JP7632452B2 - クランプ式交流電圧プローブ - Google Patents

クランプ式交流電圧プローブ Download PDF

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Publication number
JP7632452B2
JP7632452B2 JP2022505889A JP2022505889A JP7632452B2 JP 7632452 B2 JP7632452 B2 JP 7632452B2 JP 2022505889 A JP2022505889 A JP 2022505889A JP 2022505889 A JP2022505889 A JP 2022505889A JP 7632452 B2 JP7632452 B2 JP 7632452B2
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Japan
Prior art keywords
clamp
cable
voltage
amplifier
capacitor
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JP2022505889A
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English (en)
Japanese (ja)
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JPWO2021182082A1 (https=
Inventor
正寛 川口
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Nidec Advance Technology Corp
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Nidec Advance Technology Corp
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Publication of JPWO2021182082A1 publication Critical patent/JPWO2021182082A1/ja
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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R15/00—Details of measuring arrangements of the types provided for in groups G01R17/00 - G01R29/00, G01R33/00 - G01R33/26 or G01R35/00
    • G01R15/04—Voltage dividers
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/04—Housings; Supporting members; Arrangements of terminals
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G01R1/06766—Input circuits therefor
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G01R1/06788—Hand-held or hand-manipulated probes, e.g. for oscilloscopes or for portable test instruments
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R15/00—Details of measuring arrangements of the types provided for in groups G01R17/00 - G01R29/00, G01R33/00 - G01R33/26 or G01R35/00
    • G01R15/14—Adaptations providing voltage or current isolation, e.g. for high-voltage or high-current networks
    • G01R15/16—Adaptations providing voltage or current isolation, e.g. for high-voltage or high-current networks using capacitive devices
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R19/00—Arrangements for measuring currents or voltages or for indicating presence or sign thereof
    • G01R19/0084—Measuring voltage only

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  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Measuring Instrument Details And Bridges, And Automatic Balancing Devices (AREA)
  • Measurement Of Current Or Voltage (AREA)
JP2022505889A 2020-03-13 2021-02-22 クランプ式交流電圧プローブ Active JP7632452B2 (ja)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
JP2020044778 2020-03-13
JP2020044778 2020-03-13
PCT/JP2021/006518 WO2021182082A1 (ja) 2020-03-13 2021-02-22 クランプ式交流電圧プローブ

Publications (2)

Publication Number Publication Date
JPWO2021182082A1 JPWO2021182082A1 (https=) 2021-09-16
JP7632452B2 true JP7632452B2 (ja) 2025-02-19

Family

ID=77671612

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2022505889A Active JP7632452B2 (ja) 2020-03-13 2021-02-22 クランプ式交流電圧プローブ

Country Status (5)

Country Link
US (1) US12092662B2 (https=)
JP (1) JP7632452B2 (https=)
CN (1) CN115244409A (https=)
DE (1) DE112021001624T5 (https=)
WO (1) WO2021182082A1 (https=)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
USD1096465S1 (en) * 2024-04-19 2025-10-07 Hopkins Manufacturing Corporation Wire testing device

Citations (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2002090394A (ja) 2000-09-12 2002-03-27 Yokogawa Electric Corp 電圧測定回路及びその校正方法
JP2002271159A (ja) 2001-03-13 2002-09-20 Shibasoku:Kk アッテネータの周波数特性調整回路
JP2010025653A (ja) 2008-07-17 2010-02-04 Hioki Ee Corp 測定装置
JP2013120098A (ja) 2011-12-06 2013-06-17 Irt:Kk 電圧検出装置及び電力検出装置
JP2017032287A (ja) 2015-07-29 2017-02-09 日置電機株式会社 クランプ式センサおよび測定装置
JP2019023627A (ja) 2017-07-10 2019-02-14 テクトロニクス・インコーポレイテッドＴｅｋｔｒｏｎｉｘ，Ｉｎｃ． 試験測定プローブ及び試験測定プローブの校正方法
US20200041549A1 (en) 2018-08-02 2020-02-06 Aclara Technologies, Llc Medium voltage sensor using a multi-component resistive voltage divider

Family Cites Families (12)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4507618A (en) 1982-10-04 1985-03-26 Tektronix, Inc. Compensation method and apparatus for an RC attenuator
JP2850987B2 (ja) * 1991-03-04 1999-01-27 株式会社アドバンテスト 周波数特性校正装置
US6646562B1 (en) * 2002-05-28 2003-11-11 Appa Technology Corp. Hooking-type fully automatic electric meter
JP2010025918A (ja) 2008-06-18 2010-02-04 Hioki Ee Corp 電圧検出装置および線間電圧検出装置
CN103975247B (zh) * 2011-10-07 2016-08-24 弗劳恩霍夫应用研究促进协会 具有虚假峰值拒绝的峰值检测器
US20130208761A1 (en) * 2012-02-14 2013-08-15 General Tools And Instruments Instrument with Non-contact Infrared Temperature Measurement and Current Clamp
WO2013150896A1 (ja) * 2012-04-04 2013-10-10 株式会社村田製作所 磁気検出装置および紙幣識別装置
US10338102B2 (en) * 2012-06-01 2019-07-02 Mitsubishi Electric Corporation Voltage detection device for transforming apparatus
WO2014087469A1 (ja) * 2012-12-03 2014-06-12 三菱電機株式会社 電圧検出装置
JP5687311B2 (ja) * 2013-06-21 2015-03-18 三菱電機株式会社 電圧測定回路
JP6576154B2 (ja) * 2015-08-06 2019-09-18 日置電機株式会社 電圧検出センサおよび測定装置
JP6508163B2 (ja) * 2016-10-31 2019-05-08 横河電機株式会社 電流測定装置

Patent Citations (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2002090394A (ja) 2000-09-12 2002-03-27 Yokogawa Electric Corp 電圧測定回路及びその校正方法
JP2002271159A (ja) 2001-03-13 2002-09-20 Shibasoku:Kk アッテネータの周波数特性調整回路
JP2010025653A (ja) 2008-07-17 2010-02-04 Hioki Ee Corp 測定装置
JP2013120098A (ja) 2011-12-06 2013-06-17 Irt:Kk 電圧検出装置及び電力検出装置
JP2017032287A (ja) 2015-07-29 2017-02-09 日置電機株式会社 クランプ式センサおよび測定装置
JP2019023627A (ja) 2017-07-10 2019-02-14 テクトロニクス・インコーポレイテッドＴｅｋｔｒｏｎｉｘ，Ｉｎｃ． 試験測定プローブ及び試験測定プローブの校正方法
US20200041549A1 (en) 2018-08-02 2020-02-06 Aclara Technologies, Llc Medium voltage sensor using a multi-component resistive voltage divider

Also Published As

Publication number Publication date
JPWO2021182082A1 (https=) 2021-09-16
DE112021001624T5 (de) 2022-12-29
CN115244409A (zh) 2022-10-25
US12092662B2 (en) 2024-09-17
WO2021182082A1 (ja) 2021-09-16
US20230127522A1 (en) 2023-04-27

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