JP7204504B2 - 対象物確認装置 - Google Patents
対象物確認装置 Download PDFInfo
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- JP7204504B2 JP7204504B2 JP2019012788A JP2019012788A JP7204504B2 JP 7204504 B2 JP7204504 B2 JP 7204504B2 JP 2019012788 A JP2019012788 A JP 2019012788A JP 2019012788 A JP2019012788 A JP 2019012788A JP 7204504 B2 JP7204504 B2 JP 7204504B2
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- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
- G06T19/00—Manipulating 3D models or images for computer graphics
- G06T19/20—Editing of 3D images, e.g. changing shapes or colours, aligning objects or positioning parts
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
- G06T7/00—Image analysis
- G06T7/30—Determination of transform parameters for the alignment of images, i.e. image registration
- G06T7/33—Determination of transform parameters for the alignment of images, i.e. image registration using feature-based methods
- G06T7/337—Determination of transform parameters for the alignment of images, i.e. image registration using feature-based methods involving reference images or patches
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
- G06T7/00—Image analysis
- G06T7/0002—Inspection of images, e.g. flaw detection
- G06T7/0004—Industrial image inspection
- G06T7/001—Industrial image inspection using an image reference approach
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- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F18/00—Pattern recognition
- G06F18/20—Analysing
- G06F18/22—Matching criteria, e.g. proximity measures
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
- G06T7/00—Image analysis
- G06T7/30—Determination of transform parameters for the alignment of images, i.e. image registration
- G06T7/38—Registration of image sequences
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
- G06T7/00—Image analysis
- G06T7/70—Determining position or orientation of objects or cameras
- G06T7/73—Determining position or orientation of objects or cameras using feature-based methods
- G06T7/75—Determining position or orientation of objects or cameras using feature-based methods involving models
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
- G06T7/00—Image analysis
- G06T7/97—Determining parameters from multiple pictures
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06V—IMAGE OR VIDEO RECOGNITION OR UNDERSTANDING
- G06V10/00—Arrangements for image or video recognition or understanding
- G06V10/40—Extraction of image or video features
- G06V10/44—Local feature extraction by analysis of parts of the pattern, e.g. by detecting edges, contours, loops, corners, strokes or intersections; Connectivity analysis, e.g. of connected components
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- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
- G06T2207/00—Indexing scheme for image analysis or image enhancement
- G06T2207/30—Subject of image; Context of image processing
- G06T2207/30108—Industrial image inspection
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- Engineering & Computer Science (AREA)
- Theoretical Computer Science (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Computer Vision & Pattern Recognition (AREA)
- Data Mining & Analysis (AREA)
- General Engineering & Computer Science (AREA)
- Bioinformatics & Computational Biology (AREA)
- Computer Graphics (AREA)
- Evolutionary Biology (AREA)
- Bioinformatics & Cheminformatics (AREA)
- Artificial Intelligence (AREA)
- Life Sciences & Earth Sciences (AREA)
- Architecture (AREA)
- Evolutionary Computation (AREA)
- Computer Hardware Design (AREA)
- Software Systems (AREA)
- Quality & Reliability (AREA)
- Multimedia (AREA)
- Length Measuring Devices By Optical Means (AREA)
- Image Analysis (AREA)
- Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
Description
10 対象物確認装置
21 領域特定部
22 画像生成部
23 差異特定部
24 差異加工部
25 モデル加工部
40 画像データ
41 撮像データ
42 3Dモデルデータ
Claims (3)
- 対象物を撮像した撮像データから抽出された特徴部に基づいて、前記対象物の3Dモデルデータのうち、前記撮像データに対応する領域を特定する領域特定部と、
前記3Dモデルデータから、特定された前記領域の画像データを生成する画像生成部と、
前記撮像データと前記画像データとの間で差異がある箇所を特定し、前記差異がある箇所に対応する対象部品の位置が、前記対象部品の公差データに示される公差の範囲内であるか否かの判定を行う差異特定部と、
を備える対象物確認装置。 - 前記差異がある箇所を特定可能となる態様に前記撮像データまたは前記画像データを加工する差異加工部
を備える請求項1に記載の対象物確認装置。 - 前記3Dモデルデータのうち、対応する前記撮像データがある領域と、対応する前記撮像データがない領域とを特定できるように、前記3Dモデルデータを加工するモデル加工部
を備える請求項1または2に記載の対象物確認装置。
Priority Applications (4)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2019012788A JP7204504B2 (ja) | 2019-01-29 | 2019-01-29 | 対象物確認装置 |
CN201911094396.XA CN111489449A (zh) | 2019-01-29 | 2019-11-11 | 对象物确认装置 |
EP19214463.2A EP3690807A1 (en) | 2019-01-29 | 2019-12-09 | Object checking device |
US16/751,490 US11335016B2 (en) | 2019-01-29 | 2020-01-24 | Object checking device |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2019012788A JP7204504B2 (ja) | 2019-01-29 | 2019-01-29 | 対象物確認装置 |
Publications (2)
Publication Number | Publication Date |
---|---|
JP2020122653A JP2020122653A (ja) | 2020-08-13 |
JP7204504B2 true JP7204504B2 (ja) | 2023-01-16 |
Family
ID=68840923
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP2019012788A Active JP7204504B2 (ja) | 2019-01-29 | 2019-01-29 | 対象物確認装置 |
Country Status (4)
Country | Link |
---|---|
US (1) | US11335016B2 (ja) |
EP (1) | EP3690807A1 (ja) |
JP (1) | JP7204504B2 (ja) |
CN (1) | CN111489449A (ja) |
Citations (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2002369812A (ja) | 2001-06-15 | 2002-12-24 | Babcock Hitachi Kk | 頭蓋骨スーパーインポーズ方法と装置 |
JP2008235504A (ja) | 2007-03-20 | 2008-10-02 | Mitsubishi Electric Corp | 組立品検査装置 |
WO2015068470A1 (ja) | 2013-11-06 | 2015-05-14 | 凸版印刷株式会社 | 3次元形状計測装置、3次元形状計測方法及び3次元形状計測プログラム |
Family Cites Families (14)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
DE19702623C2 (de) * | 1997-01-25 | 2002-08-01 | Franz Miller | Verfahren zur Herstellung eines Stereolichtbildpaares zur Betrachtung in einem Stereolichtbildbetrachter |
JP3300682B2 (ja) * | 1999-04-08 | 2002-07-08 | ファナック株式会社 | 画像処理機能を持つロボット装置 |
JP4068541B2 (ja) * | 2003-09-25 | 2008-03-26 | 株式会社東芝 | 集積回路パターン検証装置と検証方法 |
JP2004325464A (ja) * | 2004-08-09 | 2004-11-18 | Olympus Corp | 三次元情報再構成装置及び三次元情報再構成方法、基準パターン並びに撮影装置及び撮影方法。 |
JP4653606B2 (ja) * | 2005-05-23 | 2011-03-16 | 株式会社東芝 | 画像認識装置、方法およびプログラム |
TWI443600B (zh) * | 2011-05-05 | 2014-07-01 | Mstar Semiconductor Inc | 影像處理的方法與相關裝置 |
JP6285765B2 (ja) * | 2014-03-18 | 2018-02-28 | キヤノン株式会社 | 情報処理装置、情報処理方法 |
US10659750B2 (en) * | 2014-07-23 | 2020-05-19 | Apple Inc. | Method and system for presenting at least part of an image of a real object in a view of a real environment, and method and system for selecting a subset of a plurality of images |
JP6327144B2 (ja) * | 2014-12-25 | 2018-05-23 | 株式会社デンソー | 画像処理システム及び画像処理装置 |
JP6643843B2 (ja) * | 2015-09-14 | 2020-02-12 | オリンパス株式会社 | 撮像操作ガイド装置および撮像装置の操作ガイド方法 |
US9875535B2 (en) * | 2016-02-11 | 2018-01-23 | Caterpillar Inc. | Wear measurement system using computer vision |
JP6733244B2 (ja) | 2016-03-18 | 2020-07-29 | 株式会社Ihi | 外観検査システム |
JP6868487B2 (ja) * | 2016-06-30 | 2021-05-12 | 株式会社日立システムズ | 被写体異常有無調査システム |
WO2018136262A1 (en) * | 2017-01-20 | 2018-07-26 | Aquifi, Inc. | Systems and methods for defect detection |
-
2019
- 2019-01-29 JP JP2019012788A patent/JP7204504B2/ja active Active
- 2019-11-11 CN CN201911094396.XA patent/CN111489449A/zh active Pending
- 2019-12-09 EP EP19214463.2A patent/EP3690807A1/en active Pending
-
2020
- 2020-01-24 US US16/751,490 patent/US11335016B2/en active Active
Patent Citations (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2002369812A (ja) | 2001-06-15 | 2002-12-24 | Babcock Hitachi Kk | 頭蓋骨スーパーインポーズ方法と装置 |
JP2008235504A (ja) | 2007-03-20 | 2008-10-02 | Mitsubishi Electric Corp | 組立品検査装置 |
WO2015068470A1 (ja) | 2013-11-06 | 2015-05-14 | 凸版印刷株式会社 | 3次元形状計測装置、3次元形状計測方法及び3次元形状計測プログラム |
Also Published As
Publication number | Publication date |
---|---|
US20200242787A1 (en) | 2020-07-30 |
EP3690807A1 (en) | 2020-08-05 |
US11335016B2 (en) | 2022-05-17 |
JP2020122653A (ja) | 2020-08-13 |
CN111489449A (zh) | 2020-08-04 |
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