JP7186932B2 - 導波管モード測定装置、導波管モード測定方法及び導波管システム - Google Patents

導波管モード測定装置、導波管モード測定方法及び導波管システム Download PDF

Info

Publication number
JP7186932B2
JP7186932B2 JP2022543204A JP2022543204A JP7186932B2 JP 7186932 B2 JP7186932 B2 JP 7186932B2 JP 2022543204 A JP2022543204 A JP 2022543204A JP 2022543204 A JP2022543204 A JP 2022543204A JP 7186932 B2 JP7186932 B2 JP 7186932B2
Authority
JP
Japan
Prior art keywords
probe
average value
mode
amplitude
waveguide
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Active
Application number
JP2022543204A
Other languages
English (en)
Japanese (ja)
Other versions
JPWO2022038725A5 (ja
JPWO2022038725A1 (enrdf_load_stackoverflow
Inventor
伸一 山本
宏昌 中嶋
秀憲 湯川
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Mitsubishi Electric Corp
Original Assignee
Mitsubishi Electric Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Mitsubishi Electric Corp filed Critical Mitsubishi Electric Corp
Publication of JPWO2022038725A1 publication Critical patent/JPWO2022038725A1/ja
Publication of JPWO2022038725A5 publication Critical patent/JPWO2022038725A5/ja
Application granted granted Critical
Publication of JP7186932B2 publication Critical patent/JP7186932B2/ja
Active legal-status Critical Current
Anticipated expiration legal-status Critical

Links

Images

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R29/00Arrangements for measuring or indicating electric quantities not covered by groups G01R19/00 - G01R27/00
    • G01R29/08Measuring electromagnetic field characteristics

Landscapes

  • Physics & Mathematics (AREA)
  • Electromagnetism (AREA)
  • General Physics & Mathematics (AREA)
  • Waveguides (AREA)
  • Plasma Technology (AREA)
JP2022543204A 2020-08-20 2020-08-20 導波管モード測定装置、導波管モード測定方法及び導波管システム Active JP7186932B2 (ja)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
PCT/JP2020/031360 WO2022038725A1 (ja) 2020-08-20 2020-08-20 導波管モード測定装置、導波管モード測定方法、導波管システム及び導波管装置

Publications (3)

Publication Number Publication Date
JPWO2022038725A1 JPWO2022038725A1 (enrdf_load_stackoverflow) 2022-02-24
JPWO2022038725A5 JPWO2022038725A5 (ja) 2022-09-27
JP7186932B2 true JP7186932B2 (ja) 2022-12-09

Family

ID=80323479

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2022543204A Active JP7186932B2 (ja) 2020-08-20 2020-08-20 導波管モード測定装置、導波管モード測定方法及び導波管システム

Country Status (2)

Country Link
JP (1) JP7186932B2 (enrdf_load_stackoverflow)
WO (1) WO2022038725A1 (enrdf_load_stackoverflow)

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4686491A (en) 1985-10-22 1987-08-11 Chaparral Communications Dual probe signal receiver

Family Cites Families (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS61206301A (ja) * 1985-03-08 1986-09-12 Matsushita Electric Ind Co Ltd 偏分波器
JPH08242101A (ja) * 1995-03-03 1996-09-17 Maspro Denkoh Corp 偏波分波器
JPH10209899A (ja) * 1997-01-17 1998-08-07 Nippon Antenna Co Ltd 低雑音コンバータ
JP2011077292A (ja) * 2009-09-30 2011-04-14 Hitachi High-Technologies Corp プラズマ処理装置
JP2012049353A (ja) * 2010-08-27 2012-03-08 Hitachi High-Technologies Corp プラズマ処理装置
JP5671933B2 (ja) * 2010-10-18 2015-02-18 ソニー株式会社 信号伝送装置

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4686491A (en) 1985-10-22 1987-08-11 Chaparral Communications Dual probe signal receiver

Also Published As

Publication number Publication date
WO2022038725A1 (ja) 2022-02-24
JPWO2022038725A1 (enrdf_load_stackoverflow) 2022-02-24

Similar Documents

Publication Publication Date Title
JP4635544B2 (ja) 電界分布測定方法及び電界分布測定装置
US20080079424A1 (en) Measuring method for electromagnetic field intensity and apparatus therefor, measuring method for electromagnetic field intensity distribution and apparatus therefor, measuring method for current and voltage distributions and apparatus therefor
Zhang et al. An efficient probe calibration based near-field-to-near-field transformation for EMI diagnosis
US20150185298A1 (en) Method of estimating specific absorption rate
CN103336273B (zh) 一种基于波谱域补偿的探头耦合消除方法
JP6803974B2 (ja) 多導体システムの1つの個別導体の電流強度を測定する装置および方法
JP5696387B2 (ja) 電界プローブの校正方法及び校正装置、並びにコンピュータプログラム
CN106707210A (zh) 一种基于传输线的近场探头空间分辨率的行波校准方法
JP7186932B2 (ja) 導波管モード測定装置、導波管モード測定方法及び導波管システム
CN106124891A (zh) 一种平面电路测试空间电磁辐射干扰方法
CN114069254B (zh) 用于制造天线阵列的方法、天线阵列和测试系统
Ren et al. The impact of near-field scanning size on the accuracy of far-field estimation
CN106990277A (zh) 时域电压测量装置、测量校准装置及测量校准验证装置
CN105425014A (zh) 板级射频电流的时域测量、测量校准及校准验证系统
JP2020513105A (ja) 導体内の電流強度の測定方法
JP7183887B2 (ja) 電磁界分布生成プログラム、フィルタ生成プログラム及び電磁界分布生成装置
Spang et al. Application of probes with multiple outputs on probe-compensated EMC near-field measurements
CN114325167A (zh) 微带装置、测量系统、确定方法、装置和存储介质
JP2000009775A (ja) 電流測定装置および電流発生源特定方法
Chen et al. Research on imaging detection of RF leakage on the surface of spacecraft
Harm et al. Calibration of loop antennas using a contactless vector network analysis method
Loona et al. Development of a Magnetic Field Probe for Near-Field Measurement
Kunz et al. Experimental validation of time-domain three-dimensional finite-difference techniques for predicting interior coupling responses
CN105372475A (zh) 板级射频电流的时域测量、测量校准及校准验证方法
Newell et al. Higher order mode probes in spherical near-field measurements

Legal Events

Date Code Title Description
A521 Request for written amendment filed

Free format text: JAPANESE INTERMEDIATE CODE: A523

Effective date: 20220722

A621 Written request for application examination

Free format text: JAPANESE INTERMEDIATE CODE: A621

Effective date: 20220722

A871 Explanation of circumstances concerning accelerated examination

Free format text: JAPANESE INTERMEDIATE CODE: A871

Effective date: 20220722

A131 Notification of reasons for refusal

Free format text: JAPANESE INTERMEDIATE CODE: A131

Effective date: 20220823

A521 Request for written amendment filed

Free format text: JAPANESE INTERMEDIATE CODE: A523

Effective date: 20221004

TRDD Decision of grant or rejection written
A01 Written decision to grant a patent or to grant a registration (utility model)

Free format text: JAPANESE INTERMEDIATE CODE: A01

Effective date: 20221101

A61 First payment of annual fees (during grant procedure)

Free format text: JAPANESE INTERMEDIATE CODE: A61

Effective date: 20221129

R150 Certificate of patent or registration of utility model

Ref document number: 7186932

Country of ref document: JP

Free format text: JAPANESE INTERMEDIATE CODE: R150