JP7282894B2 - 粒子定量装置 - Google Patents
粒子定量装置 Download PDFInfo
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- JP7282894B2 JP7282894B2 JP2021536609A JP2021536609A JP7282894B2 JP 7282894 B2 JP7282894 B2 JP 7282894B2 JP 2021536609 A JP2021536609 A JP 2021536609A JP 2021536609 A JP2021536609 A JP 2021536609A JP 7282894 B2 JP7282894 B2 JP 7282894B2
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Description
粒子状試料を表す試料画像を取得する画像取得手段と、
前記試料画像に関する演算処理を行うデータ処理手段と、
を備える、粒子定量装置であって、
前記データ処理手段は、
前記試料画像の周波数領域表現を取得し、
前記周波数領域表現を、高周波数成分および低周波数成分に分離し、
前記高周波数成分の空間領域表現として高周波数画像を取得し、
前記低周波数成分の空間領域表現として低周波数画像を取得し、
前記高周波数画像および前記低周波数画像に基づいて前記粒子状試料を認識する、
ことを特徴とする。
粒子状試料を表す試料画像を取得する画像取得手段と、
前記試料画像に関する演算処理を行うデータ処理手段と、
を備える、粒子定量装置であって、
前記データ処理手段は、
前記試料画像に基づいて、光学的に高開口数の光路を通過する成分の光による高開口数画像と、光学的に低開口数の光路を通過する成分の光による低開口数画像とを取得し、
前記高開口数画像および前記低開口数画像に基づいて前記粒子状試料を定量する、
ことを特徴とする。
粒子状試料を表す試料画像を取得する画像取得手段と、
前記試料画像に関する演算処理を行うデータ処理手段と、
を備える、粒子定量装置であって、
前記データ処理手段は、
前記試料画像において粒子が存在する粒子領域を抽出し、
前記粒子領域の画素数を算定し、
前記試料画像の画素数に対する、前記粒子領域の画素数の割合に基づいて、前記粒子状試料を定量する、
ことを特徴とする。
図6は、高周波数画像の全画素に対する輝度のヒストグラムの例である。このヒストグラムは図5(e)の高周波数画像のものである。図中の「m」は時間単位を表し、この例では「分」を表す。たとえば、「0m」は培養開始時点すなわち培養経過時間が0分である状態の画像の輝度分布を表し、「34m」は培養経過時間が34分である状態の画像の輝度分布を表す。
第1の実施形態において、以下のような変形を施すことができる。
各閾値は任意に設計することができる。たとえば、周波数領域表現(図5(b)~(d))において低周波数領域と高周波数領域とを分離する円の半径を6とする必要はなく、高周波数画像において高輝度画素を抽出する際の閾値輝度(図6)を6とする必要はなく、低周波数画像において低輝度画素を抽出する際の閾値輝度(図8)を96とする必要はない。
101…照明用光学系
102…サンプル容器
103…台座
104…XYステージ
105…対物レンズ
106…対物レンズアクチュエータ
107…撮像カメラ(画像取得手段)
108…コンピュータ(データ処理手段)
S1…ステップ(画像取得工程)
S2,S3,S4,S5…ステップ(データ処理工程)
本明細書で引用した全ての刊行物、特許及び特許出願はそのまま引用により本明細書に組み入れられるものとする。
Claims (8)
- 粒子状試料を表す試料画像を取得する画像取得手段と、
前記試料画像に関する演算処理を行うデータ処理手段と、
を備える、粒子定量装置であって、
前記データ処理手段は、
単一の前記試料画像の周波数領域表現を取得し、
前記周波数領域表現を、高周波数成分および低周波数成分に分離し、
前記高周波数成分の空間領域表現として高周波数画像を取得し、
前記低周波数成分の空間領域表現として低周波数画像を取得し、
同一の前記試料画像から取得される前記高周波数画像および前記低周波数画像に基づいて、
前記高周波数画像において粒子が存在する第1領域を抽出し、
前記低周波数画像において粒子が存在する第2領域を抽出し、
前記第1領域と前記第2領域との論理和を取ることによって論理和領域を取得し、
前記論理和領域の面積に基づいて前記粒子状試料を定量する、
ことを特徴とする、粒子定量装置。 - 前記高周波数成分の分離は、前記周波数領域表現から0次回折成分を除去することであることを特徴とする、請求項1に記載の粒子定量装置。
- 粒子状試料を表す試料画像を取得する画像取得手段と、
前記試料画像に関する演算処理を行うデータ処理手段と、
を備える、粒子定量装置であって、
前記データ処理手段は、
単一の前記試料画像に基づいて、光学的に高開口数の光路を通過する成分の光による高開口数画像と、光学的に低開口数の光路を通過する成分の光による低開口数画像とを取得し、
同一の前記試料画像から取得される前記高開口数画像および前記低開口数画像に基づいて、
前記高開口数画像において粒子が存在する第1領域を抽出し、
前記低開口数画像において粒子が存在する第2領域を抽出し、
前記第1領域と前記第2領域との論理和を取ることによって論理和領域を取得し、
前記論理和領域の面積に基づいて前記粒子状試料を定量する、
ことを特徴とする、粒子定量装置。 - 前記画像取得手段は、所定時間ごとに前記試料画像を取得し、
前記データ処理手段は、各前記試料画像について前記粒子状試料を定量する、
ことを特徴とする、請求項1に記載の粒子定量装置。 - 前記データ処理手段は、
前記高周波数画像の各画素の輝度に基づいて前記第1領域を抽出し、
前記低周波数画像の各画素の輝度に基づいて前記第2領域を抽出する、
ことを特徴とする、請求項1に記載の粒子定量装置。 - 前記データ処理手段は、
前記第1領域の画素数と、前記第2領域の画素数とに基づいて前記粒子状試料を定量する、
ことを特徴とする、請求項1に記載の粒子定量装置。 - 前記データ処理手段は、
前記第1領域の各画素の輝度の経時変化を表す情報と、前記第2領域の各画素の輝度の経時変化を表す情報とを出力するか、または、
前記第1領域の画素数の経時変化を表す情報と、前記第2領域の画素数の経時変化を表す情報とを出力する、
ことを特徴とする、請求項1に記載の粒子定量装置。 - 前記粒子状試料は透光性を有し、
前記粒子状試料は、粒子、細胞、または細菌である、
ことを特徴とする、請求項1に記載の粒子定量装置。
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JP2019138526 | 2019-07-29 | ||
PCT/JP2020/011638 WO2021019830A1 (ja) | 2019-07-29 | 2020-03-17 | 粒子定量装置 |
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JPWO2021019830A1 JPWO2021019830A1 (ja) | 2021-02-04 |
JPWO2021019830A5 JPWO2021019830A5 (ja) | 2022-05-17 |
JP7282894B2 true JP7282894B2 (ja) | 2023-05-29 |
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JP2001307066A (ja) | 2000-04-21 | 2001-11-02 | Matsushita Electric Ind Co Ltd | 細胞画像分析装置および細胞画像分析方法 |
JP2005218379A (ja) | 2004-02-06 | 2005-08-18 | Olympus Corp | 培養細胞の状態計測方法及び計測装置 |
JP2012150140A (ja) | 2011-01-17 | 2012-08-09 | Nikon Corp | 顕微鏡装置及び観察方法 |
WO2018128080A1 (ja) | 2017-01-06 | 2018-07-12 | オリンパス株式会社 | 細胞観察システム |
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JP2005218379A (ja) | 2004-02-06 | 2005-08-18 | Olympus Corp | 培養細胞の状態計測方法及び計測装置 |
JP2012150140A (ja) | 2011-01-17 | 2012-08-09 | Nikon Corp | 顕微鏡装置及び観察方法 |
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