JP7841373B2 - 検眼装置および検眼プログラム - Google Patents

検眼装置および検眼プログラム

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Publication number
JP7841373B2
JP7841373B2 JP2022107533A JP2022107533A JP7841373B2 JP 7841373 B2 JP7841373 B2 JP 7841373B2 JP 2022107533 A JP2022107533 A JP 2022107533A JP 2022107533 A JP2022107533 A JP 2022107533A JP 7841373 B2 JP7841373 B2 JP 7841373B2
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Japan
Prior art keywords
eye
distance
objective
refractive power
measurement
Prior art date
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Active
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JP2022107533A
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English (en)
Japanese (ja)
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JP2024006535A (ja
JP2024006535A5 (https=
Inventor
尋久 寺部
妙子 堀野
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Nidek Co Ltd
Original Assignee
Nidek Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
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Publication date
Application filed by Nidek Co Ltd filed Critical Nidek Co Ltd
Priority to JP2022107533A priority Critical patent/JP7841373B2/ja
Publication of JP2024006535A publication Critical patent/JP2024006535A/ja
Publication of JP2024006535A5 publication Critical patent/JP2024006535A5/ja
Application granted granted Critical
Publication of JP7841373B2 publication Critical patent/JP7841373B2/ja
Active legal-status Critical Current
Anticipated expiration legal-status Critical

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  • Eye Examination Apparatus (AREA)
JP2022107533A 2022-07-04 2022-07-04 検眼装置および検眼プログラム Active JP7841373B2 (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP2022107533A JP7841373B2 (ja) 2022-07-04 2022-07-04 検眼装置および検眼プログラム

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2022107533A JP7841373B2 (ja) 2022-07-04 2022-07-04 検眼装置および検眼プログラム

Publications (3)

Publication Number Publication Date
JP2024006535A JP2024006535A (ja) 2024-01-17
JP2024006535A5 JP2024006535A5 (https=) 2025-05-13
JP7841373B2 true JP7841373B2 (ja) 2026-04-07

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ID=89540277

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2022107533A Active JP7841373B2 (ja) 2022-07-04 2022-07-04 検眼装置および検眼プログラム

Country Status (1)

Country Link
JP (1) JP7841373B2 (https=)

Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2000241118A (ja) 1999-02-22 2000-09-08 Nidek Co Ltd 眼位置測定装置
JP2001340298A (ja) 2000-05-30 2001-12-11 Nikon Corp 眼屈折力測定装置
JP2004229769A (ja) 2003-01-29 2004-08-19 Nidek Co Ltd 検眼装置

Family Cites Families (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6399835A (ja) * 1987-05-29 1988-05-02 株式会社 ニデック 自覚式眼屈折力測定装置

Patent Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2000241118A (ja) 1999-02-22 2000-09-08 Nidek Co Ltd 眼位置測定装置
JP2001340298A (ja) 2000-05-30 2001-12-11 Nikon Corp 眼屈折力測定装置
JP2004229769A (ja) 2003-01-29 2004-08-19 Nidek Co Ltd 検眼装置

Also Published As

Publication number Publication date
JP2024006535A (ja) 2024-01-17

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