JP7386321B2 - 自動分析システム - Google Patents

自動分析システム Download PDF

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Publication number
JP7386321B2
JP7386321B2 JP2022509309A JP2022509309A JP7386321B2 JP 7386321 B2 JP7386321 B2 JP 7386321B2 JP 2022509309 A JP2022509309 A JP 2022509309A JP 2022509309 A JP2022509309 A JP 2022509309A JP 7386321 B2 JP7386321 B2 JP 7386321B2
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Japan
Prior art keywords
calibration
automatic analysis
analysis system
quality control
list
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JP2022509309A
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English (en)
Japanese (ja)
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JPWO2021192537A1 (enExample
JPWO2021192537A5 (enExample
Inventor
拓也 中村
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Hitachi High Tech Corp
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Hitachi High Tech Corp
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Publication of JPWO2021192537A5 publication Critical patent/JPWO2021192537A5/ja
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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N35/00—Automatic analysis not limited to methods or materials provided for in any single one of groups G01N1/00 - G01N33/00; Handling materials therefor
    • G01N35/02—Automatic analysis not limited to methods or materials provided for in any single one of groups G01N1/00 - G01N33/00; Handling materials therefor using a plurality of sample containers moved by a conveyor system past one or more treatment or analysis stations
    • G01N35/025—Automatic analysis not limited to methods or materials provided for in any single one of groups G01N1/00 - G01N33/00; Handling materials therefor using a plurality of sample containers moved by a conveyor system past one or more treatment or analysis stations having a carousel or turntable for reaction cells or cuvettes
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N35/00—Automatic analysis not limited to methods or materials provided for in any single one of groups G01N1/00 - G01N33/00; Handling materials therefor
    • G01N35/00584—Control arrangements for automatic analysers
    • G01N35/00594—Quality control, including calibration or testing of components of the analyser
    • G01N35/00613—Quality control
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N35/00—Automatic analysis not limited to methods or materials provided for in any single one of groups G01N1/00 - G01N33/00; Handling materials therefor
    • G01N35/00584—Control arrangements for automatic analysers
    • G01N35/00594—Quality control, including calibration or testing of components of the analyser
    • G01N35/00693—Calibration
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N35/00—Automatic analysis not limited to methods or materials provided for in any single one of groups G01N1/00 - G01N33/00; Handling materials therefor
    • G01N35/00584—Control arrangements for automatic analysers
    • G01N35/00722—Communications; Identification
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N35/00—Automatic analysis not limited to methods or materials provided for in any single one of groups G01N1/00 - G01N33/00; Handling materials therefor
    • G01N35/00584—Control arrangements for automatic analysers
    • G01N35/00722—Communications; Identification
    • G01N2035/00891—Displaying information to the operator
    • G01N2035/0091—GUI [graphical user interfaces]
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N35/00—Automatic analysis not limited to methods or materials provided for in any single one of groups G01N1/00 - G01N33/00; Handling materials therefor
    • G01N35/02—Automatic analysis not limited to methods or materials provided for in any single one of groups G01N1/00 - G01N33/00; Handling materials therefor using a plurality of sample containers moved by a conveyor system past one or more treatment or analysis stations
    • G01N35/04—Details of the conveyor system
    • G01N2035/0401—Sample carriers, cuvettes or reaction vessels
    • G01N2035/0412—Block or rack elements with a single row of samples
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N35/00—Automatic analysis not limited to methods or materials provided for in any single one of groups G01N1/00 - G01N33/00; Handling materials therefor
    • G01N35/02—Automatic analysis not limited to methods or materials provided for in any single one of groups G01N1/00 - G01N33/00; Handling materials therefor using a plurality of sample containers moved by a conveyor system past one or more treatment or analysis stations
    • G01N35/04—Details of the conveyor system
    • G01N2035/0439—Rotary sample carriers, i.e. carousels
    • G01N2035/0443—Rotary sample carriers, i.e. carousels for reagents
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N35/00—Automatic analysis not limited to methods or materials provided for in any single one of groups G01N1/00 - G01N33/00; Handling materials therefor
    • G01N35/02—Automatic analysis not limited to methods or materials provided for in any single one of groups G01N1/00 - G01N33/00; Handling materials therefor using a plurality of sample containers moved by a conveyor system past one or more treatment or analysis stations
    • G01N35/04—Details of the conveyor system
    • G01N2035/0474—Details of actuating means for conveyors or pipettes
    • G01N2035/0491—Position sensing, encoding; closed-loop control
    • G01N2035/0493—Locating samples; identifying different tube sizes

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  • Chemical & Material Sciences (AREA)
  • Biochemistry (AREA)
  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Analytical Chemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Engineering & Computer Science (AREA)
  • Quality & Reliability (AREA)
  • Chemical Kinetics & Catalysis (AREA)
  • Automatic Analysis And Handling Materials Therefor (AREA)
JP2022509309A 2020-03-23 2021-01-18 自動分析システム Active JP7386321B2 (ja)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
JP2020050598 2020-03-23
JP2020050598 2020-03-23
PCT/JP2021/001437 WO2021192537A1 (ja) 2020-03-23 2021-01-18 自動分析システム

Publications (3)

Publication Number Publication Date
JPWO2021192537A1 JPWO2021192537A1 (enExample) 2021-09-30
JPWO2021192537A5 JPWO2021192537A5 (enExample) 2023-01-23
JP7386321B2 true JP7386321B2 (ja) 2023-11-24

Family

ID=77891367

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2022509309A Active JP7386321B2 (ja) 2020-03-23 2021-01-18 自動分析システム

Country Status (5)

Country Link
US (1) US20230107051A1 (enExample)
EP (1) EP4130748A4 (enExample)
JP (1) JP7386321B2 (enExample)
CN (1) CN115298550A (enExample)
WO (1) WO2021192537A1 (enExample)

Families Citing this family (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN114579018B (zh) * 2022-03-04 2024-07-05 中元汇吉生物技术股份有限公司 图形化显示装置、方法、设备及计算机可读存储介质
CN117741170B (zh) * 2024-02-19 2024-05-24 深圳市帝迈生物技术有限公司 质控品实验项目登记方法及检测控制方法
CN117783564B (zh) * 2024-02-19 2024-05-28 深圳市帝迈生物技术有限公司 通道设置方法及样本实验项目登记方法
CN117783565B (zh) * 2024-02-19 2024-05-24 深圳市帝迈生物技术有限公司 通道设置方法及样本实验项目登记方法
WO2025225236A1 (ja) * 2024-04-24 2025-10-30 株式会社日立ハイテク 電解質分析装置、及び電解質分析装置の結果表示方法

Citations (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2007078375A (ja) 2005-09-12 2007-03-29 Hitachi High-Technologies Corp 自動分析装置
JP2008170191A (ja) 2007-01-09 2008-07-24 Olympus Corp 分析装置
JP2010151707A (ja) 2008-12-26 2010-07-08 Hitachi High-Technologies Corp 自動分析装置、その支援システム
WO2017033576A1 (ja) 2015-08-27 2017-03-02 株式会社日立ハイテクノロジーズ 自動分析装置
JP2018080957A (ja) 2016-11-15 2018-05-24 日本電子株式会社 自動分析装置及びプログラム
WO2018168432A1 (ja) 2017-03-14 2018-09-20 株式会社日立ハイテクノロジーズ 自動分析システム

Family Cites Families (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE69837230T2 (de) * 1997-04-10 2007-12-20 Hitachi, Ltd. Automatische Analysevorrichtung
JP5501205B2 (ja) * 2010-12-09 2014-05-21 株式会社日立ハイテクノロジーズ 自動分析システム
US20140252079A1 (en) * 2013-03-11 2014-09-11 Promega Corporation Analyzer with machine readable protocol prompting
EP3553530B1 (en) * 2018-04-10 2023-09-20 Jeol Ltd. Automatic analyzer and program

Patent Citations (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2007078375A (ja) 2005-09-12 2007-03-29 Hitachi High-Technologies Corp 自動分析装置
JP2008170191A (ja) 2007-01-09 2008-07-24 Olympus Corp 分析装置
JP2010151707A (ja) 2008-12-26 2010-07-08 Hitachi High-Technologies Corp 自動分析装置、その支援システム
WO2017033576A1 (ja) 2015-08-27 2017-03-02 株式会社日立ハイテクノロジーズ 自動分析装置
JP2018080957A (ja) 2016-11-15 2018-05-24 日本電子株式会社 自動分析装置及びプログラム
WO2018168432A1 (ja) 2017-03-14 2018-09-20 株式会社日立ハイテクノロジーズ 自動分析システム

Also Published As

Publication number Publication date
JPWO2021192537A1 (enExample) 2021-09-30
EP4130748A1 (en) 2023-02-08
US20230107051A1 (en) 2023-04-06
WO2021192537A1 (ja) 2021-09-30
EP4130748A4 (en) 2024-03-27
CN115298550A (zh) 2022-11-04

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