JPH0112187Y2 - - Google Patents

Info

Publication number
JPH0112187Y2
JPH0112187Y2 JP1981028276U JP2827681U JPH0112187Y2 JP H0112187 Y2 JPH0112187 Y2 JP H0112187Y2 JP 1981028276 U JP1981028276 U JP 1981028276U JP 2827681 U JP2827681 U JP 2827681U JP H0112187 Y2 JPH0112187 Y2 JP H0112187Y2
Authority
JP
Japan
Prior art keywords
light
image
cell
polarizer
cells
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
JP1981028276U
Other languages
English (en)
Japanese (ja)
Other versions
JPS57139855U (enrdf_load_stackoverflow
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP1981028276U priority Critical patent/JPH0112187Y2/ja
Publication of JPS57139855U publication Critical patent/JPS57139855U/ja
Application granted granted Critical
Publication of JPH0112187Y2 publication Critical patent/JPH0112187Y2/ja
Expired legal-status Critical Current

Links

Landscapes

  • Investigating Or Analysing Materials By Optical Means (AREA)
  • Investigating Or Analysing Biological Materials (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
JP1981028276U 1981-02-27 1981-02-27 Expired JPH0112187Y2 (enrdf_load_stackoverflow)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP1981028276U JPH0112187Y2 (enrdf_load_stackoverflow) 1981-02-27 1981-02-27

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP1981028276U JPH0112187Y2 (enrdf_load_stackoverflow) 1981-02-27 1981-02-27

Publications (2)

Publication Number Publication Date
JPS57139855U JPS57139855U (enrdf_load_stackoverflow) 1982-09-01
JPH0112187Y2 true JPH0112187Y2 (enrdf_load_stackoverflow) 1989-04-10

Family

ID=29825936

Family Applications (1)

Application Number Title Priority Date Filing Date
JP1981028276U Expired JPH0112187Y2 (enrdf_load_stackoverflow) 1981-02-27 1981-02-27

Country Status (1)

Country Link
JP (1) JPH0112187Y2 (enrdf_load_stackoverflow)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US11448563B2 (en) 2017-10-31 2022-09-20 Tohoku University Force measurement method, force measurement device, force measurement system, force measurement program, and recording medium

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2012037507A (ja) * 2010-07-13 2012-02-23 Spectr Design Kk 流動状物品の異物検査方法及び装置

Family Cites Families (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS4960578A (enrdf_load_stackoverflow) * 1972-10-09 1974-06-12

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US11448563B2 (en) 2017-10-31 2022-09-20 Tohoku University Force measurement method, force measurement device, force measurement system, force measurement program, and recording medium

Also Published As

Publication number Publication date
JPS57139855U (enrdf_load_stackoverflow) 1982-09-01

Similar Documents

Publication Publication Date Title
US4515445A (en) Optical system for transmitted-light microscopy with incident illumination
CN1087424A (zh) 检测的玻璃中缺陷
GB2056059A (en) A method of assessing the quality of a system comprising a wiper blade and the surface of a windscreen
ATE88560T1 (de) Anordnung zur optischen erfassung raeumlicher unebenheiten in der struktur eines zu untersuchenden objekts.
JP3520356B2 (ja) 磁気ディスクの磁気膜欠陥検査装置
JPH0112187Y2 (enrdf_load_stackoverflow)
JP3365474B2 (ja) 偏光性イメージング装置
JPH11108838A (ja) 濁度測定方法および濁度測定器
CN100460861C (zh) 大角小角兼备的时间分辨二维激光光散射仪
JPH03289504A (ja) 気泡計測装置
JPH0118370B2 (enrdf_load_stackoverflow)
CN109470145A (zh) 偏振调制高分辨力立体视觉测量系统与方法
JP3034390B2 (ja) 透明板の内部欠陥検査方法及びそのための試料台
SU1449842A1 (ru) Способ измерени радиуса кривизны сферической поверхности оптической детали
JPH08297096A (ja) 透明板状体の品質検査装置
CN116793996A (zh) 一种基于扫描方式实现的高通量spr检测装置
JPS5886509U (ja) 表面検査装置
SU124191A1 (ru) Двойной микроскоп с пол ризационной оптикой
KR910007629Y1 (ko) 렌즈 초점거리 측정장치
JPH10300442A (ja) 形状計測装置
RU2032166C1 (ru) Способ определения показателя преломления клиновидных образцов
JPS5846152U (ja) 結晶方位測定装置
SU391411A1 (ru) Способ измерения зеркальной составляющей
JPS6138506A (ja) 干渉計測機におけるフオ−カシングポイント判別方法
JPS61175513A (ja) 欠陥検査方法及びその装置