JP7260589B2 - プレートタイプ加熱装置 - Google Patents
プレートタイプ加熱装置 Download PDFInfo
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- JP7260589B2 JP7260589B2 JP2021081626A JP2021081626A JP7260589B2 JP 7260589 B2 JP7260589 B2 JP 7260589B2 JP 2021081626 A JP2021081626 A JP 2021081626A JP 2021081626 A JP2021081626 A JP 2021081626A JP 7260589 B2 JP7260589 B2 JP 7260589B2
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- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05B—ELECTRIC HEATING; ELECTRIC LIGHT SOURCES NOT OTHERWISE PROVIDED FOR; CIRCUIT ARRANGEMENTS FOR ELECTRIC LIGHT SOURCES, IN GENERAL
- H05B3/00—Ohmic-resistance heating
- H05B3/20—Heating elements having extended surface area substantially in a two-dimensional plane, e.g. plate-heater
- H05B3/22—Heating elements having extended surface area substantially in a two-dimensional plane, e.g. plate-heater non-flexible
- H05B3/26—Heating elements having extended surface area substantially in a two-dimensional plane, e.g. plate-heater non-flexible heating conductor mounted on insulating base
- H05B3/265—Heating elements having extended surface area substantially in a two-dimensional plane, e.g. plate-heater non-flexible heating conductor mounted on insulating base the insulating base being an inorganic material, e.g. ceramic
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/67005—Apparatus not specifically provided for elsewhere
- H01L21/67011—Apparatus for manufacture or treatment
- H01L21/67098—Apparatus for thermal treatment
- H01L21/67103—Apparatus for thermal treatment mainly by conduction
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C14/00—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material
- C23C14/22—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material characterised by the process of coating
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C14/00—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material
- C23C14/22—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material characterised by the process of coating
- C23C14/50—Substrate holders
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C16/00—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
- C23C16/44—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating
- C23C16/458—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating characterised by the method used for supporting substrates in the reaction chamber
- C23C16/4582—Rigid and flat substrates, e.g. plates or discs
- C23C16/4583—Rigid and flat substrates, e.g. plates or discs the substrate being supported substantially horizontally
- C23C16/4586—Elements in the interior of the support, e.g. electrodes, heating or cooling devices
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C16/00—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
- C23C16/44—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating
- C23C16/46—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating characterised by the method used for heating the substrate
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/683—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping
- H01L21/687—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping using mechanical means, e.g. chucks, clamps or pinches
- H01L21/68714—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping using mechanical means, e.g. chucks, clamps or pinches the wafers being placed on a susceptor, stage or support
- H01L21/68785—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping using mechanical means, e.g. chucks, clamps or pinches the wafers being placed on a susceptor, stage or support characterised by the mechanical construction of the susceptor, stage or support
-
- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05B—ELECTRIC HEATING; ELECTRIC LIGHT SOURCES NOT OTHERWISE PROVIDED FOR; CIRCUIT ARRANGEMENTS FOR ELECTRIC LIGHT SOURCES, IN GENERAL
- H05B1/00—Details of electric heating devices
- H05B1/02—Automatic switching arrangements specially adapted to apparatus ; Control of heating devices
- H05B1/0227—Applications
- H05B1/023—Industrial applications
- H05B1/0233—Industrial applications for semiconductors manufacturing
-
- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05B—ELECTRIC HEATING; ELECTRIC LIGHT SOURCES NOT OTHERWISE PROVIDED FOR; CIRCUIT ARRANGEMENTS FOR ELECTRIC LIGHT SOURCES, IN GENERAL
- H05B3/00—Ohmic-resistance heating
- H05B3/02—Details
- H05B3/06—Heater elements structurally combined with coupling elements or holders
- H05B3/08—Heater elements structurally combined with coupling elements or holders having electric connections specially adapted for high temperatures
-
- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05B—ELECTRIC HEATING; ELECTRIC LIGHT SOURCES NOT OTHERWISE PROVIDED FOR; CIRCUIT ARRANGEMENTS FOR ELECTRIC LIGHT SOURCES, IN GENERAL
- H05B3/00—Ohmic-resistance heating
- H05B3/20—Heating elements having extended surface area substantially in a two-dimensional plane, e.g. plate-heater
- H05B3/22—Heating elements having extended surface area substantially in a two-dimensional plane, e.g. plate-heater non-flexible
- H05B3/28—Heating elements having extended surface area substantially in a two-dimensional plane, e.g. plate-heater non-flexible heating conductor embedded in insulating material
- H05B3/283—Heating elements having extended surface area substantially in a two-dimensional plane, e.g. plate-heater non-flexible heating conductor embedded in insulating material the insulating material being an inorganic material, e.g. ceramic
-
- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05B—ELECTRIC HEATING; ELECTRIC LIGHT SOURCES NOT OTHERWISE PROVIDED FOR; CIRCUIT ARRANGEMENTS FOR ELECTRIC LIGHT SOURCES, IN GENERAL
- H05B3/00—Ohmic-resistance heating
- H05B3/68—Heating arrangements specially adapted for cooking plates or analogous hot-plates
-
- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05B—ELECTRIC HEATING; ELECTRIC LIGHT SOURCES NOT OTHERWISE PROVIDED FOR; CIRCUIT ARRANGEMENTS FOR ELECTRIC LIGHT SOURCES, IN GENERAL
- H05B2203/00—Aspects relating to Ohmic resistive heating covered by group H05B3/00
- H05B2203/002—Heaters using a particular layout for the resistive material or resistive elements
-
- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05B—ELECTRIC HEATING; ELECTRIC LIGHT SOURCES NOT OTHERWISE PROVIDED FOR; CIRCUIT ARRANGEMENTS FOR ELECTRIC LIGHT SOURCES, IN GENERAL
- H05B2203/00—Aspects relating to Ohmic resistive heating covered by group H05B3/00
- H05B2203/002—Heaters using a particular layout for the resistive material or resistive elements
- H05B2203/004—Heaters using a particular layout for the resistive material or resistive elements using zigzag layout
-
- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05B—ELECTRIC HEATING; ELECTRIC LIGHT SOURCES NOT OTHERWISE PROVIDED FOR; CIRCUIT ARRANGEMENTS FOR ELECTRIC LIGHT SOURCES, IN GENERAL
- H05B2203/00—Aspects relating to Ohmic resistive heating covered by group H05B3/00
- H05B2203/002—Heaters using a particular layout for the resistive material or resistive elements
- H05B2203/005—Heaters using a particular layout for the resistive material or resistive elements using multiple resistive elements or resistive zones isolated from each other
-
- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05B—ELECTRIC HEATING; ELECTRIC LIGHT SOURCES NOT OTHERWISE PROVIDED FOR; CIRCUIT ARRANGEMENTS FOR ELECTRIC LIGHT SOURCES, IN GENERAL
- H05B2203/00—Aspects relating to Ohmic resistive heating covered by group H05B3/00
- H05B2203/016—Heaters using particular connecting means
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- Chemical & Material Sciences (AREA)
- Engineering & Computer Science (AREA)
- Organic Chemistry (AREA)
- Chemical Kinetics & Catalysis (AREA)
- Materials Engineering (AREA)
- Mechanical Engineering (AREA)
- Metallurgy (AREA)
- Manufacturing & Machinery (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- Power Engineering (AREA)
- General Physics & Mathematics (AREA)
- Physics & Mathematics (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- General Chemical & Material Sciences (AREA)
- Ceramic Engineering (AREA)
- Inorganic Chemistry (AREA)
- Resistance Heating (AREA)
- Surface Heating Bodies (AREA)
- Container, Conveyance, Adherence, Positioning, Of Wafer (AREA)
- Physical Vapour Deposition (AREA)
- Chemical Vapour Deposition (AREA)
Description
本発明は、プレートタイプ加熱装置及びその製造方法に関する。
図3は、本発明によるプレートタイプ加熱装置の一実施形態を図示した断面図で、図4は、本発明によるプレートタイプ加熱装置の上部面を図示した平面図である。図3及び図4を参考すれば、本発明のプレートタイプ加熱装置100は、セラミックスプレート基材10;前記セラミックスプレート基材の内部または上部面に位置する熱線層20;電源供給ライン30;及び前記熱線層に位置し、熱線と電源供給ラインを連結するブリッジ40;を含み、前記ブリッジ40は、熱線21、22と電源供給ライン30との間の最短距離を基準にして1.2倍~5倍の長さのブリッジ素材を屈曲させて熱線と電源供給ラインを連結する特徴を持つ。前記ブリッジ素材の長さは1.5倍~3倍であることがより好ましく、2倍~3倍であることがさらに好ましい。前記ブリッジ素材の長さが1.2倍未満の場合、ブリッジに発生する応力を分散しにくいし、5倍を超過する場合は、ブリッジ及び熱線配置の自由度が低下され、設置工程が非効率的であるため好ましくない。
前記気相蒸着装置の構造と係って、本発明で記述されていない部分は、この分野に公知された構造が制限されずに適用されてもよい。
20 熱線層
21、22 熱線
30 電源供給ライン
40 ブリッジ
50 電源供給ライン固定部
100 プレートタイプ加熱装置
Claims (9)
- セラミックスプレート基材、
前記セラミックスプレート基材の内部または上部面に位置する熱線層、
電源供給ライン、及び
前記熱線層に位置し、熱線と電源供給ラインを連結するブリッジを含み、
前記ブリッジは、熱線と電源供給ラインとの間の最短距離を基準にして1.2倍~5倍の長さのブリッジ素材を屈曲させて熱線と電源供給ラインを連結しており、
前記ブリッジは、1個以上の谷と1個以上の山を持つように屈曲して形成されており、
前記ブリッジは、谷と山が交互に配列された波形に形成され、振幅がブリッジ素材幅の1.2倍~20倍になるように形成されており、
前記ブリッジの断面積は前記熱線の断面積に対して2倍~10倍であることを特徴とするプレートタイプ加熱装置。 - 前記熱線層に配置された熱線の一端と他端には、それぞれ異なる極の電源供給ラインが連結されることを特徴とする請求項1に記載のプレートタイプ加熱装置。
- 前記熱線は、前記セラミックスプレート基材の電源供給ライン固定部を中心としてリング状に配置され、
前記ブリッジは、前記電源供給ライン固定部の電源供給ラインとリング内の熱線を連結させることを特徴とする請求項1または2に記載のプレートタイプ加熱装置。 - 前記リング状は2個以上のリングを含み、前記リングは電源供給ライン固定部を中心とする同心円、または同心円と類似な形態で形成され、それぞれのリングは電気的に連結されることを特徴とする請求項3に記載のプレートタイプ加熱装置。
- 前記リング状は2個以上のリングを含み、前記リングは電源供給ライン固定部を中心とする同心円、または同心円と類似な形態で形成され、前記2個以上のリングは、異なる温度で加熱できるように、それぞれ異なる電源供給ラインとブリッジによって連結されることを特徴とする請求項3に記載のプレートタイプ加熱装置。
- 前記電源供給ライン固定部は前記セラミックスプレート基材の中心部に位置することを特徴とする請求項3から5のいずれか一項に記載のプレートタイプ加熱装置。
- 前記熱線はジグザグに屈曲された状態でリング状を形成することを特徴とする請求項3から6のいずれか一項に記載のプレートタイプ加熱装置。
- 前記プレートタイプ加熱装置はウェハーの加熱に使われることを特徴とする請求項1から7のいずれか一項に記載のプレートタイプ加熱装置。
- 請求項1から8のいずれか一項に記載のプレートタイプ加熱装置を含む気相蒸着装置。
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
KR10-2020-0057932 | 2020-05-14 | ||
KR1020200057932A KR102355535B1 (ko) | 2020-05-14 | 2020-05-14 | 플레이트 타입 가열장치 |
Publications (2)
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JP2021179010A JP2021179010A (ja) | 2021-11-18 |
JP7260589B2 true JP7260589B2 (ja) | 2023-04-18 |
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JP2021081626A Active JP7260589B2 (ja) | 2020-05-14 | 2021-05-13 | プレートタイプ加熱装置 |
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US (1) | US20210360748A1 (ja) |
JP (1) | JP7260589B2 (ja) |
KR (1) | KR102355535B1 (ja) |
Families Citing this family (1)
Publication number | Priority date | Publication date | Assignee | Title |
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CN115505897B (zh) * | 2022-09-22 | 2023-10-31 | 江苏第三代半导体研究院有限公司 | 一种用于制备外延片的转盘式反应器、制备方法及用途 |
Citations (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2003007432A (ja) | 2001-06-21 | 2003-01-10 | Nhk Spring Co Ltd | セラミックスヒータ |
WO2006004045A1 (ja) | 2004-07-05 | 2006-01-12 | Tokyo Electron Limited | 処理装置及びヒーターユニット |
JP2006332068A (ja) | 2006-07-06 | 2006-12-07 | Sumitomo Electric Ind Ltd | セラミックスヒータおよびそれを搭載した半導体あるいは液晶製造装置 |
KR101333631B1 (ko) | 2012-12-21 | 2013-11-27 | (주)보부하이테크 | 퀄츠 히터 |
WO2019181500A1 (ja) | 2018-03-23 | 2019-09-26 | 日本碍子株式会社 | マルチゾーンヒータ |
WO2020170800A1 (ja) | 2019-02-19 | 2020-08-27 | 日本碍子株式会社 | セラミックヒータ及びその製法 |
Family Cites Families (4)
Publication number | Priority date | Publication date | Assignee | Title |
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JP4026761B2 (ja) | 2002-03-28 | 2007-12-26 | 日本碍子株式会社 | セラミックヒーター |
KR100836183B1 (ko) | 2007-01-16 | 2008-06-09 | (주)나노테크 | 히터 조립체 및 그 설치구조 |
KR102272522B1 (ko) * | 2015-06-26 | 2021-07-05 | 주식회사 미코세라믹스 | 세라믹 히터 |
US10074590B1 (en) * | 2017-07-02 | 2018-09-11 | Infineon Technologies Ag | Molded package with chip carrier comprising brazed electrically conductive layers |
-
2020
- 2020-05-14 KR KR1020200057932A patent/KR102355535B1/ko active IP Right Grant
-
2021
- 2021-05-12 US US17/318,378 patent/US20210360748A1/en not_active Abandoned
- 2021-05-13 JP JP2021081626A patent/JP7260589B2/ja active Active
Patent Citations (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2003007432A (ja) | 2001-06-21 | 2003-01-10 | Nhk Spring Co Ltd | セラミックスヒータ |
WO2006004045A1 (ja) | 2004-07-05 | 2006-01-12 | Tokyo Electron Limited | 処理装置及びヒーターユニット |
JP2006332068A (ja) | 2006-07-06 | 2006-12-07 | Sumitomo Electric Ind Ltd | セラミックスヒータおよびそれを搭載した半導体あるいは液晶製造装置 |
KR101333631B1 (ko) | 2012-12-21 | 2013-11-27 | (주)보부하이테크 | 퀄츠 히터 |
WO2019181500A1 (ja) | 2018-03-23 | 2019-09-26 | 日本碍子株式会社 | マルチゾーンヒータ |
WO2020170800A1 (ja) | 2019-02-19 | 2020-08-27 | 日本碍子株式会社 | セラミックヒータ及びその製法 |
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Publication number | Publication date |
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KR102355535B1 (ko) | 2022-01-25 |
KR20210140982A (ko) | 2021-11-23 |
US20210360748A1 (en) | 2021-11-18 |
JP2021179010A (ja) | 2021-11-18 |
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