JP7407808B2 - 分光学的装置および方法 - Google Patents

分光学的装置および方法 Download PDF

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JP7407808B2
JP7407808B2 JP2021520574A JP2021520574A JP7407808B2 JP 7407808 B2 JP7407808 B2 JP 7407808B2 JP 2021520574 A JP2021520574 A JP 2021520574A JP 2021520574 A JP2021520574 A JP 2021520574A JP 7407808 B2 JP7407808 B2 JP 7407808B2
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spectral data
spline
curve
point
knots
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JP2022504948A (ja
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ジョン エドワード スミス ブライアン
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Renishaw PLC
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Renishaw PLC
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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/62—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
    • G01N21/63—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light optically excited
    • G01N21/65—Raman scattering
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/28—Investigating the spectrum
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2201/00—Features of devices classified in G01N21/00
    • G01N2201/12—Circuits of general importance; Signal processing

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  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Biochemistry (AREA)
  • Analytical Chemistry (AREA)
  • Chemical & Material Sciences (AREA)
  • General Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Nuclear Medicine, Radiotherapy & Molecular Imaging (AREA)
  • Investigating, Analyzing Materials By Fluorescence Or Luminescence (AREA)
  • Spectrometry And Color Measurement (AREA)
JP2021520574A 2018-10-19 2019-10-17 分光学的装置および方法 Active JP7407808B2 (ja)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
GB1817028.2 2018-10-19
GBGB1817028.2A GB201817028D0 (en) 2018-10-19 2018-10-19 Spectroscopic apparatus and methods
PCT/GB2019/052966 WO2020079439A1 (en) 2018-10-19 2019-10-17 Spectroscopic apparatus and methods

Publications (2)

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JP2022504948A JP2022504948A (ja) 2022-01-13
JP7407808B2 true JP7407808B2 (ja) 2024-01-04

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JP2021520574A Active JP7407808B2 (ja) 2018-10-19 2019-10-17 分光学的装置および方法

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US (1) US11927536B2 (zh)
EP (1) EP3867613A1 (zh)
JP (1) JP7407808B2 (zh)
CN (1) CN112888919A (zh)
GB (1) GB201817028D0 (zh)
WO (1) WO2020079439A1 (zh)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN117288739B (zh) * 2023-11-27 2024-02-02 奥谱天成（厦门）光电有限公司 一种非对称的拉曼光谱基线校正方法、装置及储存介质

Citations (5)

* Cited by examiner, † Cited by third party
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JP2001059772A (ja) 1999-08-25 2001-03-06 Jasco Corp ベースライン補正方法
JP2005043271A (ja) 2003-07-24 2005-02-17 Shimadzu Corp データ処理方法及び装置、並びにマイクロチップ電気泳動装置
US20100070280A1 (en) 2008-09-16 2010-03-18 Microsoft Corporation Parameter clustering and sharing for variable-parameter hidden markov models
JP2014514581A (ja) 2011-05-05 2014-06-19 レニショウ パブリック リミテッド カンパニー 多項式フィッティングによるスペクトルデータのバックグラウンド放射線推定
JP2015532977A (ja) 2012-10-25 2015-11-16 レニショウ パブリック リミテッド カンパニーＲｅｎｉｓｈａｗ Ｐｕｂｌｉｃ Ｌｉｍｉｔｅｄ Ｃｏｍｐａｎｙ 分光装置および分光法

Family Cites Families (11)

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Publication number Priority date Publication date Assignee Title
US5442438A (en) 1988-12-22 1995-08-15 Renishaw Plc Spectroscopic apparatus and methods
US5510894A (en) 1988-12-22 1996-04-23 Renishaw Plc Spectroscopic apparatus and methods
US6253164B1 (en) * 1997-12-24 2001-06-26 Silicon Graphics, Inc. Curves and surfaces modeling based on a cloud of points
US6137104A (en) 1998-06-12 2000-10-24 Varian, Inc. Fast automated spectral fitting method
US20060017720A1 (en) * 2004-07-15 2006-01-26 Li You F System and method for 3D measurement and surface reconstruction
US8645090B2 (en) * 2009-05-14 2014-02-04 Agilent Technologies, Inc. Automated baseline removal of signal
US9784621B2 (en) 2011-05-05 2017-10-10 Renishaw Plc Spectroscopic apparatus and methods
EP2525213A1 (en) 2011-05-16 2012-11-21 Renishaw plc Spectroscopic apparatus and methods for determining components present in a sample
GB201616787D0 (en) 2016-10-03 2016-11-16 Renishaw Plc Measurement apparatus and methods
US9996952B1 (en) * 2017-08-13 2018-06-12 Sas Institute Inc. Analytic system for graphical interactive B-spline model selection
US10062190B1 (en) * 2017-08-13 2018-08-28 Sas Institute Inc. Analytic system for graphical interactive basis function selection

Patent Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2001059772A (ja) 1999-08-25 2001-03-06 Jasco Corp ベースライン補正方法
JP2005043271A (ja) 2003-07-24 2005-02-17 Shimadzu Corp データ処理方法及び装置、並びにマイクロチップ電気泳動装置
US20100070280A1 (en) 2008-09-16 2010-03-18 Microsoft Corporation Parameter clustering and sharing for variable-parameter hidden markov models
JP2014514581A (ja) 2011-05-05 2014-06-19 レニショウ パブリック リミテッド カンパニー 多項式フィッティングによるスペクトルデータのバックグラウンド放射線推定
JP2015532977A (ja) 2012-10-25 2015-11-16 レニショウ パブリック リミテッド カンパニーＲｅｎｉｓｈａｗ Ｐｕｂｌｉｃ Ｌｉｍｉｔｅｄ Ｃｏｍｐａｎｙ 分光装置および分光法

Non-Patent Citations (2)

* Cited by examiner, † Cited by third party
Title
WENNI ZHENG; ET AL，FAST B-SPLINE CURVE FITTING BY L-BFGS，COMPUTER AIDED GEOMETRIC DESIGN，NL，2012年10月，VOL:29,NR:7，PAGE(S):448-462，https://doi.org/10.1016/j.cagd.2012.03.004
XIN WANG; ET AL，A BASELINE CORRECTION ALGORITHM FOR RAMAN SPECTROSCOPY BY ADAPTIVE KNOTS B-SPLINE，MEASUREMENT SCIENCE AND TECHNOLOGY，英国，IOP，2015年10月16日，VOL:26, NR:11，PAGE(S):115503(1-7)，http://dx.doi.org/10.1088/0957-0233/26/11/115503

Also Published As

Publication number Publication date
US20210349030A1 (en) 2021-11-11
US11927536B2 (en) 2024-03-12
CN112888919A (zh) 2021-06-01
WO2020079439A1 (en) 2020-04-23
GB201817028D0 (en) 2018-12-05
EP3867613A1 (en) 2021-08-25
JP2022504948A (ja) 2022-01-13

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