JP7321979B2 - 導電性接着剤組成物、接続構造体及び半導体発光素子搭載フレキシブル配線基板 - Google Patents
導電性接着剤組成物、接続構造体及び半導体発光素子搭載フレキシブル配線基板 Download PDFInfo
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- JP7321979B2 JP7321979B2 JP2020120774A JP2020120774A JP7321979B2 JP 7321979 B2 JP7321979 B2 JP 7321979B2 JP 2020120774 A JP2020120774 A JP 2020120774A JP 2020120774 A JP2020120774 A JP 2020120774A JP 7321979 B2 JP7321979 B2 JP 7321979B2
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- wiring board
- flexible wiring
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- conductive adhesive
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Images
Classifications
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/73—Means for bonding being of different types provided for in two or more of groups H01L2224/10, H01L2224/18, H01L2224/26, H01L2224/34, H01L2224/42, H01L2224/50, H01L2224/63, H01L2224/71
- H01L2224/732—Location after the connecting process
- H01L2224/73201—Location after the connecting process on the same surface
- H01L2224/73203—Bump and layer connectors
- H01L2224/73204—Bump and layer connectors the bump connector being embedded into the layer connector
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- Adhesives Or Adhesive Processes (AREA)
- Wire Bonding (AREA)
- Conductive Materials (AREA)
Description
本実施形態の導電性接着剤組成物は、(A)融点が200℃以下の金属を含む導電性粒子、(B)熱硬化性樹脂、(C)フラックス活性剤及び(D)硬化触媒を含有する。上記導電性接着剤組成物は、フレキシブル配線基板と電子部品とを電気的に接続するために用いられる。
(A)導電性粒子は、融点が200℃以下である金属を含む。このような導電性粒子を導電性接着剤組成物に用いると、導電性粒子が比較的低い温度(例えば、200℃以下)で溶融して凝集するため、基板への電子部品の実装温度を低温化することができ、基板の可撓性及び伸縮性を損なうことなく導電性に優れる接続部を形成することができる。
(B)熱硬化性樹脂は、被着体を接着する作用を有すると共に、導電性接着剤組成物中の導電性粒子及び必要に応じて添加されるフィラーを互いに結合させるバインダ成分として作用する。このような熱硬化性樹脂としては、例えば、エポキシ樹脂、(メタ)アクリル樹脂、マレイミド樹脂、シアネート樹脂等の熱硬化性の有機高分子化合物、及び、それらの前駆体が挙げられる。ここで、(メタ)アクリル樹脂とは、メタクリル樹脂及びアクリル樹脂を示す。これらの中では、(メタ)アクリル樹脂及びマレイミド樹脂に代表される重合可能な炭素-炭素二重結合を有する化合物、又は、エポキシ樹脂が好ましい。これらの熱硬化性樹脂は、耐熱性及び接着性に優れると共に、必要に応じて有機溶剤中に溶解又は分散させれば液体の状態で取り扱うこともできるため、作業性にも優れている。また、入手容易性と接続信頼性の観点から、エポキシ樹脂を用いることがより好ましい。これらの熱硬化性樹脂は1種を単独で又は2種以上を組み合わせて用いることができる。
(C)フラックス活性剤は、(A)導電性粒子の表面に形成された酸化膜を除去する能力を示すものである。このようなフラックス活性剤を用いることにより、(A)導電性粒子の溶融凝集の妨げとなる酸化膜が除去される。(C)フラックス活性剤は、(B)熱硬化性樹脂の硬化反応を阻害しないものであれば特に制限なく、公知の化合物を使用することができる。
(D)硬化触媒は、(B)熱硬化性樹脂の硬化を促進する効果を有する。(D)硬化触媒としては、所望の硬化温度における硬化性、可使時間の長さ、得られる硬化物の耐熱性等の観点から、イミダゾール化合物が好ましい。中でもイミダゾール系エポキシ樹脂用硬化剤がより好ましい。イミダゾール化合物の市販品としては、例えば、2P4MHZ-PW(2-フェニル-4-メチル-5-ヒドロキシメチルイミダゾール)、2PHZ-PW(2-フェニル-4,5-ジヒドロキシメチルイミダゾール)、C11Z-CN(1-シアノエチル-2-ウンデシルイミダゾール)、2E4MZ-CN(1-シアノエチル-2-エチル-4-メチルイミダゾール)、2PZ-CN(1-シアノエチル-2-フェニルイミダゾール)、2MZ-A(2,4-ジアミノ-6-[2’-メチルイミダゾリル-(1’)]-エチル-s-トリアジン)、2E4MZ-A(2,4-ジアミノ-6-[2’-エチル-4’-メチルイミダゾリル-(1’)]-エチル-s-トリアジン)及び2MAOK-PW(2,4-ジアミノ-6-[2’-メチルイミダゾリル-(1’)]-エチル-s-トリアジンイソシアヌル酸付加物)(いずれも四国化成工業株式会社製、商品名)が挙げられる。これらの硬化触媒は1種を単独で又は2種以上を組み合わせて用いることができる。
本実施形態の導電性接着剤組成物は、上述の各成分の他に、必要に応じて、応力緩和のための可撓剤、作業性向上のための添加剤(希釈剤、接着力向上剤、濡れ性向上剤及び消泡剤からなる群より選ばれる少なくとも1種)を含有してもよい。また、これらの成分の他、本発明による効果を阻害しない範囲において各種添加剤を含有してもよい。
本実施形態の接続構造体は、第1の接続端子を有するフレキシブル配線基板と、第2の接続端子を有する電子部品と、フレキシブル配線基板及び電子部品の間に配置された接続部とを備え、接続部が上記本実施形態の導電性接着剤組成物の硬化物を含有し、第1の接続端子及び第2の接続端子が電気的に接続されている接続構造体である。
[実施例1]
熱硬化性樹脂であるYL980(ビスフェノールF型エポキシ樹脂、三菱化学株式会社製、商品名)16.0質量部と、硬化触媒である2P4MHZ-PW(イミダゾール化合物、四国化成工業株式会社製、商品名)1.3質量部と、フラックス活性剤であるBHPA(2,2-ビス(ヒドロキシメチル)プロピオン酸)2.7質量部とを混合し、3本ロールを3回通して接着剤成分を調製した。
下記表1及び2に示す組成及び配合量とした以外は実施例1と同様にして、実施例2~8及び比較例1~7の導電性接着剤組成物を得た。また、表中の各成分の配合量の単位は質量部である。
YL980:ビスフェノールF型エポキシ樹脂、三菱化学株式会社製、商品名
2P4MHZ-PW:イミダゾール化合物、四国化成工業株式会社製、商品名
BHPA:2,2-ビス(ヒドロキシメチル)プロピオン酸
BHBA:2,2-ビス(ヒドロキシメチル)ブタン酸
Sn42-Bi58はんだ:平均粒子径20μm、三井金属株式会社製、融点138℃
Sn42-Bi57-Ag1はんだ:平均粒子径20μm、三井金属株式会社製、融点139℃
Sn96.5-Ag3-Cu0.5はんだ:平均粒子径20μm、三井金属株式会社製、融点217℃
Agペースト:藤倉化成株式会社製、硬化温度150℃
Sn42-Bi58クリームはんだ:千住金属工業株式会社製、融点138℃
Sn96.5-Ag3-Cu0.5クリームはんだ:千住金属工業株式会社製、融点219℃
上記実施例及び比較例で得られた導電性接着剤組成物の特性を下記の方法で評価した。その結果を下記表1及び2にまとめて示す。
導電性接着剤組成物を銀めっき付き銅板上に約0.5mg塗布し、この上に長さ2mm×幅2mm×厚み0.25mmの矩形平板状の錫めっき付き銅板を圧着して試験片を得た。その後、実施例1~8、比較例1~6の試験片に対しては、150℃、10分間の熱履歴を加えた。比較例7の試験片に対しては、260℃、10分間の熱履歴を加えた。次に、実施例1~8及び比較例1~7の試験片に対して、シェア速度500μm/sec、クリアランス100μmでボンドテスター(DAGE社製、型番:2400)により、25℃におけるシェア強度を測定した。
幅1mm×長さ50mm×厚み0.03mmの帯状の金めっき付き銅板2枚を、上記接着剤組成物を介して、互いに直交するように十字型に貼り合わせて、接着剤層(直交部分)が幅1mm×長さ1mm×厚み0.03mmの寸法になるような試験片を得た。続いて、上記(1)の接着性評価と同様の熱履歴を試験片に加えた。その後、試験片について、四端子法で厚み方向の体積抵抗率を測定した。
1.7mm×1.4mmの銅箔ランドを設けた、長さ100mm×幅50mm×厚み1.0mmの矩形平板状のTPU基板を準備した。次いで、銅箔ランド上に接着剤組成物をメタルマスク(厚み100μm、開口寸法1.0mm×1.6mm)を用いて印刷し、チップ抵抗(3.2mm×1.6mm、ローム株式会社製MCR)を搭載した。この部品搭載基板に上記(1)の接着性評価と同様の熱履歴を加え、耐TCT性評価用の試験基板を得た。この試験基板を、熱衝撃試験機であるエスペック株式会社製TSE-11-A(1サイクル:-55℃で30分間保持、125℃まで5分間で昇温、125℃で30分間保持、-55℃まで5分間で降温)に投入し、接続抵抗を測定した。耐TCT性の評価は、初期抵抗値に対して±10%以内の抵抗変化率を示したサイクル数を指標とした。
1.7mm×1.4mmの銅箔ランドを設けた、長さ200mm×幅20mm×厚み1.0mmの矩形平板状のTPU基板を準備した。次いで、銅箔ランド上に接着剤組成物をメタルマスク(厚み100μm、開口寸法1.0mm×1.6mm)を用いて印刷し、チップ抵抗(3.2mm×1.6mm、ローム株式会社製MCR)を搭載した。この部品搭載基板に上記(1)の接着性評価と同様の熱履歴を加え、耐屈曲性評価用の試験基板を得た。この試験基板を、U字折り返し試験機(ユアサシステム機器株式会社、DLDMLH-FU)に、部品搭載部が内側になるように、屈曲半径が2.0mmとした状態でU字型に屈曲させて基板の両端を摺動板と固定板に装着し、試験雰囲気23℃において、摺動板を50mmのストローク、摺動速度100回/分で左右に摺動させて、試験基板を所定回繰り返し屈曲させた時の部品搭載部の抵抗値を測定した。耐屈曲性の評価は、初期抵抗値が10%上昇した時点での摺動回数を耐屈曲寿命とした。
1.7mm×1.4mmの銅箔ランドを設けた、長さ200mm×幅20mm×厚み1.0mmの矩形平板状のTPU基板を準備した。次いで、銅箔ランド上に接着剤組成物をメタルマスク(厚み100μm、開口寸法1.0mm×1.6mm)を用いて印刷し、チップ抵抗(3.2mm×1.6mm、ローム株式会社製MCR)を搭載した。この部品搭載基板に上記(1)の接着性評価と同様の熱履歴を加え、耐伸縮性評価用の試験基板を得た。この試験基板を、最も縮んだ状態となるように繰り返し伸縮試験機(株式会社大栄科学精器製作所製、DC-210)に両端をそれぞれ固定し、試験雰囲気23℃で、引っ張り時に伸張30%となるように100回/分で所定回繰り返し伸縮させた時の抵抗値を測定した。耐伸縮性の評価は、初期抵抗値が10%上昇した時点での伸縮回数を耐伸縮寿命とした。
Claims (10)
- フレキシブル配線基板と電子部品とを電気的に接続するために用いられる導電性接着剤組成物であって、
融点が200℃以下の金属を含む導電性粒子、熱硬化性樹脂、フラックス活性剤及び硬化触媒を含有し、
前記導電性粒子が、Sn42-Bi58はんだ、Sn48-In52はんだ、Sn42-Bi57-Ag1はんだ、Sn90-Ag2-Cu0.5-Bi7.5はんだ、Sn89-Zn8-Bi3はんだ、及びSn91-Zn9はんだからなる群より選ばれる少なくとも1種を含み、
前記フラックス活性剤が、2,2-ビス(ヒドロキシメチル)プロピオン酸、2,2-ビス(ヒドロキシメチル)ブタン酸、2,2-ビス(ヒドロキシメチル)ペンタン酸及び酒石酸からなる群より選ばれる少なくとも1種を含む脂肪族ジヒドロキシカルボン酸であり、
前記熱硬化性樹脂が、ビスフェノールA型エポキシ樹脂、ビスフェノールF型エポキシ樹脂、ビスフェノールAD型エポキシ樹脂及びアミン型エポキシ樹脂からなる群より選ばれる少なくとも1種のエポキシ樹脂を含み、
前記硬化触媒が、イミダゾール化合物を含み、
前記フレキシブル配線基板が、熱可塑性ポリウレタンエラストマーを含む基材から構成される、導電性接着剤組成物。 - 25℃での粘度が5~400Pa・sであるペースト状の組成物である、請求項1に記載の導電性接着剤組成物。
- 前記フレキシブル配線基板に配置された接続端子と、前記電子部品に配置された接続端子とを電気的に接続するために用いられる、請求項1又は2に記載の導電性接着剤組成物。
- 第1の接続端子を有するフレキシブル配線基板と、
第2の接続端子を有する電子部品と、
前記フレキシブル配線基板及び前記電子部品の間に配置された接続部と、を備え、
前記接続部が、請求項1~3のいずれか一項に記載の導電性接着剤組成物の硬化物を含有し、前記第1の接続端子及び前記第2の接続端子が電気的に接続されており、
前記フレキシブル配線基板が、熱可塑性ポリウレタンエラストマーを含む基材から構成される、接続構造体。 - 前記接続部が、融点が200℃以下の金属を含有する金属部と、熱硬化性樹脂を含有する樹脂部とから成る接続構造を有する、請求項4に記載の接続構造体。
- 前記接続構造を前記第2の接続端子の上面に直交する断面で見たとき、前記金属部が前記第2の接続端子及び前記第1の接続端子に接しており、前記樹脂部が前記金属部の周囲に存在する接続構造を有する、請求項5に記載の接続構造体。
- 前記金属部と前記樹脂部との面積比が、5:95~80:20である、請求項5又は6に記載の接続構造体。
- 前記樹脂部の周囲に封止部材を更に有する、請求項5~7のいずれか一項に記載の接続構造体。
- 前記電子部品が、半導体発光素子、コンデンサ、ショットキーバリアダイオード及びドライバ集積回路からなる群より選ばれる少なくとも1種を含む、請求項4~8のいずれか一項に記載の接続構造体。
- 第1の接続端子を有するフレキシブル配線基板と、
第2の接続端子を有する半導体発光素子と、
前記フレキシブル配線基板及び前記半導体発光素子の間に配置された接続部と、を備え、
前記接続部が、請求項1~3のいずれか一項に記載の導電性接着剤組成物の硬化物を含有し、前記第1の接続端子及び前記第2の接続端子が電気的に接続されており、
前記フレキシブル配線基板が、熱可塑性ポリウレタンエラストマーを含む基材から構成される、半導体発光素子搭載フレキシブル配線基板。
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