JPH01118382U - - Google Patents

Info

Publication number
JPH01118382U
JPH01118382U JP1144988U JP1144988U JPH01118382U JP H01118382 U JPH01118382 U JP H01118382U JP 1144988 U JP1144988 U JP 1144988U JP 1144988 U JP1144988 U JP 1144988U JP H01118382 U JPH01118382 U JP H01118382U
Authority
JP
Japan
Prior art keywords
station
test
setting
tests
semiconductor device
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP1144988U
Other languages
Japanese (ja)
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP1144988U priority Critical patent/JPH01118382U/ja
Publication of JPH01118382U publication Critical patent/JPH01118382U/ja
Pending legal-status Critical Current

Links

Landscapes

  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)
  • Tests Of Electronic Circuits (AREA)

Description

【図面の簡単な説明】[Brief explanation of the drawing]

第1図は本考案の一実施例のブロツク図、第2
図は第1図の実施例のタイミングチヤート、第3
図は従来の装置のタイミングチヤートである。 1……テストステーシヨン1、2……テストス
テーシヨン2、3……ステーシヨン切換部、4…
…中央処理部、5……テスト回数設定部、6……
データレベル設定電源部。
Fig. 1 is a block diagram of an embodiment of the present invention;
The figure shows the timing chart of the embodiment shown in Fig. 1, and the timing chart of the embodiment shown in Fig. 3.
The figure is a timing chart of a conventional device. 1...Test station 1, 2...Test station 2, 3...Station switching section, 4...
...Central processing section, 5...Test number setting section, 6...
Data level setting power supply section.

Claims (1)

【実用新案登録請求の範囲】[Scope of utility model registration request] 複数のテストステーシヨンを持つ半導体素子の
試験装置において、各ステーシヨン毎のテスト回
数を設定するテスト回数設定部を有し、ステーシ
ヨン毎に異なつたテスト進行速度を設定できる機
能を有することを特徴とする半導体素子の試験装
置。
A semiconductor device testing apparatus having a plurality of test stations, characterized by having a test number setting section for setting the number of tests for each station, and having a function of setting different test progress speeds for each station. Element testing equipment.
JP1144988U 1988-01-29 1988-01-29 Pending JPH01118382U (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP1144988U JPH01118382U (en) 1988-01-29 1988-01-29

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP1144988U JPH01118382U (en) 1988-01-29 1988-01-29

Publications (1)

Publication Number Publication Date
JPH01118382U true JPH01118382U (en) 1989-08-10

Family

ID=31220014

Family Applications (1)

Application Number Title Priority Date Filing Date
JP1144988U Pending JPH01118382U (en) 1988-01-29 1988-01-29

Country Status (1)

Country Link
JP (1) JPH01118382U (en)

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