JP7206234B2 - セラミックス製の円柱状ハニカム構造体の検査方法及び検査装置 - Google Patents

セラミックス製の円柱状ハニカム構造体の検査方法及び検査装置 Download PDF

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Publication number
JP7206234B2
JP7206234B2 JP2020061297A JP2020061297A JP7206234B2 JP 7206234 B2 JP7206234 B2 JP 7206234B2 JP 2020061297 A JP2020061297 A JP 2020061297A JP 2020061297 A JP2020061297 A JP 2020061297A JP 7206234 B2 JP7206234 B2 JP 7206234B2
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honeycomb structure
columnar honeycomb
line sensor
inspection
light
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Japanese (ja)
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JP2021162348A5 (https=
JP2021162348A (ja
Inventor
貴史 寺拝
祥弘 佐藤
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NGK Insulators Ltd
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NGK Insulators Ltd
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Priority to JP2020061297A priority Critical patent/JP7206234B2/ja
Priority to US17/188,123 priority patent/US11761899B2/en
Priority to DE102021001126.0A priority patent/DE102021001126A1/de
Priority to CN202110238612.4A priority patent/CN113466128B/zh
Publication of JP2021162348A publication Critical patent/JP2021162348A/ja
Publication of JP2021162348A5 publication Critical patent/JP2021162348A5/ja
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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/8851—Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/95—Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined
    • G01N21/956—Inspecting patterns on the surface of objects
    • G01N21/95692—Patterns showing hole parts, e.g. honeycomb filtering structures
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/01—Arrangements or apparatus for facilitating the optical investigation
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/89—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles
    • G01N21/8914—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles characterised by the material examined
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/95—Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined
    • G01N21/952—Inspecting the exterior surface of cylindrical bodies or wires
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T7/00—Image analysis
    • G06T7/0002—Inspection of images, e.g. flaw detection
    • G06T7/0004—Industrial image inspection
    • G06T7/0008—Industrial image inspection checking presence/absence
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N7/00—Television systems
    • H04N7/18—Closed-circuit television [CCTV] systems, i.e. systems in which the video signal is not broadcast
    • H04N7/183—Closed-circuit television [CCTV] systems, i.e. systems in which the video signal is not broadcast for receiving images from a single remote source
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/01—Arrangements or apparatus for facilitating the optical investigation
    • G01N2021/0106—General arrangement of respective parts
    • G01N2021/0112—Apparatus in one mechanical, optical or electronic block
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T2207/00—Indexing scheme for image analysis or image enhancement
    • G06T2207/30—Subject of image; Context of image processing
    • G06T2207/30108—Industrial image inspection

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  • General Physics & Mathematics (AREA)
  • Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Immunology (AREA)
  • Health & Medical Sciences (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Pathology (AREA)
  • Analytical Chemistry (AREA)
  • Signal Processing (AREA)
  • Computer Vision & Pattern Recognition (AREA)
  • Textile Engineering (AREA)
  • Multimedia (AREA)
  • Quality & Reliability (AREA)
  • Theoretical Computer Science (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
  • Length Measuring Devices By Optical Means (AREA)
JP2020061297A 2020-03-30 2020-03-30 セラミックス製の円柱状ハニカム構造体の検査方法及び検査装置 Active JP7206234B2 (ja)

Priority Applications (4)

Application Number Priority Date Filing Date Title
JP2020061297A JP7206234B2 (ja) 2020-03-30 2020-03-30 セラミックス製の円柱状ハニカム構造体の検査方法及び検査装置
US17/188,123 US11761899B2 (en) 2020-03-30 2021-03-01 Inspection method and inspection system for cylindrical honeycomb structure made of ceramics
DE102021001126.0A DE102021001126A1 (de) 2020-03-30 2021-03-02 Prüfverfahren und Prüfsystem für zylindrische Wabenstruktur aus Keramik
CN202110238612.4A CN113466128B (zh) 2020-03-30 2021-03-04 陶瓷制的圆柱状蜂窝结构体的检查方法及检查装置

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2020061297A JP7206234B2 (ja) 2020-03-30 2020-03-30 セラミックス製の円柱状ハニカム構造体の検査方法及び検査装置

Publications (3)

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JP2021162348A JP2021162348A (ja) 2021-10-11
JP2021162348A5 JP2021162348A5 (https=) 2021-12-16
JP7206234B2 true JP7206234B2 (ja) 2023-01-17

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JP2020061297A Active JP7206234B2 (ja) 2020-03-30 2020-03-30 セラミックス製の円柱状ハニカム構造体の検査方法及び検査装置

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US (1) US11761899B2 (https=)
JP (1) JP7206234B2 (https=)
CN (1) CN113466128B (https=)
DE (1) DE102021001126A1 (https=)

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* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US12078574B2 (en) * 2021-08-11 2024-09-03 Corning Incorporated Systems and methods for visual inspection and 3D measurement
KR102725142B1 (ko) * 2022-05-20 2024-11-01 주식회사 윈텍오토메이션 초경인서트 측면 코너부 검사를 위한 영상 획득시스템
JP7733042B2 (ja) * 2023-03-27 2025-09-02 日本碍子株式会社 ハニカム成形体の外周形状を検査するシステム及び方法
CN118464922B (zh) * 2024-05-10 2025-09-19 冠捷电子科技(福建)有限公司 一种基于相机前后景深的面板快速检测方法
CN118758967B (zh) * 2024-07-17 2024-12-10 江苏赛立昂复合材料有限公司 一种陶瓷内部缺陷检测装置

Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2007105825A1 (ja) 2006-03-16 2007-09-20 Ngk Insulators, Ltd. ハニカム構造体の外壁検査方法
JP2008241529A (ja) 2007-03-28 2008-10-09 Yaskawa Electric Corp 回転中心合わせ装置
JP2008275496A (ja) 2007-05-01 2008-11-13 Canon Chemicals Inc 発泡体ローラーの欠陥検出方法および装置
WO2017061318A1 (ja) 2015-10-06 2017-04-13 日本碍子株式会社 セラミックス体の表面検査方法

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JPH0612253B2 (ja) * 1989-03-01 1994-02-16 日本碍子株式会社 ハニカム成形用口金の検査方法
JP3840619B2 (ja) * 1995-05-25 2006-11-01 株式会社キーエンス 変位計
JPH11281321A (ja) * 1998-03-31 1999-10-15 Copal Co Ltd 部品認識装置
US7460703B2 (en) * 2002-12-03 2008-12-02 Og Technologies, Inc. Apparatus and method for detecting surface defects on a workpiece such as a rolled/drawn metal bar
WO2009058247A1 (en) * 2007-10-31 2009-05-07 Corning Incorporated Laser scanning measurement systems and methods for surface shape measurement of hidden surfaces
US8049878B2 (en) * 2008-08-22 2011-11-01 Corning Incorporated Systems and methods for detecting defects in ceramic filter bodies
GB0901040D0 (en) * 2009-01-22 2009-03-11 Renishaw Plc Optical measuring method and system
JP2010249798A (ja) * 2009-03-23 2010-11-04 Ngk Insulators Ltd 目封止ハニカム構造体の検査装置及び目封止ハニカム構造体の検査方法
US8285027B2 (en) * 2009-11-13 2012-10-09 Corning Incorporated High-resolution large-field scanning inspection system for extruded ceramic honeycomb structures
US8537215B2 (en) * 2009-11-30 2013-09-17 Corning Incorporated Multi-camera skin inspection system for extruded ceramic honeycomb structures
CN201697882U (zh) * 2010-06-03 2011-01-05 成都精密光学工程研究中心 光学元件亚表面缺陷的检测装置
JP5963453B2 (ja) * 2011-03-15 2016-08-03 株式会社荏原製作所 検査装置
US9239296B2 (en) * 2014-03-18 2016-01-19 Corning Incorporated Skinning of ceramic honeycomb bodies
MX373614B (es) * 2014-11-25 2020-05-07 Corning Inc Métodos de inspección de material extrudido y control de retroalimentación integrados para la fabricación de cuerpos de panal.
US11255663B2 (en) * 2016-03-04 2022-02-22 May Patents Ltd. Method and apparatus for cooperative usage of multiple distance meters
CN110741464B (zh) * 2017-06-07 2021-03-19 佳能机械株式会社 缺陷检测装置、缺陷检测方法、裸片接合机、半导体制造方法、以及半导体装置制造方法

Patent Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2007105825A1 (ja) 2006-03-16 2007-09-20 Ngk Insulators, Ltd. ハニカム構造体の外壁検査方法
JP2008241529A (ja) 2007-03-28 2008-10-09 Yaskawa Electric Corp 回転中心合わせ装置
JP2008275496A (ja) 2007-05-01 2008-11-13 Canon Chemicals Inc 発泡体ローラーの欠陥検出方法および装置
WO2017061318A1 (ja) 2015-10-06 2017-04-13 日本碍子株式会社 セラミックス体の表面検査方法

Also Published As

Publication number Publication date
CN113466128B (zh) 2024-09-13
DE102021001126A1 (de) 2021-09-30
US20210302325A1 (en) 2021-09-30
US11761899B2 (en) 2023-09-19
CN113466128A (zh) 2021-10-01
JP2021162348A (ja) 2021-10-11

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