JP7262212B2 - Film forming apparatus, film forming method, and method for manufacturing electronic device - Google Patents

Film forming apparatus, film forming method, and method for manufacturing electronic device Download PDF

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JP7262212B2
JP7262212B2 JP2018221606A JP2018221606A JP7262212B2 JP 7262212 B2 JP7262212 B2 JP 7262212B2 JP 2018221606 A JP2018221606 A JP 2018221606A JP 2018221606 A JP2018221606 A JP 2018221606A JP 7262212 B2 JP7262212 B2 JP 7262212B2
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JP2019218623A5 (en
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利治 住谷
雄樹 相澤
悠 深澤
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Canon Tokki Corp
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    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10KORGANIC ELECTRIC SOLID-STATE DEVICES
    • H10K71/00Manufacture or treatment specially adapted for the organic devices covered by this subclass
    • CCHEMISTRY; METALLURGY
    • C23COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
    • C23CCOATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
    • C23C14/00Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material
    • C23C14/04Coating on selected surface areas, e.g. using masks
    • C23C14/042Coating on selected surface areas, e.g. using masks using masks
    • CCHEMISTRY; METALLURGY
    • C23COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
    • C23CCOATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
    • C23C14/00Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material
    • C23C14/06Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material characterised by the coating material
    • C23C14/12Organic material
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    • C23COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
    • C23CCOATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
    • C23C14/00Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material
    • C23C14/06Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material characterised by the coating material
    • C23C14/14Metallic material, boron or silicon
    • C23C14/18Metallic material, boron or silicon on other inorganic substrates
    • CCHEMISTRY; METALLURGY
    • C23COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
    • C23CCOATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
    • C23C14/00Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material
    • C23C14/22Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material characterised by the process of coating
    • C23C14/24Vacuum evaporation
    • C23C14/243Crucibles for source material
    • CCHEMISTRY; METALLURGY
    • C23COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
    • C23CCOATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
    • C23C14/00Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material
    • C23C14/22Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material characterised by the process of coating
    • C23C14/50Substrate holders
    • C23C14/505Substrate holders for rotation of the substrates
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10KORGANIC ELECTRIC SOLID-STATE DEVICES
    • H10K71/00Manufacture or treatment specially adapted for the organic devices covered by this subclass
    • H10K71/10Deposition of organic active material
    • H10K71/16Deposition of organic active material using physical vapour deposition [PVD], e.g. vacuum deposition or sputtering
    • H10K71/164Deposition of organic active material using physical vapour deposition [PVD], e.g. vacuum deposition or sputtering using vacuum deposition

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  • Engineering & Computer Science (AREA)
  • Chemical Kinetics & Catalysis (AREA)
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Description

本発明は、成膜装置、成膜方法および電子デバイスを製造する方法に関するものである。 The present invention relates to a film forming apparatus, a film forming method, and a method of manufacturing an electronic device.

最近、フラットパネル表示装置として有機EL表示装置が脚光を浴びている。有機EL表示装置は自発光ディスプレイであり、応答速度、視野角、薄型化などの特性が液晶パネルディスプレイより優れており、モニタ、テレビ、スマートフォンに代表される各種の携帯端末などで既存の液晶パネルディスプレイを速いスピードで代替している。また、自動車用ディスプレイ等にも、その応用分野を広げている。 Recently, an organic EL display device has been spotlighted as a flat panel display device. Organic EL display devices are self-luminous displays, and are superior to liquid crystal panel displays in characteristics such as response speed, viewing angle, and thinness. It is replacing the display at a fast speed. In addition, the field of application is expanding to automobile displays and the like.

有機EL表示装置の素子は、2つの向かい合う電極(カソード電極、アノード電極)の間に発光を起こす有機物層が形成された基本構造を持つ。有機ELディスプレイ素子の有機物層と金属電極層は、真空チャンバー内で蒸着材料が収容された蒸発源を加熱し、蒸着材料を蒸発させて、画素パターンが形成されたマスクを介して基板に成膜することで製造される。 An element of an organic EL display device has a basic structure in which an organic material layer that emits light is formed between two facing electrodes (a cathode electrode and an anode electrode). The organic layer and metal electrode layer of the organic EL display element are formed on the substrate through a mask with a pixel pattern formed by heating an evaporation source containing an evaporation material in a vacuum chamber to evaporate the evaporation material. It is manufactured by

特に、金属電極層を基板に成膜するための蒸発源700は図7に示すように、複数のるつぼ710~770が円周上に配置され、複数のるつぼ710~770のうちで実際に成膜に使われるるつぼ710が蒸着位置に回転移動して基板に対して蒸着材料を蒸発させる。このような回転型の多点蒸発源をリボルバとも呼ぶ。一方、成膜対象の基板のサイズが大型化することにつれ、成膜速度などを高めるため、成膜装置内に複数の蒸発源を配置する必要が出てきている。 In particular, an evaporation source 700 for depositing a metal electrode layer on a substrate has a plurality of crucibles 710 to 770 arranged on a circumference as shown in FIG. A crucible 710 used for the film is rotated to the deposition position to evaporate the deposition material onto the substrate. Such a rotating multi-point evaporation source is also called a revolver. On the other hand, as the size of substrates on which films are to be formed increases, it becomes necessary to arrange a plurality of evaporation sources in a film forming apparatus in order to increase the film forming speed.

ところが、このように複数の蒸発源を配置する場合には、蒸発源の配置によっては基板に対する各蒸発源の蒸発特性に差が生じ得る可能性があり、また、成膜装置の大型化につながる恐れもあるが、このような蒸発源の蒸発特性の差や、成膜装置内のスペース利用効率を十分に考慮して複数の蒸発源を効果的に配置する技術は提案されていなかった。 However, when a plurality of evaporation sources are arranged in this way, there is a possibility that the evaporation characteristics of each evaporation source with respect to the substrate may differ depending on the arrangement of the evaporation sources. Although there is a risk, no technique has been proposed for effectively arranging a plurality of evaporation sources in full consideration of the difference in evaporation characteristics of the evaporation sources and the space utilization efficiency in the film forming apparatus.

本発明は、以上の点を考慮して、成膜装置内のスペース利用効率を高めて成膜装置の大型化を抑制できるように複数の蒸発源を効果的に配置した成膜装置、この成膜装置を用いた成膜方法および電子デバイスを製造する方法を提供することを目的とする。 In consideration of the above points, the present invention provides a film forming apparatus in which a plurality of evaporation sources are effectively arranged so as to improve space utilization efficiency in the film forming apparatus and suppress an increase in the size of the film forming apparatus. An object of the present invention is to provide a film forming method using a film apparatus and a method of manufacturing an electronic device.

また、本発明は、成膜装置内のスペース利用効率の向上とともに、基板に対する良好な成膜、および各蒸発源からの熱輻射の変動が基板に及ぼす影響を低減できる成膜装置、この成膜装置を用いた成膜方法および電子デバイスを製造する方法を提供することを他の目的とする。 In addition, the present invention provides a film forming apparatus capable of improving the efficiency of space utilization in the film forming apparatus, achieving good film formation on a substrate, and reducing the influence of fluctuations in thermal radiation from each evaporation source on the substrate. Another object of the present invention is to provide a film forming method using the apparatus and a method of manufacturing an electronic device.

本発明の第1態様による成膜装置は、回転する基板の成膜面に蒸着材料を蒸発させて蒸着する成膜装置であって、前記基板の成膜面と対向する面内に配置される3つ以上の蒸発源を含み、前記3つ以上の蒸発源のそれぞれは、回転軸を中心に放射状に配置された複数のるつぼを有し、前記回転軸を回転中心として回転可能であり、前記3つ以上の蒸発源は、前記3つ以上の蒸発源のうちの任意の3つの蒸発源の各回転中心が前記面内において三角形状を成すように配置され、前記3つ以上の蒸発源のそれぞれの前記複数のるつぼは、蒸着位置に位置する蒸着用るつぼと、予備加熱位置に位置する予備加熱用るつぼを含み、前記3つ以上の蒸発源のそれぞれの前記蒸着用るつぼは、前記面内において前記基板の回転中心軸から同一の距離に配置され、前記3つ以上の蒸発源のそれぞれの前記回転中心は、前記面内において前記基板の回転中心軸を中心とする同一の円上に配置され、前記3つ以上の蒸発源のそれぞれの前記蒸着用るつぼは、前記円よりも内側に配置され、前記3つ以上の蒸発源のそれぞれの前記予備加熱用るつぼは、前記基板の回転半径よりも外側で、且つ、前記円よりも外側に配置されることを特徴とする。
A film forming apparatus according to a first aspect of the present invention is a film forming apparatus that evaporates and deposits a vapor deposition material on a film forming surface of a rotating substrate, and is arranged in a plane facing the film forming surface of the substrate. three or more evaporation sources, each of the three or more evaporation sources having a plurality of crucibles radially arranged around a rotation axis, rotatable around the rotation axis, The three or more evaporation sources are arranged such that rotation centers of any three of the three or more evaporation sources form a triangular shape in the plane, and Each of the plurality of crucibles includes a vapor deposition crucible positioned at a vapor deposition position and a preheating crucible positioned at a preheating position, and each of the vapor deposition crucibles of the three or more evaporation sources are arranged at the same distance from the central axis of rotation of the substrate, and the centers of rotation of the three or more evaporation sources are arranged on the same circle centered on the central axis of rotation of the substrate in the plane. the vapor deposition crucibles of each of the three or more evaporation sources are arranged inside the circle, and the preheating crucibles of each of the three or more evaporation sources are located closer to the radius of rotation of the substrate. and outside the circle .

本発明の第2態様による成膜装置は、回転する基板の成膜面に蒸着材料を蒸発させて蒸着する成膜装置であって、前記基板の成膜面と対向する面内に配置される複数の蒸発源を含み、前記複数の蒸発源のそれぞれは、回転軸を中心に放射状に配置された複数のるつぼを有し、前記回転軸を回転中心として回転可能であり、前記複数の蒸発源は、複数の第1るつぼを有する複数の第1蒸発源と、前記各第1蒸発源が有する前記複数の第1るつぼの数よりも少ない数の第2るつぼを有する第2蒸発源とを含み、前記複数の第1蒸発源は、各回転中心が前記面内において前記基板の回転中心軸を中心とする第1円上に配置され、
前記第2蒸発源は、前記複数の第1蒸発源のうち隣接する二つの第1蒸発源の間に配置され、かつ、前記第2蒸発源の回転中心が前記隣接する二つの第1蒸発源の回転中心を結ぶ線分と同一直線上に位置しないように前記基板の回転中心軸を基準に前記隣接する二つの第1蒸発源の回転中心を結ぶ線分よりも外側で前記第1円よりも内側に配置されることを特徴とする。
本発明の第3態様による成膜装置は、回転する基板の成膜面に蒸着材料を蒸発させて蒸着する成膜装置であって、前記基板の成膜面と対向する面内に配置される複数の蒸発源を含み、前記複数の蒸発源のそれぞれは、回転軸を中心に放射状に配置された複数のるつぼを有し、前記回転軸を回転中心として回転可能であり、前記複数の蒸発源は、複数の第1るつぼを有する複数の第1蒸発源と、前記各第1蒸発源が有する前記複数の第1るつぼの数よりも少ない数の第2るつぼを有する第2蒸発源とを含み、前記複数の第1蒸発源は、各回転中心が前記面内において前記基板の回転中心軸を中心とする第1円上に配置され、前記第2蒸発源は、前記複数の第1蒸発源のうち隣接する二つの第1蒸発源の間に配置され、かつ、前記第2蒸発源の回転中心が前記隣接する二つの第1蒸発源の回転中心を結ぶ線分と同一直線上に位置しないように配置され、前記各第1蒸発源の前記第1るつぼおよび前記第2蒸発源の第2るつぼは、それぞれ、蒸着位置に位置する蒸着用るつぼと、予備加熱位置に位置する予備加熱用るつぼとを含み、前記第1蒸発源および前記第2蒸発源のそれぞれにおいて、前記各蒸着用るつぼは、前記各予備加熱用るつぼよりも前記基板の回転中心軸から近い位置に配置され、前記第2蒸発源の前記蒸着用るつぼは、前記基板の回転中心軸を基準に前記第2蒸発源の回転中心よりも内側に配置されることを特徴とする。
本発明の第4態様による成膜装置は、回転する基板の成膜面に蒸着材料を蒸発させて蒸着する成膜装置であって、前記基板の成膜面と対向する面内に配置される複数の蒸発源を含み、前記複数の蒸発源のそれぞれは、回転軸を中心に放射状に配置された複数のるつぼを有し、前記回転軸を回転中心として回転可能であり、前記複数の蒸発源は、複数の第1るつぼを有する複数の第1蒸発源と、前記各第1蒸発源が有する前記複数の第1るつぼの数よりも少ない数の第2るつぼを有する第2蒸発源とを含み、前記複数の第1蒸発源は、各回転中心が前記面内において前記基板の回転中心軸を中心とする第1円上に配置され、前記第2蒸発源は、前記複数の第1蒸発源のうち隣接する二つの第1蒸発源の間に配置され、かつ、前記第2蒸発源の回転中心が前記隣接する二つの第1蒸発源の回転中心を結ぶ線分と同一直線上に位置しないように配置され、前記各第1蒸発源の前記第1るつぼおよび前記第2蒸発源の第2るつぼは、それぞれ、蒸着位置に位置する蒸着用るつぼと、予備加熱位置に位置する予備加熱用るつぼとを含み、前記第1蒸発源および前記第2蒸発源のそれぞれにおいて、前記各蒸着用るつぼは、前記各予備加熱用るつぼよりも前記基板の回転中心軸から近い位置に配置され、前記第2蒸発源の前記予備加熱用るつぼは、前記基板の回転中心軸を基準に前記第2蒸発源の回転中心よりも外側に配置されることを特徴とする。
本発明の第5態様による成膜装置は、回転する基板の成膜面に蒸着材料を蒸発させて蒸着する成膜装置であって、前記基板の成膜面と対向する面内に配置される複数の蒸発源を含み、前記複数の蒸発源のそれぞれは、回転軸を中心に放射状に配置された複数のるつぼを有し、前記回転軸を回転中心として回転可能であり、前記複数の蒸発源は、複数の第1るつぼを有する複数の第1蒸発源と、前記各第1蒸発源が有する前記複数の第1るつぼの数よりも少ない数の第2るつぼを有する第2蒸発源とを含み、前記複数の第1蒸発源は、各回転中心が前記面内において前記基板の回転中心軸を中心とする第1円上に配置され、前記第2蒸発源は、前記複数の第1蒸発源のうち隣接する二つの第1蒸発源の間に配置され、かつ、前記第2蒸発源の回転中心が前記隣接する二つの第1蒸発源の回転中心を結ぶ線分と同一直線上に位置しないように配置され、前記各第1蒸発源の前記第1るつぼおよび前記第2蒸発源の第2るつぼは、それぞれ、蒸着位置に位置する蒸着用るつぼと、予備加熱位置に位置する予備加熱用るつぼとを含み、前記第1蒸発源および前記第2蒸発源のそれぞれにおいて、前記各蒸着用るつぼは、前記各予備加熱用るつぼよりも前記基板の回転中心軸から近い位置に配置され、前記各第1蒸発源の前記各蒸着用るつぼおよび前記第
2蒸発源の前記蒸着用るつぼは、前記基板の回転半径よりも外側に配置されることを特徴とする。
本発明の第6態様による成膜装置は、回転する基板の成膜面に蒸着材料を蒸発させて蒸着する成膜装置であって、前記基板の成膜面と対向する面内に配置される複数の蒸発源を含み、前記複数の蒸発源のそれぞれは、回転軸を中心に放射状に配置された複数のるつぼを有し、前記回転軸を回転中心として回転可能であり、前記複数の蒸発源は、複数の第1るつぼを有する複数の第1蒸発源と、前記各第1蒸発源が有する前記複数の第1るつぼの数よりも少ない数の第2るつぼを有する第2蒸発源とを含み、前記複数の第1蒸発源は、各回転中心が前記面内において前記基板の回転中心軸を中心とする第1円上に配置され、前記第2蒸発源は、前記複数の第1蒸発源のうち隣接する二つの第1蒸発源の間に配置され、かつ、前記第2蒸発源の回転中心が前記隣接する二つの第1蒸発源の回転中心を結ぶ線分と同一直線上に位置しないように配置され、前記各第1蒸発源の前記第1るつぼおよび前記第2蒸発源の第2るつぼは、それぞれ、蒸着位置に位置する蒸着用るつぼと、予備加熱位置に位置する予備加熱用るつぼとを含み、前記第1蒸発源および前記第2蒸発源のそれぞれにおいて、前記各蒸着用るつぼは、前記各予備加熱用るつぼよりも前記基板の回転中心軸から近い位置に配置され、前記各第1蒸発源の前記各予備加熱用るつぼおよび前記第2蒸発源の前記予備加熱用るつぼは、前記基板の回転半径よりも外側に配置されることを特徴とする。
本発明の第7態様による成膜装置は、回転する基板の成膜面に蒸着材料を蒸発させて蒸着する成膜装置であって、前記基板の成膜面と対向する面内に配置される複数の蒸発源を含み、前記複数の蒸発源のそれぞれは、回転軸を中心に放射状に配置された複数のるつぼを有し、前記回転軸を回転中心として回転可能であり、前記複数の蒸発源は、複数の第1るつぼを有する複数の第1蒸発源と、前記各第1蒸発源が有する前記複数の第1るつぼの数よりも少ない数の第2るつぼを有する第2蒸発源とを含み、前記複数の第1蒸発源は、各回転中心が前記面内において前記基板の回転中心軸を中心とする第1円上に配置され、前記第2蒸発源は、前記複数の第1蒸発源のうち隣接する二つの第1蒸発源の間に配置され、かつ、前記第2蒸発源の回転中心が前記隣接する二つの第1蒸発源の回転中心を結ぶ線分と同一直線上に位置しないように配置され、前記各第1蒸発源の前記第1るつぼおよび前記第2蒸発源の第2るつぼは、それぞれ、蒸着位置に位置する蒸着用るつぼと、予備加熱位置に位置する予備加熱用るつぼとを含み、前記第1蒸発源および前記第2蒸発源のそれぞれにおいて、前記各蒸着用るつぼは、前記各予備加熱用るつぼよりも前記基板の回転中心軸から近い位置に配置され、前記成膜装置は四つのコーナー部を有する多角形の成膜装置であり、前記複数の第1蒸発源は、上面から見たとき、前記多角形の成膜装置の各コーナー部に対応して四つの第1蒸発源が矩形状の四つの角部に対応する位置に配置され、前記各第1蒸発源の前記各蒸着用るつぼが長方形状の四つの角部に対応する位置に配置され、前記第2蒸発源は、上面から見たとき、前記矩形状に配置される四つの第1蒸発源のうち隣接する二つの第1蒸発源の間に配置され、かつ、前記長方形状の長辺に沿って配置されることを特徴とする。
A film forming apparatus according to a second aspect of the present invention is a film forming apparatus that evaporates and deposits a vapor deposition material on a film forming surface of a rotating substrate, and is arranged in a plane facing the film forming surface of the substrate. comprising a plurality of evaporation sources, each of the plurality of evaporation sources having a plurality of crucibles radially arranged around a rotation axis, rotatable around the rotation axis, and the plurality of evaporation sources includes a plurality of first evaporation sources having a plurality of first crucibles, and a second evaporation source having a smaller number of second crucibles than the number of the plurality of first crucibles possessed by each of the first evaporation sources , the plurality of first evaporation sources are each arranged on a first circle centered on the rotation center axis of the substrate in the plane, and
The second evaporation source is arranged between two adjacent first evaporation sources among the plurality of first evaporation sources, and the center of rotation of the second evaporation source is the two adjacent first evaporation sources. outside the line segment connecting the rotation centers of the two adjacent first evaporation sources with respect to the rotation center axis of the substrate so as not to be on the same straight line as the line segment connecting the rotation centers of the first circle are also arranged inside .
A film forming apparatus according to a third aspect of the present invention is a film forming apparatus that evaporates and deposits a vapor deposition material on a film forming surface of a rotating substrate, and is arranged in a plane facing the film forming surface of the substrate. comprising a plurality of evaporation sources, each of the plurality of evaporation sources having a plurality of crucibles radially arranged around a rotation axis, rotatable around the rotation axis, and the plurality of evaporation sources includes a plurality of first evaporation sources having a plurality of first crucibles, and a second evaporation source having a smaller number of second crucibles than the number of the plurality of first crucibles possessed by each of the first evaporation sources , the plurality of first evaporation sources are arranged on a first circle centered on the rotation center axis of the substrate in the plane, and the second evaporation sources are arranged on the plurality of first evaporation sources. and the rotation center of the second evaporation source is not located on the same straight line as the line segment connecting the rotation centers of the two adjacent first evaporation sources and the first crucible of each first evaporation source and the second crucible of the second evaporation source are respectively a vapor deposition crucible positioned at a vapor deposition position and a preheating crucible positioned at a preheating position. wherein, in each of the first evaporation source and the second evaporation source, each of the vapor deposition crucibles is arranged at a position closer to the rotation center axis of the substrate than each of the preheating crucibles, and the second The deposition crucible of the evaporation source is arranged inside the rotation center of the second evaporation source with respect to the rotation center axis of the substrate.
A film forming apparatus according to a fourth aspect of the present invention is a film forming apparatus that evaporates and deposits a vapor deposition material on a film forming surface of a rotating substrate, and is arranged in a plane facing the film forming surface of the substrate. comprising a plurality of evaporation sources, each of the plurality of evaporation sources having a plurality of crucibles radially arranged around a rotation axis, rotatable around the rotation axis, and the plurality of evaporation sources includes a plurality of first evaporation sources having a plurality of first crucibles, and a second evaporation source having a smaller number of second crucibles than the number of the plurality of first crucibles possessed by each of the first evaporation sources , the plurality of first evaporation sources are arranged on a first circle centered on the rotation center axis of the substrate in the plane, and the second evaporation sources are arranged on the plurality of first evaporation sources. and the rotation center of the second evaporation source is not located on the same straight line as the line segment connecting the rotation centers of the two adjacent first evaporation sources and the first crucible of each first evaporation source and the second crucible of the second evaporation source are respectively a vapor deposition crucible positioned at a vapor deposition position and a preheating crucible positioned at a preheating position. wherein, in each of the first evaporation source and the second evaporation source, each of the vapor deposition crucibles is arranged at a position closer to the rotation center axis of the substrate than each of the preheating crucibles, and the second The preheating crucible of the evaporation source is arranged outside the center of rotation of the second evaporation source with respect to the central axis of rotation of the substrate.
A film forming apparatus according to a fifth aspect of the present invention is a film forming apparatus that evaporates and deposits a vapor deposition material on a film forming surface of a rotating substrate, and is arranged in a plane facing the film forming surface of the substrate. comprising a plurality of evaporation sources, each of the plurality of evaporation sources having a plurality of crucibles radially arranged around a rotation axis, rotatable around the rotation axis, and the plurality of evaporation sources includes a plurality of first evaporation sources having a plurality of first crucibles, and a second evaporation source having a smaller number of second crucibles than the number of the plurality of first crucibles possessed by each of the first evaporation sources , the plurality of first evaporation sources are arranged on a first circle centered on the rotation center axis of the substrate in the plane, and the second evaporation sources are arranged on the plurality of first evaporation sources. and the rotation center of the second evaporation source is not located on the same straight line as the line segment connecting the rotation centers of the two adjacent first evaporation sources and the first crucible of each first evaporation source and the second crucible of the second evaporation source are respectively a vapor deposition crucible positioned at a vapor deposition position and a preheating crucible positioned at a preheating position. wherein, in each of the first evaporation source and the second evaporation source, each of the vapor deposition crucibles is arranged at a position closer to the rotation center axis of the substrate than each of the preheating crucibles; 1 each of the vapor deposition crucibles of the vapor source and the
The crucible for vapor deposition of two evaporation sources is characterized in that it is arranged outside the radius of rotation of the substrate.
A film forming apparatus according to a sixth aspect of the present invention is a film forming apparatus that evaporates and deposits a vapor deposition material on a film forming surface of a rotating substrate, and is arranged in a plane facing the film forming surface of the substrate. comprising a plurality of evaporation sources, each of the plurality of evaporation sources having a plurality of crucibles radially arranged around a rotation axis, rotatable around the rotation axis, and the plurality of evaporation sources includes a plurality of first evaporation sources having a plurality of first crucibles, and a second evaporation source having a smaller number of second crucibles than the number of the plurality of first crucibles possessed by each of the first evaporation sources , the plurality of first evaporation sources are arranged on a first circle centered on the rotation center axis of the substrate in the plane, and the second evaporation sources are arranged on the plurality of first evaporation sources. and the rotation center of the second evaporation source is not located on the same straight line as the line segment connecting the rotation centers of the two adjacent first evaporation sources and the first crucible of each first evaporation source and the second crucible of the second evaporation source are respectively a vapor deposition crucible positioned at a vapor deposition position and a preheating crucible positioned at a preheating position. wherein, in each of the first evaporation source and the second evaporation source, each of the vapor deposition crucibles is arranged at a position closer to the rotation center axis of the substrate than each of the preheating crucibles; Each of the preheating crucibles of one evaporation source and the preheating crucible of the second evaporation source are arranged outside a radius of rotation of the substrate.
A film forming apparatus according to a seventh aspect of the present invention is a film forming apparatus that evaporates and deposits a vapor deposition material on a film forming surface of a rotating substrate, and is arranged in a plane facing the film forming surface of the substrate. comprising a plurality of evaporation sources, each of the plurality of evaporation sources having a plurality of crucibles radially arranged around a rotation axis, rotatable around the rotation axis, and the plurality of evaporation sources includes a plurality of first evaporation sources having a plurality of first crucibles, and a second evaporation source having a smaller number of second crucibles than the number of the plurality of first crucibles possessed by each of the first evaporation sources , the plurality of first evaporation sources are arranged on a first circle centered on the rotation center axis of the substrate in the plane, and the second evaporation sources are arranged on the plurality of first evaporation sources. and the rotation center of the second evaporation source is not located on the same straight line as the line segment connecting the rotation centers of the two adjacent first evaporation sources and the first crucible of each first evaporation source and the second crucible of the second evaporation source are respectively a vapor deposition crucible positioned at a vapor deposition position and a preheating crucible positioned at a preheating position. and in each of the first evaporation source and the second evaporation source, each of the vapor deposition crucibles is arranged at a position closer to the rotation center axis of the substrate than each of the preheating crucibles, and the film formation The apparatus is a polygonal film forming apparatus having four corners, and when viewed from above, the plurality of first evaporation sources has four corners corresponding to the respective corners of the polygonal film forming apparatus. 1 evaporation sources are arranged at positions corresponding to four corners of a rectangular shape, the vapor deposition crucibles of the first evaporation sources are arranged at positions corresponding to the four corners of the rectangular shape, and the second When viewed from above, the evaporation sources are arranged between two adjacent first evaporation sources among the four first evaporation sources arranged in the rectangular shape, and are arranged along the long side of the rectangular shape. It is characterized by being arranged.

本発明によれば、成膜装置内のスペース利用効率を高めて成膜装置の大型化を抑制することができ、また、基板に対する良好な成膜、および各蒸発源からの熱輻射の変動が基板に及ぼす影響を効果的に低減できる。 According to the present invention, it is possible to improve the space utilization efficiency in the film forming apparatus and suppress the enlargement of the film forming apparatus. The influence on the substrate can be effectively reduced.

図1は、電子デバイス製造装置の一部の模式図である。FIG. 1 is a schematic diagram of part of an electronic device manufacturing apparatus. 図2は、本発明の一実施例による成膜装置の模式図である。FIG. 2 is a schematic diagram of a film forming apparatus according to an embodiment of the present invention. 図3は、本発明の一実施例による成膜装置内での基板と複数の蒸発源との配置関係を説明するための上面図である。FIG. 3 is a top view for explaining the positional relationship between a substrate and a plurality of evaporation sources in a film forming apparatus according to an embodiment of the present invention. 図4は、本発明の一実施例による成膜装置において、各蒸発源の蒸着用るつぼと予備加熱用るつぼの基板に対する相対的な配置関係を示した断面図である。FIG. 4 is a cross-sectional view showing the positional relationship of the vapor deposition crucible and the preheating crucible of each evaporation source relative to the substrate in the film forming apparatus according to an embodiment of the present invention. 図5は、本発明の他の実施例による成膜装置内での基板と複数の蒸発源との配置関係を説明するための上面図である。FIG. 5 is a top view for explaining the positional relationship between a substrate and a plurality of evaporation sources in a film forming apparatus according to another embodiment of the present invention. 図6は、本発明の有機EL装置の概略図である。FIG. 6 is a schematic diagram of an organic EL device of the present invention. 図7は、回転型の多点蒸発源(リボルバ)の概略図である。FIG. 7 is a schematic diagram of a rotating multi-point evaporation source (revolver).

以下、図面を参照して、本発明の好ましい実施形態及び実施例を説明する。ただし、以下の実施形態及び実施例は、本発明の好ましい構成を例示的に示すものであり、本発明の範囲は、これらの構成に限定されない。また、以下の説明において、装置のハードウェア構成及びソフトウェア構成、処理の流れ、製造条件、大きさ、材質、形状等は、特に特定的な記載がない限り、本発明の範囲をこれに限定しようとする趣旨ではない。 Preferred embodiments and examples of the present invention will now be described with reference to the drawings. However, the following embodiments and examples exemplify preferred configurations of the present invention, and the scope of the present invention is not limited to these configurations. In addition, in the following description, the scope of the present invention is limited to the hardware configuration and software configuration of the device, process flow, manufacturing conditions, size, material, shape, etc., unless otherwise specified. It is not the intention to do so.

<電子デバイスの製造装置>
図1は、電子デバイスの製造装置の一例を示す模式図である。
図1の電子デバイスの製造装置は、例えば、スマートフォン用の有機EL表示装置の表示パネルの製造に用いられる。スマートフォン用の表示パネルの場合、例えば、フルサイズ(約1500mm×約1850mm)又はハーフカットサイズ(約1500mm×約925mm)の基板に有機EL表示素子の形成のための成膜を行った後、該基板を切り抜いて複数の小さなサイズのパネルに製作する。
<Electronic Device Manufacturing Equipment>
FIG. 1 is a schematic diagram showing an example of an electronic device manufacturing apparatus.
The electronic device manufacturing apparatus of FIG. 1 is used, for example, for manufacturing display panels of organic EL display devices for smartphones. In the case of a display panel for smartphones, for example, a full-size (about 1500 mm × about 1850 mm) or half-cut size (about 1500 mm × about 925 mm) substrate is subjected to film formation for forming an organic EL display element, and then the Cut out the substrate to produce multiple small size panels.

電子デバイスの製造装置は、一般的に図1に示すように、複数のクラスタ装置1を含み、各クラスタ装置1は、基板10に対する処理(例えば、成膜)が行われる複数の成膜室11と、使用前後のマスクが収納される複数のマスクストックチャンバー12と、その中
央に配置される搬送室13を具備する。
As shown in FIG. 1, an electronic device manufacturing apparatus generally includes a plurality of cluster apparatuses 1. Each cluster apparatus 1 includes a plurality of film formation chambers 11 in which processing (for example, film formation) is performed on a substrate 10. , a plurality of mask stock chambers 12 in which masks before and after use are stored, and a transfer chamber 13 arranged in the center thereof.

搬送室13内には、複数の成膜室11の間で基板10を搬送し、成膜室11とマスクストックチャンバー12との間でマスクを搬送する搬送ロボット14が設置される。搬送ロボット14は、例えば、多関節アームに、基板10を保持するロボットハンドが取り付けられた構造を有するロボットである。 A transfer robot 14 is installed in the transfer chamber 13 to transfer the substrate 10 between the film formation chambers 11 and transfer the mask between the film formation chambers 11 and the mask stock chamber 12 . The transport robot 14 is, for example, a robot having a structure in which a robot hand holding the substrate 10 is attached to an articulated arm.

各成膜室11には、成膜装置(蒸着装置とも呼ぶ)が設置される。成膜装置では、蒸発源に収納された蒸着材料がヒータによって加熱されて蒸発し、マスクを介して基板10上に蒸着される。搬送ロボット14との基板10の受け渡し、基板10とマスクの相対位置の調整(アライメント)、マスク上への基板10の固定、成膜(蒸着)などの一連の成膜プロセスは、成膜装置によって自動的に行われる。 Each film forming chamber 11 is provided with a film forming apparatus (also referred to as a vapor deposition apparatus). In the film forming apparatus, the vapor deposition material stored in the evaporation source is heated by the heater to evaporate, and is vapor deposited on the substrate 10 through the mask. A series of film formation processes, such as transfer of the substrate 10 to and from the transport robot 14, adjustment of the relative positions of the substrate 10 and the mask (alignment), fixing of the substrate 10 onto the mask, and film formation (evaporation), are performed by the film formation apparatus. done automatically.

マスクストックチャンバー12には、成膜室11での成膜工程に使われる新しいマスクと、使用済みのマスクとが、二つのカセットに分けて収納される。搬送ロボット14は、使用済みのマスクを成膜室11からマスクストックチャンバー12のカセットに搬送し、マスクストックチャンバー12の他のカセットに収納された新しいマスクを成膜室11に搬送する。 In the mask stock chamber 12, a new mask to be used in the film forming process in the film forming chamber 11 and a used mask are stored separately in two cassettes. The transport robot 14 transports the used mask from the film formation chamber 11 to a cassette in the mask stock chamber 12 and transports a new mask stored in another cassette in the mask stock chamber 12 to the film formation chamber 11 .

クラスタ装置1には、基板10の流れ方向において上流側からの基板10を当該クラスタ装置1に伝達するパス室15と、当該クラスタ装置1で成膜処理が完了した基板10を下流側の他のクラスタ装置1に伝えるためのバッファー室16が連結される。搬送室13の搬送ロボット14は、上流側のパス室15から基板10を受け取って、当該クラスタ装置1内の成膜室11の一つ(例えば、成膜室11a)に搬送する。また、搬送ロボット14は、当該クラスタ装置1での成膜処理が完了した基板10を複数の成膜室11の一つ(例えば、成膜室11b)から受け取って、下流側に連結されたバッファー室16に搬送する。 The cluster device 1 includes a pass chamber 15 for transferring the substrates 10 from the upstream side to the cluster device 1 in the flow direction of the substrates 10, and a pass chamber 15 for transferring the substrates 10 that have undergone the film forming process in the cluster device 1 to the other downstream side. A buffer chamber 16 for transmitting to the cluster device 1 is connected. The transfer robot 14 in the transfer chamber 13 receives the substrate 10 from the pass chamber 15 on the upstream side and transfers it to one of the film formation chambers 11 (for example, the film formation chamber 11a) in the cluster device 1 . Further, the transport robot 14 receives the substrate 10 on which the film forming process in the cluster apparatus 1 has been completed from one of the plurality of film forming chambers 11 (for example, the film forming chamber 11b), and transfers the substrate to the buffer connected downstream. Transfer to chamber 16 .

バッファー室16とパス室15との間には、基板の向きを変える旋回室17が設置される。これにより、上流側のクラスタ装置1と下流側のクラスタ装置1で基板10の向きが同一となり、基板処理が容易になる。 Between the buffer chamber 16 and the pass chamber 15, a swirling chamber 17 for changing the orientation of the substrate is installed. As a result, the direction of the substrate 10 becomes the same between the cluster device 1 on the upstream side and the cluster device 1 on the downstream side, which facilitates substrate processing.

本実施例では、図1を参照して、電子デバイスの製造装置の構成について説明したが、本発明はこれに限定されず、他の種類のチャンバーを有してもよく、チャンバー間の配置が変わってもよい。 In this example, the configuration of the electronic device manufacturing apparatus was described with reference to FIG. may change.

以下、成膜室11に設けられる成膜装置の構成について説明する。
<成膜装置>
図2は、成膜装置、特に、金属電極層を形成するのに使われる金属性蒸着材料の成膜装置2の構成を模式的に示す断面図である。
The configuration of the film forming apparatus provided in the film forming chamber 11 will be described below.
<Deposition equipment>
FIG. 2 is a cross-sectional view schematically showing the configuration of a film forming apparatus, in particular, a film forming apparatus 2 for a metallic deposition material used to form a metal electrode layer.

成膜装置2は真空チャンバー20を具備する。真空チャンバー20の内部は真空などの減圧雰囲気、或いは窒素ガスなどの不活性ガス雰囲気に維持される。真空チャンバー20の内部の上部には、基板保持ユニット21とマスク台22とが設けられ、真空チャンバー20の内部の下部には蒸発源23が設置される。
基板保持ユニット21は、搬送室13の搬送ロボット14から受け取った基板10を保持及び搬送する手段で、基板ホルダとも呼ぶ。
フレーム状のマスク台22は、基板保持ユニット21の下側に設置され、マスク台22上にはマスク222が載置される。マスク222は、基板10上に形成される薄膜パターンに対応する開口パターンを有する。
The film forming apparatus 2 has a vacuum chamber 20 . The inside of the vacuum chamber 20 is maintained in a reduced-pressure atmosphere such as vacuum or an inert gas atmosphere such as nitrogen gas. A substrate holding unit 21 and a mask table 22 are installed in the upper part inside the vacuum chamber 20 , and an evaporation source 23 is installed in the lower part inside the vacuum chamber 20 .
The substrate holding unit 21 is means for holding and transferring the substrate 10 received from the transfer robot 14 in the transfer chamber 13, and is also called a substrate holder.
A frame-shaped mask table 22 is installed below the substrate holding unit 21 , and a mask 222 is placed on the mask table 22 . Mask 222 has an opening pattern corresponding to the thin film pattern to be formed on substrate 10 .

成膜時には、基板保持ユニット21がマスク台22に対して相対的に下降し(或いはマスク台22が基板保持ユニット21に向かって上昇し)、基板保持ユニット21によって保持された基板10がマスク222上に置かれた後、真空チャンバー20の上部(外部)から導入された回転シャフト27によって、基板保持ユニット21及びマスク台22を回転させることで、マスク222及びマスク222の上に置かれた基板10を回転させる。これは基板10上に金属性蒸着材料が均一な厚さで成膜できるようにするためである。 During film formation, the substrate holding unit 21 is lowered relative to the mask table 22 (or the mask table 22 is raised toward the substrate holding unit 21 ), and the substrate 10 held by the substrate holding unit 21 is moved to the mask 222 . After being placed on the mask 222 and the substrate placed on the mask 222 , the substrate holding unit 21 and the mask table 22 are rotated by the rotating shaft 27 introduced from the upper part (outside) of the vacuum chamber 20 . Rotate 10. This is for the purpose of forming a film of a metallic vapor deposition material on the substrate 10 with a uniform thickness.

図2には示していないが、真空チャンバー20の上面の外部(大気側)には、回転シャフト27を回転駆動するためのアクチュエータを含む駆動機構が設置される。また、マスク台22の下側には基板シャッタ(不図示)を設けることができる。基板シャッタは、基板10に対する成膜時以外においては基板10を覆っており、蒸発源23から蒸発された蒸着材料が基板10に堆積することを抑止する。 Although not shown in FIG. 2 , a drive mechanism including an actuator for rotating the rotating shaft 27 is installed outside the upper surface of the vacuum chamber 20 (atmosphere side). A substrate shutter (not shown) can be provided below the mask table 22 . The substrate shutter covers the substrate 10 except during film formation on the substrate 10 , and prevents the evaporation material evaporated from the evaporation source 23 from depositing on the substrate 10 .

真空チャンバー20の内部の下部には、基板10に成膜される蒸着材料が収納されるるつぼ231とるつぼ231を加熱するためのヒータ(不図示)とを含む蒸発源23、蒸発源シャッタ25、蒸発レートセンサー26などが設置される。 In the lower part of the interior of the vacuum chamber 20, an evaporation source 23 including a crucible 231 containing a vapor deposition material to be deposited on the substrate 10 and a heater (not shown) for heating the crucible 231, an evaporation source shutter 25, An evaporation rate sensor 26 or the like is installed.

金属性蒸着材料の成膜装置2の蒸発源23は真空チャンバーの底面に複数設置され、各蒸発源23は複数のるつぼ231を含む。各蒸発源23は回転駆動機構(不図示)によって回転することで、複数のるつぼ231の位置を順に移動させ、このるつぼの位置移動によってあらかじめ定められた蒸着位置に移動してきたるつぼから蒸着材料を順に蒸発させて基板10に堆積させる回転型の多点蒸発源(リボルバ)である。
各蒸発源23の詳細構造および複数の蒸発源23の配置構成については後述する。
A plurality of evaporation sources 23 of the film forming apparatus 2 for metallic evaporation material are installed on the bottom surface of the vacuum chamber, and each evaporation source 23 includes a plurality of crucibles 231 . Each evaporation source 23 is rotated by a rotary drive mechanism (not shown) to sequentially move the positions of the plurality of crucibles 231, and the evaporation material is removed from the crucibles that have been moved to predetermined evaporation positions by this positional movement of the crucibles. It is a rotating multi-point evaporation source (revolver) that sequentially evaporates and deposits on the substrate 10 .
A detailed structure of each evaporation source 23 and an arrangement configuration of the plurality of evaporation sources 23 will be described later.

基板10への蒸着材料の移動経路を遮蔽または開放を制御するために、蒸発源23の上部に蒸発源シャッタ25が設置されてもよい。これにより、蒸着位置のるつぼから蒸発した蒸着材料が基板10に堆積することが、必要に応じて(例えば、成膜開始前の準備工程など)一時的に抑止される。蒸発源シャッタ25が回転移動して蒸着位置のるつぼの上方を開放することにより、蒸着位置のるつぼからの蒸着材料が基板10に向かって飛散し、基板10への成膜が開始される。
蒸発レートセンサー26は蒸発源23のるつぼ231から蒸着材料が蒸発されるレートをモニタリングする装置である。蒸発レートセンサー26の配置位置の詳細については後述する。
An evaporation source shutter 25 may be installed above the evaporation source 23 in order to block or open the movement path of the vapor deposition material to the substrate 10 . As a result, the deposition of the vapor deposition material evaporated from the crucible at the vapor deposition position on the substrate 10 is temporarily suppressed as necessary (for example, in the preparatory process before starting film formation). By rotating the evaporation source shutter 25 to open the top of the crucible at the evaporation position, the evaporation material from the crucible at the evaporation position scatters toward the substrate 10, and film formation on the substrate 10 is started.
The evaporation rate sensor 26 is a device that monitors the rate at which the evaporation material is evaporated from the crucible 231 of the evaporation source 23 . The details of the arrangement position of the evaporation rate sensor 26 will be described later.

<蒸発源の配置>
図3を参照して、本発明の実施例による回転型の多点蒸発源(リボルバ)の構造および複数の蒸発源の配置構成について説明する。
図3は、成膜装置2内での基板10と複数の蒸発源23との配置関係を説明するための上面図である。
<Placement of Evaporation Source>
The structure of a rotating multi-point evaporation source (revolver) and the arrangement configuration of a plurality of evaporation sources according to an embodiment of the present invention will be described with reference to FIG.
FIG. 3 is a top view for explaining the positional relationship between the substrate 10 and the plurality of evaporation sources 23 in the film forming apparatus 2. As shown in FIG.

前述のように、成膜装置2の真空チャンバー内の上部には、成膜時、回転シャフト27によって駆動されて回転する基板10が配置される。成膜装置2の真空チャンバー内の下部には、基板10と対向して、基板10の成膜面と対向する面内に複数(3個以上)の蒸発源23が配置される。本実施例では、成膜装置2の上面から見たとき(平面視で)、多角形の成膜装置2の各コーナー部に対応して四つの蒸発源23が矩形状D1の四つの角部に対応する位置に配置されている。 As described above, the substrate 10 that is rotated by being driven by the rotary shaft 27 during film formation is placed in the upper part of the vacuum chamber of the film formation apparatus 2 . A plurality of (three or more) evaporation sources 23 are arranged in the lower part of the vacuum chamber of the film forming apparatus 2 so as to face the substrate 10 in the plane facing the film forming surface of the substrate 10 . In this embodiment, when viewed from the top of the film forming apparatus 2 (planar view), the four evaporation sources 23 are arranged at four corners of a rectangular shape D1 corresponding to the respective corners of the polygonal film forming apparatus 2. is placed at a position corresponding to

各蒸発源23は、上述のように、成膜時回転(自転)によって複数のるつぼ231の位置を順に移動させて、るつぼごとに蒸着材料を蒸発させる回転型の多点蒸発源(リボルバ
)であり、それぞれの回転軸を中心に放射状に配置された複数のるつぼ231を有している。一方、四つの各蒸発源23は、図示のように、隣接する蒸発源23が互いに反対方向に回転(自転)し、それぞれのるつぼを順次移動させて成膜を行う。各蒸発源23の回転方向は特にこれに限定されない。
As described above, each evaporation source 23 is a rotary multi-point evaporation source (revolver) that sequentially moves the positions of a plurality of crucibles 231 by rotation (rotation) during film formation and evaporates the evaporation material for each crucible. and has a plurality of crucibles 231 radially arranged around their respective rotation axes. On the other hand, as shown in the figure, the four evaporation sources 23 rotate (rotate) in mutually opposite directions, and sequentially move the respective crucibles to form films. The rotation direction of each evaporation source 23 is not particularly limited to this.

各蒸発源23に設置されるるつぼ231の数は特に制限されず、各蒸発源23のるつぼの数は同じであってもよいし、異なってもよい。本実施例では、各蒸発源23が七つのるつぼ231を有する例を示している。 The number of crucibles 231 installed in each evaporation source 23 is not particularly limited, and the number of crucibles in each evaporation source 23 may be the same or different. This embodiment shows an example in which each evaporation source 23 has seven crucibles 231 .

各蒸発源23において七つのるつぼ231のうちの一つのるつぼ232は、成膜時、蒸着位置に位置する。蒸着位置とは、該位置に位置するるつぼが基板10に向かって蒸着材料を蒸発させて供給する位置をいう。つまり、各蒸発源23は、成膜時、蒸着位置に位置するるつぼ232(以下、「蒸着用るつぼ」ともいう)をヒータによって高温(例えば、1300℃)に加熱して該当るつぼ232内に収納された蒸着材料を蒸発させて基板10に堆積させる。 One crucible 232 out of seven crucibles 231 in each evaporation source 23 is positioned at the evaporation position during film formation. The vapor deposition position is a position where the crucible located at the position evaporates and supplies the vapor deposition material toward the substrate 10 . That is, each evaporation source 23 heats a crucible 232 positioned at the evaporation position (hereinafter also referred to as a “vapor deposition crucible”) to a high temperature (for example, 1300° C.) by a heater and accommodates it in the corresponding crucible 232 at the time of film formation. The evaporated deposition material is evaporated and deposited on the substrate 10 .

蒸着位置のるつぼ232内の蒸着材料が消耗すれば、蒸発源23を回転駆動して、蒸着位置に位置するるつぼ232を蒸着後位置に移動させ、予備加熱位置に位置するるつぼ233を蒸着位置232に回転移動させる。 When the deposition material in the crucible 232 at the deposition position is exhausted, the evaporation source 23 is rotated to move the crucible 232 located at the deposition position to the post-deposition position, and the crucible 233 located at the preheating position is moved to the deposition position 232 . rotate to

予備加熱位置は次回(例えば、蒸着位置のるつぼ232内の蒸着材料が消耗したとき)において蒸着位置に移動するるつぼを予熱しておく位置である。以下、予備加熱位置に位置するるつぼ233を「予備加熱用るつぼ」とも称する。このように、次回において蒸着位置に移動するるつぼ233をあらかじめ加熱しておくことで、予備加熱位置に位置するるつぼ233が蒸着位置に移動した後に当該るつぼを加熱するのにかかる時間を減らすことができ、成膜時間を短縮することができる。 A preheat position is a position where the next time (eg, when the deposition material in the crucible 232 at the deposition position is exhausted) the crucible that is moved to the deposition position is preheated. Hereinafter, the crucible 233 positioned at the preheating position is also referred to as "preheating crucible". In this way, by preheating the crucible 233 that is to be moved to the vapor deposition position next time, it is possible to reduce the time required to heat the crucible 233 that is positioned at the preheating position after it is moved to the vapor deposition position. The film formation time can be shortened.

蒸着位置と予備加熱位置は、当該位置に配置されたるつぼが互いに熱干渉による影響を受けないように離間している。本実施例では蒸着用るつぼ232と予備加熱用るつぼ233との間に他のるつぼを配置している。 The vapor deposition position and the preheating position are spaced apart so that the crucibles placed at these positions are not affected by thermal interference with each other. In this embodiment, another crucible is arranged between the vapor deposition crucible 232 and the preheating crucible 233 .

各蒸発源23のすべてのるつぼ231の蒸着材料が消耗するまで蒸発源23を回転させながら蒸着を行い、すべての蒸着材料が消耗すれば、成膜装置2の動作を止めて、るつぼ231内に蒸着材料を充填する。 Evaporation is performed while rotating the evaporation source 23 until the evaporation material in all the crucibles 231 of each evaporation source 23 is exhausted. Fill with vapor deposition material.

以下、蒸発源23を成膜装置2内に複数配置する構造について詳しく説明する。
図3に示すように、複数(本実施例では4個)の蒸発源23は、そのうちの任意の3つの蒸発源23のそれぞれの回転中心が同一直線上に位置しないように配置される。言い換えれば、任意に選択される3つの蒸発源23の各回転中心軸間の距離をa、b、cとすると、a+b>cの関係を満たすように(すなわち、三角形状を成すように)、複数の蒸発源23が配置される。より具体的には、複数の蒸発源23は、各蒸発源23の回転中心が蒸発源23の配置面内における基板10の回転中心軸Oを中心とする一つの同心円C1上に位置するように配置される。
A structure in which a plurality of evaporation sources 23 are arranged in the film forming apparatus 2 will be described in detail below.
As shown in FIG. 3, a plurality of (four in this embodiment) evaporation sources 23 are arranged such that the rotation centers of any three evaporation sources 23 are not aligned on the same straight line. In other words, if the distances between the rotation center axes of the three arbitrarily selected evaporation sources 23 are a, b, and c, then the relationship a+b>c is satisfied (that is, a triangular shape is formed). A plurality of evaporation sources 23 are arranged. More specifically, the plurality of evaporation sources 23 are arranged so that the rotation center of each evaporation source 23 is positioned on one concentric circle C1 centered on the rotation center axis O of the substrate 10 within the arrangement plane of the evaporation sources 23. placed.

よって、複数配置される蒸発源23においてどの3つの蒸発源23も一直線上には位置していないので、蒸発源23間の距離を増加させずに成膜装置2内に複数の蒸発源23を効果的に配置することができ、成膜装置2内のスペース利用効率を高めることができる。 Therefore, since none of the three evaporation sources 23 among the plurality of evaporation sources 23 are positioned on a straight line, the plurality of evaporation sources 23 can be arranged in the film forming apparatus 2 without increasing the distance between the evaporation sources 23 . It can be arranged effectively, and the space utilization efficiency in the film forming apparatus 2 can be improved.

また、このような複数の蒸発源23の配置の下で、各蒸発源23の蒸着用るつぼ232は、上記蒸発源23の回転中心を結ぶ円C1よりも内側に配置される。より具体的には、
各蒸発源23の蒸着用るつぼ232は、上記蒸発源23の回転中心を結ぶ円C1よりも内側に、かつ、基板10の回転中心軸Oからの距離が実質的に同一の同心円C2上に位置するように配置される。
このように、複数の蒸発源23において、成膜時に蒸着材料を実際に供給する各蒸着用るつぼ232が基板10に対して実質的に同一距離に位置することによって、蒸発源23間の蒸発特性の差を抑制することができる。
Further, under such arrangement of the plurality of evaporation sources 23 , the evaporation crucible 232 of each evaporation source 23 is arranged inside the circle C<b>1 connecting the rotation centers of the evaporation sources 23 . More specifically,
The crucible 232 for vapor deposition of each evaporation source 23 is positioned on a concentric circle C2 inside a circle C1 connecting the rotation centers of the evaporation sources 23 and having substantially the same distance from the rotation center axis O of the substrate 10. are arranged to
In this way, in the plurality of evaporation sources 23, the evaporation crucibles 232 that actually supply the evaporation material during film formation are positioned at substantially the same distance from the substrate 10, so that the evaporation characteristics between the evaporation sources 23 are difference can be suppressed.

また、前述のような複数の蒸発源23の配置の下で、各蒸発源23の予備加熱用るつぼ233は、上記蒸発源23の回転中心を結ぶ円C1よりも外側に配置される。つまり、基板10の中心から近い距離に蒸着用るつぼ232が位置し、より遠い距離に予備加熱用るつぼ233が位置するように、各蒸発源23内における複数のるつぼ231の配置関係が構成されている。図4は、このような各蒸発源23における蒸着用るつぼ232と予備加熱用るつぼ233の基板10に対する相対的な配置関係を模式的に示した断面図である。より具体的には、蒸発源23のそれぞれの予備加熱用るつぼ233は、基板10の回転半径よりも外側に位置するように配置される。すなわち、いずれの蒸発源23の予備加熱用るつぼ233も基板10と重ならない位置に配置されている。 Further, under the arrangement of the plurality of evaporation sources 23 as described above, the preheating crucible 233 of each evaporation source 23 is arranged outside the circle C1 connecting the rotation centers of the evaporation sources 23 . In other words, the placement relationship of the plurality of crucibles 231 in each evaporation source 23 is configured so that the vapor deposition crucible 232 is located at a short distance from the center of the substrate 10 and the preheating crucible 233 is located at a farther distance. there is FIG. 4 is a cross-sectional view schematically showing the relative arrangement relationship of the deposition crucible 232 and the preheating crucible 233 in each evaporation source 23 with respect to the substrate 10 . More specifically, each preheating crucible 233 of the evaporation source 23 is arranged to be positioned outside the radius of rotation of the substrate 10 . That is, the preheating crucible 233 of any evaporation source 23 is arranged at a position not overlapping the substrate 10 .

予備加熱用るつぼ233は、成膜時に実質的な蒸着には関与しないが、予熱に必要な程度の高い温度で維持されるため、るつぼから輻射される熱が基板10に影響を及ぼす可能性がある。基板10の下部に複数の蒸発源23が配置される場合は、各蒸発源23において予備加熱用るつぼ233から輻射される熱が基板10に及ぼす影響の大きさに差がある可能性もある。
本発明の実施例では、各蒸発源23において、成膜時に実質的な蒸着に関与しない予備加熱用るつぼ233を基板10の回転半径より外側に位置するように配置することによって、各蒸発源23からの熱輻射の変動が基板10に及ぼす影響を低減することができる。
The preheating crucible 233 does not substantially participate in vapor deposition during film formation, but is maintained at a high temperature necessary for preheating, so the heat radiated from the crucible may affect the substrate 10 . be. When a plurality of evaporation sources 23 are arranged below the substrate 10 , the heat radiated from the preheating crucible 233 may affect the substrate 10 differently in each evaporation source 23 .
In the embodiment of the present invention, each evaporation source 23 is provided with a preheating crucible 233 that does not substantially participate in evaporation during film formation so as to be positioned outside the radius of rotation of the substrate 10 . The influence of variations in thermal radiation from the substrate 10 on the substrate 10 can be reduced.

図2を参照して前述したように、基板10の成膜面と複数の蒸発源23との間の領域には各蒸発源23の蒸着用るつぼ232から蒸発される蒸着材料のレートをモニタリングするための蒸発レートセンサー26を設置することができる。この蒸発レートセンサー26は、成膜時に基板10への成膜に影響を及ぼさないようにするため、蒸発源23の上方において蒸発源23の回転中心を結ぶ円C1より外側の位置に設置することが好ましい。 As described above with reference to FIG. 2, in the region between the film formation surface of the substrate 10 and the plurality of evaporation sources 23, the rate of evaporation material evaporated from the evaporation crucibles 232 of each evaporation source 23 is monitored. An evaporation rate sensor 26 can be installed for The evaporation rate sensor 26 should be placed above the evaporation source 23 outside the circle C1 connecting the rotation centers of the evaporation source 23 so as not to affect the film formation on the substrate 10 during film formation. is preferred.

以上のように、本実施例によると、成膜装置内のスペース利用効率を高めて装置の大型化を抑制することができ、基板10に対する良好な成膜および各蒸発源23からの熱輻射の変動が基板10に及ぼす影響を低減することができる。 As described above, according to this embodiment, it is possible to improve the space utilization efficiency in the film forming apparatus and suppress the enlargement of the apparatus. The influence of variations on the substrate 10 can be reduced.

図5は、本発明の他の実施例による回転型の多点蒸発源(リボルバ)の配置構成を示す。
本実施例は、上記実施例の構成に加え、少ない数のるつぼ241を有する小径の蒸発源24を追加で配置した構成である。蒸発源24は、蒸発源23よりも直径が小さい。具体的には、図5に示すように、回転軸(自転軸)を中心に五つのるつぼ241が放射状に配置された小径の蒸発源24を、隣接する二つの大径の蒸発源23の間に配置している。
FIG. 5 shows an arrangement of a rotating multi-point evaporation source (revolver) according to another embodiment of the present invention.
In addition to the configuration of the above embodiment, the present embodiment has a configuration in which a small-diameter evaporation source 24 having a small number of crucibles 241 is additionally arranged. Evaporation source 24 has a smaller diameter than evaporation source 23 . Specifically, as shown in FIG. 5 , a small-diameter evaporation source 24 in which five crucibles 241 are arranged radially around a rotation axis (rotational axis) is placed between two adjacent large-diameter evaporation sources 23 . are placed in

蒸着材料の種類や蒸発量などの制御のために、必要に応じて、るつぼの数が異なる大径の蒸発源23と小径の蒸発源24を一緒に成膜装置2内に配置する場合がある。
本実施例は、この場合でも、前述の実施例と同様に、成膜装置内のスペース利用効率を高めるとともに良好な成膜および各蒸発源からの熱輻射の変動の抑制を可能にする蒸発源の配置構成を提案する。
In some cases, large-diameter evaporation sources 23 and small-diameter evaporation sources 24 having different numbers of crucibles are arranged together in the film forming apparatus 2 in order to control the type of vapor deposition material, the amount of evaporation, etc. .
Even in this case, as in the previous embodiment, the present embodiment is an evaporation source that can improve the efficiency of space utilization in the film forming apparatus, achieve good film formation, and suppress variations in heat radiation from each evaporation source. We propose the configuration of

具体的には、大径の蒸発源23(以下、「第1蒸発源」という)は、前述の実施例と同
様に、多角形の成膜装置2の各コーナー部に対応して四つの蒸発源23の回転中心が基板10の回転中心軸Oを中心とする一つの同心円C1上に位置するように矩形状の四つの角部に対応する位置に配置される。図5に示すように、第1蒸発源23の各蒸着用るつぼ232が長方形状D2の四つの角部に対応する位置に配置される。また、図5に示すように、蒸発源24が、隣接する2つの第1蒸発源23の間であって、かつ、長方形状D2の長辺に沿って配置される。
Specifically, the large-diameter evaporation sources 23 (hereinafter referred to as "first evaporation sources") are four evaporation sources corresponding to the corners of the polygonal film forming apparatus 2, as in the above-described embodiment. The sources 23 are arranged at positions corresponding to the four corners of the rectangular shape so that the rotation center of the source 23 is positioned on one concentric circle C1 around the rotation center axis O of the substrate 10 . As shown in FIG. 5, each vapor deposition crucible 232 of the first evaporation source 23 is arranged at positions corresponding to four corners of the rectangular shape D2. Also, as shown in FIG. 5, the evaporation source 24 is arranged between two adjacent first evaporation sources 23 along the long side of the rectangular shape D2.

また、各第1蒸発源23において、蒸着用るつぼ232は、第1蒸発源23の回転中心を結ぶ円C1よりも内側に、かつ、基板10の回転中心軸Oからの距離が実質的に同一の円C2上に位置するように配置される。図5に示す例では、また、各第1蒸発源23において、予備加熱用るつぼ233は、蒸発源23の回転中心を結ぶ円C1よりも外側に、より具体的には基板10の回転半径の外側に位置するように配置される。 In addition, in each first evaporation source 23, the vapor deposition crucible 232 is located inside the circle C1 connecting the rotation centers of the first evaporation sources 23 and is substantially the same distance from the rotation center axis O of the substrate 10. are arranged so as to be positioned on the circle C2 of . In the example shown in FIG. 5 , in each first evaporation source 23 , the preheating crucible 233 is positioned outside the circle C1 connecting the rotation centers of the evaporation sources 23 , more specifically, outside the radius of rotation of the substrate 10 . It is arranged so as to be located on the outside.

小径の蒸発源24(以下、「第2蒸発源」という)は、隣接する2つの第1蒸発源23の間、具体的には第2蒸発源24の回転中心が隣接する2つの第1蒸発源23の回転中心を結ぶ線分Lと同一直線上に位置しないように配置される。より具体的には、第2蒸発源24は、その回転中心が基板10の回転中心軸Oを基準に線分Lよりも外側、かつ、円C1よりも内側に位置するように配置される。 The small-diameter evaporation source 24 (hereinafter referred to as “second evaporation source”) is positioned between two adjacent first evaporation sources 23 , specifically two first evaporation sources where the rotation centers of the second evaporation sources 24 are adjacent. It is arranged so as not to be on the same straight line as the line segment L connecting the rotation center of the source 23 . More specifically, the second evaporation source 24 is arranged so that its center of rotation is positioned outside the line segment L and inside the circle C1 with respect to the rotation center axis O of the substrate 10 .

よって、第2蒸発源24を挟んで隣接する二つの第1蒸発源23間の間隔を狭く設定することができ、また、追加で配置される第2蒸発源24をできるだけ成膜装置2の内側に位置させることができるので、成膜装置2内部の空間利用効率を一層高めることができる。なお、図5に示すように、第2蒸発源24が有する複数のるつぼ241の数は、第1蒸発源23が有する複数のるつぼ231の数よりも少ない。 Therefore, it is possible to narrow the distance between the two first evaporation sources 23 adjacent to each other with the second evaporation source 24 interposed therebetween. , the efficiency of space utilization inside the film forming apparatus 2 can be further enhanced. Note that, as shown in FIG. 5 , the number of crucibles 241 in the second evaporation source 24 is smaller than the number of crucibles 231 in the first evaporation source 23 .

また、第2蒸発源24における蒸着用るつぼ242と予備加熱用るつぼ243は、第1蒸発源23のそれと同様に配置することができる。
つまり、第2蒸発源24において、蒸着用るつぼ242は予備加熱用るつぼ243よりも基板10の回転中心軸Oから近い位置に配置される。具体的には、蒸着用るつぼ242は第2蒸発源24の回転中心よりも内側に配置され、予備加熱用るつぼ243は第2蒸発源24の回転中心よりも外側に配置される。
Also, the vapor deposition crucible 242 and the preheating crucible 243 in the second evaporation source 24 can be arranged in the same manner as in the first evaporation source 23 .
That is, in the second evaporation source 24 , the vapor deposition crucible 242 is arranged closer to the rotation center axis O of the substrate 10 than the preheating crucible 243 . Specifically, the vapor deposition crucible 242 is arranged inside the rotation center of the second evaporation source 24 , and the preheating crucible 243 is arranged outside the rotation center of the second evaporation source 24 .

更に、第2蒸発源24をできるだけ成膜装置2の内側に位置させることにおいては、このような第2蒸発源24の蒸着用るつぼ242と予備加熱用るつぼ243の配置条件および隣接する第1蒸発源23との配置関係も考慮し、次のように配置する。
つまり、第2蒸発源24は、その蒸着用るつぼ242が、基板10の回転中心軸Oからの距離が第1蒸発源23の各蒸着用るつぼ232と同一距離に位置するように(円C2上に位置するように)し、それと共に、その予備加熱用るつぼ243は、第1蒸発源23の各予備加熱用るつぼ233と同様に基板10の回転半径よりも外側に位置するように配置することが好ましい。
これによって、成膜装置内のスペース利用効率を高めながらも、良好な成膜および蒸発源(特に、予備加熱用るつぼ)からの熱輻射の変動による基板10への影響を低減することができる。
Furthermore, in locating the second evaporation source 24 inside the film forming apparatus 2 as much as possible, the arrangement condition of the evaporation crucible 242 and the preheating crucible 243 of the second evaporation source 24 and the adjacent first evaporation Considering the positional relationship with the source 23, they are arranged as follows.
That is, the second evaporation source 24 is arranged so that the evaporation crucible 242 is located at the same distance from the rotation center axis O of the substrate 10 as the evaporation crucibles 232 of the first evaporation source 23 (on the circle C2). ), and at the same time, the preheating crucible 243 is positioned outside the radius of rotation of the substrate 10 like the preheating crucibles 233 of the first evaporation source 23. is preferred.
As a result, it is possible to improve the efficiency of space utilization in the film forming apparatus, and to reduce the effects on the substrate 10 caused by fluctuations in the heat radiation from the evaporation source (particularly, the crucible for preheating).

<電子デバイスの製造方法>
次に、前述した実施例に係る成膜装置を用いた電子デバイスの製造方法の一例を説明する。以下、電子デバイスの例として有機EL表示装置の構成及び製造方法を例示する。
<Method for manufacturing electronic device>
Next, an example of an electronic device manufacturing method using the film forming apparatus according to the above-described embodiment will be described. The configuration and manufacturing method of an organic EL display device will be exemplified below as an example of an electronic device.

まず、製造する有機EL表示装置について説明する。図6(a)は有機EL表示装置50の全体図、図6(b)は1画素の断面構造を示している。 First, the organic EL display device to be manufactured will be described. FIG. 6(a) shows an overall view of the organic EL display device 50, and FIG. 6(b) shows a cross-sectional structure of one pixel.

図6(a)に示すように、有機EL表示装置50の表示領域51には、発光素子を複数備える画素52がマトリクス状に複数配置されている。詳細は後で説明するが、発光素子のそれぞれは、一対の電極に挟まれた有機層を備えた構造を有している。なお、ここでいう画素とは、表示領域51において所望の色の表示を可能とする最小単位を指している。本実施例にかかる有機EL表示装置50の場合、互いに異なる発光を示す第1発光素子52R、第2発光素子52G、第3発光素子52Bの組合せにより画素52が構成されている。画素52は、赤色発光素子と緑色発光素子と青色発光素子の組合せで構成されることが多いが、黄色発光素子とシアン発光素子と白色発光素子の組み合わせでもよく、少なくとも1色以上であれば特に制限されるものではない。 As shown in FIG. 6A, in a display region 51 of an organic EL display device 50, a plurality of pixels 52 each having a plurality of light emitting elements are arranged in a matrix. Although details will be described later, each of the light emitting elements has a structure including an organic layer sandwiched between a pair of electrodes. The term "pixel" as used herein refers to a minimum unit capable of displaying a desired color in the display area 51. FIG. In the case of the organic EL display device 50 according to this embodiment, the pixel 52 is configured by a combination of the first light emitting element 52R, the second light emitting element 52G, and the third light emitting element 52B that emit light different from each other. The pixel 52 is often composed of a combination of a red light emitting element, a green light emitting element and a blue light emitting element, but may be a combination of a yellow light emitting element, a cyan light emitting element and a white light emitting element. It is not limited.

図6(b)は、図6(a)のA-B線における部分断面模式図である。画素52は、基板53上に、第1電極(陽極)54と、正孔輸送層55と、発光層56R、56G、56Bのいずれかと、電子輸送層57と、第2電極(陰極)58と、を備える有機EL素子を有している。これらのうち、正孔輸送層55、発光層56R、56G、56B、電子輸送層57が有機層に相当する。また、本実施形態では、発光層56Rは赤色を発する有機EL層、発光層56Gは緑色を発する有機EL層、発光層56Bは青色を発する有機EL層である。発光層56R、56G、56Bは、それぞれ赤色、緑色、青色を発する発光素子(有機EL素子と記述する場合もある)に対応するパターンに形成されている。また、第1電極54は、発光素子ごとに分離して形成されている。正孔輸送層55と電子輸送層57と第2電極58は、複数の発光素子52R、52G、52Bと共通で形成されていてもよいし、発光素子毎に形成されていてもよい。なお、第1電極54と第2電極58とが異物によってショートするのを防ぐために、第1電極54間に絶縁層59が設けられている。さらに、有機EL層は水分や酸素によって劣化するため、水分や酸素から有機EL素子を保護するための保護層60が設けられている。 FIG. 6(b) is a schematic partial cross-sectional view taken along line AB in FIG. 6(a). The pixel 52 includes, on a substrate 53, a first electrode (anode) 54, a hole transport layer 55, one of the light emitting layers 56R, 56G, and 56B, an electron transport layer 57, and a second electrode (cathode) 58. and an organic EL element. Among these layers, the hole transport layer 55, the light emitting layers 56R, 56G and 56B, and the electron transport layer 57 correspond to organic layers. In this embodiment, the light emitting layer 56R is an organic EL layer that emits red, the light emitting layer 56G is an organic EL layer that emits green, and the light emitting layer 56B is an organic EL layer that emits blue. The light-emitting layers 56R, 56G, and 56B are formed in patterns corresponding to light-emitting elements (also referred to as organic EL elements) that emit red, green, and blue, respectively. Also, the first electrode 54 is formed separately for each light emitting element. The hole transport layer 55, the electron transport layer 57, and the second electrode 58 may be formed in common with the plurality of light emitting elements 52R, 52G, and 52B, or may be formed for each light emitting element. An insulating layer 59 is provided between the first electrodes 54 to prevent short-circuiting between the first electrode 54 and the second electrode 58 due to foreign matter. Furthermore, since the organic EL layer is deteriorated by moisture and oxygen, a protective layer 60 is provided to protect the organic EL element from moisture and oxygen.

有機EL層を発光素子単位に形成するためには、マスクを介して成膜する方法が用いられる。近年、表示装置の高精細化が進んでおり、有機EL層の形成には開口の幅が数十μmのマスクが用いられる。 In order to form the organic EL layer for each light emitting element, a method of film formation through a mask is used. 2. Description of the Related Art In recent years, the resolution of display devices has been increasing, and a mask having an opening width of several tens of μm is used for forming an organic EL layer.

次に、有機EL表示装置の製造方法の例について具体的に説明する。
まず、有機EL表示装置を駆動するための回路(不図示)及び第1電極54が形成された基板53を準備する。
Next, an example of a method for manufacturing an organic EL display device will be specifically described.
First, a substrate 53 on which a circuit (not shown) for driving the organic EL display device and a first electrode 54 are formed is prepared.

第1電極54が形成された基板53の上にアクリル樹脂をスピンコートで形成し、アクリル樹脂をリソグラフィ法により、第1電極54が形成された部分に開口部が形成されるようにパターニングし絶縁層59を形成する。この開口部が、発光素子が実際に発光する発光領域に相当する。 An acrylic resin is formed by spin coating on the substrate 53 on which the first electrode 54 is formed, and the acrylic resin is patterned by a lithography method so that an opening is formed in the portion where the first electrode 54 is formed, and insulation is performed. Layer 59 is formed. This opening corresponds to a light emitting region where the light emitting element actually emits light.

絶縁層59がパターニングされた基板53を第1の成膜装置に搬入し、基板保持ユニットにて基板53を保持し、正孔輸送層55を、表示領域の第1電極54の上に共通する層として成膜する。正孔輸送層55は真空蒸着により成膜される。実際には正孔輸送層55は表示領域51よりも大きなサイズに形成されるため、高精細なマスクは不要である。 A substrate 53 patterned with an insulating layer 59 is carried into a first film forming apparatus, the substrate 53 is held by a substrate holding unit, and a hole transport layer 55 is commonly formed on the first electrodes 54 in the display area. Deposited as a layer. The hole transport layer 55 is deposited by vacuum deposition. Since the hole transport layer 55 is actually formed to have a size larger than that of the display area 51, a high-definition mask is not required.

次に、正孔輸送層55までが形成された基板53を第2の成膜装置に搬入し、基板保持ユニットにて保持する。基板53とマスクとのアライメントを行い、基板53をマスクの上に載置し、基板53の赤色を発する素子を配置する部分に、赤色を発する発光層56Rを成膜する。 Next, the substrate 53 formed with up to the hole transport layer 55 is carried into the second film forming apparatus and held by the substrate holding unit. Alignment of the substrate 53 and the mask is performed, the substrate 53 is placed on the mask, and a light-emitting layer 56R emitting red is formed on the portion of the substrate 53 where the element emitting red is to be arranged.

発光層56Rの成膜と同様に、第3の成膜装置により緑色を発する発光層56Gを成膜
し、さらに第4の成膜装置により青色を発する発光層56Bを成膜する。発光層56R、56G、56Bの成膜が完了した後、第5の成膜装置により表示領域51の全体に電子輸送層57を成膜する。電子輸送層57は、3色の発光層56R、56G、56Bに共通の層として形成される。
Similarly to the deposition of the light emitting layer 56R, the third deposition apparatus deposits the green light emitting layer 56G, and the fourth deposition apparatus deposits the blue light emitting layer 56B. After the formation of the light-emitting layers 56R, 56G, and 56B is completed, the electron transport layer 57 is formed over the entire display area 51 by the fifth film forming apparatus. The electron transport layer 57 is formed as a layer common to the three color light-emitting layers 56R, 56G, and 56B.

電子輸送層57までが形成された基板を第6の成膜装置に移動し、第2電極58を成膜し、その後プラズマCVD装置に移動して保護層60を成膜して、有機EL表示装置50が完成する。 The substrate on which the electron transport layer 57 is formed is moved to a sixth film forming apparatus, the second electrode 58 is formed thereon, and then the protective layer 60 is formed by moving to the plasma CVD apparatus to form an organic EL display. Device 50 is completed.

絶縁層59がパターニングされた基板53を成膜装置に搬入してから保護層60の成膜が完了するまでは、水分や酸素を含む雰囲気にさらしてしまうと、有機EL材料からなる発光層が水分や酸素によって劣化してしまうおそれがある。従って、成膜装置間の基板の搬入搬出は、真空雰囲気または不活性ガス雰囲気の下で行われる。 If the substrate 53 on which the insulating layer 59 is patterned is carried into the film forming apparatus and is exposed to an atmosphere containing moisture and oxygen until the film formation of the protective layer 60 is completed, the light emitting layer made of the organic EL material will be damaged. It may deteriorate due to moisture and oxygen. Therefore, substrates are carried in and out between film forming apparatuses under a vacuum atmosphere or an inert gas atmosphere.

以上、本発明を実施するための形態を具体的に説明したが、前述の実施例は本発明の一つの例であり、本発明はこれらの実施例の構成に限定されず、本技術的思想の範囲内で適切に変形することができる。例えば、成膜装置内に配置される複数の蒸発源の数や各蒸発源(大径の蒸発源及び/又は小径の蒸発源)内に具備される複数のるつぼの数などは、設計に応じて適宜変更できる。例えば、大径の蒸発源23と小径の蒸発源24を共に配置する前述した他の実施例においては、図5において破線で示したように、成膜装置2内の対向する位置に他の小径の第2蒸発源24を更に配置することもできる。また、前述の実施例においては、各蒸発源の蒸着用るつぼは基板10の中心から同一距離の円C2上に配置されると説明したが、ここでの同一とは厳密な意味での数学的同一だけでなく、蒸着材料の種類などの設計条件によって多少のオフセットを付与することも含む。 Although the embodiments for carrying out the present invention have been specifically described above, the above-described embodiments are examples of the present invention, and the present invention is not limited to the configurations of these embodiments. can be appropriately deformed within the range of For example, the number of multiple evaporation sources arranged in the film forming apparatus and the number of multiple crucibles provided in each evaporation source (large-diameter evaporation source and/or small-diameter evaporation source) may vary depending on the design. can be changed as appropriate. For example, in the other embodiment described above in which the large-diameter evaporation source 23 and the small-diameter evaporation source 24 are co-located, another small-diameter evaporation source 23 is placed at an opposing position within the deposition apparatus 2, as indicated by the dashed line in FIG. A second evaporation source 24 can also be arranged. Further, in the above-described embodiment, the vapor deposition crucibles of the respective vapor sources are arranged on the circle C2 at the same distance from the center of the substrate 10. In addition to being the same, it also includes giving a slight offset according to design conditions such as the type of vapor deposition material.

1:クラスタ装置
2:成膜装置
11:成膜室
20:真空チャンバー
21:基板保持ユニット
22:マスク台
23:第1蒸発源(大径)
24:第2蒸発源(小径)
25:蒸発源シャッタ
26:蒸発レートセンサー
231,241:るつぼ
232,242:蒸着用るつぼ(蒸着位置)
233,243:予備加熱用るつぼ(予備加熱位置)
50:有機EL表示装置
1: Cluster device 2: Film formation device 11: Film formation chamber 20: Vacuum chamber 21: Substrate holding unit 22: Mask table 23: First evaporation source (large diameter)
24: Second evaporation source (small diameter)
25: Evaporation source shutter 26: Evaporation rate sensor 231, 241: Crucible 232, 242: Vapor deposition crucible (Vapor deposition position)
233, 243: Preheating crucible (preheating position)
50: Organic EL display device

Claims (21)

回転する基板の成膜面に蒸着材料を蒸発させて蒸着する成膜装置であって、
前記基板の成膜面と対向する面内に配置される3つ以上の蒸発源を含み、
前記3つ以上の蒸発源のそれぞれは、回転軸を中心に放射状に配置された複数のるつぼを有し、前記回転軸を回転中心として回転可能であり、
前記3つ以上の蒸発源は、前記3つ以上の蒸発源のうちの任意の3つの蒸発源の各回転中心が前記面内において三角形状を成すように配置され、
前記3つ以上の蒸発源のそれぞれの前記複数のるつぼは、蒸着位置に位置する蒸着用るつぼと、予備加熱位置に位置する予備加熱用るつぼを含み、
前記3つ以上の蒸発源のそれぞれの前記蒸着用るつぼは、前記面内において前記基板の回転中心軸から同一の距離に配置され
前記3つ以上の蒸発源のそれぞれの前記回転中心は、前記面内において前記基板の回転中心軸を中心とする同一の円上に配置され、
前記3つ以上の蒸発源のそれぞれの前記蒸着用るつぼは、前記円よりも内側に配置され、
前記3つ以上の蒸発源のそれぞれの前記予備加熱用るつぼは、前記基板の回転半径よりも外側で、且つ、前記円よりも外側に配置されることを特徴とする成膜装置。
A film forming apparatus for evaporating and depositing a deposition material on a film forming surface of a rotating substrate,
including three or more evaporation sources arranged in a plane facing the film formation surface of the substrate;
Each of the three or more evaporation sources has a plurality of crucibles radially arranged around a rotation axis, and is rotatable around the rotation axis;
the three or more evaporation sources are arranged such that the rotation centers of any three of the three or more evaporation sources form a triangular shape in the plane;
the plurality of crucibles for each of the three or more evaporation sources includes a vapor deposition crucible positioned at a vapor deposition position and a preheating crucible positioned at a preheating position;
the vapor deposition crucibles of the three or more evaporation sources are arranged at the same distance from the central axis of rotation of the substrate in the plane ;
the rotation centers of the three or more evaporation sources are arranged on the same circle centered on the rotation center axis of the substrate in the plane;
The vapor deposition crucibles of each of the three or more evaporation sources are arranged inside the circle,
The film forming apparatus, wherein the preheating crucibles of the three or more evaporation sources are arranged outside a radius of rotation of the substrate and outside the circle.
前記蒸着位置は、該位置に位置するるつぼが前記基板に向かって蒸着材料を供給する位置であり、
前記予備加熱位置は、該位置に位置するるつぼが前記蒸発源の回転によって前記蒸着位置に移動する前に予熱される位置であることを特徴とする請求項1に記載の成膜装置。
The deposition position is a position where the crucible located at the position supplies the deposition material toward the substrate,
2. The film forming apparatus according to claim 1 , wherein the preheating position is a position where the crucible positioned at the preheating position is preheated before being moved to the vapor deposition position by rotation of the evaporation source.
回転する基板の成膜面に蒸着材料を蒸発させて蒸着する成膜装置であって、
前記基板の成膜面と対向する面内に配置される複数の蒸発源を含み、
前記複数の蒸発源のそれぞれは、回転軸を中心に放射状に配置された複数のるつぼを有し、前記回転軸を回転中心として回転可能であり、
前記複数の蒸発源は、複数の第1るつぼを有する複数の第1蒸発源と、前記各第1蒸発源が有する前記複数の第1るつぼの数よりも少ない数の第2るつぼを有する第2蒸発源と
を含み、
前記複数の第1蒸発源は、各回転中心が前記面内において前記基板の回転中心軸を中心とする第1円上に配置され、
前記第2蒸発源は、前記複数の第1蒸発源のうち隣接する二つの第1蒸発源の間に配置され、かつ、前記第2蒸発源の回転中心が前記隣接する二つの第1蒸発源の回転中心を結ぶ線分と同一直線上に位置しないように前記基板の回転中心軸を基準に前記隣接する二つの第1蒸発源の回転中心を結ぶ線分よりも外側で前記第1円よりも内側に配置されることを特徴とする成膜装置。
A film forming apparatus for evaporating and depositing a deposition material on a film forming surface of a rotating substrate,
including a plurality of evaporation sources arranged in a plane facing the film formation surface of the substrate;
Each of the plurality of evaporation sources has a plurality of crucibles radially arranged around a rotation axis, and is rotatable around the rotation axis,
The plurality of evaporation sources include a plurality of first evaporation sources having a plurality of first crucibles and a second evaporation source having a number of second crucibles less than the number of the plurality of first crucibles possessed by each of the first evaporation sources. an evaporation source;
each of the plurality of first evaporation sources is arranged on a first circle centered on the rotation center axis of the substrate in the plane,
The second evaporation source is arranged between two adjacent first evaporation sources among the plurality of first evaporation sources, and the center of rotation of the second evaporation source is the two adjacent first evaporation sources. outside the line segment connecting the rotation centers of the two adjacent first evaporation sources with respect to the rotation center axis of the substrate so as not to be on the same straight line as the line segment connecting the rotation centers of the first circle and a film forming apparatus, wherein the film forming apparatus is arranged inside .
前記各第1蒸発源の前記第1るつぼおよび前記第2蒸発源の第2るつぼは、それぞれ、蒸着位置に位置する蒸着用るつぼと、予備加熱位置に位置する予備加熱用るつぼとを含み、
前記第1蒸発源および前記第2蒸発源のそれぞれにおいて、前記各蒸着用るつぼは、前記各予備加熱用るつぼよりも前記基板の回転中心軸から近い位置に配置されることを特徴とする請求項に記載の成膜装置。
the first crucible of each first evaporation source and the second crucible of the second evaporation source each include a vapor deposition crucible positioned at a vapor deposition position and a preheating crucible positioned at a preheating position;
3. The crucible for vapor deposition in each of the first evaporation source and the second evaporation source is arranged at a position closer to the rotation center axis of the substrate than each of the preheating crucibles. 3. The film forming apparatus according to 3 .
前記各第1蒸発源の前記各蒸着用るつぼは、前記第1円よりも内側に配置されることを特徴とする請求項に記載の成膜装置。 5. The film forming apparatus according to claim 4, wherein each of the vapor deposition crucibles of each of the first evaporation sources is arranged inside the first circle. 前記各第1蒸発源の前記各予備加熱用るつぼは、前記第1円よりも外側に配置されることを特徴とする請求項又は請求項に記載の成膜装置。 6. The film forming apparatus according to claim 4 , wherein the preheating crucibles of the first evaporation sources are arranged outside the first circle. 回転する基板の成膜面に蒸着材料を蒸発させて蒸着する成膜装置であって、
前記基板の成膜面と対向する面内に配置される複数の蒸発源を含み、
前記複数の蒸発源のそれぞれは、回転軸を中心に放射状に配置された複数のるつぼを有し、前記回転軸を回転中心として回転可能であり、
前記複数の蒸発源は、複数の第1るつぼを有する複数の第1蒸発源と、前記各第1蒸発源が有する前記複数の第1るつぼの数よりも少ない数の第2るつぼを有する第2蒸発源とを含み、
前記複数の第1蒸発源は、各回転中心が前記面内において前記基板の回転中心軸を中心とする第1円上に配置され、
前記第2蒸発源は、前記複数の第1蒸発源のうち隣接する二つの第1蒸発源の間に配置され、かつ、前記第2蒸発源の回転中心が前記隣接する二つの第1蒸発源の回転中心を結ぶ線分と同一直線上に位置しないように配置され、
前記各第1蒸発源の前記第1るつぼおよび前記第2蒸発源の第2るつぼは、それぞれ、蒸着位置に位置する蒸着用るつぼと、予備加熱位置に位置する予備加熱用るつぼとを含み、
前記第1蒸発源および前記第2蒸発源のそれぞれにおいて、前記各蒸着用るつぼは、前記各予備加熱用るつぼよりも前記基板の回転中心軸から近い位置に配置され、
前記第2蒸発源の前記蒸着用るつぼは、前記基板の回転中心軸を基準に前記第2蒸発源の回転中心よりも内側に配置されることを特徴とする成膜装置。
A film forming apparatus for evaporating and depositing a deposition material on a film forming surface of a rotating substrate,
including a plurality of evaporation sources arranged in a plane facing the film formation surface of the substrate;
Each of the plurality of evaporation sources has a plurality of crucibles radially arranged around a rotation axis, and is rotatable around the rotation axis,
The plurality of evaporation sources include a plurality of first evaporation sources having a plurality of first crucibles and a second evaporation source having a number of second crucibles less than the number of the plurality of first crucibles possessed by each of the first evaporation sources. an evaporation source;
each of the plurality of first evaporation sources is arranged on a first circle centered on the rotation center axis of the substrate in the plane,
The second evaporation source is arranged between two adjacent first evaporation sources among the plurality of first evaporation sources, and the center of rotation of the second evaporation source is the two adjacent first evaporation sources. is arranged so as not to be on the same straight line as the line segment connecting the rotation centers of
the first crucible of each first evaporation source and the second crucible of the second evaporation source each include a vapor deposition crucible positioned at a vapor deposition position and a preheating crucible positioned at a preheating position;
In each of the first evaporation source and the second evaporation source, each of the vapor deposition crucibles is arranged closer to the rotation center axis of the substrate than each of the preheating crucibles,
The deposition apparatus, wherein the vapor deposition crucible of the second evaporation source is arranged inside the rotation center of the second evaporation source with respect to the rotation center axis of the substrate.
回転する基板の成膜面に蒸着材料を蒸発させて蒸着する成膜装置であって、
前記基板の成膜面と対向する面内に配置される複数の蒸発源を含み、
前記複数の蒸発源のそれぞれは、回転軸を中心に放射状に配置された複数のるつぼを有し、前記回転軸を回転中心として回転可能であり、
前記複数の蒸発源は、複数の第1るつぼを有する複数の第1蒸発源と、前記各第1蒸発源が有する前記複数の第1るつぼの数よりも少ない数の第2るつぼを有する第2蒸発源とを含み、
前記複数の第1蒸発源は、各回転中心が前記面内において前記基板の回転中心軸を中心
とする第1円上に配置され、
前記第2蒸発源は、前記複数の第1蒸発源のうち隣接する二つの第1蒸発源の間に配置され、かつ、前記第2蒸発源の回転中心が前記隣接する二つの第1蒸発源の回転中心を結ぶ線分と同一直線上に位置しないように配置され、
前記各第1蒸発源の前記第1るつぼおよび前記第2蒸発源の第2るつぼは、それぞれ、蒸着位置に位置する蒸着用るつぼと、予備加熱位置に位置する予備加熱用るつぼとを含み、
前記第1蒸発源および前記第2蒸発源のそれぞれにおいて、前記各蒸着用るつぼは、前記各予備加熱用るつぼよりも前記基板の回転中心軸から近い位置に配置され、
前記第2蒸発源の前記予備加熱用るつぼは、前記基板の回転中心軸を基準に前記第2蒸発源の回転中心よりも外側に配置されることを特徴とする成膜装置。
A film forming apparatus for evaporating and depositing a deposition material on a film forming surface of a rotating substrate,
including a plurality of evaporation sources arranged in a plane facing the film formation surface of the substrate;
Each of the plurality of evaporation sources has a plurality of crucibles radially arranged around a rotation axis, and is rotatable around the rotation axis,
The plurality of evaporation sources include a plurality of first evaporation sources having a plurality of first crucibles and a second evaporation source having a number of second crucibles less than the number of the plurality of first crucibles possessed by each of the first evaporation sources. an evaporation source;
In the plurality of first evaporation sources, each rotation center is centered on the rotation center axis of the substrate in the plane.
is placed on the first circle with
The second evaporation source is arranged between two adjacent first evaporation sources among the plurality of first evaporation sources, and the center of rotation of the second evaporation source is the two adjacent first evaporation sources. is arranged so as not to be on the same straight line as the line segment connecting the rotation centers of
the first crucible of each first evaporation source and the second crucible of the second evaporation source each include a vapor deposition crucible positioned at a vapor deposition position and a preheating crucible positioned at a preheating position;
In each of the first evaporation source and the second evaporation source, each of the vapor deposition crucibles is arranged closer to the rotation center axis of the substrate than each of the preheating crucibles,
The film forming apparatus, wherein the preheating crucible of the second evaporation source is arranged outside the center of rotation of the second evaporation source with respect to the central axis of rotation of the substrate.
回転する基板の成膜面に蒸着材料を蒸発させて蒸着する成膜装置であって、
前記基板の成膜面と対向する面内に配置される複数の蒸発源を含み、
前記複数の蒸発源のそれぞれは、回転軸を中心に放射状に配置された複数のるつぼを有し、前記回転軸を回転中心として回転可能であり、
前記複数の蒸発源は、複数の第1るつぼを有する複数の第1蒸発源と、前記各第1蒸発源が有する前記複数の第1るつぼの数よりも少ない数の第2るつぼを有する第2蒸発源とを含み、
前記複数の第1蒸発源は、各回転中心が前記面内において前記基板の回転中心軸を中心とする第1円上に配置され、
前記第2蒸発源は、前記複数の第1蒸発源のうち隣接する二つの第1蒸発源の間に配置され、かつ、前記第2蒸発源の回転中心が前記隣接する二つの第1蒸発源の回転中心を結ぶ線分と同一直線上に位置しないように配置され、
前記各第1蒸発源の前記第1るつぼおよび前記第2蒸発源の第2るつぼは、それぞれ、蒸着位置に位置する蒸着用るつぼと、予備加熱位置に位置する予備加熱用るつぼとを含み、
前記第1蒸発源および前記第2蒸発源のそれぞれにおいて、前記各蒸着用るつぼは、前記各予備加熱用るつぼよりも前記基板の回転中心軸から近い位置に配置され、
前記各第1蒸発源の前記各蒸着用るつぼおよび前記第2蒸発源の前記蒸着用るつぼは、前記基板の回転半径よりも外側に配置されることを特徴とする成膜装置。
A film forming apparatus for evaporating and depositing a deposition material on a film forming surface of a rotating substrate,
including a plurality of evaporation sources arranged in a plane facing the film formation surface of the substrate;
Each of the plurality of evaporation sources has a plurality of crucibles radially arranged around a rotation axis, and is rotatable around the rotation axis,
The plurality of evaporation sources include a plurality of first evaporation sources having a plurality of first crucibles and a second evaporation source having a number of second crucibles less than the number of the plurality of first crucibles possessed by each of the first evaporation sources. an evaporation source;
each of the plurality of first evaporation sources is arranged on a first circle centered on the rotation center axis of the substrate in the plane,
The second evaporation source is arranged between two adjacent first evaporation sources among the plurality of first evaporation sources, and the center of rotation of the second evaporation source is the two adjacent first evaporation sources. is arranged so as not to be on the same straight line as the line segment connecting the rotation centers of
the first crucible of each first evaporation source and the second crucible of the second evaporation source each include a vapor deposition crucible positioned at a vapor deposition position and a preheating crucible positioned at a preheating position;
In each of the first evaporation source and the second evaporation source, each of the vapor deposition crucibles is arranged closer to the rotation center axis of the substrate than each of the preheating crucibles,
The deposition apparatus, wherein each of the vapor deposition crucibles of the first vapor sources and the vapor deposition crucibles of the second vapor source are arranged outside a radius of rotation of the substrate.
回転する基板の成膜面に蒸着材料を蒸発させて蒸着する成膜装置であって、
前記基板の成膜面と対向する面内に配置される複数の蒸発源を含み、
前記複数の蒸発源のそれぞれは、回転軸を中心に放射状に配置された複数のるつぼを有し、前記回転軸を回転中心として回転可能であり、
前記複数の蒸発源は、複数の第1るつぼを有する複数の第1蒸発源と、前記各第1蒸発源が有する前記複数の第1るつぼの数よりも少ない数の第2るつぼを有する第2蒸発源とを含み、
前記複数の第1蒸発源は、各回転中心が前記面内において前記基板の回転中心軸を中心とする第1円上に配置され、
前記第2蒸発源は、前記複数の第1蒸発源のうち隣接する二つの第1蒸発源の間に配置され、かつ、前記第2蒸発源の回転中心が前記隣接する二つの第1蒸発源の回転中心を結ぶ線分と同一直線上に位置しないように配置され、
前記各第1蒸発源の前記第1るつぼおよび前記第2蒸発源の第2るつぼは、それぞれ、蒸着位置に位置する蒸着用るつぼと、予備加熱位置に位置する予備加熱用るつぼとを含み、
前記第1蒸発源および前記第2蒸発源のそれぞれにおいて、前記各蒸着用るつぼは、前記各予備加熱用るつぼよりも前記基板の回転中心軸から近い位置に配置され、
前記各第1蒸発源の前記各予備加熱用るつぼおよび前記第2蒸発源の前記予備加熱用る
つぼは、前記基板の回転半径よりも外側に配置されることを特徴とする成膜装置。
A film forming apparatus for evaporating and depositing a deposition material on a film forming surface of a rotating substrate,
including a plurality of evaporation sources arranged in a plane facing the film formation surface of the substrate;
Each of the plurality of evaporation sources has a plurality of crucibles radially arranged around a rotation axis, and is rotatable around the rotation axis,
The plurality of evaporation sources include a plurality of first evaporation sources having a plurality of first crucibles and a second evaporation source having a number of second crucibles less than the number of the plurality of first crucibles possessed by each of the first evaporation sources. an evaporation source;
each of the plurality of first evaporation sources is arranged on a first circle centered on the rotation center axis of the substrate in the plane,
The second evaporation source is arranged between two adjacent first evaporation sources among the plurality of first evaporation sources, and the center of rotation of the second evaporation source is the two adjacent first evaporation sources. is arranged so as not to be on the same straight line as the line segment connecting the rotation centers of
the first crucible of each first evaporation source and the second crucible of the second evaporation source each include a vapor deposition crucible positioned at a vapor deposition position and a preheating crucible positioned at a preheating position;
In each of the first evaporation source and the second evaporation source, each of the vapor deposition crucibles is arranged closer to the rotation center axis of the substrate than each of the preheating crucibles,
The film forming apparatus, wherein each of the preheating crucibles of the first evaporation sources and the preheating crucible of the second evaporation sources are arranged outside a radius of rotation of the substrate.
前記各第1蒸発源の前記各蒸着用るつぼおよび前記第2蒸発源の前記蒸着用るつぼは、前記基板の回転中心軸から同一の距離に配置されることを特徴とする請求項7~請求項10のいずれか1項に記載の成膜装置。7 to 10, wherein each of the vapor deposition crucibles of each of the first evaporation sources and the vapor deposition crucible of the second evaporation source are arranged at the same distance from the central axis of rotation of the substrate. 11. The film forming apparatus according to any one of 10. 前記蒸着位置は、該位置に位置するるつぼが前記基板に向かって蒸着材料を供給する位置であり、
前記予備加熱位置は、該位置に位置するるつぼが前記各蒸発源の回転によって前記蒸着位置に移動される前に予熱される位置であることを特徴とする請求項~請求項11のいずれか1項に記載の成膜装置。
The deposition position is a position where the crucible located at the position supplies the deposition material toward the substrate,
12. The preheating position is a position where the crucible positioned at the preheating position is preheated before being moved to the vapor deposition position by the rotation of each of the evaporation sources. The film forming apparatus according to item 1.
前記成膜装置は複数のコーナー部を有する多角形の成膜装置であり、前記複数の第1蒸発源は、上面から見たとき、前記多角形の成膜装置の各コーナー部に対応して前記各第1蒸発源が配置されることを特徴とする請求項~請求項12のいずれか1項に記載の成膜装置。 The film forming apparatus is a polygonal film forming apparatus having a plurality of corners, and the plurality of first evaporation sources correspond to the respective corners of the polygonal film forming apparatus when viewed from above. 13. The film forming apparatus according to any one of claims 3 to 12 , wherein each of the first evaporation sources is arranged. 前記成膜装置は四つのコーナー部を有する成膜装置であり、前記複数の第1蒸発源は、上面から見たとき、前記成膜装置の各コーナー部に対応して四つの第1蒸発源が矩形状の四つの角部に対応する位置に配置されることを特徴とする請求項13に記載の成膜装置。 The film forming apparatus is a film forming apparatus having four corners, and the plurality of first evaporation sources are four first evaporation sources corresponding to the respective corners of the film forming apparatus when viewed from above. 14. The film forming apparatus according to claim 13 , wherein are arranged at positions corresponding to four corners of a rectangular shape. 前記成膜装置は四つのコーナー部を有する多角形の成膜装置であり、前記複数の第1蒸発源は、上面から見たとき、前記多角形の成膜装置の各コーナー部に対応して四つの第1蒸発源が矩形状の四つの角部に対応する位置に配置され、前記各第1蒸発源の前記各蒸着用るつぼが長方形状の四つの角部に対応する位置に配置されることを特徴とする請求項~請求項12のいずれか1項に記載の成膜装置。 The film forming apparatus is a polygonal film forming apparatus having four corners, and the plurality of first evaporation sources correspond to the respective corners of the polygonal film forming apparatus when viewed from above. Four first evaporation sources are arranged at positions corresponding to four corners of a rectangular shape, and the vapor deposition crucibles of the respective first evaporation sources are arranged at positions corresponding to the four corners of the rectangular shape. 13. The film forming apparatus according to any one of claims 4 to 12 , characterized in that: 回転する基板の成膜面に蒸着材料を蒸発させて蒸着する成膜装置であって、
前記基板の成膜面と対向する面内に配置される複数の蒸発源を含み、
前記複数の蒸発源のそれぞれは、回転軸を中心に放射状に配置された複数のるつぼを有し、前記回転軸を回転中心として回転可能であり、
前記複数の蒸発源は、複数の第1るつぼを有する複数の第1蒸発源と、前記各第1蒸発源が有する前記複数の第1るつぼの数よりも少ない数の第2るつぼを有する第2蒸発源とを含み、
前記複数の第1蒸発源は、各回転中心が前記面内において前記基板の回転中心軸を中心とする第1円上に配置され、
前記第2蒸発源は、前記複数の第1蒸発源のうち隣接する二つの第1蒸発源の間に配置され、かつ、前記第2蒸発源の回転中心が前記隣接する二つの第1蒸発源の回転中心を結ぶ線分と同一直線上に位置しないように配置され
前記各第1蒸発源の前記第1るつぼおよび前記第2蒸発源の第2るつぼは、それぞれ、蒸着位置に位置する蒸着用るつぼと、予備加熱位置に位置する予備加熱用るつぼとを含み、
前記第1蒸発源および前記第2蒸発源のそれぞれにおいて、前記各蒸着用るつぼは、前記各予備加熱用るつぼよりも前記基板の回転中心軸から近い位置に配置され、
前記成膜装置は四つのコーナー部を有する多角形の成膜装置であり、前記複数の第1蒸発源は、上面から見たとき、前記多角形の成膜装置の各コーナー部に対応して四つの第1蒸発源が矩形状の四つの角部に対応する位置に配置され、前記各第1蒸発源の前記各蒸着用るつぼが長方形状の四つの角部に対応する位置に配置され、
前記第2蒸発源は、上面から見たとき、前記矩形状に配置される四つの第1蒸発源のうち隣接する二つの第1蒸発源の間に配置され、かつ、前記長方形状の長辺に沿って配置さ
れることを特徴とする成膜装置。
A film forming apparatus for evaporating and depositing a deposition material on a film forming surface of a rotating substrate,
including a plurality of evaporation sources arranged in a plane facing the film formation surface of the substrate;
Each of the plurality of evaporation sources has a plurality of crucibles radially arranged around a rotation axis, and is rotatable around the rotation axis,
The plurality of evaporation sources include a plurality of first evaporation sources having a plurality of first crucibles and a second evaporation source having a number of second crucibles less than the number of the plurality of first crucibles possessed by each of the first evaporation sources. an evaporation source;
each of the plurality of first evaporation sources is arranged on a first circle centered on the rotation center axis of the substrate in the plane,
The second evaporation source is arranged between two adjacent first evaporation sources among the plurality of first evaporation sources, and the center of rotation of the second evaporation source is the two adjacent first evaporation sources. is arranged so as not to be on the same straight line as the line segment connecting the rotation centers of
the first crucible of each first evaporation source and the second crucible of the second evaporation source each include a vapor deposition crucible positioned at a vapor deposition position and a preheating crucible positioned at a preheating position;
In each of the first evaporation source and the second evaporation source, each of the vapor deposition crucibles is arranged closer to the rotation center axis of the substrate than each of the preheating crucibles,
The film forming apparatus is a polygonal film forming apparatus having four corners, and the plurality of first evaporation sources correspond to the respective corners of the polygonal film forming apparatus when viewed from above. Four first evaporation sources are arranged at positions corresponding to four corners of a rectangular shape, and the respective vapor deposition crucibles of the first evaporation sources are arranged at positions corresponding to the four corners of the rectangular shape,
When viewed from above, the second evaporation source is arranged between two adjacent first evaporation sources among the four first evaporation sources arranged in the rectangular shape, and has a long side of the rectangular shape. A film forming apparatus characterized by being arranged along.
前記四つの第1蒸発源は、隣接する各第1蒸発源が互いに反対方向に回転することを特徴とする請求項14~請求項16のいずれか一項に記載の成膜装置。 17. The film forming apparatus according to any one of claims 14 to 16 , wherein the four first evaporation sources rotate in directions opposite to each other. 更に、前記基板の成膜面と前記複数の蒸発源が配置される前記面との間の領域において、前記第1円よりも外側に設置される蒸発レートセンサーを含む請求項~請求項17のいずれか1項に記載の成膜装置。 Claims 3 to 17 , further comprising an evaporation rate sensor installed outside the first circle in a region between the film formation surface of the substrate and the surface on which the plurality of evaporation sources are arranged. The film-forming apparatus of any one of 1 item|term. 前記第2蒸発源は、前記各第1蒸発源よりも直径が小さい蒸発源であることを特徴とする請求項3~請求項18のいずれか1項に記載の成膜装置。19. The film forming apparatus according to any one of claims 3 to 18, wherein the second evaporation source has a smaller diameter than each of the first evaporation sources. 請求項1~請求項19のいずれか1項に記載の成膜装置を用いて、有機EL表示素子の電極層を形成する成膜方法。 A film forming method for forming an electrode layer of an organic EL display element using the film forming apparatus according to any one of claims 1 to 19 . 請求項20に記載の成膜方法を用いて、電子デバイスを製造する方法。 A method of manufacturing an electronic device using the film forming method according to claim 20 .
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