JP7396809B2 - 位置依存的な非接触電圧及び電流測定 - Google Patents

位置依存的な非接触電圧及び電流測定 Download PDF

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Publication number
JP7396809B2
JP7396809B2 JP2019089280A JP2019089280A JP7396809B2 JP 7396809 B2 JP7396809 B2 JP 7396809B2 JP 2019089280 A JP2019089280 A JP 2019089280A JP 2019089280 A JP2019089280 A JP 2019089280A JP 7396809 B2 JP7396809 B2 JP 7396809B2
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calibration
electrical parameter
conductor
voltage
measuring device
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JP2019215329A5 (enExample
JP2019215329A (ja
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カール シュミツェル クリスチャン
シュトイアー ロナルド
ロドリゲス リカード
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Fluke Corp
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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R35/00—Testing or calibrating of apparatus covered by the other groups of this subclass
    • G01R35/005—Calibrating; Standards or reference devices, e.g. voltage or resistance standards, "golden" references
    • G01R35/007—Standards or reference devices, e.g. voltage or resistance standards, "golden references"
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R35/00—Testing or calibrating of apparatus covered by the other groups of this subclass
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/04—Housings; Supporting members; Arrangements of terminals
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/20—Modifications of basic electric elements for use in electric measuring instruments; Structural combinations of such elements with such instruments
    • G01R1/22—Tong testers acting as secondary windings of current transformers
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R15/00—Details of measuring arrangements of the types provided for in groups G01R17/00 - G01R29/00, G01R33/00 - G01R33/26 or G01R35/00
    • G01R15/12—Circuits for multi-testers, i.e. multimeters, e.g. for measuring voltage, current, or impedance at will
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R15/00—Details of measuring arrangements of the types provided for in groups G01R17/00 - G01R29/00, G01R33/00 - G01R33/26 or G01R35/00
    • G01R15/14—Adaptations providing voltage or current isolation, e.g. for high-voltage or high-current networks
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R15/00—Details of measuring arrangements of the types provided for in groups G01R17/00 - G01R29/00, G01R33/00 - G01R33/26 or G01R35/00
    • G01R15/14—Adaptations providing voltage or current isolation, e.g. for high-voltage or high-current networks
    • G01R15/16—Adaptations providing voltage or current isolation, e.g. for high-voltage or high-current networks using capacitive devices
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R17/00—Measuring arrangements involving comparison with a reference value, e.g. bridge
    • G01R17/02—Arrangements in which the value to be measured is automatically compared with a reference value
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R19/00—Arrangements for measuring currents or voltages or for indicating presence or sign thereof
    • G01R19/25—Arrangements for measuring currents or voltages or for indicating presence or sign thereof using digital measurement techniques
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R35/00—Testing or calibrating of apparatus covered by the other groups of this subclass
    • G01R35/005—Calibrating; Standards or reference devices, e.g. voltage or resistance standards, "golden" references

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  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Power Engineering (AREA)
  • Measuring Instrument Details And Bridges, And Automatic Balancing Devices (AREA)
  • Measurement Of Current Or Voltage (AREA)
  • Measurement Of Resistance Or Impedance (AREA)
  • Transmission And Conversion Of Sensor Element Output (AREA)
JP2019089280A 2018-05-09 2019-05-09 位置依存的な非接触電圧及び電流測定 Active JP7396809B2 (ja)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US15/974,981 US10677876B2 (en) 2018-05-09 2018-05-09 Position dependent non-contact voltage and current measurement
US15/974,981 2018-05-09

Publications (3)

Publication Number Publication Date
JP2019215329A JP2019215329A (ja) 2019-12-19
JP2019215329A5 JP2019215329A5 (enExample) 2022-05-17
JP7396809B2 true JP7396809B2 (ja) 2023-12-12

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JP2019089280A Active JP7396809B2 (ja) 2018-05-09 2019-05-09 位置依存的な非接触電圧及び電流測定

Country Status (5)

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US (1) US10677876B2 (enExample)
EP (1) EP3567394B1 (enExample)
JP (1) JP7396809B2 (enExample)
CN (1) CN110470898B (enExample)
TW (2) TWI875027B (enExample)

Families Citing this family (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
MX2014004430A (es) * 2011-10-12 2014-10-06 Cequent Performance Prod Inc Convertidor electrico que detecta corriente.
JP2023541200A (ja) * 2020-09-15 2023-09-28 フルークコーポレイション 径方向デュアル取り付けセンサを備える非接触電気パラメータ測定装置
US11002765B1 (en) * 2020-12-04 2021-05-11 Vizi Metering, Inc. Non-contact voltage sensing method and apparatus
US11614469B2 (en) 2020-12-04 2023-03-28 Interbay Assets, Llc Capacitive non-contact voltage sensing method and apparatus
CN113341204B (zh) * 2021-06-11 2022-03-08 南方电网数字电网研究院有限公司 电压检测装置和方法
CN113848367A (zh) * 2021-09-22 2021-12-28 温州大学乐清工业研究院 一种非接触式电压测量的自适应动态补偿方法及装置
CN113687288B (zh) * 2021-09-23 2023-09-26 温州大学乐清工业研究院 一种非接触式电压传感器输出特性的检测装置与控制方法
CN113702749A (zh) * 2021-09-24 2021-11-26 温州大学 一种非接触式电能综合测量装置及电力物联网系统
US12265102B2 (en) 2021-12-03 2025-04-01 4Quadrant Networks Inc. Capacitive non-contact voltage sensing method and apparatus
IT202300002316A1 (it) * 2023-02-10 2024-08-10 Terna S P A Dispositivo di rivelazione della tensione e/o della corrente in un impianto elettrico
DK182172B1 (en) * 2024-05-07 2025-10-09 Remoni As Non-intrusive power measurement for multiconductor power cables

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2007518086A (ja) 2004-01-07 2007-07-05 スパルールズ リミテッド 電圧測定装置
JP2010025653A (ja) 2008-07-17 2010-02-04 Hioki Ee Corp 測定装置

Family Cites Families (84)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5687864A (en) * 1979-12-20 1981-07-16 Toshiba Corp Method and device for measuring electric current
JPH06102295A (ja) * 1992-07-28 1994-04-15 Hewlett Packard Co <Hp> 非接触型プローブおよび非接触電圧測定装置
US5473244A (en) 1992-09-17 1995-12-05 Libove; Joel M. Apparatus for measuring voltages and currents using non-contacting sensors
JPH06222087A (ja) 1993-01-27 1994-08-12 Hamamatsu Photonics Kk 電圧検出装置
US5493211A (en) 1993-07-15 1996-02-20 Tektronix, Inc. Current probe
US5973501A (en) 1993-10-18 1999-10-26 Metropolitan Industries, Inc. Current and voltage probe for measuring harmonic distortion
JPH09184866A (ja) 1995-12-28 1997-07-15 Sumitomo Electric Ind Ltd ケーブルの活線下劣化診断方法
US6043640A (en) * 1997-10-29 2000-03-28 Fluke Corporation Multimeter with current sensor
US6118270A (en) 1998-02-17 2000-09-12 Singer; Jerome R. Apparatus for fast measurements of current and power with scaleable wand-like sensor
US6211679B1 (en) * 1998-08-11 2001-04-03 Halliburton Energy Services, Inc. Method of compensating laterlog measurements for perturbation of survey voltage by cable armor voltage
IL127699A0 (en) 1998-12-23 1999-10-28 Bar Dov Aharon Method and device for non contact detection of external electric or magnetic fields
US6812685B2 (en) 2001-03-22 2004-11-02 Actuant Corporation Auto-selecting, auto-ranging contact/noncontact voltage and continuity tester
JP3761470B2 (ja) 2001-04-04 2006-03-29 北斗電子工業株式会社 非接触電圧計測方法及び装置並びに検出プローブ
US6644636B1 (en) 2001-10-26 2003-11-11 M. Terry Ryan Clamp adapter
EP1443335B1 (en) * 2003-01-31 2006-09-06 Agilent Technologies, Inc. - a Delaware corporation - Sensor apparatus, measuring system and method of calibration
CN2639905Y (zh) 2003-07-25 2004-09-08 深圳市纳米电子有限公司 一种钳形表校验仪
JP2005214761A (ja) * 2004-01-29 2005-08-11 Yokogawa Electric Corp 非接触電圧測定装置
US7256588B2 (en) 2004-04-16 2007-08-14 General Electric Company Capacitive sensor and method for non-contacting gap and dielectric medium measurement
DE102004063249A1 (de) 2004-12-23 2006-07-13 Fraunhofer-Gesellschaft zur Förderung der angewandten Forschung e.V. Sensorsystem und Verfahren zur kapazitiven Messung elektromagnetischer Signale biologischen Ursprungs
JP4611774B2 (ja) 2005-03-04 2011-01-12 東日本電信電話株式会社 非接触型電圧検出方法及び非接触型電圧検出装置
US7289924B2 (en) 2005-07-20 2007-10-30 Honeywell International Inc. Self-calibrating sensor
US7466145B2 (en) 2005-10-12 2008-12-16 Hioki Denki Kabushiki Kaisha Voltage measuring apparatus and power measuring apparatus
JP4607752B2 (ja) 2005-12-16 2011-01-05 日置電機株式会社 可変容量回路、電圧測定装置および電力測定装置
JP4607753B2 (ja) 2005-12-16 2011-01-05 日置電機株式会社 電圧測定装置および電力測定装置
JP4713358B2 (ja) 2006-02-08 2011-06-29 日置電機株式会社 電圧検出装置
JP4648228B2 (ja) 2006-03-24 2011-03-09 日置電機株式会社 電圧検出装置および初期化方法
JP5106798B2 (ja) 2006-06-22 2012-12-26 日置電機株式会社 電圧測定装置
JP4726722B2 (ja) 2006-07-03 2011-07-20 日置電機株式会社 電圧測定装置
JP4726721B2 (ja) 2006-07-03 2011-07-20 日置電機株式会社 電圧測定装置
JP4629625B2 (ja) 2006-07-12 2011-02-09 日置電機株式会社 電圧測定装置
GB0614261D0 (en) 2006-07-18 2006-08-30 Univ Sussex The Electric Potential Sensor
US7511468B2 (en) 2006-11-20 2009-03-31 Mceachern Alexander Harmonics measurement instrument with in-situ calibration
JP5106909B2 (ja) 2007-04-10 2012-12-26 日置電機株式会社 線間電圧測定装置
JP4927632B2 (ja) 2007-04-13 2012-05-09 日置電機株式会社 電圧測定装置
JP5144110B2 (ja) 2007-04-13 2013-02-13 日置電機株式会社 電圧測定装置
FI121522B (fi) * 2007-06-06 2010-12-15 Abb Oy Menetelmä taajuusmuuttajayksikön ohjaamiseksi ja taajuusmuuttajakokoonpano
JP5069978B2 (ja) 2007-08-31 2012-11-07 株式会社ダイヘン 電流・電圧検出用プリント基板および電流・電圧検出器
JP5160248B2 (ja) 2008-01-18 2013-03-13 日置電機株式会社 電圧検出装置
US20100090682A1 (en) 2008-02-14 2010-04-15 Armstrong Eric A Multi-Meter Test Lead Probe For Hands-Free Electrical Measurement of Control Panel Industrial Terminal Blocks
US8222886B2 (en) 2008-06-18 2012-07-17 Hioki Denki Kabushiki Kaisha Voltage detecting apparatus and line voltage detecting apparatus having a detection electrode disposed facing a detected object
JP5389389B2 (ja) 2008-07-22 2014-01-15 日置電機株式会社 線間電圧測定装置およびプログラム
CN101881791B (zh) 2009-04-30 2015-08-05 日置电机株式会社 电压检测装置
JP5340817B2 (ja) 2009-06-11 2013-11-13 日置電機株式会社 電圧検出装置
US9127987B2 (en) * 2009-06-30 2015-09-08 Greenlight Innovation Corporation Channel, system and method for monitoring voltages
TWM381787U (en) * 2009-07-10 2010-06-01 Danaher Shanghai Ind Instrumentation Technologies R & D Co Ltd Multimeter
JP5420387B2 (ja) 2009-12-09 2014-02-19 日置電機株式会社 電圧検出装置
US9615147B2 (en) * 2010-05-17 2017-04-04 Flir Systems, Inc. Multisensory meter system
JP5474707B2 (ja) 2010-08-30 2014-04-16 日置電機株式会社 電圧検出装置用の検出回路および電圧検出装置
US9063184B2 (en) * 2011-02-09 2015-06-23 International Business Machines Corporation Non-contact current-sensing and voltage-sensing clamp
US8680845B2 (en) 2011-02-09 2014-03-25 International Business Machines Corporation Non-contact current and voltage sensor
US8718964B2 (en) 2011-04-01 2014-05-06 Wilsun Xu Method and system for calibrating current sensors
JP5834663B2 (ja) * 2011-04-06 2015-12-24 富士通株式会社 交流電力測定装置
JP5834292B2 (ja) 2011-05-09 2015-12-16 アルプス・グリーンデバイス株式会社 電流センサ
US8508212B2 (en) 2011-06-14 2013-08-13 International Business Machines Corporation Calibration of non-contact current sensors
BR112014002634B1 (pt) 2011-08-03 2021-06-15 Fluke Corporation Método de obtenção e manutenção de registro de manutenção,sistema para obtenção e manutenção de registros de manutenção e meio de armazenamento legível por computador.
US8754636B2 (en) * 2011-12-07 2014-06-17 Brymen Technology Corporation Clamp meter with multipoint measurement
US20140035607A1 (en) 2012-08-03 2014-02-06 Fluke Corporation Handheld Devices, Systems, and Methods for Measuring Parameters
JP5981271B2 (ja) 2012-08-28 2016-08-31 日置電機株式会社 電圧測定用センサおよび電圧測定装置
JP5981270B2 (ja) 2012-08-28 2016-08-31 日置電機株式会社 電圧測定用センサおよび電圧測定装置
US9007077B2 (en) 2012-08-28 2015-04-14 International Business Machines Corporation Flexible current and voltage sensor
EP2929359B1 (en) * 2012-12-05 2021-02-03 Schneider Electric USA, Inc. Isolated and self-calibrating voltage measurement sensor
JP6172264B2 (ja) * 2013-03-29 2017-08-02 東芝三菱電機産業システム株式会社 電圧測定装置
KR101488690B1 (ko) * 2013-07-31 2015-02-04 주식회사 레티그리드 인접 전류의 간섭을 제거한 전류 측정 방법 및 전류 측정 장치
US9625535B2 (en) 2013-08-07 2017-04-18 Allegro Microsystems, Llc Systems and methods for computing a position of a magnetic target
AT514768A1 (de) * 2013-09-12 2015-03-15 Fluke Corp Verfahren und Vorrichtung zum Messen von elektrischen Größen
CN103487643A (zh) * 2013-10-08 2014-01-01 王岩 一种智能非接触式电压传感器及其校准方法
US9759798B2 (en) * 2014-05-13 2017-09-12 General Electric Company Calibration methods for voltage sensing devices
US9678115B2 (en) * 2014-05-13 2017-06-13 General Electric Company Contactless voltage sensing devices
JP6210938B2 (ja) 2014-06-18 2017-10-11 日置電機株式会社 非接触型電圧検出装置
US9739498B2 (en) * 2014-07-03 2017-08-22 Fred Katz Multi-mode passive infrared occupancy sensor system for energy saving application
US9689903B2 (en) * 2014-08-12 2017-06-27 Analog Devices, Inc. Apparatus and methods for measuring current
US10120055B2 (en) 2014-08-28 2018-11-06 Siemens Industry, Inc. Isolated capacitance line voltage sensor
KR20170053719A (ko) * 2014-09-12 2017-05-16 벨킨 인터내셔널, 인크. 자체 교정 무접촉 전력 소모 감지
US10602082B2 (en) 2014-09-17 2020-03-24 Fluke Corporation Triggered operation and/or recording of test and measurement or imaging tools
TWI649568B (zh) 2014-10-17 2019-02-01 日商日置電機股份有限公司 Voltage detecting device
US10271020B2 (en) 2014-10-24 2019-04-23 Fluke Corporation Imaging system employing fixed, modular mobile, and portable infrared cameras with ability to receive, communicate, and display data and images with proximity detection
US10591546B2 (en) * 2014-11-26 2020-03-17 Hubbell Incorporated Apparatuses and methods for passive fault monitoring of current sensing devices in protective circuit interrupters
US9632120B2 (en) * 2014-12-24 2017-04-25 Infineon Technologies Austria Ag System and method for measuring power in a power factor converter
US9977051B2 (en) * 2015-01-13 2018-05-22 Fluke Corporation Electrical conductor testing device
JP6420901B2 (ja) * 2015-04-28 2018-11-07 アルプス電気株式会社 非接触電圧計測装置
DE102015109009B4 (de) * 2015-06-08 2025-10-30 Infineon Technologies Ag Stromsensorchip mit Magnetfeldsensor
US10578641B2 (en) * 2016-08-22 2020-03-03 Nxp Usa, Inc. Methods and systems for electrically calibrating transducers
US10267833B2 (en) 2016-11-02 2019-04-23 Equinix, Inc. Power monitoring probe for monitoring power distribution in an electrical system
US10502807B2 (en) * 2017-09-05 2019-12-10 Fluke Corporation Calibration system for voltage measurement devices

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2007518086A (ja) 2004-01-07 2007-07-05 スパルールズ リミテッド 電圧測定装置
JP2010025653A (ja) 2008-07-17 2010-02-04 Hioki Ee Corp 測定装置

Also Published As

Publication number Publication date
US20190346529A1 (en) 2019-11-14
CN110470898A (zh) 2019-11-19
TWI821286B (zh) 2023-11-11
US10677876B2 (en) 2020-06-09
EP3567394A1 (en) 2019-11-13
TW201947234A (zh) 2019-12-16
TWI875027B (zh) 2025-03-01
CN110470898B (zh) 2024-07-02
JP2019215329A (ja) 2019-12-19
EP3567394B1 (en) 2023-07-05
TW202338368A (zh) 2023-10-01

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