JP7353935B2 - 統合型ひずみセンサを有する可撓性ｘ線センサ - Google Patents

統合型ひずみセンサを有する可撓性ｘ線センサ Download PDF

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JP7353935B2
JP7353935B2 JP2019209445A JP2019209445A JP7353935B2 JP 7353935 B2 JP7353935 B2 JP 7353935B2 JP 2019209445 A JP2019209445 A JP 2019209445A JP 2019209445 A JP2019209445 A JP 2019209445A JP 7353935 B2 JP7353935 B2 JP 7353935B2
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ray detector
strain sensors
detector
ray
strain
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JP2020095025A (ja
JP2020095025A5 (enExample
Inventor
ジュリー・エイ・バート
ロバート・エイ・ストリート
ジョン・シー・ナイツ
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パロ アルト リサーチ センター インコーポレイテッド
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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
    • G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
    • G01T1/16—Measuring radiation intensity
    • G01T1/20—Measuring radiation intensity with scintillation detectors
    • G01T1/2018—Scintillation-photodiode combinations
    • G01T1/20188—Auxiliary details, e.g. casings or cooling
    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10F—INORGANIC SEMICONDUCTOR DEVICES SENSITIVE TO INFRARED RADIATION, LIGHT, ELECTROMAGNETIC RADIATION OF SHORTER WAVELENGTH OR CORPUSCULAR RADIATION
    • H10F39/00—Integrated devices, or assemblies of multiple devices, comprising at least one element covered by group H10F30/00, e.g. radiation detectors comprising photodiode arrays
    • H10F39/10—Integrated devices
    • H10F39/12—Image sensors
    • H10F39/18—Complementary metal-oxide-semiconductor [CMOS] image sensors; Photodiode array image sensors
    • H10F39/189—X-ray, gamma-ray or corpuscular radiation imagers
    • H10F39/1898—Indirect radiation image sensors, e.g. using luminescent members
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B7/00—Measuring arrangements characterised by the use of electric or magnetic techniques
    • G01B7/16—Measuring arrangements characterised by the use of electric or magnetic techniques for measuring the deformation in a solid, e.g. by resistance strain gauge
    • G01B7/18—Measuring arrangements characterised by the use of electric or magnetic techniques for measuring the deformation in a solid, e.g. by resistance strain gauge using change in resistance
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N23/00—Cameras or camera modules comprising electronic image sensors; Control thereof
    • H04N23/30—Cameras or camera modules comprising electronic image sensors; Control thereof for generating image signals from X-rays
    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
    • H10D30/00—Field-effect transistors [FET]
    • H10D30/60—Insulated-gate field-effect transistors [IGFET]
    • H10D30/67—Thin-film transistors [TFT]
    • H10D30/674—Thin-film transistors [TFT] characterised by the active materials
    • H10D30/6741—Group IV materials, e.g. germanium or silicon carbide
    • H10D30/6743—Silicon
    • H10D30/6746—Amorphous silicon

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  • General Physics & Mathematics (AREA)
  • Multimedia (AREA)
  • Signal Processing (AREA)
  • Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • High Energy & Nuclear Physics (AREA)
  • Molecular Biology (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Measurement Of Radiation (AREA)
  • Length Measuring Devices With Unspecified Measuring Means (AREA)
  • Apparatus For Radiation Diagnosis (AREA)
JP2019209445A 2018-12-13 2019-11-20 統合型ひずみセンサを有する可撓性ｘ線センサ Active JP7353935B2 (ja)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US16/218,905 US10825855B2 (en) 2018-12-13 2018-12-13 Flexible x-ray sensor with integrated strain sensor
US16/218,905 2018-12-13

Publications (3)

Publication Number Publication Date
JP2020095025A JP2020095025A (ja) 2020-06-18
JP2020095025A5 JP2020095025A5 (enExample) 2022-11-22
JP7353935B2 true JP7353935B2 (ja) 2023-10-02

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JP2019209445A Active JP7353935B2 (ja) 2018-12-13 2019-11-20 統合型ひずみセンサを有する可撓性ｘ線センサ

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US (1) US10825855B2 (enExample)
EP (1) EP3667371B1 (enExample)
JP (1) JP7353935B2 (enExample)

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* Cited by examiner, † Cited by third party
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KR102351328B1 (ko) * 2019-11-18 2022-01-14 (주)피코팩 곡면 구강내센서
KR102373241B1 (ko) * 2021-06-15 2022-03-15 주식회사 디알텍 방사선 디텍터 및 이를 포함하는 방사선 검사장치
CN114385285B (zh) * 2021-11-30 2024-02-06 重庆长安汽车股份有限公司 一种基于汽车ai智慧助手的形象创建方法
WO2023146205A1 (ko) * 2022-01-27 2023-08-03 주식회사 뷰웍스 가변형 디텍터 및 이를 포함하는 영상 촬영 장치
KR102766405B1 (ko) * 2022-04-13 2025-02-14 주식회사 레이언스 X선 디텍터
CN115120255A (zh) * 2022-06-06 2022-09-30 上海奕瑞光电子科技股份有限公司 一种x射线平板探测器及探测系统
EP4407350A1 (de) * 2023-01-27 2024-07-31 Fraunhofer-Gesellschaft zur Förderung der angewandten Forschung e.V. Strahlungsdetektor und verfahren zu seiner verwendung
CN120052941B (zh) * 2025-02-28 2025-12-02 合肥工业大学 柔性x射线成像传感器标定方法及系统、成像方法及系统

Citations (3)

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JP2003070776A (ja) 2001-07-27 2003-03-11 Siemens Ag Ｘ線診断装置
JP2011072502A (ja) 2009-09-30 2011-04-14 Fujifilm Corp 放射線撮影装置
JP2012047584A (ja) 2010-08-26 2012-03-08 Fujifilm Corp 放射線画像撮影装置、放射線画像撮影システム、およびプログラム

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US7233005B2 (en) 2005-02-16 2007-06-19 Hologic, Inc. Amorphous selenium flat panel x-ray imager for tomosynthesis and static imaging
US7263165B2 (en) 2005-07-14 2007-08-28 Siemens Medical Solutions Usa, Inc. Flat panel detector with KV/MV integration
US7563026B2 (en) * 2005-09-08 2009-07-21 Schick Technologies, Inc. Flexible intra-oral x-ray imaging device
US7733397B2 (en) * 2006-12-22 2010-06-08 Palo Alto Research Center Incorporated Sensor surface with 3D curvature formed by electronics on a continuous 2D flexible substrate
US7742090B2 (en) * 2006-12-22 2010-06-22 Palo Alto Research Center Incorporated Flexible segmented image sensor
US8707796B2 (en) 2010-08-04 2014-04-29 Terrisa Duenas Semiconductor strain gauge array
US9269741B2 (en) * 2010-09-07 2016-02-23 Konica Minolta Medical & Graphic, Inc. Production method of radiation image detector and radiation image detector
RU2015101436A (ru) 2012-06-20 2016-08-10 Конинклейке Филипс Н.В. Детектор излучений с органическим фотодиодом
JP2014182108A (ja) * 2013-03-21 2014-09-29 Canon Inc 放射線検出装置及び放射線検出システム
US9520437B2 (en) 2014-08-14 2016-12-13 Cbrite Inc. Flexible APS X-ray imager with MOTFT pixel readout and a pin diode sensing element
KR102278163B1 (ko) * 2014-09-15 2021-07-19 주식회사 레이언스 이미지센서와 이를 사용한 영상 시스템
EP3185045B1 (en) * 2015-12-22 2021-06-16 Nokia Technologies Oy An apparatus for detecting electromagnetic radiation and method and computer program for controlling an apparatus for detecting electromagnetic radiation
US10353083B2 (en) 2017-09-12 2019-07-16 Palo Alto Research Center Incorporated Monolithic digital x-ray detector stack with energy resolution
US10608041B2 (en) 2018-04-12 2020-03-31 Palo Alto Research Center Incorporated Bendable x-ray detector with TFT backplane in the neutral plane

Patent Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2003070776A (ja) 2001-07-27 2003-03-11 Siemens Ag Ｘ線診断装置
JP2011072502A (ja) 2009-09-30 2011-04-14 Fujifilm Corp 放射線撮影装置
JP2012047584A (ja) 2010-08-26 2012-03-08 Fujifilm Corp 放射線画像撮影装置、放射線画像撮影システム、およびプログラム

Also Published As

Publication number Publication date
US10825855B2 (en) 2020-11-03
US20200194489A1 (en) 2020-06-18
EP3667371A1 (en) 2020-06-17
EP3667371B1 (en) 2022-07-27
JP2020095025A (ja) 2020-06-18

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