JP7787804B2 - ナノワイヤデバイス - Google Patents

ナノワイヤデバイス

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Publication number
JP7787804B2
JP7787804B2 JP2022502585A JP2022502585A JP7787804B2 JP 7787804 B2 JP7787804 B2 JP 7787804B2 JP 2022502585 A JP2022502585 A JP 2022502585A JP 2022502585 A JP2022502585 A JP 2022502585A JP 7787804 B2 JP7787804 B2 JP 7787804B2
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layer
nanowires
nanopyramids
graphene
substrate
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Japanese (ja)
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JP2022541490A5 (https=
JP2022541490A (ja
Inventor
ムンシ、マジィド
ヴェマン、ヘルゲ
エル デーラージ、ダサ
オヴェ エム フィムランド、ビョルン
ヴィゲン、レイダルフ
バリエト、デイビッド
Original Assignee
クラヨナノ エーエス
ノルウェージャン ユニバーシティ オブ サイエンス アンド テクノロジー(エヌティーエヌユー)
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    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10HINORGANIC LIGHT-EMITTING SEMICONDUCTOR DEVICES HAVING POTENTIAL BARRIERS
    • H10H20/00Individual inorganic light-emitting semiconductor devices having potential barriers, e.g. light-emitting diodes [LED]
    • H10H20/80Constructional details
    • H10H20/81Bodies
    • H10H20/813Bodies having a plurality of light-emitting regions, e.g. multi-junction LEDs or light-emitting devices having photoluminescent regions within the bodies
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    • H10F71/00Manufacture or treatment of devices covered by this subclass
    • H10F71/127The active layers comprising only Group III-V materials, e.g. GaAs or InP
    • H10F71/1272The active layers comprising only Group III-V materials, e.g. GaAs or InP comprising at least three elements, e.g. GaAlAs or InGaAsP
    • H10F71/1274The active layers comprising only Group III-V materials, e.g. GaAs or InP comprising at least three elements, e.g. GaAlAs or InGaAsP comprising nitrides, e.g. InGaN or InGaAlN
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    • H10F71/127The active layers comprising only Group III-V materials, e.g. GaAs or InP
    • H10F71/1276The active layers comprising only Group III-V materials, e.g. GaAs or InP comprising growth substrates not made of Group III-V materials
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    • H10F77/10Semiconductor bodies
    • H10F77/12Active materials
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    • H10F77/10Semiconductor bodies
    • H10F77/12Active materials
    • H10F77/124Active materials comprising only Group III-V materials, e.g. GaAs
    • H10F77/1248Active materials comprising only Group III-V materials, e.g. GaAs having three or more elements, e.g. GaAlAs, InGaAs or InGaAsP
    • H10F77/12485Active materials comprising only Group III-V materials, e.g. GaAs having three or more elements, e.g. GaAlAs, InGaAs or InGaAsP comprising nitride compounds, e.g. InGaN
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    • H10F77/10Semiconductor bodies
    • H10F77/14Shape of semiconductor bodies; Shapes, relative sizes or dispositions of semiconductor regions within semiconductor bodies
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    • H10H20/01Manufacture or treatment
    • H10H20/011Manufacture or treatment of bodies, e.g. forming semiconductor layers
    • H10H20/013Manufacture or treatment of bodies, e.g. forming semiconductor layers having light-emitting regions comprising only Group III-V materials
    • H10H20/0133Manufacture or treatment of bodies, e.g. forming semiconductor layers having light-emitting regions comprising only Group III-V materials with a substrate not being Group III-V materials
    • H10H20/01335Manufacture or treatment of bodies, e.g. forming semiconductor layers having light-emitting regions comprising only Group III-V materials with a substrate not being Group III-V materials the light-emitting regions comprising nitride materials
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    • H10H20/821Bodies characterised by their shape, e.g. curved or truncated substrates of the light-emitting regions, e.g. non-planar junctions
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    • H10H20/80Constructional details
    • H10H20/81Bodies
    • H10H20/822Materials of the light-emitting regions
    • H10H20/824Materials of the light-emitting regions comprising only Group III-V materials, e.g. GaP
    • H10H20/825Materials of the light-emitting regions comprising only Group III-V materials, e.g. GaP containing nitrogen, e.g. GaN
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    • H10P14/00Formation of materials, e.g. in the shape of layers or pillars
    • H10P14/20Formation of materials, e.g. in the shape of layers or pillars of semiconductor materials
    • H10P14/22Formation of materials, e.g. in the shape of layers or pillars of semiconductor materials using physical deposition, e.g. vacuum deposition or sputtering
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    • H10P14/271Formation of materials, e.g. in the shape of layers or pillars of semiconductor materials using selective deposition, e.g. simultaneous growth of monocrystalline and non-monocrystalline semiconductor materials characterised by the preparation of substrate for selective deposition
    • H10P14/272Formation of materials, e.g. in the shape of layers or pillars of semiconductor materials using selective deposition, e.g. simultaneous growth of monocrystalline and non-monocrystalline semiconductor materials characterised by the preparation of substrate for selective deposition using mask materials other than SiO2 or SiN
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    • H10P14/27Formation of materials, e.g. in the shape of layers or pillars of semiconductor materials using selective deposition, e.g. simultaneous growth of monocrystalline and non-monocrystalline semiconductor materials
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    • H10P14/2907Materials being Group IIIA-VA materials
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    • H10P14/32Formation of materials, e.g. in the shape of layers or pillars of semiconductor materials characterised by intermediate layers between substrates and deposited layers
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    • H10P14/32Formation of materials, e.g. in the shape of layers or pillars of semiconductor materials characterised by intermediate layers between substrates and deposited layers
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    • H10P14/34Deposited materials, e.g. layers
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    • H10P14/34Deposited materials, e.g. layers
    • H10P14/3451Structure
    • H10P14/3452Microstructure
    • H10P14/3462Nanowires
    • YGENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y02TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
    • Y02EREDUCTION OF GREENHOUSE GAS [GHG] EMISSIONS, RELATED TO ENERGY GENERATION, TRANSMISSION OR DISTRIBUTION
    • Y02E10/00Energy generation through renewable energy sources
    • Y02E10/50Photovoltaic [PV] energy
    • Y02E10/544Solar cells from Group III-V materials

Landscapes

  • Crystals, And After-Treatments Of Crystals (AREA)
  • Led Devices (AREA)
  • Chemical & Material Sciences (AREA)
  • Chemical Vapour Deposition (AREA)
  • Electrodes Of Semiconductors (AREA)
  • Photovoltaic Devices (AREA)
  • Recrystallisation Techniques (AREA)
  • Crystallography & Structural Chemistry (AREA)
  • Engineering & Computer Science (AREA)
  • Nanotechnology (AREA)
JP2022502585A 2019-07-16 2020-07-16 ナノワイヤデバイス Active JP7787804B2 (ja)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
GBGB1910170.8A GB201910170D0 (en) 2019-07-16 2019-07-16 Nanowire device
GB1910170.8 2019-07-16
PCT/EP2020/070228 WO2021009325A1 (en) 2019-07-16 2020-07-16 Nanowire device

Publications (3)

Publication Number Publication Date
JP2022541490A JP2022541490A (ja) 2022-09-26
JP2022541490A5 JP2022541490A5 (https=) 2023-07-12
JP7787804B2 true JP7787804B2 (ja) 2025-12-17

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Country Status (9)

Country Link
US (1) US20220262978A1 (https=)
EP (1) EP4000089A1 (https=)
JP (1) JP7787804B2 (https=)
KR (1) KR20220068218A (https=)
CN (1) CN114207778A (https=)
CA (1) CA3147488A1 (https=)
GB (1) GB201910170D0 (https=)
TW (1) TW202116664A (https=)
WO (1) WO2021009325A1 (https=)

Families Citing this family (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN111682061B (zh) * 2020-05-18 2021-12-31 华为技术有限公司 氮化物外延片及其制备方法和半导体器件
CN112071967B (zh) * 2020-11-16 2021-02-26 至芯半导体(杭州)有限公司 紫外led结构及其制备方法
KR102947899B1 (ko) * 2021-01-27 2026-04-03 삼성디스플레이 주식회사 발광 소자, 발광 소자를 포함하는 발광 소자 유닛, 및 표시 장치
KR20230114631A (ko) 2022-01-25 2023-08-01 삼성전자주식회사 나노 로드 발광 다이오드, 디스플레이 장치 및 제조 방법
GB202212397D0 (en) 2022-08-25 2022-10-12 Crayonano As Nanowire device with mask layer
GB202212395D0 (en) 2022-08-25 2022-10-12 Crayonano As Nanostructure/Microstructure device
GB2626352A (en) * 2023-01-19 2024-07-24 Paragraf Ltd A method of patterning a two-dimensional material for use in the manufacture of an electronic device
CN116463627B (zh) * 2023-04-18 2024-03-15 陕西科技大学 一种磷化铟纳米线及其制备方法
DE102023113584A1 (de) * 2023-05-24 2024-11-28 Ams-Osram International Gmbh Optoelektronisches halbleiterbauelement und verfahren zur herstellung eines optoelektronischen halbleiterbauelements
CN117334774A (zh) * 2023-10-31 2024-01-02 华南师范大学 InGaN基双波长光电探测外延晶片、制备方法和光触发布尔逻辑门器件

Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20130187128A1 (en) 2010-10-07 2013-07-25 Snu R&Db Foundation Light-emitting element and method for manufacturing same
US20150221823A1 (en) 2014-02-03 2015-08-06 Samsung Electronics Co., Ltd. Semiconductor light emitting device
JP2018521516A (ja) 2015-07-13 2018-08-02 クラヨナノ エーエス ナノワイヤ/ナノピラミッド型発光ダイオード及び光検出器
WO2019099461A1 (en) 2017-11-14 2019-05-23 Massachusetts Institute Of Technology Epitaxial growth and transfer via patterned two-dimensional (2d) layers

Family Cites Families (18)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US7968359B2 (en) * 2006-03-10 2011-06-28 Stc.Unm Thin-walled structures
US8415682B2 (en) * 2007-12-28 2013-04-09 Rohm Co., Ltd. Light emitting semiconductor device having an improved outward luminosity efficiency and fabrication method for the light emitting semiconductor device
EP2357676A4 (en) * 2008-10-17 2013-05-29 Univ Hokkaido Nat Univ Corp SEMICONDUCTOR LIGHT ELEMENT ARRAY AND MANUFACTURING METHOD THEREFOR
US20110175126A1 (en) * 2010-01-15 2011-07-21 Hung-Chih Yang Light-emitting diode structure
GB201021112D0 (en) 2010-12-13 2011-01-26 Ntnu Technology Transfer As Nanowires
US9024310B2 (en) * 2011-01-12 2015-05-05 Tsinghua University Epitaxial structure
KR20120083084A (ko) * 2011-01-17 2012-07-25 삼성엘이디 주식회사 나노 로드 발광 소자 및 그 제조 방법
GB201200355D0 (en) 2012-01-10 2012-02-22 Norwegian Univ Sci & Tech Ntnu Nanowires
KR101967836B1 (ko) * 2012-12-14 2019-04-10 삼성전자주식회사 3차원 발광 소자 및 그 제조방법
KR101898679B1 (ko) * 2012-12-14 2018-10-04 삼성전자주식회사 나노구조 발광소자
KR101603207B1 (ko) * 2013-01-29 2016-03-14 삼성전자주식회사 나노구조 반도체 발광소자 제조방법
US9530643B2 (en) * 2015-03-12 2016-12-27 International Business Machines Corporation Selective epitaxy using epitaxy-prevention layers
US10347791B2 (en) * 2015-07-13 2019-07-09 Crayonano As Nanowires or nanopyramids grown on graphitic substrate
CN119349566A (zh) 2015-09-08 2025-01-24 麻省理工学院 基于石墨烯的层转移的系统和方法
DE102016114992A1 (de) * 2016-08-12 2018-02-15 Osram Opto Semiconductors Gmbh Optoelektronischer Halbleiterchip
JP2018152413A (ja) * 2017-03-10 2018-09-27 株式会社東芝 半導体装置及びその製造方法
KR102578825B1 (ko) * 2017-10-31 2023-09-15 삼성전자주식회사 전자소자용 전도성 복합구조체 , 그 제조방법, 이를 포함하는 전자소자용 전극 및 전자소자
CN108807617A (zh) * 2018-06-30 2018-11-13 华南理工大学 生长在硅/石墨烯复合衬底上的GaN基纳米柱LED外延片及其制备方法

Patent Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20130187128A1 (en) 2010-10-07 2013-07-25 Snu R&Db Foundation Light-emitting element and method for manufacturing same
US20150221823A1 (en) 2014-02-03 2015-08-06 Samsung Electronics Co., Ltd. Semiconductor light emitting device
JP2018521516A (ja) 2015-07-13 2018-08-02 クラヨナノ エーエス ナノワイヤ/ナノピラミッド型発光ダイオード及び光検出器
WO2019099461A1 (en) 2017-11-14 2019-05-23 Massachusetts Institute Of Technology Epitaxial growth and transfer via patterned two-dimensional (2d) layers

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