JP2020122653A - 対象物確認装置 - Google Patents
対象物確認装置 Download PDFInfo
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- JP2020122653A JP2020122653A JP2019012788A JP2019012788A JP2020122653A JP 2020122653 A JP2020122653 A JP 2020122653A JP 2019012788 A JP2019012788 A JP 2019012788A JP 2019012788 A JP2019012788 A JP 2019012788A JP 2020122653 A JP2020122653 A JP 2020122653A
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- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
- G06T7/00—Image analysis
- G06T7/0002—Inspection of images, e.g. flaw detection
- G06T7/0004—Industrial image inspection
- G06T7/001—Industrial image inspection using an image reference approach
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- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
- G06T7/00—Image analysis
- G06T7/30—Determination of transform parameters for the alignment of images, i.e. image registration
- G06T7/33—Determination of transform parameters for the alignment of images, i.e. image registration using feature-based methods
- G06T7/337—Determination of transform parameters for the alignment of images, i.e. image registration using feature-based methods involving reference images or patches
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
- G06T19/00—Manipulating 3D models or images for computer graphics
- G06T19/20—Editing of 3D images, e.g. changing shapes or colours, aligning objects or positioning parts
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- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F18/00—Pattern recognition
- G06F18/20—Analysing
- G06F18/22—Matching criteria, e.g. proximity measures
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- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
- G06T7/00—Image analysis
- G06T7/30—Determination of transform parameters for the alignment of images, i.e. image registration
- G06T7/38—Registration of image sequences
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- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
- G06T7/00—Image analysis
- G06T7/70—Determining position or orientation of objects or cameras
- G06T7/73—Determining position or orientation of objects or cameras using feature-based methods
- G06T7/75—Determining position or orientation of objects or cameras using feature-based methods involving models
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- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
- G06T7/00—Image analysis
- G06T7/97—Determining parameters from multiple pictures
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- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06V—IMAGE OR VIDEO RECOGNITION OR UNDERSTANDING
- G06V10/00—Arrangements for image or video recognition or understanding
- G06V10/40—Extraction of image or video features
- G06V10/44—Local feature extraction by analysis of parts of the pattern, e.g. by detecting edges, contours, loops, corners, strokes or intersections; Connectivity analysis, e.g. of connected components
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- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
- G06T2207/00—Indexing scheme for image analysis or image enhancement
- G06T2207/30—Subject of image; Context of image processing
- G06T2207/30108—Industrial image inspection
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- Computer Vision & Pattern Recognition (AREA)
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- Bioinformatics & Computational Biology (AREA)
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Abstract
Description
10 対象物確認装置
21 領域特定部
22 画像生成部
23 差異特定部
24 差異加工部
25 モデル加工部
40 画像データ
41 撮像データ
42 3Dモデルデータ
Claims (3)
- 対象物を撮像した撮像データから抽出された特徴部に基づいて、前記対象物の3Dモデルデータのうち、前記撮像データに対応する領域を特定する領域特定部と、
前記3Dモデルデータから、特定された前記領域の画像データを生成する画像生成部と、
前記撮像データと前記画像データとの間で差異がある箇所を特定する差異特定部と、
を備える対象物確認装置。 - 前記差異がある箇所を特定可能となる態様に前記撮像データまたは前記画像データを加工する差異加工部
を備える請求項1に記載の対象物確認装置。 - 前記3Dモデルデータのうち、対応する前記撮像データがある領域と、対応する前記撮像データがない領域とを特定できるように、前記3Dモデルデータを加工するモデル加工部
を備える請求項1または2に記載の対象物確認装置。
Priority Applications (4)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2019012788A JP7204504B2 (ja) | 2019-01-29 | 2019-01-29 | 対象物確認装置 |
CN201911094396.XA CN111489449A (zh) | 2019-01-29 | 2019-11-11 | 对象物确认装置 |
EP19214463.2A EP3690807A1 (en) | 2019-01-29 | 2019-12-09 | Object checking device |
US16/751,490 US11335016B2 (en) | 2019-01-29 | 2020-01-24 | Object checking device |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2019012788A JP7204504B2 (ja) | 2019-01-29 | 2019-01-29 | 対象物確認装置 |
Publications (2)
Publication Number | Publication Date |
---|---|
JP2020122653A true JP2020122653A (ja) | 2020-08-13 |
JP7204504B2 JP7204504B2 (ja) | 2023-01-16 |
Family
ID=68840923
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP2019012788A Active JP7204504B2 (ja) | 2019-01-29 | 2019-01-29 | 対象物確認装置 |
Country Status (4)
Country | Link |
---|---|
US (1) | US11335016B2 (ja) |
EP (1) | EP3690807A1 (ja) |
JP (1) | JP7204504B2 (ja) |
CN (1) | CN111489449A (ja) |
Citations (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2002369812A (ja) * | 2001-06-15 | 2002-12-24 | Babcock Hitachi Kk | 頭蓋骨スーパーインポーズ方法と装置 |
JP2008235504A (ja) * | 2007-03-20 | 2008-10-02 | Mitsubishi Electric Corp | 組立品検査装置 |
WO2015068470A1 (ja) * | 2013-11-06 | 2015-05-14 | 凸版印刷株式会社 | 3次元形状計測装置、3次元形状計測方法及び3次元形状計測プログラム |
Family Cites Families (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP3300682B2 (ja) * | 1999-04-08 | 2002-07-08 | ファナック株式会社 | 画像処理機能を持つロボット装置 |
JP4653606B2 (ja) * | 2005-05-23 | 2011-03-16 | 株式会社東芝 | 画像認識装置、方法およびプログラム |
TWI443600B (zh) * | 2011-05-05 | 2014-07-01 | Mstar Semiconductor Inc | 影像處理的方法與相關裝置 |
US9875535B2 (en) * | 2016-02-11 | 2018-01-23 | Caterpillar Inc. | Wear measurement system using computer vision |
JP6733244B2 (ja) | 2016-03-18 | 2020-07-29 | 株式会社Ihi | 外観検査システム |
US20180211373A1 (en) * | 2017-01-20 | 2018-07-26 | Aquifi, Inc. | Systems and methods for defect detection |
-
2019
- 2019-01-29 JP JP2019012788A patent/JP7204504B2/ja active Active
- 2019-11-11 CN CN201911094396.XA patent/CN111489449A/zh active Pending
- 2019-12-09 EP EP19214463.2A patent/EP3690807A1/en active Pending
-
2020
- 2020-01-24 US US16/751,490 patent/US11335016B2/en active Active
Patent Citations (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2002369812A (ja) * | 2001-06-15 | 2002-12-24 | Babcock Hitachi Kk | 頭蓋骨スーパーインポーズ方法と装置 |
JP2008235504A (ja) * | 2007-03-20 | 2008-10-02 | Mitsubishi Electric Corp | 組立品検査装置 |
WO2015068470A1 (ja) * | 2013-11-06 | 2015-05-14 | 凸版印刷株式会社 | 3次元形状計測装置、3次元形状計測方法及び3次元形状計測プログラム |
Also Published As
Publication number | Publication date |
---|---|
US11335016B2 (en) | 2022-05-17 |
CN111489449A (zh) | 2020-08-04 |
EP3690807A1 (en) | 2020-08-05 |
US20200242787A1 (en) | 2020-07-30 |
JP7204504B2 (ja) | 2023-01-16 |
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