JP7783297B2 - 異常診断装置、異常診断システム、及び記憶媒体 - Google Patents

異常診断装置、異常診断システム、及び記憶媒体

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Publication number
JP7783297B2
JP7783297B2 JP2023562049A JP2023562049A JP7783297B2 JP 7783297 B2 JP7783297 B2 JP 7783297B2 JP 2023562049 A JP2023562049 A JP 2023562049A JP 2023562049 A JP2023562049 A JP 2023562049A JP 7783297 B2 JP7783297 B2 JP 7783297B2
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JP
Japan
Prior art keywords
anomaly
abnormality
data
anomaly detection
unit
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Active
Application number
JP2023562049A
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English (en)
Japanese (ja)
Other versions
JPWO2023089773A5 (cg-RX-API-DMAC7.html
JPWO2023089773A1 (cg-RX-API-DMAC7.html
Inventor
蓮成 胡
和宏 佐藤
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Fanuc Corp
Original Assignee
Fanuc Corp
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Publication date
Application filed by Fanuc Corp filed Critical Fanuc Corp
Publication of JPWO2023089773A1 publication Critical patent/JPWO2023089773A1/ja
Publication of JPWO2023089773A5 publication Critical patent/JPWO2023089773A5/ja
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Publication of JP7783297B2 publication Critical patent/JP7783297B2/ja
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Classifications

    • G—PHYSICS
    • G05—CONTROLLING; REGULATING
    • G05B—CONTROL OR REGULATING SYSTEMS IN GENERAL; FUNCTIONAL ELEMENTS OF SUCH SYSTEMS; MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS OR ELEMENTS
    • G05B23/00—Testing or monitoring of control systems or parts thereof
    • G05B23/02—Electric testing or monitoring
    • G—PHYSICS
    • G05—CONTROLLING; REGULATING
    • G05B—CONTROL OR REGULATING SYSTEMS IN GENERAL; FUNCTIONAL ELEMENTS OF SUCH SYSTEMS; MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS OR ELEMENTS
    • G05B19/00—Program-control systems
    • G05B19/02—Program-control systems electric
    • G05B19/418—Total factory control, i.e. centrally controlling a plurality of machines, e.g. direct or distributed numerical control [DNC], flexible manufacturing systems [FMS], integrated manufacturing systems [IMS] or computer integrated manufacturing [CIM]
    • G05B19/4184—Total factory control, i.e. centrally controlling a plurality of machines, e.g. direct or distributed numerical control [DNC], flexible manufacturing systems [FMS], integrated manufacturing systems [IMS] or computer integrated manufacturing [CIM] characterised by fault tolerance, reliability of production system

Landscapes

  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Automation & Control Theory (AREA)
  • General Engineering & Computer Science (AREA)
  • Manufacturing & Machinery (AREA)
  • Quality & Reliability (AREA)
  • Testing And Monitoring For Control Systems (AREA)
JP2023562049A 2021-11-19 2021-11-19 異常診断装置、異常診断システム、及び記憶媒体 Active JP7783297B2 (ja)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
PCT/JP2021/042610 WO2023089773A1 (ja) 2021-11-19 2021-11-19 異常診断装置、異常診断システム、及び記憶媒体

Publications (3)

Publication Number Publication Date
JPWO2023089773A1 JPWO2023089773A1 (cg-RX-API-DMAC7.html) 2023-05-25
JPWO2023089773A5 JPWO2023089773A5 (cg-RX-API-DMAC7.html) 2024-08-02
JP7783297B2 true JP7783297B2 (ja) 2025-12-09

Family

ID=86396486

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2023562049A Active JP7783297B2 (ja) 2021-11-19 2021-11-19 異常診断装置、異常診断システム、及び記憶媒体

Country Status (5)

Country Link
US (1) US20250238020A1 (cg-RX-API-DMAC7.html)
JP (1) JP7783297B2 (cg-RX-API-DMAC7.html)
CN (1) CN118215892A (cg-RX-API-DMAC7.html)
DE (1) DE112021008222T5 (cg-RX-API-DMAC7.html)
WO (1) WO2023089773A1 (cg-RX-API-DMAC7.html)

Citations (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2007165721A (ja) 2005-12-15 2007-06-28 Omron Corp プロセス異常分析装置及びプログラム
JP2012138044A (ja) 2010-12-28 2012-07-19 Toshiba Corp プロセス状態監視装置
JP2016012240A (ja) 2014-06-30 2016-01-21 株式会社日立製作所 異常検知システム
JP2018109851A (ja) 2016-12-28 2018-07-12 三菱日立パワーシステムズ株式会社 診断装置、診断方法及びプログラム
JP2019061565A (ja) 2017-09-27 2019-04-18 パナソニック インテレクチュアル プロパティ コーポレーション オブ アメリカＰａｎａｓｏｎｉｃ Ｉｎｔｅｌｌｅｃｔｕａｌ Ｐｒｏｐｅｒｔｙ Ｃｏｒｐｏｒａｔｉｏｎ ｏｆ Ａｍｅｒｉｃａ 異常診断方法および異常診断装置
JP2022176700A (ja) 2021-05-17 2022-11-30 ロザイ工業株式会社 工業炉保全支援システム

Family Cites Families (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH05322603A (ja) * 1992-05-21 1993-12-07 Toshiba Corp プラントの異常検出装置
US10719577B2 (en) * 2014-12-05 2020-07-21 Nec Corporation System analyzing device, system analyzing method and storage medium
WO2019138891A1 (ja) * 2018-01-12 2019-07-18 日本電信電話株式会社 異常箇所特定装置、異常箇所特定方法及びプログラム
JP7016459B2 (ja) * 2020-01-23 2022-02-04 三菱電機株式会社 アノマリ検知装置、アノマリ検知方法及びアノマリ検知プログラム

Patent Citations (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2007165721A (ja) 2005-12-15 2007-06-28 Omron Corp プロセス異常分析装置及びプログラム
JP2012138044A (ja) 2010-12-28 2012-07-19 Toshiba Corp プロセス状態監視装置
JP2016012240A (ja) 2014-06-30 2016-01-21 株式会社日立製作所 異常検知システム
JP2018109851A (ja) 2016-12-28 2018-07-12 三菱日立パワーシステムズ株式会社 診断装置、診断方法及びプログラム
JP2019061565A (ja) 2017-09-27 2019-04-18 パナソニック インテレクチュアル プロパティ コーポレーション オブ アメリカＰａｎａｓｏｎｉｃ Ｉｎｔｅｌｌｅｃｔｕａｌ Ｐｒｏｐｅｒｔｙ Ｃｏｒｐｏｒａｔｉｏｎ ｏｆ Ａｍｅｒｉｃａ 異常診断方法および異常診断装置
JP2022176700A (ja) 2021-05-17 2022-11-30 ロザイ工業株式会社 工業炉保全支援システム

Also Published As

Publication number Publication date
WO2023089773A9 (ja) 2024-03-07
JPWO2023089773A1 (cg-RX-API-DMAC7.html) 2023-05-25
DE112021008222T5 (de) 2024-08-22
CN118215892A (zh) 2024-06-18
WO2023089773A1 (ja) 2023-05-25
US20250238020A1 (en) 2025-07-24

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