a contact pin for contacting an electrode is removably inserted at its base into a socket of a pin support base, and its tip is brought into contact with an electrode part of an integrated circuit, when the contact pin is inserted into the socket, A measuring jig for integrated circuits, characterized in that it has a flange-like convex part on the outside of the socket and serves as a gripping part for tweezers or the like.
JP3647388U 1988-03-18 1988-03-18 Pending JPH01140179U (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP3647388U JPH01140179U (en) 1988-03-18 1988-03-18

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP3647388U JPH01140179U (en) 1988-03-18 1988-03-18

Publications (1)

Publication Number Publication Date
JPH01140179U true JPH01140179U (en) 1989-09-26

Family

ID=31263075

Family Applications (1)

Application Number Title Priority Date Filing Date
JP3647388U Pending JPH01140179U (en) 1988-03-18 1988-03-18

Country Status (1)

Country Link
JP (1) JPH01140179U (en)

Similar Documents

Publication Publication Date Title
JPH01140179U (en)
JPH02103283U (en)
JPS6363772U (en)
JPS61135489U (en)
JPH0457776U (en)
JPS6440069U (en)
JPS649380U (en)
JPS6184874U (en)
JPS60185245U (en) Specimen holding device
JPS61157869U (en)
JPH01110385U (en)
JPH01171367U (en)
JPH01118369U (en)
JPH0271983U (en)
JPH01134263U (en)
JPS6176362U (en)
JPS6351289U (en)
JPH0175883U (en)
JPH0459147U (en)
JPS62176770U (en)
JPH0470745U (en)
JPS63195276U (en)
JPH01154480U (en)
JPH0244281U (en)
JPH0263479U (en)