JP7479138B2 - オーバーヘッドサイドライト - Google Patents

オーバーヘッドサイドライト Download PDF

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JP7479138B2
JP7479138B2 JP2019221565A JP2019221565A JP7479138B2 JP 7479138 B2 JP7479138 B2 JP 7479138B2 JP 2019221565 A JP2019221565 A JP 2019221565A JP 2019221565 A JP2019221565 A JP 2019221565A JP 7479138 B2 JP7479138 B2 JP 7479138B2
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wood fiber
fiber web
leds
web
sidelight
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JP2020107605A (ja
JP2020107605A5 (enExample
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リトニエミ ジャリ
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プロセメク オーワイ
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    • HELECTRICITY
    • H04ELECTRIC COMMUNICATION TECHNIQUE
    • H04NPICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N23/00Cameras or camera modules comprising electronic image sensors; Control thereof
    • H04N23/70Circuitry for compensating brightness variation in the scene
    • H04N23/74Circuitry for compensating brightness variation in the scene by influencing the scene brightness using illuminating means
    • HELECTRICITY
    • H05ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05BELECTRIC HEATING; ELECTRIC LIGHT SOURCES NOT OTHERWISE PROVIDED FOR; CIRCUIT ARRANGEMENTS FOR ELECTRIC LIGHT SOURCES, IN GENERAL
    • H05B45/00Circuit arrangements for operating light-emitting diodes [LED]
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84Systems specially adapted for particular applications
    • G01N21/88Investigating the presence of flaws or contamination
    • G01N21/89Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles
    • G01N21/8901Optical details; Scanning details
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84Systems specially adapted for particular applications
    • G01N21/88Investigating the presence of flaws or contamination
    • G01N21/8806Specially adapted optical and illumination features
    • DTEXTILES; PAPER
    • D21PAPER-MAKING; PRODUCTION OF CELLULOSE
    • D21GCALENDERS; ACCESSORIES FOR PAPER-MAKING MACHINES
    • D21G9/00Other accessories for paper-making machines
    • D21G9/0009Paper-making control systems
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/01Arrangements or apparatus for facilitating the optical investigation
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84Systems specially adapted for particular applications
    • G01N21/88Investigating the presence of flaws or contamination
    • G01N21/89Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles
    • G01N21/8901Optical details; Scanning details
    • G01N21/8903Optical details; Scanning details using a multiple detector array
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84Systems specially adapted for particular applications
    • G01N21/88Investigating the presence of flaws or contamination
    • G01N21/89Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles
    • G01N21/8914Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles characterised by the material examined
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84Systems specially adapted for particular applications
    • G01N21/88Investigating the presence of flaws or contamination
    • G01N21/89Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles
    • G01N21/892Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles characterised by the flaw, defect or object feature examined
    • G01N21/8921Streaks
    • GPHYSICS
    • G06COMPUTING OR CALCULATING; COUNTING
    • G06TIMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T7/00Image analysis
    • G06T7/0002Inspection of images, e.g. flaw detection
    • G06T7/0004Industrial image inspection
    • HELECTRICITY
    • H05ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05BELECTRIC HEATING; ELECTRIC LIGHT SOURCES NOT OTHERWISE PROVIDED FOR; CIRCUIT ARRANGEMENTS FOR ELECTRIC LIGHT SOURCES, IN GENERAL
    • H05B33/00Electroluminescent light sources
    • H05B33/02Details
    • HELECTRICITY
    • H05ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05BELECTRIC HEATING; ELECTRIC LIGHT SOURCES NOT OTHERWISE PROVIDED FOR; CIRCUIT ARRANGEMENTS FOR ELECTRIC LIGHT SOURCES, IN GENERAL
    • H05B44/00Circuit arrangements for operating electroluminescent light sources
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84Systems specially adapted for particular applications
    • G01N2021/8444Fibrous material
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84Systems specially adapted for particular applications
    • G01N21/88Investigating the presence of flaws or contamination
    • G01N21/8806Specially adapted optical and illumination features
    • G01N2021/8835Adjustable illumination, e.g. software adjustable screen
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84Systems specially adapted for particular applications
    • G01N21/88Investigating the presence of flaws or contamination
    • G01N21/89Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles
    • G01N21/8901Optical details; Scanning details
    • G01N2021/8908Strip illuminator, e.g. light tube
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84Systems specially adapted for particular applications
    • G01N21/88Investigating the presence of flaws or contamination
    • G01N21/89Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles
    • G01N21/8914Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles characterised by the material examined
    • G01N2021/8917Paper, also ondulated
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84Systems specially adapted for particular applications
    • G01N21/88Investigating the presence of flaws or contamination
    • G01N21/89Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles
    • G01N21/892Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles characterised by the flaw, defect or object feature examined
    • G01N2021/8924Dents; Relief flaws
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2201/00Features of devices classified in G01N21/00
    • G01N2201/06Illumination; Optics
    • G01N2201/062LED's
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2201/00Features of devices classified in G01N21/00
    • G01N2201/06Illumination; Optics
    • G01N2201/063Illuminating optical parts
    • GPHYSICS
    • G06COMPUTING OR CALCULATING; COUNTING
    • G06TIMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T2207/00Indexing scheme for image analysis or image enhancement
    • G06T2207/10Image acquisition modality
    • G06T2207/10141Special mode during image acquisition
    • G06T2207/10152Varying illumination
    • GPHYSICS
    • G06COMPUTING OR CALCULATING; COUNTING
    • G06TIMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T2207/00Indexing scheme for image analysis or image enhancement
    • G06T2207/30Subject of image; Context of image processing
    • G06T2207/30108Industrial image inspection
    • G06T2207/30161Wood; Lumber
    • YGENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y02TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
    • Y02BCLIMATE CHANGE MITIGATION TECHNOLOGIES RELATED TO BUILDINGS, e.g. HOUSING, HOUSE APPLIANCES OR RELATED END-USER APPLICATIONS
    • Y02B20/00Energy efficient lighting technologies, e.g. halogen lamps or gas discharge lamps
    • Y02B20/40Control techniques providing energy savings, e.g. smart controller or presence detection

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  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Pathology (AREA)
  • Immunology (AREA)
  • General Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • Textile Engineering (AREA)
  • Theoretical Computer Science (AREA)
  • Computer Vision & Pattern Recognition (AREA)
  • Quality & Reliability (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Signal Processing (AREA)
  • Optics & Photonics (AREA)
  • Multimedia (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
  • Length Measuring Devices By Optical Means (AREA)
  • Circuit Arrangement For Electric Light Sources In General (AREA)
  • Preliminary Treatment Of Fibers (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
JP2019221565A 2018-12-10 2019-12-06 オーバーヘッドサイドライト Active JP7479138B2 (ja)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
FI20186060 2018-12-10
FI20186060A FI128235B (en) 2018-12-10 2018-12-10 Overhead sidelight

Publications (3)

Publication Number Publication Date
JP2020107605A JP2020107605A (ja) 2020-07-09
JP2020107605A5 JP2020107605A5 (enExample) 2022-12-14
JP7479138B2 true JP7479138B2 (ja) 2024-05-08

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Country Status (9)

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US (1) US11128808B2 (enExample)
EP (1) EP3667302B1 (enExample)
JP (1) JP7479138B2 (enExample)
CN (1) CN111289522A (enExample)
AU (1) AU2019264545A1 (enExample)
BR (1) BR102019026058A2 (enExample)
CA (1) CA3062306A1 (enExample)
FI (1) FI128235B (enExample)
RU (1) RU2019140809A (enExample)

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US11920299B2 (en) 2020-03-06 2024-03-05 Ibs Of America Formation detection system and a process of controlling
CN114324321B (zh) * 2020-09-29 2024-06-18 南京造币有限公司 机器视觉检测控制装置、系统和方法

Citations (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2005214734A (ja) 2004-01-28 2005-08-11 Fuji Xerox Co Ltd 紙皺検査装置、制御装置
US20080170237A1 (en) 2007-01-11 2008-07-17 Wysokowski John P Web planarity gauge and method
CN204188542U (zh) 2014-11-04 2015-03-04 江苏万宝瑞达纸业有限公司 一种用于检测纸张质量的检测记录装置
WO2015045423A1 (ja) 2013-09-30 2015-04-02 セーレン株式会社 斜め照射照明を有する検査装置
WO2017080904A1 (de) 2015-11-11 2017-05-18 Protechna Herbst Gmbh & Co. Kg Vorrichtung und verfahren zur überwachung einer laufenden warenbahn
JP2018159567A (ja) 2017-03-22 2018-10-11 独立行政法人 国立印刷局 異物除去工程を備えた用紙検査方法

Family Cites Families (36)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3513321A (en) * 1967-08-03 1970-05-19 Weyerhaeuser Co Log tally system with minimum diameter measuring means
GB1217642A (en) * 1968-04-08 1970-12-31 Omron Tateisi Electronics Co Improvements in or relating to the photoelectric inspection of sheet materials
US3698818A (en) * 1971-04-27 1972-10-17 Black Clawson Co Log diameter scanner including a plurality of photodetectors
US3890509A (en) * 1972-05-09 1975-06-17 Black Clawson Co Automatic edger set works method and apparatus
US3806253A (en) * 1972-12-13 1974-04-23 Weyerhaeuser Co Sweep measuring scheme
FI56451C (fi) * 1977-10-20 1980-01-10 Ahlstroem Oy Foerfarande och anordning foer maetning av traevirke
US4196648A (en) * 1978-08-07 1980-04-08 Seneca Sawmill Company, Inc. Automatic sawmill apparatus
US4348114A (en) * 1979-12-07 1982-09-07 Ciba-Geigy Ag Method of inspecting coated web material to detect the presence of downlines thereon
US4541722A (en) * 1982-12-13 1985-09-17 Jenksystems, Inc. Contour line scanner
JPS62293145A (ja) * 1986-06-13 1987-12-19 Mitsubishi Heavy Ind Ltd 枚葉印刷機の評価装置
CA1323290C (en) * 1988-09-14 1993-10-19 Aaron U. Jones Method and apparatus for an automatic sawmill
JPH01253641A (ja) * 1988-04-01 1989-10-09 Fuji Photo Film Co Ltd 筋状欠陥弁別処理回路
AT396181B (de) * 1990-12-10 1993-06-25 Sprecher Energie Oesterreich Einrichtung zum erfassen der masse eines gegebenenfalls bewegten gegenstandes
US6122065A (en) * 1996-08-12 2000-09-19 Centre De Recherche Industrielle Du Quebec Apparatus and method for detecting surface defects
FI114337B (fi) * 2001-07-03 2004-09-30 Metso Automation Oy Menetelmä ja mittalaite liikkuvan rainan ainakin yhden ominaisuuden mittaamiseksi
US20040246473A1 (en) * 2003-03-18 2004-12-09 Hermary Terrance John Coded-light dual-view profile scanning apparatus
FI117575B (fi) * 2004-05-27 2006-11-30 Ekspansio Engineering Ltd Oy Puupinnan karheuden tarkastus
CA2514788A1 (en) * 2004-08-06 2006-02-06 John Laurent System and method for the detection of bluestain and rot on wood
WO2006105351A1 (en) * 2005-03-30 2006-10-05 Delta Design, Inc. Led lighting system for line scan camera based multiple data matrix scanners
US7545502B2 (en) * 2006-09-27 2009-06-09 Weyerhaeuser Nr Company Methods for detecting compression wood in lumber
US8374498B2 (en) * 2006-09-29 2013-02-12 Microscan Systems, Inc. Systems and/or devices for camera-based inspections
US8229803B2 (en) * 2007-10-16 2012-07-24 Eb Associates Inc. Systems and methods for tracking lumber in a sawmill
JP5028567B2 (ja) * 2010-07-14 2012-09-19 シーシーエス株式会社 光照射装置及び調光方法
FI20106053A0 (fi) * 2010-10-13 2010-10-13 Metso Automation Oy Järjestelmä rainan tarkkailemiseksi ja vastaava menetelmä rainan tarkkailemiseksi
US8531652B2 (en) * 2011-04-08 2013-09-10 Dri-Mark Products Three way desktop UV counterfeit detector
CN102419665B (zh) * 2011-08-03 2014-06-04 北京汇冠新技术股份有限公司 一种用于触摸屏的扫描方法及扫描系统
FR2983419B1 (fr) * 2011-12-06 2017-05-19 Pellenc Selective Tech Procede et installation d'inspection et/ou de tri combinant analyse de surface et analyse volumique
CN102818809A (zh) * 2012-09-05 2012-12-12 杭州瑞利测控技术有限公司 一种基于机器视觉的坯布疵点在线检测系统及实现方法
EP2865988B1 (de) * 2013-10-22 2018-09-19 Baumer Electric Ag Lichtschnittsensor
CN104458764B (zh) * 2014-12-14 2017-03-22 中国科学技术大学 基于大景深条带图像投影的弯曲粗糙表面缺陷鉴别方法
KR20180009792A (ko) * 2015-06-25 2018-01-29 제이에프이 스틸 가부시키가이샤 표면 결함 검출 장치, 표면 결함 검출 방법 및, 강재의 제조 방법
FI20155643A (fi) * 2015-09-08 2017-03-09 Procemex Oy Ltd Fluoresoivan nesteen optinen havainnointi puukuiturainasta
FI128850B (en) * 2016-05-06 2021-01-29 Procemex Oy Ltd A machine vision method and system for monitoring manufacturing processes
US20180164224A1 (en) * 2016-12-13 2018-06-14 ASA Corporation Apparatus for Photographing Glass in Multiple Layers
CN207135173U (zh) * 2017-05-31 2018-03-23 惠州市纬讯科技有限公司 一种电感侧面图像采集机构
KR102112053B1 (ko) * 2018-08-01 2020-05-18 주식회사 뷰온 이미지 센서를 이용한 표면결함 검사장치 및 검사방법

Patent Citations (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2005214734A (ja) 2004-01-28 2005-08-11 Fuji Xerox Co Ltd 紙皺検査装置、制御装置
US20080170237A1 (en) 2007-01-11 2008-07-17 Wysokowski John P Web planarity gauge and method
WO2015045423A1 (ja) 2013-09-30 2015-04-02 セーレン株式会社 斜め照射照明を有する検査装置
CN204188542U (zh) 2014-11-04 2015-03-04 江苏万宝瑞达纸业有限公司 一种用于检测纸张质量的检测记录装置
WO2017080904A1 (de) 2015-11-11 2017-05-18 Protechna Herbst Gmbh & Co. Kg Vorrichtung und verfahren zur überwachung einer laufenden warenbahn
JP2018159567A (ja) 2017-03-22 2018-10-11 独立行政法人 国立印刷局 異物除去工程を備えた用紙検査方法

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US20200186696A1 (en) 2020-06-11
EP3667302B1 (en) 2025-10-29
JP2020107605A (ja) 2020-07-09
CN111289522A (zh) 2020-06-16
FI20186060A1 (fi) 2020-01-15
RU2019140809A (ru) 2021-06-10
EP3667302C0 (en) 2025-10-29
BR102019026058A2 (pt) 2020-06-23
FI128235B (en) 2020-01-15
CA3062306A1 (en) 2020-06-10
AU2019264545A1 (en) 2020-06-25
EP3667302A1 (en) 2020-06-17
US11128808B2 (en) 2021-09-21

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