JP7291082B2 - 撮像装置 - Google Patents
撮像装置 Download PDFInfo
- Publication number
- JP7291082B2 JP7291082B2 JP2019567908A JP2019567908A JP7291082B2 JP 7291082 B2 JP7291082 B2 JP 7291082B2 JP 2019567908 A JP2019567908 A JP 2019567908A JP 2019567908 A JP2019567908 A JP 2019567908A JP 7291082 B2 JP7291082 B2 JP 7291082B2
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- Prior art keywords
- light
- imaging device
- photoelectric conversion
- light shielding
- imaging
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Images
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L27/00—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate
- H01L27/14—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation
- H01L27/144—Devices controlled by radiation
- H01L27/146—Imager structures
- H01L27/14601—Structural or functional details thereof
- H01L27/1462—Coatings
- H01L27/14623—Optical shielding
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L27/00—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate
- H01L27/14—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation
- H01L27/144—Devices controlled by radiation
- H01L27/146—Imager structures
- H01L27/14665—Imagers using a photoconductor layer
- H01L27/14669—Infrared imagers
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L24/00—Arrangements for connecting or disconnecting semiconductor or solid-state bodies; Methods or apparatus related thereto
- H01L24/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L24/26—Layer connectors, e.g. plate connectors, solder or adhesive layers; Manufacturing methods related thereto
- H01L24/28—Structure, shape, material or disposition of the layer connectors prior to the connecting process
- H01L24/29—Structure, shape, material or disposition of the layer connectors prior to the connecting process of an individual layer connector
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L24/00—Arrangements for connecting or disconnecting semiconductor or solid-state bodies; Methods or apparatus related thereto
- H01L24/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L24/26—Layer connectors, e.g. plate connectors, solder or adhesive layers; Manufacturing methods related thereto
- H01L24/31—Structure, shape, material or disposition of the layer connectors after the connecting process
- H01L24/32—Structure, shape, material or disposition of the layer connectors after the connecting process of an individual layer connector
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L27/00—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate
- H01L27/14—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation
- H01L27/144—Devices controlled by radiation
- H01L27/146—Imager structures
- H01L27/14601—Structural or functional details thereof
- H01L27/14625—Optical elements or arrangements associated with the device
- H01L27/14627—Microlenses
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L27/00—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate
- H01L27/14—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation
- H01L27/144—Devices controlled by radiation
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- H01L27/14649—Infrared imagers
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L27/00—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate
- H01L27/14—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation
- H01L27/144—Devices controlled by radiation
- H01L27/146—Imager structures
- H01L27/14683—Processes or apparatus peculiar to the manufacture or treatment of these devices or parts thereof
- H01L27/14694—The active layers comprising only AIIIBV compounds, e.g. GaAs, InP
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L2224/26—Layer connectors, e.g. plate connectors, solder or adhesive layers; Manufacturing methods related thereto
- H01L2224/28—Structure, shape, material or disposition of the layer connectors prior to the connecting process
- H01L2224/29—Structure, shape, material or disposition of the layer connectors prior to the connecting process of an individual layer connector
- H01L2224/29001—Core members of the layer connector
- H01L2224/29005—Structure
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L2224/26—Layer connectors, e.g. plate connectors, solder or adhesive layers; Manufacturing methods related thereto
- H01L2224/31—Structure, shape, material or disposition of the layer connectors after the connecting process
- H01L2224/32—Structure, shape, material or disposition of the layer connectors after the connecting process of an individual layer connector
- H01L2224/321—Disposition
- H01L2224/32151—Disposition the layer connector connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive
- H01L2224/32221—Disposition the layer connector connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked
- H01L2224/32225—Disposition the layer connector connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked the item being non-metallic, e.g. insulating substrate with or without metallisation
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- Microelectronics & Electronic Packaging (AREA)
- Electromagnetism (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Solid State Image Pick-Up Elements (AREA)
- Transforming Light Signals Into Electric Signals (AREA)
- Optical Elements Other Than Lenses (AREA)
Description
1.実施の形態(遮光部を有する撮像装置の例)
2.変形例(レンズ形状の遮光部を有する例)
3.適用例
4.応用例
[構成]
図1は、本開示の一実施の形態に係る撮像装置(撮像装置1)の要部の模式的な断面構成を表したものである。撮像装置1は、例えばIII-V族半導体などの化合物半導体材料を用いた赤外線センサ等に適用されるものであり、例えば、可視領域(例えば380nm以上780nm未満)~短赤外領域(例えば780nm以上2400nm未満)の波長の光に、光電変換機能を有している。この撮像装置1には、例えば2次元配置された複数の受光単位領域P(画素P)が設けられている。図1には、2つの画素Pに相当する部分の断面構成について示す。
撮像装置1では、遮光部15および第2コンタクト層14を介して、光電変換層13へ光(例えば可視領域および赤外領域の波長の光)が入射すると、この光が光電変換層13において吸収される。これにより、光電変換層13では正孔(ホール)および電子の対が発生する(光電変換される)。このとき、例えば電極11に所定の電圧が印加されると、光電変換層13に電位勾配が生じ、発生した電荷のうち一方の電荷(例えば正孔)が、信号電荷として拡散領域12Aに移動し、拡散領域12Aから電極11へ収集される。この信号電荷が、コンタクト電極17E,22Eを通じて画素回路に移動し、画素P毎に読み出される。
図3は、撮像装置1に入射する光(光L1,L2,L3)の経路を模式的に表している。本実施の形態の撮像装置1は、光電変換層13の第1面S1に入射する光の光路に遮光部15を有している。この遮光部15は、例えば、紫外領域の波長の光(光L3)等を遮光する。一方、赤外領域の波長の光(光L1)および可視領域の波長の光(光L2)は、遮光部15を透過して、第1面S1から光電変換層13に入射する。この撮像装置1では、第2コンタクト層14の厚みを小さくすることにより、光電変換層13の感度を向上させるとともに、遮光部15により、ノイズを低減することができる。以下、これについて説明する。
図4は、上記実施の形態の変形例に係る撮像装置(撮像装置1A)の要部の断面構成を模式的に表したものである。この撮像装置1Aは、オンチップレンズとして設けられた遮光部(遮光部15A)を有している。この点を除き、撮像装置1Aは撮像装置1と同様の構成および効果を有している。
上述の撮像装置1,1Aは、例えば赤外領域を撮像可能なカメラなど、様々なタイプの電子機器に適用することができる。図7に、その一例として、電子機器5(カメラ)の概略構成を示す。この電子機器5は、例えば静止画または動画を撮影可能なカメラであり、撮像装置1,1Aと、光学系(光学レンズ)310と、シャッタ装置311と、撮像装置1,1Aおよびシャッタ装置311を駆動する駆動部313と、信号処理部312とを有する。
更に、本開示に係る技術(本技術)は、様々な製品へ応用することができる。例えば、本開示に係る技術は、内視鏡手術システムに適用されてもよい。
本開示に係る技術(本技術)は、様々な製品へ応用することができる。例えば、本開示に係る技術は、内視鏡手術システムに適用されてもよい。
本開示に係る技術は、様々な製品へ応用することができる。例えば、本開示に係る技術は、自動車、電気自動車、ハイブリッド電気自動車、自動二輪車、自転車、パーソナルモビリティ、飛行機、ドローン、船舶、ロボット、建設機械、農業機械(トラクター)などのいずれかの種類の移動体に搭載される装置として実現されてもよい。
(1)
化合物半導体を含み、光入射面を有する光電変換層と、
前記光入射面に入射する光の光路に設けられ、前記光電変換層に格子整合された化合物を含むと共に、450nm未満の波長の光を遮光する遮光部とを備え、
前記遮光部は、InxGayAszP(1-x-y-z),InxGayAlzAs(1-x-y-z),InxGayAszSb(1-x-y-z),InxAlyAszSb(1-x-y-z),InxAlyGazN(1-x-y-z)またはZnxCdySezを含む(0≦x≦1、0≦y≦1、0≦z≦1)
撮像装置。
(2)
前記遮光部は無機材料を含む
前記(1)に記載の撮像装置。
(3)
前記遮光部は有機材料を含む
前記(1)に記載の撮像装置。
(4)
前記遮光部は金属を含む
前記(1)に記載の撮像装置。
(5)
前記遮光部はレンズ形状を有する
前記(1)ないし(3)のうちいずれか1つに記載の撮像装置。
(6)
前記遮光部は、赤外領域の波長の光および可視領域の波長の光を透過する
前記(1)ないし(5)のうちいずれか1つに記載の撮像装置。
(7)
更に、前記光電変換層を間にして前記遮光部に対向する第1コンタクト層と、
前記光電変換層を間にして、前記第1コンタクト層に対向する第2コンタクト層とを有する
前記(1)ないし(6)のうちいずれか1つに記載の撮像装置。
(8)
前記遮光部は、前記第2コンタクト層に接して設けられている
前記(7)に記載の撮像装置。
(9)
前記遮光部は、前記第2コンタクト層に離間して設けられている
前記(7)に記載の撮像装置。
(10)
前記第2コンタクト層は、100nm以下の厚みを有する
前記(7)ないし(9)のうちいずれか1つに記載の撮像装置。
(11)
更に、前記第1コンタクト層、前記光電変換層および前記第2コンタクト層を含む素子基板と、
前記光電変換層に電気的に接続された画素回路を有する回路基板とを有する
前記(7)ないし(10)のうちいずれか1つに記載の撮像装置。
(12)
前記素子基板と前記回路基板とがCu-Cu接合により電気的に接続されている
前記(11)に記載の撮像装置。
(13)
前記化合物半導体は、赤外領域の波長の光を吸収する
前記(1)ないし(12)のうちいずれか1つに記載の撮像装置。
(14)
前記化合物半導体は、InGaAs,InAsSb,InAs,InSb,PbS,PbSe,GeAuおよびHgCdTeのうちのいずれか1つである
前記(1)ないし(13)のうちいずれか1つに記載の撮像装置。
Claims (14)
- 化合物半導体を含み、光入射面を有する光電変換層と、
前記光入射面に入射する光の光路に設けられ、前記光電変換層に格子整合された化合物を含むと共に、450nm未満の波長の光を遮光する遮光部とを備え、
前記遮光部は、InxGayAszP(1-x-y-z),InxGayAlzAs(1-x-y-z),InxGayAszSb(1-x-y-z),InxAlyAszSb(1-x-y-z),InxAlyGazN(1-x-y-z)またはZnxCdySezを含む(0≦x≦1、0≦y≦1、0≦z≦1)
撮像装置。 - 前記遮光部は無機材料を含む
請求項1に記載の撮像装置。 - 前記遮光部は有機材料を含む
請求項1に記載の撮像装置。 - 前記遮光部は金属を含む
請求項1に記載の撮像装置。 - 前記遮光部はレンズ形状を有する
請求項1に記載の撮像装置。 - 前記遮光部は、赤外領域の波長の光および可視領域の波長の光を透過する
請求項1に記載の撮像装置。 - 更に、前記光電変換層を間にして前記遮光部に対向する第1コンタクト層と、
前記光電変換層を間にして、前記第1コンタクト層に対向する第2コンタクト層とを有する
請求項1に記載の撮像装置。 - 前記遮光部は、前記第2コンタクト層に接して設けられている
請求項7に記載の撮像装置。 - 前記遮光部は、前記第2コンタクト層に離間して設けられている
請求項7に記載の撮像装置。 - 前記第2コンタクト層は、100nm以下の厚みを有する
請求項7に記載の撮像装置。 - 更に、前記第1コンタクト層、前記光電変換層および前記第2コンタクト層を含む素子基板と、
前記光電変換層に電気的に接続された画素回路を有する回路基板とを有する
請求項7に記載の撮像装置。 - 前記素子基板と前記回路基板とがCu-Cu接合により電気的に接続されている
請求項11に記載の撮像装置。 - 前記化合物半導体は、赤外領域の波長の光を吸収する
請求項1に記載の撮像装置。 - 前記化合物半導体は、InGaAs,InAsSb,InAs,InSb,PbS,PbSe,GeAuおよびHgCdTeのうちのいずれか1つである
請求項1に記載の撮像装置。
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