CN113466128B - 陶瓷制的圆柱状蜂窝结构体的检查方法及检查装置 - Google Patents

陶瓷制的圆柱状蜂窝结构体的检查方法及检查装置 Download PDF

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Publication number
CN113466128B
CN113466128B CN202110238612.4A CN202110238612A CN113466128B CN 113466128 B CN113466128 B CN 113466128B CN 202110238612 A CN202110238612 A CN 202110238612A CN 113466128 B CN113466128 B CN 113466128B
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honeycomb structure
cylindrical honeycomb
rotary table
light
line sensor
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Chinese (zh)
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CN113466128A (zh
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寺拝贵史
佐藤祥弘
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NGK Insulators Ltd
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NGK Insulators Ltd
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    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/01Arrangements or apparatus for facilitating the optical investigation
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84Systems specially adapted for particular applications
    • G01N21/88Investigating the presence of flaws or contamination
    • G01N21/95Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined
    • G01N21/956Inspecting patterns on the surface of objects
    • G01N21/95692Patterns showing hole parts, e.g. honeycomb filtering structures
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84Systems specially adapted for particular applications
    • G01N21/88Investigating the presence of flaws or contamination
    • G01N21/8851Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84Systems specially adapted for particular applications
    • G01N21/88Investigating the presence of flaws or contamination
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84Systems specially adapted for particular applications
    • G01N21/88Investigating the presence of flaws or contamination
    • G01N21/89Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles
    • G01N21/8914Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles characterised by the material examined
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84Systems specially adapted for particular applications
    • G01N21/88Investigating the presence of flaws or contamination
    • G01N21/95Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined
    • G01N21/952Inspecting the exterior surface of cylindrical bodies or wires
    • GPHYSICS
    • G06COMPUTING OR CALCULATING; COUNTING
    • G06TIMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T7/00Image analysis
    • G06T7/0002Inspection of images, e.g. flaw detection
    • G06T7/0004Industrial image inspection
    • G06T7/0008Industrial image inspection checking presence/absence
    • HELECTRICITY
    • H04ELECTRIC COMMUNICATION TECHNIQUE
    • H04NPICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N7/00Television systems
    • H04N7/18Closed-circuit television [CCTV] systems, i.e. systems in which the video signal is not broadcast
    • H04N7/183Closed-circuit television [CCTV] systems, i.e. systems in which the video signal is not broadcast for receiving images from a single remote source
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/01Arrangements or apparatus for facilitating the optical investigation
    • G01N2021/0106General arrangement of respective parts
    • G01N2021/0112Apparatus in one mechanical, optical or electronic block
    • GPHYSICS
    • G06COMPUTING OR CALCULATING; COUNTING
    • G06TIMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T2207/00Indexing scheme for image analysis or image enhancement
    • G06T2207/30Subject of image; Context of image processing
    • G06T2207/30108Industrial image inspection

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  • General Physics & Mathematics (AREA)
  • Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Immunology (AREA)
  • Health & Medical Sciences (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Pathology (AREA)
  • Analytical Chemistry (AREA)
  • Signal Processing (AREA)
  • Computer Vision & Pattern Recognition (AREA)
  • Textile Engineering (AREA)
  • Multimedia (AREA)
  • Quality & Reliability (AREA)
  • Theoretical Computer Science (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
  • Length Measuring Devices By Optical Means (AREA)
CN202110238612.4A 2020-03-30 2021-03-04 陶瓷制的圆柱状蜂窝结构体的检查方法及检查装置 Active CN113466128B (zh)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP2020-061297 2020-03-30
JP2020061297A JP7206234B2 (ja) 2020-03-30 2020-03-30 セラミックス製の円柱状ハニカム構造体の検査方法及び検査装置

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CN113466128A CN113466128A (zh) 2021-10-01
CN113466128B true CN113466128B (zh) 2024-09-13

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US (1) US11761899B2 (https=)
JP (1) JP7206234B2 (https=)
CN (1) CN113466128B (https=)
DE (1) DE102021001126A1 (https=)

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US12078574B2 (en) * 2021-08-11 2024-09-03 Corning Incorporated Systems and methods for visual inspection and 3D measurement
KR102725142B1 (ko) * 2022-05-20 2024-11-01 주식회사 윈텍오토메이션 초경인서트 측면 코너부 검사를 위한 영상 획득시스템
JP7733042B2 (ja) * 2023-03-27 2025-09-02 日本碍子株式会社 ハニカム成形体の外周形状を検査するシステム及び方法
CN118464922B (zh) * 2024-05-10 2025-09-19 冠捷电子科技(福建)有限公司 一种基于相机前后景深的面板快速检测方法
CN118758967B (zh) * 2024-07-17 2024-12-10 江苏赛立昂复合材料有限公司 一种陶瓷内部缺陷检测装置

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JP3840619B2 (ja) * 1995-05-25 2006-11-01 株式会社キーエンス 変位計
JPH11281321A (ja) * 1998-03-31 1999-10-15 Copal Co Ltd 部品認識装置
US7460703B2 (en) * 2002-12-03 2008-12-02 Og Technologies, Inc. Apparatus and method for detecting surface defects on a workpiece such as a rolled/drawn metal bar
EP2006666A4 (en) 2006-03-16 2010-10-13 Ngk Insulators Ltd METHOD FOR INSPECTION OF THE OUTER WALL OF A HONEY WAVE STRUCTURE BODY
JP2008241529A (ja) 2007-03-28 2008-10-09 Yaskawa Electric Corp 回転中心合わせ装置
WO2009058247A1 (en) * 2007-10-31 2009-05-07 Corning Incorporated Laser scanning measurement systems and methods for surface shape measurement of hidden surfaces
US8049878B2 (en) * 2008-08-22 2011-11-01 Corning Incorporated Systems and methods for detecting defects in ceramic filter bodies
GB0901040D0 (en) * 2009-01-22 2009-03-11 Renishaw Plc Optical measuring method and system
JP2010249798A (ja) * 2009-03-23 2010-11-04 Ngk Insulators Ltd 目封止ハニカム構造体の検査装置及び目封止ハニカム構造体の検査方法
US8285027B2 (en) * 2009-11-13 2012-10-09 Corning Incorporated High-resolution large-field scanning inspection system for extruded ceramic honeycomb structures
US8537215B2 (en) * 2009-11-30 2013-09-17 Corning Incorporated Multi-camera skin inspection system for extruded ceramic honeycomb structures
CN201697882U (zh) * 2010-06-03 2011-01-05 成都精密光学工程研究中心 光学元件亚表面缺陷的检测装置
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Publication number Publication date
JP7206234B2 (ja) 2023-01-17
DE102021001126A1 (de) 2021-09-30
US20210302325A1 (en) 2021-09-30
US11761899B2 (en) 2023-09-19
CN113466128A (zh) 2021-10-01
JP2021162348A (ja) 2021-10-11

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