JP7350702B2 - 駆動制御回路 - Google Patents
駆動制御回路 Download PDFInfo
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- JP7350702B2 JP7350702B2 JP2020154310A JP2020154310A JP7350702B2 JP 7350702 B2 JP7350702 B2 JP 7350702B2 JP 2020154310 A JP2020154310 A JP 2020154310A JP 2020154310 A JP2020154310 A JP 2020154310A JP 7350702 B2 JP7350702 B2 JP 7350702B2
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- Prior art keywords
- drive
- transistor
- gate
- output transistor
- voltage
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- 239000003990 capacitor Substances 0.000 claims description 33
- 238000001514 detection method Methods 0.000 claims description 25
- 230000007274 generation of a signal involved in cell-cell signaling Effects 0.000 claims description 14
- 238000010586 diagram Methods 0.000 description 11
- 239000000872 buffer Substances 0.000 description 7
- 230000003111 delayed effect Effects 0.000 description 6
- 229910002601 GaN Inorganic materials 0.000 description 4
- JMASRVWKEDWRBT-UHFFFAOYSA-N Gallium nitride Chemical group [Ga]#N JMASRVWKEDWRBT-UHFFFAOYSA-N 0.000 description 4
- 230000000694 effects Effects 0.000 description 2
- 230000003071 parasitic effect Effects 0.000 description 2
- 230000007704 transition Effects 0.000 description 2
- 230000002159 abnormal effect Effects 0.000 description 1
- 230000005856 abnormality Effects 0.000 description 1
- 230000007257 malfunction Effects 0.000 description 1
- 238000000034 method Methods 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
- 238000006467 substitution reaction Methods 0.000 description 1
- 230000001629 suppression Effects 0.000 description 1
Images
Classifications
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- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03K—PULSE TECHNIQUE
- H03K17/00—Electronic switching or gating, i.e. not by contact-making and –breaking
- H03K17/51—Electronic switching or gating, i.e. not by contact-making and –breaking characterised by the components used
- H03K17/56—Electronic switching or gating, i.e. not by contact-making and –breaking characterised by the components used by the use, as active elements, of semiconductor devices
- H03K17/687—Electronic switching or gating, i.e. not by contact-making and –breaking characterised by the components used by the use, as active elements, of semiconductor devices the devices being field-effect transistors
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03K—PULSE TECHNIQUE
- H03K17/00—Electronic switching or gating, i.e. not by contact-making and –breaking
- H03K17/16—Modifications for eliminating interference voltages or currents
- H03K17/161—Modifications for eliminating interference voltages or currents in field-effect transistor switches
- H03K17/162—Modifications for eliminating interference voltages or currents in field-effect transistor switches without feedback from the output circuit to the control circuit
- H03K17/163—Soft switching
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03K—PULSE TECHNIQUE
- H03K17/00—Electronic switching or gating, i.e. not by contact-making and –breaking
- H03K17/04—Modifications for accelerating switching
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L27/00—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate
- H01L27/02—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having potential barriers; including integrated passive circuit elements having potential barriers
- H01L27/04—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having potential barriers; including integrated passive circuit elements having potential barriers the substrate being a semiconductor body
- H01L27/10—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having potential barriers; including integrated passive circuit elements having potential barriers the substrate being a semiconductor body including a plurality of individual components in a repetitive configuration
- H01L27/118—Masterslice integrated circuits
- H01L27/11898—Input and output buffer/driver structures
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03K—PULSE TECHNIQUE
- H03K17/00—Electronic switching or gating, i.e. not by contact-making and –breaking
- H03K17/04—Modifications for accelerating switching
- H03K17/041—Modifications for accelerating switching without feedback from the output circuit to the control circuit
- H03K17/0412—Modifications for accelerating switching without feedback from the output circuit to the control circuit by measures taken in the control circuit
- H03K17/04123—Modifications for accelerating switching without feedback from the output circuit to the control circuit by measures taken in the control circuit in field-effect transistor switches
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03K—PULSE TECHNIQUE
- H03K3/00—Circuits for generating electric pulses; Monostable, bistable or multistable circuits
- H03K3/01—Details
- H03K3/015—Modifications of generator to maintain energy constant
Landscapes
- Engineering & Computer Science (AREA)
- Power Engineering (AREA)
- Physics & Mathematics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Electronic Switches (AREA)
Description
図1は、第1の実施形態の駆動制御回路の構成を示す図である。本実施形態は、駆動回路10を有する。駆動回路10は、スイッチング信号VS、VS1を出力する。スイッチング信号VS、VS1には、駆動トランジスタQ11とQ13、及び、Q12とQ14が同時にオンすることがない様に、所謂、デッドタイムが設けられる。
図6は、第2の実施形態の駆動制御回路の構成を示す図である。既述した実施形態に対応する構成には、同一符号を付し、重複した記載は必要な場合にのみ行う。以降、同様である。
Claims (5)
- 出力トランジスタをオン状態とする駆動信号に応答して、前記出力トランジスタのゲートに駆動電流を供給する第1の駆動トランジスタと、
一端に基準電位が印加される第1の容量と、
前記駆動信号に応答して、前記第1の容量の他端に充電電流を供給する第2の駆動トランジスタと、
前記出力トランジスタのゲート電圧と前記第1の容量の他端の電圧を比較して、その結果に基づいて第1の検出信号を出力する第1の比較回路と、
前記第1の検出信号と前記駆動信号に応答して第1の制御信号を生成する第1の制御信号生成回路と、
前記第1の制御信号に応答して、前記出力トランジスタのゲートに駆動電流を供給する第3の駆動トランジスタと、
を具備することを特徴とする駆動制御回路。 - 前記第3の駆動トランジスタの駆動能力は、前記第1の駆動トランジスタの駆動能力よりも高いことを特徴とする請求項1に記載の駆動制御回路。
- 前記第1の容量の値は、
前記出力トランジスタのゲート・ソース間容量と前記第1の駆動トランジスタの駆動能力によって定まる時定数と、前記第2の駆動トランジスタの駆動能力に基づいて設定することを特徴とする請求項2に記載の駆動制御回路。 - 一端に前記基準電位が印加される第2の容量と、
前記駆動信号に応答して、前記第2の容量の他端に充電電流を供給する第4の駆動トランジスタと、
前記出力トランジスタのゲート電圧と前記第2の容量の他端の電圧を比較して、その比較結果に応じて第2の検出信号を出力する第2の比較回路と、
前記第2の検出信号と前記駆動信号に応答して第2の制御信号を生成する第2の制御信号生成回路と、
前記第2の制御信号に応答して、前記出力トランジスタのゲートに駆動電流を供給する第5の駆動トランジスタと、
を具備することを特徴とする請求項1から3のいずれか一項に記載の駆動制御回路。 - 前記出力トランジスタは、GaNトランジスタであることを特徴する請求項1から4のいずれか一項に記載の駆動制御回路。
Priority Applications (3)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2020154310A JP7350702B2 (ja) | 2020-09-15 | 2020-09-15 | 駆動制御回路 |
US17/178,341 US11476846B2 (en) | 2020-09-15 | 2021-02-18 | Drive control circuit |
CN202110211232.1A CN114189233A (zh) | 2020-09-15 | 2021-02-25 | 驱动控制电路 |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2020154310A JP7350702B2 (ja) | 2020-09-15 | 2020-09-15 | 駆動制御回路 |
Publications (2)
Publication Number | Publication Date |
---|---|
JP2022048476A JP2022048476A (ja) | 2022-03-28 |
JP7350702B2 true JP7350702B2 (ja) | 2023-09-26 |
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JP2020154310A Active JP7350702B2 (ja) | 2020-09-15 | 2020-09-15 | 駆動制御回路 |
Country Status (3)
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US (1) | US11476846B2 (ja) |
JP (1) | JP7350702B2 (ja) |
CN (1) | CN114189233A (ja) |
Families Citing this family (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
WO2023209966A1 (ja) * | 2022-04-28 | 2023-11-02 | 国立大学法人東京大学 | ゲート駆動装置、および、ゲート駆動システム |
WO2023238293A1 (ja) * | 2022-06-08 | 2023-12-14 | 三菱電機株式会社 | 空気調和機 |
WO2023238296A1 (ja) * | 2022-06-08 | 2023-12-14 | 三菱電機株式会社 | 電力変換装置、モータ駆動装置及び冷凍サイクル適用機器 |
Citations (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2013168905A (ja) | 2012-02-17 | 2013-08-29 | Mitsubishi Electric Corp | パワーデバイス制御回路およびパワーデバイス回路 |
JP2015061406A (ja) | 2013-09-19 | 2015-03-30 | 三菱電機株式会社 | パワーモジュール |
JP2016143905A (ja) | 2015-01-29 | 2016-08-08 | 株式会社東芝 | 半導体装置 |
JP2017143700A (ja) | 2016-02-12 | 2017-08-17 | 国立大学法人 東京大学 | 短絡検出装置および短絡検出方法 |
Family Cites Families (7)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2003168735A (ja) | 2001-11-30 | 2003-06-13 | Hitachi Ltd | 半導体集積回路装置 |
US7170324B2 (en) * | 2004-07-15 | 2007-01-30 | Agere Systems Inc. | Output buffer with selectable slew rate |
JP4846272B2 (ja) | 2005-06-07 | 2011-12-28 | ルネサスエレクトロニクス株式会社 | 半導体集積回路装置 |
US7928774B2 (en) * | 2008-09-29 | 2011-04-19 | Infineon Technologies Ag | Adaptive drive signal adjustment for bridge EMI control |
JP2011082764A (ja) | 2009-10-06 | 2011-04-21 | Mitsubishi Electric Corp | パワーデバイス制御回路およびそれを用いたipm |
JP2012038389A (ja) * | 2010-08-09 | 2012-02-23 | Elpida Memory Inc | 半導体装置 |
EP2688208B1 (en) * | 2011-07-07 | 2020-04-22 | Fuji Electric Co., Ltd. | Gate drive device |
-
2020
- 2020-09-15 JP JP2020154310A patent/JP7350702B2/ja active Active
-
2021
- 2021-02-18 US US17/178,341 patent/US11476846B2/en active Active
- 2021-02-25 CN CN202110211232.1A patent/CN114189233A/zh active Pending
Patent Citations (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2013168905A (ja) | 2012-02-17 | 2013-08-29 | Mitsubishi Electric Corp | パワーデバイス制御回路およびパワーデバイス回路 |
JP2015061406A (ja) | 2013-09-19 | 2015-03-30 | 三菱電機株式会社 | パワーモジュール |
JP2016143905A (ja) | 2015-01-29 | 2016-08-08 | 株式会社東芝 | 半導体装置 |
JP2017143700A (ja) | 2016-02-12 | 2017-08-17 | 国立大学法人 東京大学 | 短絡検出装置および短絡検出方法 |
Also Published As
Publication number | Publication date |
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CN114189233A (zh) | 2022-03-15 |
US20220085805A1 (en) | 2022-03-17 |
US11476846B2 (en) | 2022-10-18 |
JP2022048476A (ja) | 2022-03-28 |
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