JP7480552B2 - 眼科装置および眼軸長演算プログラム - Google Patents

眼科装置および眼軸長演算プログラム Download PDF

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Publication number
JP7480552B2
JP7480552B2 JP2020060070A JP2020060070A JP7480552B2 JP 7480552 B2 JP7480552 B2 JP 7480552B2 JP 2020060070 A JP2020060070 A JP 2020060070A JP 2020060070 A JP2020060070 A JP 2020060070A JP 7480552 B2 JP7480552 B2 JP 7480552B2
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eye
optical system
anterior
axial length
cross
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JP2021154066A (ja
JP2021154066A5 (enExample
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通浩 滝井
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Nidek Co Ltd
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Nidek Co Ltd
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Priority to JP2020060070A priority Critical patent/JP7480552B2/ja
Priority to EP21165538.6A priority patent/EP3888528A1/en
Priority to CN202110332347.6A priority patent/CN113456017B/zh
Priority to US17/215,327 priority patent/US12133687B2/en
Publication of JP2021154066A publication Critical patent/JP2021154066A/ja
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JP2020060070A 2020-03-30 2020-03-30 眼科装置および眼軸長演算プログラム Active JP7480552B2 (ja)

Priority Applications (4)

Application Number Priority Date Filing Date Title
JP2020060070A JP7480552B2 (ja) 2020-03-30 2020-03-30 眼科装置および眼軸長演算プログラム
EP21165538.6A EP3888528A1 (en) 2020-03-30 2021-03-29 Ophthalmic apparatus
CN202110332347.6A CN113456017B (zh) 2020-03-30 2021-03-29 眼科装置
US17/215,327 US12133687B2 (en) 2020-03-30 2021-03-29 Ophthalmic apparatus

Applications Claiming Priority (1)

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JP2020060070A JP7480552B2 (ja) 2020-03-30 2020-03-30 眼科装置および眼軸長演算プログラム

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JP2021154066A JP2021154066A (ja) 2021-10-07
JP2021154066A5 JP2021154066A5 (enExample) 2023-03-02
JP7480552B2 true JP7480552B2 (ja) 2024-05-10

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Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20230181032A1 (en) * 2021-12-13 2023-06-15 Welch Allyn, Inc. Measurements of keratometry and axial length

Citations (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2001269314A (ja) 2000-03-24 2001-10-02 Topcon Corp 眼特性測定装置
JP2004008768A (ja) 2002-06-10 2004-01-15 Tomey Corporation 眼屈折力測定装置
JP2008188047A (ja) 2007-01-31 2008-08-21 Nidek Co Ltd 眼軸長測定装置
JP2012115575A (ja) 2010-12-02 2012-06-21 Nidek Co Ltd 眼底撮影装置
JP2012249768A (ja) 2011-06-01 2012-12-20 Nidek Co Ltd 前眼部測定装置
JP2014198277A (ja) 2014-08-01 2014-10-23 株式会社ニデック 角膜形状測定装置
JP2014534004A (ja) 2011-10-19 2014-12-18 ノバルティス アーゲー 直接決定された眼内レンズ（ｉｏｌ）位置に基づくｉｏｌ度数の計算
JP2016220860A (ja) 2015-05-28 2016-12-28 株式会社ニデック 眼科測定装置
JP2019013392A (ja) 2017-07-05 2019-01-31 株式会社ニデック 眼科装置、および眼科装置制御プログラム

Family Cites Families (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0659273B2 (ja) * 1987-02-12 1994-08-10 株式会社ニデツク 角膜曲率半径測定装置
JP2763585B2 (ja) * 1989-05-09 1998-06-11 株式会社トプコン 手術眼の前房深度決定装置及びその前房深度決定に用いるテストレンズ装置

Patent Citations (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2001269314A (ja) 2000-03-24 2001-10-02 Topcon Corp 眼特性測定装置
JP2004008768A (ja) 2002-06-10 2004-01-15 Tomey Corporation 眼屈折力測定装置
JP2008188047A (ja) 2007-01-31 2008-08-21 Nidek Co Ltd 眼軸長測定装置
JP2012115575A (ja) 2010-12-02 2012-06-21 Nidek Co Ltd 眼底撮影装置
JP2012249768A (ja) 2011-06-01 2012-12-20 Nidek Co Ltd 前眼部測定装置
JP2014534004A (ja) 2011-10-19 2014-12-18 ノバルティス アーゲー 直接決定された眼内レンズ（ｉｏｌ）位置に基づくｉｏｌ度数の計算
JP2014198277A (ja) 2014-08-01 2014-10-23 株式会社ニデック 角膜形状測定装置
JP2016220860A (ja) 2015-05-28 2016-12-28 株式会社ニデック 眼科測定装置
JP2019013392A (ja) 2017-07-05 2019-01-31 株式会社ニデック 眼科装置、および眼科装置制御プログラム

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